SE9904318D0 - Method and device for electrospray ionisation - Google Patents

Method and device for electrospray ionisation

Info

Publication number
SE9904318D0
SE9904318D0 SE9904318A SE9904318A SE9904318D0 SE 9904318 D0 SE9904318 D0 SE 9904318D0 SE 9904318 A SE9904318 A SE 9904318A SE 9904318 A SE9904318 A SE 9904318A SE 9904318 D0 SE9904318 D0 SE 9904318D0
Authority
SE
Sweden
Prior art keywords
liquid
electrospray ionization
heating
inlet
mass analyser
Prior art date
Application number
SE9904318A
Other languages
English (en)
Inventor
Johan Eriksson
Jan Axelsson
Original Assignee
Amersham Pharm Biotech Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Amersham Pharm Biotech Ab filed Critical Amersham Pharm Biotech Ab
Priority to SE9904318A priority Critical patent/SE9904318D0/sv
Publication of SE9904318D0 publication Critical patent/SE9904318D0/sv
Priority to PCT/EP2000/011859 priority patent/WO2001040791A2/en
Priority to AU18605/01A priority patent/AU1860501A/en
Priority to EP00981314A priority patent/EP1243018A2/en
Priority to US10/148,717 priority patent/US6683302B1/en
Priority to CA002392750A priority patent/CA2392750A1/en
Priority to JP2001542202A priority patent/JP2003515902A/ja

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165—Electrospray ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B6/00—Heating by electric, magnetic or electromagnetic fields
    • H05B6/64—Heating using microwaves
    • H05B6/80—Apparatus for specific applications
    • H05B6/802—Apparatus for specific applications for heating fluids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/724—Nebulising, aerosol formation or ionisation
    • G01N30/7266—Nebulising, aerosol formation or ionisation by electric field, e.g. electrospray

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Electromagnetism (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Constitution Of High-Frequency Heating (AREA)
  • Electron Tubes For Measurement (AREA)
SE9904318A 1999-11-29 1999-11-29 Method and device for electrospray ionisation SE9904318D0 (sv)

Priority Applications (7)

Application Number Priority Date Filing Date Title
SE9904318A SE9904318D0 (sv) 1999-11-29 1999-11-29 Method and device for electrospray ionisation
PCT/EP2000/011859 WO2001040791A2 (en) 1999-11-29 2000-11-28 Method and device for electrospray ionisation
AU18605/01A AU1860501A (en) 1999-11-29 2000-11-28 Method and device for electrospray ionisation
EP00981314A EP1243018A2 (en) 1999-11-29 2000-11-28 Method and device for electrospray ionisation
US10/148,717 US6683302B1 (en) 1999-11-29 2000-11-28 Method and device for electrospray ionization
CA002392750A CA2392750A1 (en) 1999-11-29 2000-11-28 Method and device for electrospray ionisation
JP2001542202A JP2003515902A (ja) 1999-11-29 2000-11-28 エレクトロスプレーイオン化方法及び装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9904318A SE9904318D0 (sv) 1999-11-29 1999-11-29 Method and device for electrospray ionisation

Publications (1)

Publication Number Publication Date
SE9904318D0 true SE9904318D0 (sv) 1999-11-29

Family

ID=20417891

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9904318A SE9904318D0 (sv) 1999-11-29 1999-11-29 Method and device for electrospray ionisation

Country Status (7)

Country Link
US (1) US6683302B1 (sv)
EP (1) EP1243018A2 (sv)
JP (1) JP2003515902A (sv)
AU (1) AU1860501A (sv)
CA (1) CA2392750A1 (sv)
SE (1) SE9904318D0 (sv)
WO (1) WO2001040791A2 (sv)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10392706B4 (de) * 2002-05-31 2016-09-29 Waters Technologies Corp. (N.D.Ges.D. Staates Delaware) Schnelle Kombinations-Mehrfachmodus-Ionisierungsquelle für Massenspektrometer
WO2003106165A1 (ja) * 2002-06-14 2003-12-24 電気化学工業株式会社 シート及び電子部品包装容器
US6646257B1 (en) * 2002-09-18 2003-11-11 Agilent Technologies, Inc. Multimode ionization source
US6967326B2 (en) * 2004-02-27 2005-11-22 Lucent Technologies Inc. Mass spectrometers on wafer-substrates
US20070023677A1 (en) * 2005-06-29 2007-02-01 Perkins Patrick D Multimode ionization source and method for screening molecules
ES2319837B2 (es) * 2006-08-02 2009-12-04 Universidad De Alicante Sistema integrado y flexible para la introduccion de muestras en espectrometria atomica basado en la radiacion de microondas.
US20090211522A1 (en) * 2008-02-21 2009-08-27 Gm Global Technology Operations, Inc. Use of Variable Frequency Microwaves to Control the Teflon Profile of Gas Diffusion Media
KR100971057B1 (ko) 2008-03-10 2010-07-20 김미화 금속 와이어가 삽입된 전자 분무 이온화용 분무 바늘

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5935347A (ja) * 1982-08-20 1984-02-27 Masahiko Tsuchiya イオン生成装置
US4842701A (en) * 1987-04-06 1989-06-27 Battelle Memorial Institute Combined electrophoretic-separation and electrospray method and system
US4935624A (en) 1987-09-30 1990-06-19 Cornell Research Foundation, Inc. Thermal-assisted electrospray interface (TAESI) for LC/MS
JP3160050B2 (ja) * 1992-03-13 2001-04-23 株式会社日立製作所 質量分析計
JP3367719B2 (ja) * 1993-09-20 2003-01-20 株式会社日立製作所 質量分析計および静電レンズ
CA2305071C (en) * 1999-04-12 2009-03-24 Mds Inc. High intensity ion source

Also Published As

Publication number Publication date
EP1243018A2 (en) 2002-09-25
CA2392750A1 (en) 2001-06-07
WO2001040791A2 (en) 2001-06-07
JP2003515902A (ja) 2003-05-07
US6683302B1 (en) 2004-01-27
AU1860501A (en) 2001-06-12
WO2001040791A3 (en) 2002-07-18

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