SG11201702090QA - Embedded universal serial bus (usb) debug (eud) for multi-interfaced debugging in electronic systems - Google Patents

Embedded universal serial bus (usb) debug (eud) for multi-interfaced debugging in electronic systems

Info

Publication number
SG11201702090QA
SG11201702090QA SG11201702090QA SG11201702090QA SG11201702090QA SG 11201702090Q A SG11201702090Q A SG 11201702090QA SG 11201702090Q A SG11201702090Q A SG 11201702090QA SG 11201702090Q A SG11201702090Q A SG 11201702090QA SG 11201702090Q A SG11201702090Q A SG 11201702090QA
Authority
SG
Singapore
Prior art keywords
eud
debug
usb
serial bus
universal serial
Prior art date
Application number
SG11201702090QA
Other languages
English (en)
Inventor
Terrence Brian Remple
Duane Eugene Ellis
Sassan Shahrokhinia
Victor Kam Kin Wong
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of SG11201702090QA publication Critical patent/SG11201702090QA/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2213/00—Indexing scheme relating to interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F2213/0042—Universal serial bus [USB]
SG11201702090QA 2014-10-30 2015-10-05 Embedded universal serial bus (usb) debug (eud) for multi-interfaced debugging in electronic systems SG11201702090QA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/527,873 US9684578B2 (en) 2014-10-30 2014-10-30 Embedded universal serial bus (USB) debug (EUD) for multi-interfaced debugging in electronic systems
PCT/US2015/053938 WO2016069206A1 (en) 2014-10-30 2015-10-05 Embedded universal serial bus (usb) debug (eud) for multi-interfaced debugging in electronic systems

Publications (1)

Publication Number Publication Date
SG11201702090QA true SG11201702090QA (en) 2017-05-30

Family

ID=54293427

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201702090QA SG11201702090QA (en) 2014-10-30 2015-10-05 Embedded universal serial bus (usb) debug (eud) for multi-interfaced debugging in electronic systems

Country Status (16)

Country Link
US (1) US9684578B2 (ja)
EP (1) EP3213215B1 (ja)
JP (1) JP6594972B2 (ja)
KR (1) KR20170078662A (ja)
CN (1) CN107077409B (ja)
AU (1) AU2015339839A1 (ja)
BR (1) BR112017008712A2 (ja)
CA (1) CA2962771A1 (ja)
CL (1) CL2017001033A1 (ja)
CO (1) CO2017003937A2 (ja)
MX (1) MX2017005636A (ja)
PH (1) PH12017500531A1 (ja)
RU (1) RU2017114719A (ja)
SG (1) SG11201702090QA (ja)
TW (1) TWI689813B (ja)
WO (1) WO2016069206A1 (ja)

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US20170138998A1 (en) * 2015-11-16 2017-05-18 Mediatek Inc. Testing Device for Connection Interface and Related Testing Methods
US10503683B2 (en) * 2015-11-20 2019-12-10 Parade Technologies, Ltd. Service redirect over USB Type-C
US10705142B2 (en) * 2016-12-29 2020-07-07 Intel Corporation Device, system and method for providing on-chip test/debug functionality
KR102376750B1 (ko) 2018-09-13 2022-03-21 한국전자통신연구원 디버깅을 위한 네트워크를 포함하는 시스템 온 칩
US10846201B1 (en) * 2018-09-21 2020-11-24 Amazon Technologies, Inc. Performance debug for networks
FR3089657B1 (fr) * 2018-12-06 2021-05-28 Idemia Identity & Security France Dispositif tel qu’un objet connecté pourvu de moyens pour contrôler l’exécution d’un programme exécuté par le dispositif
KR20200123680A (ko) * 2019-04-22 2020-10-30 에스케이하이닉스 주식회사 테스트 기판
TWI710778B (zh) * 2019-12-04 2020-11-21 瑞軒科技股份有限公司 自動化測試系統及其裝置
TWI748297B (zh) 2019-12-04 2021-12-01 瑞軒科技股份有限公司 自動化測試方法
CN112416835A (zh) * 2021-01-25 2021-02-26 智道网联科技(北京)有限公司 智能车载网联终端主板、智能车载网联终端及调试方法

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Also Published As

Publication number Publication date
TW201633128A (zh) 2016-09-16
WO2016069206A1 (en) 2016-05-06
CL2017001033A1 (es) 2018-01-05
US20160124822A1 (en) 2016-05-05
BR112017008712A2 (pt) 2017-12-19
TWI689813B (zh) 2020-04-01
AU2015339839A1 (en) 2017-04-13
CA2962771A1 (en) 2016-05-06
RU2017114719A3 (ja) 2019-04-24
KR20170078662A (ko) 2017-07-07
MX2017005636A (es) 2017-06-29
US9684578B2 (en) 2017-06-20
EP3213215B1 (en) 2019-11-20
CN107077409A (zh) 2017-08-18
RU2017114719A (ru) 2018-12-03
PH12017500531A1 (en) 2017-08-07
JP2017537382A (ja) 2017-12-14
EP3213215A1 (en) 2017-09-06
CO2017003937A2 (es) 2017-07-11
CN107077409B (zh) 2021-01-15
JP6594972B2 (ja) 2019-10-23

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