SG11201510639QA - Method of producing bonded wafer - Google Patents
Method of producing bonded waferInfo
- Publication number
- SG11201510639QA SG11201510639QA SG11201510639QA SG11201510639QA SG11201510639QA SG 11201510639Q A SG11201510639Q A SG 11201510639QA SG 11201510639Q A SG11201510639Q A SG 11201510639QA SG 11201510639Q A SG11201510639Q A SG 11201510639QA SG 11201510639Q A SG11201510639Q A SG 11201510639QA
- Authority
- SG
- Singapore
- Prior art keywords
- bonded wafer
- producing bonded
- producing
- wafer
- bonded
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/7624—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
- H01L21/76251—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology using bonding techniques
- H01L21/76254—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology using bonding techniques with separation/delamination along an ion implanted layer, e.g. Smart-cut, Unibond
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02032—Preparing bulk and homogeneous wafers by reclaiming or re-processing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/7806—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices involving the separation of the active layers from a substrate
- H01L21/7813—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices involving the separation of the active layers from a substrate leaving a reusable substrate, e.g. epitaxial lift off
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Element Separation (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013133868A JP5888286B2 (en) | 2013-06-26 | 2013-06-26 | Manufacturing method of bonded wafer |
PCT/JP2014/002615 WO2014207988A1 (en) | 2013-06-26 | 2014-05-19 | Method for manufacturing bonded wafer |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201510639QA true SG11201510639QA (en) | 2016-01-28 |
Family
ID=52141364
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201510639QA SG11201510639QA (en) | 2013-06-26 | 2014-05-19 | Method of producing bonded wafer |
Country Status (8)
Country | Link |
---|---|
US (1) | US9859149B2 (en) |
EP (1) | EP3016133B1 (en) |
JP (1) | JP5888286B2 (en) |
KR (1) | KR102095383B1 (en) |
CN (1) | CN105283943B (en) |
SG (1) | SG11201510639QA (en) |
TW (1) | TWI567833B (en) |
WO (1) | WO2014207988A1 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6136786B2 (en) * | 2013-09-05 | 2017-05-31 | 信越半導体株式会社 | Manufacturing method of bonded wafer |
CN107112205B (en) | 2015-01-16 | 2020-12-22 | 住友电气工业株式会社 | Semiconductor substrate and method of manufacturing the same, combined semiconductor substrate and method of manufacturing the same |
US20180033609A1 (en) * | 2016-07-28 | 2018-02-01 | QMAT, Inc. | Removal of non-cleaved/non-transferred material from donor substrate |
JP6686962B2 (en) * | 2017-04-25 | 2020-04-22 | 信越半導体株式会社 | Method for manufacturing bonded wafer |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4963505A (en) * | 1987-10-27 | 1990-10-16 | Nippondenso Co., Ltd. | Semiconductor device and method of manufacturing same |
FR2681472B1 (en) | 1991-09-18 | 1993-10-29 | Commissariat Energie Atomique | PROCESS FOR PRODUCING THIN FILMS OF SEMICONDUCTOR MATERIAL. |
JP3943782B2 (en) | 1999-11-29 | 2007-07-11 | 信越半導体株式会社 | Reclaimed wafer reclaim processing method and reclaimed peeled wafer |
JP4509488B2 (en) * | 2003-04-02 | 2010-07-21 | 株式会社Sumco | Manufacturing method of bonded substrate |
EP1807320B1 (en) | 2004-10-11 | 2010-12-08 | MeadWestvaco Corporation | Slide card for child-resistant package |
ATE420461T1 (en) | 2004-11-09 | 2009-01-15 | Soitec Silicon On Insulator | METHOD FOR PRODUCING COMPOSITE WAFERS |
JP4715470B2 (en) | 2005-11-28 | 2011-07-06 | 株式会社Sumco | Release wafer reclaim processing method and release wafer regenerated by this method |
JP5314838B2 (en) | 2006-07-14 | 2013-10-16 | 信越半導体株式会社 | Method for reusing peeled wafers |
JP5799740B2 (en) | 2011-10-17 | 2015-10-28 | 信越半導体株式会社 | Recycled wafer reclaim processing method |
-
2013
- 2013-06-26 JP JP2013133868A patent/JP5888286B2/en active Active
-
2014
- 2014-05-19 WO PCT/JP2014/002615 patent/WO2014207988A1/en active Application Filing
- 2014-05-19 US US14/895,184 patent/US9859149B2/en active Active
- 2014-05-19 CN CN201480032979.9A patent/CN105283943B/en active Active
- 2014-05-19 SG SG11201510639QA patent/SG11201510639QA/en unknown
- 2014-05-19 EP EP14818587.9A patent/EP3016133B1/en active Active
- 2014-05-19 KR KR1020157036519A patent/KR102095383B1/en active IP Right Grant
- 2014-06-16 TW TW103120720A patent/TWI567833B/en active
Also Published As
Publication number | Publication date |
---|---|
US20160118294A1 (en) | 2016-04-28 |
EP3016133A1 (en) | 2016-05-04 |
JP2015012009A (en) | 2015-01-19 |
EP3016133A4 (en) | 2017-03-01 |
JP5888286B2 (en) | 2016-03-16 |
KR20160023712A (en) | 2016-03-03 |
TWI567833B (en) | 2017-01-21 |
US9859149B2 (en) | 2018-01-02 |
CN105283943A (en) | 2016-01-27 |
KR102095383B1 (en) | 2020-03-31 |
EP3016133B1 (en) | 2020-01-15 |
WO2014207988A1 (en) | 2014-12-31 |
TW201511141A (en) | 2015-03-16 |
CN105283943B (en) | 2018-05-08 |
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