KR101931541B1 - Epi 베이스 링 - Google Patents
Epi 베이스 링 Download PDFInfo
- Publication number
- KR101931541B1 KR101931541B1 KR1020177019408A KR20177019408A KR101931541B1 KR 101931541 B1 KR101931541 B1 KR 101931541B1 KR 1020177019408 A KR1020177019408 A KR 1020177019408A KR 20177019408 A KR20177019408 A KR 20177019408A KR 101931541 B1 KR101931541 B1 KR 101931541B1
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- KR
- South Korea
- Prior art keywords
- ring
- trench
- ring body
- disposed
- substrate
- Prior art date
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67115—Apparatus for thermal treatment mainly by radiation
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45502—Flow conditions in reaction chamber
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge clamping, e.g. clamping ring
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4411—Cooling of the reaction chamber walls
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45502—Flow conditions in reaction chamber
- C23C16/45504—Laminar flow
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4584—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally the substrate being rotated
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/48—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation
- C23C16/481—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation by radiant heating of the substrate
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Fluid Mechanics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201361780447P | 2013-03-13 | 2013-03-13 | |
| US61/780,447 | 2013-03-13 | ||
| US201361781960P | 2013-03-14 | 2013-03-14 | |
| US61/781,960 | 2013-03-14 | ||
| US13/846,355 US9322097B2 (en) | 2013-03-13 | 2013-03-18 | EPI base ring |
| US13/846,355 | 2013-03-18 | ||
| PCT/US2014/017200 WO2014163809A1 (en) | 2013-03-13 | 2014-02-19 | Epi base ring |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020157029118A Division KR101759818B1 (ko) | 2013-03-13 | 2014-02-19 | Epi 베이스 링 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20170084372A KR20170084372A (ko) | 2017-07-19 |
| KR101931541B1 true KR101931541B1 (ko) | 2018-12-24 |
Family
ID=51521626
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020177019408A Active KR101931541B1 (ko) | 2013-03-13 | 2014-02-19 | Epi 베이스 링 |
| KR1020157029118A Active KR101759818B1 (ko) | 2013-03-13 | 2014-02-19 | Epi 베이스 링 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020157029118A Active KR101759818B1 (ko) | 2013-03-13 | 2014-02-19 | Epi 베이스 링 |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US9322097B2 (enExample) |
| JP (2) | JP6353026B2 (enExample) |
| KR (2) | KR101931541B1 (enExample) |
| CN (3) | CN105810610B (enExample) |
| SG (1) | SG11201505674SA (enExample) |
| TW (2) | TWI607113B (enExample) |
| WO (1) | WO2014163809A1 (enExample) |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
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| KR101884003B1 (ko) * | 2011-03-22 | 2018-07-31 | 어플라이드 머티어리얼스, 인코포레이티드 | 화학 기상 증착 챔버를 위한 라이너 조립체 |
| US9512520B2 (en) * | 2011-04-25 | 2016-12-06 | Applied Materials, Inc. | Semiconductor substrate processing system |
| US9499905B2 (en) * | 2011-07-22 | 2016-11-22 | Applied Materials, Inc. | Methods and apparatus for the deposition of materials on a substrate |
| US20140116336A1 (en) * | 2012-10-26 | 2014-05-01 | Applied Materials, Inc. | Substrate process chamber exhaust |
| US9814099B2 (en) * | 2013-08-02 | 2017-11-07 | Applied Materials, Inc. | Substrate support with surface feature for reduced reflection and manufacturing techniques for producing same |
| WO2016036497A1 (en) * | 2014-09-05 | 2016-03-10 | Applied Materials, Inc. | Upper dome for epi chamber |
| WO2016125433A1 (ja) * | 2015-02-06 | 2016-08-11 | ウシオ電機株式会社 | 光処理装置および光処理方法 |
| JP6299635B2 (ja) * | 2015-03-12 | 2018-03-28 | 信越半導体株式会社 | 気相成長装置及び気相成長装置に用いるリフレクタ |
| GB201513339D0 (en) * | 2015-07-29 | 2015-09-09 | Pilkington Group Ltd | Coating apparatus |
| CN105118803B (zh) * | 2015-08-21 | 2019-01-22 | 京东方科技集团股份有限公司 | 顶针机构及支撑装置 |
| US10325790B2 (en) * | 2016-04-29 | 2019-06-18 | Applied Materials, Inc. | Methods and apparatus for correcting substrate deformity |
| KR102242336B1 (ko) | 2016-10-03 | 2021-04-20 | 어플라이드 머티어리얼스, 인코포레이티드 | 다중 채널 유량 제어기 및 처리 챔버 |
| US10934620B2 (en) * | 2016-11-29 | 2021-03-02 | Applied Materials, Inc. | Integration of dual remote plasmas sources for flowable CVD |
| KR102408720B1 (ko) * | 2017-06-07 | 2022-06-14 | 삼성전자주식회사 | 상부 돔을 포함하는 반도체 공정 챔버 |
| TWI872604B (zh) * | 2018-01-24 | 2025-02-11 | 美商應用材料股份有限公司 | 腔室入口組件、入口構件及包括此腔室入口組件的基板處理系統 |
| KR102848536B1 (ko) * | 2018-08-06 | 2025-08-21 | 어플라이드 머티어리얼스, 인코포레이티드 | 처리 챔버를 위한 라이너 |
| CN214848503U (zh) | 2018-08-29 | 2021-11-23 | 应用材料公司 | 注入器设备、基板处理设备及在机器可读介质中实现的结构 |
| US10995419B2 (en) * | 2019-04-16 | 2021-05-04 | Applied Materials, Inc. | Methods and apparatus for gallium nitride deposition |
| US11032945B2 (en) * | 2019-07-12 | 2021-06-08 | Applied Materials, Inc. | Heat shield assembly for an epitaxy chamber |
| TWI870464B (zh) | 2019-09-19 | 2025-01-21 | 美商應用材料股份有限公司 | 用於進行馬達軸桿及加熱器調平的裝置及方法 |
| CN110854044B (zh) * | 2019-11-20 | 2022-05-27 | 北京北方华创微电子装备有限公司 | 半导体设备及其加热装置 |
| FI129610B (en) * | 2020-01-10 | 2022-05-31 | Picosun Oy | SUBSTRATE PROCESSING EQUIPMENT AND METHOD |
| CN119465090A (zh) | 2020-04-20 | 2025-02-18 | 应用材料公司 | 具有共用的气体输送和排气系统的多个热cvd腔室 |
| CN116368269A (zh) * | 2020-10-13 | 2023-06-30 | 周星工程股份有限公司 | 基板处理设备 |
| US12188148B2 (en) | 2020-12-22 | 2025-01-07 | Applied Materials, Inc. | Multi-layer EPI chamber body |
| CN112831771A (zh) * | 2020-12-30 | 2021-05-25 | 上海埃原半导体设备有限公司 | 一种化学气相沉积用的非金属反应腔 |
| CN114686849B (zh) | 2020-12-31 | 2023-12-01 | 拓荆科技股份有限公司 | 制造半导体薄膜的装置和方法 |
| KR102811576B1 (ko) * | 2021-05-11 | 2025-05-22 | 어플라이드 머티어리얼스, 인코포레이티드 | 에피택시 및 cvd 챔버용 가스 인젝터 |
| CN117758237A (zh) * | 2022-09-23 | 2024-03-26 | 中微半导体设备(上海)股份有限公司 | 角度调节方法、可调节支架及其薄膜处理装置 |
| US20240141488A1 (en) * | 2022-10-27 | 2024-05-02 | Applied Materials, Inc. | Coated substrate support assembly for substrate processing in processing chambers |
| CN118773580A (zh) * | 2023-04-06 | 2024-10-15 | 中微半导体设备(上海)股份有限公司 | 基环组件及基片处理设备 |
| US20250215566A1 (en) * | 2023-12-27 | 2025-07-03 | Applied Materials, Inc. | Process chamber gas supply improvement |
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2014
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- 2014-02-19 KR KR1020177019408A patent/KR101931541B1/ko active Active
- 2014-02-19 CN CN201480008331.8A patent/CN104995717B/zh active Active
- 2014-02-19 SG SG11201505674SA patent/SG11201505674SA/en unknown
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Also Published As
| Publication number | Publication date |
|---|---|
| TW201807758A (zh) | 2018-03-01 |
| US20140261185A1 (en) | 2014-09-18 |
| SG11201505674SA (en) | 2015-09-29 |
| CN105810610B (zh) | 2018-09-21 |
| JP2018170514A (ja) | 2018-11-01 |
| CN104995717A (zh) | 2015-10-21 |
| US9322097B2 (en) | 2016-04-26 |
| CN105810610A (zh) | 2016-07-27 |
| US10119192B2 (en) | 2018-11-06 |
| CN104995717B (zh) | 2017-12-05 |
| KR20150132382A (ko) | 2015-11-25 |
| CN108034931B (zh) | 2020-09-22 |
| TWI607113B (zh) | 2017-12-01 |
| JP2016517167A (ja) | 2016-06-09 |
| CN108034931A (zh) | 2018-05-15 |
| US20160230276A1 (en) | 2016-08-11 |
| KR20170084372A (ko) | 2017-07-19 |
| WO2014163809A1 (en) | 2014-10-09 |
| TWI643266B (zh) | 2018-12-01 |
| KR101759818B1 (ko) | 2017-07-19 |
| JP6353026B2 (ja) | 2018-07-04 |
| TW201437427A (zh) | 2014-10-01 |
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