SG10202001791WA - Semiconductor memory devices having enhanced error correction circuits therein - Google Patents

Semiconductor memory devices having enhanced error correction circuits therein

Info

Publication number
SG10202001791WA
SG10202001791WA SG10202001791WA SG10202001791WA SG10202001791WA SG 10202001791W A SG10202001791W A SG 10202001791WA SG 10202001791W A SG10202001791W A SG 10202001791WA SG 10202001791W A SG10202001791W A SG 10202001791WA SG 10202001791W A SG10202001791W A SG 10202001791WA
Authority
SG
Singapore
Prior art keywords
semiconductor memory
error correction
memory devices
correction circuits
enhanced error
Prior art date
Application number
SG10202001791WA
Inventor
Cha Sanguhn
Ryu Yesin
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of SG10202001791WA publication Critical patent/SG10202001791WA/en

Links

SG10202001791WA 2019-06-12 2020-02-28 Semiconductor memory devices having enhanced error correction circuits therein SG10202001791WA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020190069150A KR20200142213A (en) 2019-06-12 2019-06-12 Error correction circuit of semiconductor memory device, semiconductor memory device and memory system

Publications (1)

Publication Number Publication Date
SG10202001791WA true SG10202001791WA (en) 2021-01-28

Family

ID=73735861

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10202001791WA SG10202001791WA (en) 2019-06-12 2020-02-28 Semiconductor memory devices having enhanced error correction circuits therein

Country Status (4)

Country Link
US (1) US11436079B2 (en)
KR (1) KR20200142213A (en)
CN (1) CN112084059A (en)
SG (1) SG10202001791WA (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11611358B2 (en) * 2019-12-24 2023-03-21 Kioxia Corporation Systems and methods for detecting or preventing false detection of three error bits by SEC
KR20210147686A (en) * 2020-05-29 2021-12-07 에스케이하이닉스 주식회사 Error correction circuit and method for error correctoin encoding
KR20220039432A (en) * 2020-09-22 2022-03-29 삼성전자주식회사 Semiconductor memory devices and methods of operating the same
KR20220139199A (en) * 2021-04-07 2022-10-14 삼성전자주식회사 Semiconductor memory devices and memory systems including the same
KR20230083689A (en) * 2021-12-03 2023-06-12 서울대학교산학협력단 Memory device capable of dynamically switching between error correction code and error detection code in on-die Error Correction Code
US11955989B2 (en) 2022-08-21 2024-04-09 Nanya Technology Corporation Memory device and test method thereof

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4213814B2 (en) 1999-05-11 2009-01-21 富士通株式会社 Error correction circuit check method and error correction circuit with check function
US8230305B2 (en) 2009-04-02 2012-07-24 Micron Technology, Inc. Extended single-bit error correction and multiple-bit error detection
KR102296738B1 (en) 2015-06-01 2021-09-01 삼성전자 주식회사 Semiconductor memory device, memory system including the same, and method of error correction of the same
US9817714B2 (en) 2015-08-28 2017-11-14 Intel Corporation Memory device on-die error checking and correcting code
US10108512B2 (en) 2016-04-01 2018-10-23 Intel Corporation Validation of memory on-die error correction code
KR102608908B1 (en) * 2016-06-23 2023-12-04 에스케이하이닉스 주식회사 Method of correcting error of data and memory device thereof
KR102258140B1 (en) 2017-07-06 2021-05-28 삼성전자주식회사 Error correction circuit of semiconductor memory device, semiconductor memory device and memory system
KR20190052754A (en) * 2017-11-09 2019-05-17 삼성전자주식회사 Semiconductor memory device and memory system including the same for adaptive error check and correction
KR20190054533A (en) * 2017-11-14 2019-05-22 삼성전자주식회사 Semiconductor memory devices, memory systems including the same and methods of operating semiconductor memory devices

Also Published As

Publication number Publication date
CN112084059A (en) 2020-12-15
US20200394102A1 (en) 2020-12-17
KR20200142213A (en) 2020-12-22
US11436079B2 (en) 2022-09-06

Similar Documents

Publication Publication Date Title
SG10202001791WA (en) Semiconductor memory devices having enhanced error correction circuits therein
SG10202008178YA (en) Semiconductor Memory Devices
SG10202007886XA (en) Three-Dimensional Semiconductor Memory Device
SG10202004453RA (en) Three-Dimensional Semiconductor Memory Device
SG10202004477SA (en) Three-dimensional semiconductor memory device
SG10201909445RA (en) Semiconductor memory device
SG10201905122TA (en) Semiconductor memory device
IL284546A (en) Integrated circuits including memory cells
SG10201911466SA (en) Semiconductor memory devices
SG11202102625VA (en) Semiconductor memory device
IL286750A (en) Semiconductor flipper
GB201814693D0 (en) Semiconductor devices
SG10201906732VA (en) Three dimensional semiconductor memory devices
SG11202008495TA (en) Semiconductor memory device
SG11202013103YA (en) Semiconductor memory device
GB2587854B (en) Semiconductor devices
SG10202009449SA (en) Integrated circuit semiconductor device
SG10202003704XA (en) Semiconductor Devices
KR102304963B9 (en) Semiconductor package
KR102153413B9 (en) Semiconductor package
SG10201909192XA (en) Semiconductor memory device
GB202009043D0 (en) Semiconductor structures
KR102346189B9 (en) Semiconductor package
SG10202003583UA (en) Semiconductor Memory Device
TWI800988B (en) Semiconductor memory devices