SG10201400838PA - System for testing an integrated circuit of a device and its method of use - Google Patents
System for testing an integrated circuit of a device and its method of useInfo
- Publication number
- SG10201400838PA SG10201400838PA SG10201400838PA SG10201400838PA SG10201400838PA SG 10201400838P A SG10201400838P A SG 10201400838PA SG 10201400838P A SG10201400838P A SG 10201400838PA SG 10201400838P A SG10201400838P A SG 10201400838PA SG 10201400838P A SG10201400838P A SG 10201400838PA
- Authority
- SG
- Singapore
- Prior art keywords
- testing
- integrated circuit
- integrated
- circuit
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0491—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets for testing integrated circuits on wafers, e.g. wafer-level test cartridge
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06705—Apparatus for holding or moving single probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/411,233 US8030957B2 (en) | 2009-03-25 | 2009-03-25 | System for testing an integrated circuit of a device and its method of use |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201400838PA true SG10201400838PA (en) | 2014-07-30 |
Family
ID=42781520
Family Applications (5)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201912223SA SG10201912223SA (en) | 2009-03-25 | 2010-03-25 | System for testing an integrated circuit of a device and its method of use |
SG10202108629YA SG10202108629YA (en) | 2009-03-25 | 2010-03-25 | System for testing an integrated circuit of a device and its method of use |
SG2011068228A SG174890A1 (en) | 2009-03-25 | 2010-03-25 | System for testing an integrated circuit of a device and its method of use |
SG10201801948WA SG10201801948WA (en) | 2009-03-25 | 2010-03-25 | System for testing an integrated circuit of a device and its method of use |
SG10201400838PA SG10201400838PA (en) | 2009-03-25 | 2010-03-25 | System for testing an integrated circuit of a device and its method of use |
Family Applications Before (4)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201912223SA SG10201912223SA (en) | 2009-03-25 | 2010-03-25 | System for testing an integrated circuit of a device and its method of use |
SG10202108629YA SG10202108629YA (en) | 2009-03-25 | 2010-03-25 | System for testing an integrated circuit of a device and its method of use |
SG2011068228A SG174890A1 (en) | 2009-03-25 | 2010-03-25 | System for testing an integrated circuit of a device and its method of use |
SG10201801948WA SG10201801948WA (en) | 2009-03-25 | 2010-03-25 | System for testing an integrated circuit of a device and its method of use |
Country Status (5)
Country | Link |
---|---|
US (8) | US8030957B2 (en) |
EP (1) | EP2411819A1 (en) |
JP (4) | JP5635586B2 (en) |
SG (5) | SG10201912223SA (en) |
WO (1) | WO2010111526A1 (en) |
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US8362797B2 (en) * | 2009-08-25 | 2013-01-29 | Advanced Inquiry Systems, Inc. | Maintaining a wafer/wafer translator pair in an attached state free of a gasket disposed therebetween |
SG189154A1 (en) | 2010-09-28 | 2013-05-31 | Advanced Inquiry Systems Inc | Wafer testing systems and associated methods of use and manufacture |
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KR101641108B1 (en) | 2010-04-30 | 2016-07-20 | 삼성전자주식회사 | Target device providing debugging functionality and test system comprising the same |
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2009
- 2009-03-25 US US12/411,233 patent/US8030957B2/en active Active
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- 2010-03-25 EP EP20100756867 patent/EP2411819A1/en not_active Withdrawn
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- 2010-03-25 WO PCT/US2010/028719 patent/WO2010111526A1/en active Application Filing
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- 2011-09-01 US US13/223,319 patent/US8947116B2/en active Active
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US10401385B2 (en) | 2019-09-03 |
JP2015053500A (en) | 2015-03-19 |
US11592465B2 (en) | 2023-02-28 |
JP6013423B2 (en) | 2016-10-25 |
SG10202108629YA (en) | 2021-09-29 |
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EP2411819A1 (en) | 2012-02-01 |
US20170176492A1 (en) | 2017-06-22 |
JP2017022403A (en) | 2017-01-26 |
SG174890A1 (en) | 2011-11-28 |
JP2018032873A (en) | 2018-03-01 |
US8030957B2 (en) | 2011-10-04 |
JP2012522381A (en) | 2012-09-20 |
US8947116B2 (en) | 2015-02-03 |
JP5635586B2 (en) | 2014-12-03 |
US20150109011A1 (en) | 2015-04-23 |
SG10201801948WA (en) | 2018-04-27 |
US20100244866A1 (en) | 2010-09-30 |
US9880197B2 (en) | 2018-01-30 |
US20230168277A1 (en) | 2023-06-01 |
US20110316577A1 (en) | 2011-12-29 |
US20210364549A1 (en) | 2021-11-25 |
SG10201912223SA (en) | 2020-02-27 |
US20190339303A1 (en) | 2019-11-07 |
JP6239714B2 (en) | 2017-11-29 |
WO2010111526A1 (en) | 2010-09-30 |
US9625521B2 (en) | 2017-04-18 |
US11112429B2 (en) | 2021-09-07 |
JP6465947B2 (en) | 2019-02-06 |
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