SG11201502225XA - Incorporating additives into fixed abrasive webs for improved cmp performance - Google Patents

Incorporating additives into fixed abrasive webs for improved cmp performance

Info

Publication number
SG11201502225XA
SG11201502225XA SG11201502225XA SG11201502225XA SG11201502225XA SG 11201502225X A SG11201502225X A SG 11201502225XA SG 11201502225X A SG11201502225X A SG 11201502225XA SG 11201502225X A SG11201502225X A SG 11201502225XA SG 11201502225X A SG11201502225X A SG 11201502225XA
Authority
SG
Singapore
Prior art keywords
fixed abrasive
incorporating additives
cmp performance
improved cmp
abrasive webs
Prior art date
Application number
SG11201502225XA
Other languages
English (en)
Inventor
Julie Y Qian
William D Joseph
Stephen C Loper
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of SG11201502225XA publication Critical patent/SG11201502225XA/en

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/24Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
    • B24B37/245Pads with fixed abrasives
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D3/00Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
    • B24D3/34Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents characterised by additives enhancing special physical properties, e.g. wear resistance, electric conductivity, self-cleaning properties
    • B24D3/342Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents characterised by additives enhancing special physical properties, e.g. wear resistance, electric conductivity, self-cleaning properties incorporated in the bonding agent
    • B24D3/344Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents characterised by additives enhancing special physical properties, e.g. wear resistance, electric conductivity, self-cleaning properties incorporated in the bonding agent the bonding agent being organic
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00Materials not provided for elsewhere
    • C09K3/14Anti-slip materials; Abrasives
    • C09K3/1436Composite particles, e.g. coated particles
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105After-treatment
    • H01L21/31051Planarisation of the insulating layers
    • H01L21/31053Planarisation of the insulating layers involving a dielectric removal step

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Mechanical Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Composite Materials (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Polishing Bodies And Polishing Tools (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
SG11201502225XA 2012-09-21 2013-09-17 Incorporating additives into fixed abrasive webs for improved cmp performance SG11201502225XA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201261703815P 2012-09-21 2012-09-21
PCT/US2013/060022 WO2014047014A1 (en) 2012-09-21 2013-09-17 Incorporating additives into fixed abrasive webs for improved cmp performance

Publications (1)

Publication Number Publication Date
SG11201502225XA true SG11201502225XA (en) 2015-05-28

Family

ID=50341881

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201502225XA SG11201502225XA (en) 2012-09-21 2013-09-17 Incorporating additives into fixed abrasive webs for improved cmp performance

Country Status (8)

Country Link
US (1) US20150217424A1 (ja)
EP (1) EP2897767A4 (ja)
JP (1) JP2015532895A (ja)
KR (1) KR20150058302A (ja)
CN (1) CN104822495A (ja)
SG (1) SG11201502225XA (ja)
TW (1) TW201420706A (ja)
WO (1) WO2014047014A1 (ja)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9649741B2 (en) * 2014-07-07 2017-05-16 Jh Rhodes Company, Inc. Polishing material for polishing hard surfaces, media including the material, and methods of forming and using same
US9873180B2 (en) 2014-10-17 2018-01-23 Applied Materials, Inc. CMP pad construction with composite material properties using additive manufacturing processes
US11745302B2 (en) 2014-10-17 2023-09-05 Applied Materials, Inc. Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process
US10875153B2 (en) 2014-10-17 2020-12-29 Applied Materials, Inc. Advanced polishing pad materials and formulations
US10456886B2 (en) * 2016-01-19 2019-10-29 Applied Materials, Inc. Porous chemical mechanical polishing pads
CN106947396B (zh) * 2017-03-23 2019-02-26 河南联合精密材料股份有限公司 研磨液用悬浮体系、研磨液及其制备方法
CN109251678A (zh) * 2017-07-13 2019-01-22 安集微电子科技(上海)股份有限公司 一种化学机械抛光液
CN108747876B (zh) * 2018-06-11 2021-03-19 河北思瑞恩新材料科技有限公司 一种漆面研磨砂碟的制备方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8092707B2 (en) * 1997-04-30 2012-01-10 3M Innovative Properties Company Compositions and methods for modifying a surface suited for semiconductor fabrication
TW479285B (en) * 1997-04-30 2002-03-11 Minnesota Mining & Mfg Method of modifying a wafer suited for semiconductor fabrication
US6121143A (en) * 1997-09-19 2000-09-19 3M Innovative Properties Company Abrasive articles comprising a fluorochemical agent for wafer surface modification
US20030176151A1 (en) * 2002-02-12 2003-09-18 Applied Materials, Inc. STI polish enhancement using fixed abrasives with amino acid additives
JP2007514553A (ja) * 2003-11-26 2007-06-07 スリーエム イノベイティブ プロパティズ カンパニー 工作物の研磨方法
US7435162B2 (en) * 2005-10-24 2008-10-14 3M Innovative Properties Company Polishing fluids and methods for CMP
US8591764B2 (en) * 2006-12-20 2013-11-26 3M Innovative Properties Company Chemical mechanical planarization composition, system, and method of use
US8083820B2 (en) * 2006-12-22 2011-12-27 3M Innovative Properties Company Structured fixed abrasive articles including surface treated nano-ceria filler, and method for making and using the same
WO2009058463A1 (en) * 2007-10-31 2009-05-07 3M Innovative Properties Company Composition, method and process for polishing a wafer
JP5351967B2 (ja) * 2008-08-28 2013-11-27 スリーエム イノベイティブ プロパティズ カンパニー 構造化研磨物品、その製造方法、及びウエハの平坦化における使用
SG10201401549SA (en) * 2009-06-22 2014-06-27 Cabot Microelectronics Corp CMP Compositions And Methods For Suppressing Polysilicon Removal Rates
US8348723B2 (en) * 2009-09-16 2013-01-08 3M Innovative Properties Company Structured abrasive article and method of using the same
US20130059506A1 (en) * 2010-05-11 2013-03-07 3M Innovative Properties Company Fixed abrasive pad with surfactant for chemical mechanical planarization
CN102947781B (zh) * 2010-06-22 2016-03-09 日本写真印刷株式会社 具有防锈性的窄边框触摸输入薄片及其制造方法
JP5903502B2 (ja) * 2011-12-30 2016-04-13 サン−ゴバン セラミックス アンド プラスティクス,インコーポレイティド 成形研磨粒子を備える粒子材料

Also Published As

Publication number Publication date
US20150217424A1 (en) 2015-08-06
TW201420706A (zh) 2014-06-01
KR20150058302A (ko) 2015-05-28
WO2014047014A1 (en) 2014-03-27
JP2015532895A (ja) 2015-11-16
EP2897767A1 (en) 2015-07-29
EP2897767A4 (en) 2016-07-27
CN104822495A (zh) 2015-08-05

Similar Documents

Publication Publication Date Title
HRP20171459T1 (hr) Piridin-2-amidi korisni kao agonisti cb2
HRP20171445T1 (hr) Piridin-2-amidi korisni kao agonisti cb2
EP2875086A4 (en) CMP GST
TWI561618B (en) Polishing component
SG11201502768UA (en) Polishing composition
SG11201502225XA (en) Incorporating additives into fixed abrasive webs for improved cmp performance
SG11201503751TA (en) Polishing composition
EP2664261A4 (en) MILL
SG11201505037VA (en) Polishing composition
SG11201502766QA (en) Polishing composition
SG11201501849RA (en) Polishing composition
SI2574500T1 (sl) Mobilna kamping enota
GB201318163D0 (en) Refrigerant additive
EP2915859A4 (en) POLISHING COMPOSITION
GB2504174B (en) Abrasive cutting machine
SG11201502457YA (en) Cmp brush packaging
GB2499954B (en) Grinding assembly
SG11201402486TA (en) Polishing composition
GB2491945B (en) Grinding assembly
GB201200135D0 (en) Skirting sanding block
GB201211822D0 (en) Sanders
GB201222457D0 (en) Reversed mode
GB201101560D0 (en) Eco sense
GB201114227D0 (en) Grinding assembly
GB201109998D0 (en) Grinding assembly