SG11201505674SA - Epi base ring - Google Patents

Epi base ring

Info

Publication number
SG11201505674SA
SG11201505674SA SG11201505674SA SG11201505674SA SG11201505674SA SG 11201505674S A SG11201505674S A SG 11201505674SA SG 11201505674S A SG11201505674S A SG 11201505674SA SG 11201505674S A SG11201505674S A SG 11201505674SA SG 11201505674S A SG11201505674S A SG 11201505674SA
Authority
SG
Singapore
Prior art keywords
base ring
epi base
epi
ring
base
Prior art date
Application number
SG11201505674SA
Other languages
English (en)
Inventor
Steve Aboagye
Paul Brillhart
Surajit Kumar
Anzhong Chang
Satheesh Kuppurao
Mehmet Tugrul Samir
David K Carlson
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Publication of SG11201505674SA publication Critical patent/SG11201505674SA/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45502Flow conditions in reaction chamber
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • H01L21/67115Apparatus for thermal treatment mainly by radiation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68721Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge clamping, e.g. clamping ring
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45502Flow conditions in reaction chamber
    • C23C16/45504Laminar flow
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/4411Cooling of the reaction chamber walls
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
    • C23C16/4582Rigid and flat substrates, e.g. plates or discs
    • C23C16/4583Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
    • C23C16/4584Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally the substrate being rotated
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/48Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation
    • C23C16/481Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation by radiant heating of the substrate

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Fluid Mechanics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chemical Vapour Deposition (AREA)
SG11201505674SA 2013-03-13 2014-02-19 Epi base ring SG11201505674SA (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201361780447P 2013-03-13 2013-03-13
US201361781960P 2013-03-14 2013-03-14
US13/846,355 US9322097B2 (en) 2013-03-13 2013-03-18 EPI base ring
PCT/US2014/017200 WO2014163809A1 (en) 2013-03-13 2014-02-19 Epi base ring

Publications (1)

Publication Number Publication Date
SG11201505674SA true SG11201505674SA (en) 2015-09-29

Family

ID=51521626

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201505674SA SG11201505674SA (en) 2013-03-13 2014-02-19 Epi base ring

Country Status (7)

Country Link
US (2) US9322097B2 (enExample)
JP (2) JP6353026B2 (enExample)
KR (2) KR101931541B1 (enExample)
CN (3) CN105810610B (enExample)
SG (1) SG11201505674SA (enExample)
TW (2) TWI607113B (enExample)
WO (1) WO2014163809A1 (enExample)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012128783A1 (en) * 2011-03-22 2012-09-27 Applied Materials, Inc. Liner assembly for chemical vapor deposition chamber
US9512520B2 (en) * 2011-04-25 2016-12-06 Applied Materials, Inc. Semiconductor substrate processing system
US9499905B2 (en) * 2011-07-22 2016-11-22 Applied Materials, Inc. Methods and apparatus for the deposition of materials on a substrate
US20140116336A1 (en) * 2012-10-26 2014-05-01 Applied Materials, Inc. Substrate process chamber exhaust
US9814099B2 (en) * 2013-08-02 2017-11-07 Applied Materials, Inc. Substrate support with surface feature for reduced reflection and manufacturing techniques for producing same
WO2016036497A1 (en) * 2014-09-05 2016-03-10 Applied Materials, Inc. Upper dome for epi chamber
US20180249580A1 (en) * 2015-02-06 2018-08-30 Ushio Denki Kabushiki Kaisha Optical processing device and optical processing method
JP6299635B2 (ja) * 2015-03-12 2018-03-28 信越半導体株式会社 気相成長装置及び気相成長装置に用いるリフレクタ
GB201513339D0 (en) * 2015-07-29 2015-09-09 Pilkington Group Ltd Coating apparatus
CN105118803B (zh) * 2015-08-21 2019-01-22 京东方科技集团股份有限公司 顶针机构及支撑装置
US10325790B2 (en) * 2016-04-29 2019-06-18 Applied Materials, Inc. Methods and apparatus for correcting substrate deformity
CN116190216A (zh) 2016-10-03 2023-05-30 应用材料公司 多通道流量比例控制器与处理腔室
US10934620B2 (en) * 2016-11-29 2021-03-02 Applied Materials, Inc. Integration of dual remote plasmas sources for flowable CVD
KR102408720B1 (ko) * 2017-06-07 2022-06-14 삼성전자주식회사 상부 돔을 포함하는 반도체 공정 챔버
TWI811284B (zh) * 2018-01-24 2023-08-11 美商應用材料股份有限公司 腔室入口組件、入口構件及包括此腔室入口組件的基板處理系統
KR102848536B1 (ko) * 2018-08-06 2025-08-21 어플라이드 머티어리얼스, 인코포레이티드 처리 챔버를 위한 라이너
WO2020046567A1 (en) * 2018-08-29 2020-03-05 Applied Materials, Inc. Chamber injector
US10995419B2 (en) * 2019-04-16 2021-05-04 Applied Materials, Inc. Methods and apparatus for gallium nitride deposition
US11032945B2 (en) * 2019-07-12 2021-06-08 Applied Materials, Inc. Heat shield assembly for an epitaxy chamber
WO2021055768A1 (en) * 2019-09-19 2021-03-25 Applied Materials, Inc. Apparatus and methods for motor shaft and heater leveling
CN110854044B (zh) * 2019-11-20 2022-05-27 北京北方华创微电子装备有限公司 半导体设备及其加热装置
FI129610B (en) * 2020-01-10 2022-05-31 Picosun Oy SUBSTRATE PROCESSING EQUIPMENT AND METHOD
US12037701B2 (en) 2020-04-20 2024-07-16 Applied Materials, Inc. Multi-thermal CVD chambers with shared gas delivery and exhaust system
JP7698042B2 (ja) * 2020-10-13 2025-06-24 チュソン エンジニアリング カンパニー,リミテッド 基板処理装置{substrate processing apparatus}
US12188148B2 (en) 2020-12-22 2025-01-07 Applied Materials, Inc. Multi-layer EPI chamber body
CN112831771A (zh) * 2020-12-30 2021-05-25 上海埃原半导体设备有限公司 一种化学气相沉积用的非金属反应腔
CN114686849B (zh) 2020-12-31 2023-12-01 拓荆科技股份有限公司 制造半导体薄膜的装置和方法
EP4337814A4 (en) * 2021-05-11 2025-10-08 Applied Materials Inc GAS INJECTOR FOR EPITAXY AND CHEMICAL VAPOR DEPOSITION CHAMBER
CN117758237A (zh) * 2022-09-23 2024-03-26 中微半导体设备(上海)股份有限公司 角度调节方法、可调节支架及其薄膜处理装置
US20240141488A1 (en) * 2022-10-27 2024-05-02 Applied Materials, Inc. Coated substrate support assembly for substrate processing in processing chambers
CN118773580A (zh) * 2023-04-06 2024-10-15 中微半导体设备(上海)股份有限公司 基环组件及基片处理设备
US20250215566A1 (en) * 2023-12-27 2025-07-03 Applied Materials, Inc. Process chamber gas supply improvement

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2674811B2 (ja) * 1988-11-25 1997-11-12 富士通株式会社 半導体装置の成長膜形成炉
US5085887A (en) * 1990-09-07 1992-02-04 Applied Materials, Inc. Wafer reactor vessel window with pressure-thermal compensation
US5346578A (en) * 1992-11-04 1994-09-13 Novellus Systems, Inc. Induction plasma source
US5578132A (en) * 1993-07-07 1996-11-26 Tokyo Electron Kabushiki Kaisha Apparatus for heat treating semiconductors at normal pressure and low pressure
DE69433656T2 (de) 1993-07-30 2005-02-17 Applied Materials, Inc., Santa Clara Verfahren zum Einleiten reaktiven Gases in eine Substratbearbeitungsvorrichtung
US5597439A (en) 1994-10-26 1997-01-28 Applied Materials, Inc. Process gas inlet and distribution passages
DE69815163T2 (de) 1997-01-24 2004-05-06 Applied Materials, Inc., Santa Clara Verfahren und Vorrichtung zur Abscheidung von Titanschichten
US5879459A (en) * 1997-08-29 1999-03-09 Genus, Inc. Vertically-stacked process reactor and cluster tool system for atomic layer deposition
US6153260A (en) * 1997-04-11 2000-11-28 Applied Materials, Inc. Method for heating exhaust gas in a substrate reactor
US6406543B1 (en) * 1998-07-23 2002-06-18 Applied Materials, Inc. Infra-red transparent thermal reactor cover member
EP1036988A3 (en) 1999-02-26 2001-05-16 R. Jan Mowill Gas turbine engine fuel/air premixers with variable geometry exit and method for controlling exit velocities
US6245149B1 (en) * 1999-07-01 2001-06-12 Applied Materials, Inc. Inert barrier for high purity epitaxial deposition systems
US6307184B1 (en) * 1999-07-12 2001-10-23 Fsi International, Inc. Thermal processing chamber for heating and cooling wafer-like objects
US6635117B1 (en) * 2000-04-26 2003-10-21 Axcelis Technologies, Inc. Actively-cooled distribution plate for reducing reactive gas temperature in a plasma processing system
US6344631B1 (en) * 2001-05-11 2002-02-05 Applied Materials, Inc. Substrate support assembly and processing apparatus
JP4060684B2 (ja) * 2002-10-29 2008-03-12 日本発条株式会社 ステージ
JP2004311550A (ja) * 2003-04-03 2004-11-04 Hitachi Kokusai Electric Inc 基板処理装置
JP4689969B2 (ja) * 2003-04-05 2011-06-01 ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. Iva族およびvia族化合物の調製
KR100439276B1 (ko) 2003-11-24 2004-07-30 코닉 시스템 주식회사 급속열처리 장치
US7794667B2 (en) 2005-10-19 2010-09-14 Moore Epitaxial, Inc. Gas ring and method of processing substrates
KR20090083404A (ko) * 2006-10-24 2009-08-03 어플라이드 머티어리얼스, 인코포레이티드 원자 층 증착을 위한 보텍스 챔버 리드
JP5074741B2 (ja) 2006-11-10 2012-11-14 株式会社日立ハイテクノロジーズ 真空処理装置
JP2008235830A (ja) * 2007-03-23 2008-10-02 Sumco Techxiv株式会社 気相成長装置
JP2009049047A (ja) * 2007-08-13 2009-03-05 Shin Etsu Handotai Co Ltd 気相成長装置及び気相成長方法
US8394229B2 (en) * 2008-08-07 2013-03-12 Asm America, Inc. Susceptor ring
JP5267366B2 (ja) * 2009-07-16 2013-08-21 株式会社Sumco シリコンウェーハの処理装置
WO2012054206A2 (en) 2010-10-19 2012-04-26 Applied Materials, Inc. Quartz showerhead for nanocure uv chamber
WO2012128783A1 (en) * 2011-03-22 2012-09-27 Applied Materials, Inc. Liner assembly for chemical vapor deposition chamber
US9499905B2 (en) 2011-07-22 2016-11-22 Applied Materials, Inc. Methods and apparatus for the deposition of materials on a substrate
US8960235B2 (en) 2011-10-28 2015-02-24 Applied Materials, Inc. Gas dispersion apparatus
US20130160948A1 (en) * 2011-12-23 2013-06-27 Lam Research Corporation Plasma Processing Devices With Corrosion Resistant Components

Also Published As

Publication number Publication date
CN108034931A (zh) 2018-05-15
WO2014163809A1 (en) 2014-10-09
JP2016517167A (ja) 2016-06-09
KR20150132382A (ko) 2015-11-25
US10119192B2 (en) 2018-11-06
TWI643266B (zh) 2018-12-01
JP6353026B2 (ja) 2018-07-04
JP2018170514A (ja) 2018-11-01
CN104995717A (zh) 2015-10-21
TWI607113B (zh) 2017-12-01
US9322097B2 (en) 2016-04-26
CN105810610A (zh) 2016-07-27
TW201437427A (zh) 2014-10-01
CN105810610B (zh) 2018-09-21
US20160230276A1 (en) 2016-08-11
KR101759818B1 (ko) 2017-07-19
KR101931541B1 (ko) 2018-12-24
TW201807758A (zh) 2018-03-01
CN108034931B (zh) 2020-09-22
US20140261185A1 (en) 2014-09-18
CN104995717B (zh) 2017-12-05
KR20170084372A (ko) 2017-07-19

Similar Documents

Publication Publication Date Title
SG11201505674SA (en) Epi base ring
AU353439S (en) Dial
AU351107S (en) Blender base
AU351470S (en) Cup
ZA201506092B (en) Support bustier garment
AU352104S (en) Blender base
AU351472S (en) Cup
GB201312133D0 (en) Immunotherapy
PL2944730T3 (pl) Miska ustępowa sedesu
AU354078S (en) Carrier
GB201306968D0 (en) Anchor ring assembly
GB201323067D0 (en) Seat Base
PL2984371T3 (pl) Pierścień tłokowy o zmieniających się okresowo właściwościach
KR101578185B9 (ko) 대형 등명기의 안정적인 회전을 유도하는 구동장치
PT3036460T (pt) Anel raspador de óleo
GB2521143B (en) An improved ring main unit
PT3004695T (pt) Anel de pistão
GB2509918B (en) Cup
GB201320968D0 (en) Snap ring piers
AU351517S (en) Charging base
TWM476025U (en) Retaining ring
TWM477090U (en) Charge base
AP2015008613A0 (en) Cooling ring
AU352530S (en) Ring
AU352531S (en) Ring