CA2479872A1 - Ionization apparatus and method for mass spectrometer system - Google Patents

Ionization apparatus and method for mass spectrometer system Download PDF

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Publication number
CA2479872A1
CA2479872A1 CA002479872A CA2479872A CA2479872A1 CA 2479872 A1 CA2479872 A1 CA 2479872A1 CA 002479872 A CA002479872 A CA 002479872A CA 2479872 A CA2479872 A CA 2479872A CA 2479872 A1 CA2479872 A1 CA 2479872A1
Authority
CA
Canada
Prior art keywords
region
sample spots
ionization apparatus
pressure
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA002479872A
Other languages
French (fr)
Other versions
CA2479872C (en
Inventor
Alexander A. Makarov
Pavel V. Bondarenko
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thermo Finnigan LLC
Original Assignee
Thermo Finnigan Llc
Alexander A. Makarov
Pavel V. Bondarenko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/105,172 external-priority patent/US6707036B2/en
Application filed by Thermo Finnigan Llc, Alexander A. Makarov, Pavel V. Bondarenko filed Critical Thermo Finnigan Llc
Publication of CA2479872A1 publication Critical patent/CA2479872A1/en
Application granted granted Critical
Publication of CA2479872C publication Critical patent/CA2479872C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H01J49/0418—Sample holders or containers for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

An ionization apparatus (10) for connection to a mass analyzer (103) is provided. The ionization apparatus (10) comprises a sample slide (101) having at least two sample spots (100) containing analytes to be analyzed by a mass analyzer (103), means for delivering energy (104) to one of the sample spots to release and ionize the analytes to form ions, and an interface (15) connecting the one of the sample spots (100) to the analyzer. The interface (15) comprises a chamber (118) having an orifice (102) in close proximity to the one of the sample spots (100) and defining a first region encompassing the one of the sample spots, and an ion guide (106) disposed in the chamber (118) and leading to the mass analyzer (103) in a second region. Means for sustaining a pressure substantially lower than atmospheric within the first region is provided for capturing the ions while other sample spots (100) are maintained at atmospheric pressure. Means for sustaining a pressure within the second region substantially lower than the pressure within the first region is provided.
CA002479872A 2002-03-21 2003-03-14 Ionization apparatus and method for mass spectrometer system Expired - Fee Related CA2479872C (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US10/105,172 2002-03-21
US10/105,172 US6707036B2 (en) 2002-03-21 2002-03-21 Ionization apparatus and method for mass spectrometer system
US10/341,621 US6707040B2 (en) 2002-03-21 2003-01-13 Ionization apparatus and method for mass spectrometer system
US10/341,621 2003-01-13
PCT/US2003/008041 WO2003081205A2 (en) 2002-03-21 2003-03-14 Ionization apparatus and method for mass spectrometer system

Publications (2)

Publication Number Publication Date
CA2479872A1 true CA2479872A1 (en) 2003-10-02
CA2479872C CA2479872C (en) 2009-06-23

Family

ID=29738740

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002479872A Expired - Fee Related CA2479872C (en) 2002-03-21 2003-03-14 Ionization apparatus and method for mass spectrometer system

Country Status (4)

Country Link
EP (1) EP1492613A4 (en)
AU (1) AU2003220320A1 (en)
CA (1) CA2479872C (en)
WO (1) WO2003081205A2 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2493691A1 (en) * 2004-01-22 2005-07-22 Ionalytics Corporation Method and apparatus for faims with a laser-based ionization source
US7700913B2 (en) * 2006-03-03 2010-04-20 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy
US7777181B2 (en) 2006-05-26 2010-08-17 Ionsense, Inc. High resolution sampling system for use with surface ionization technology
EP2294601A2 (en) * 2008-05-29 2011-03-16 Universitätsklinikum Münster Ion source means for desorption / ionisation of analyte substances and method of desorbing / ionising of analyte subtances
US8207497B2 (en) 2009-05-08 2012-06-26 Ionsense, Inc. Sampling of confined spaces
US8822949B2 (en) 2011-02-05 2014-09-02 Ionsense Inc. Apparatus and method for thermal assisted desorption ionization systems
US8901488B1 (en) 2011-04-18 2014-12-02 Ionsense, Inc. Robust, rapid, secure sample manipulation before during and after ionization for a spectroscopy system
EP2732457A4 (en) * 2011-07-14 2015-09-16 Univ George Washington Plume collimation for laser ablation electrospray ionization mass spectrometry
GB2493179B (en) * 2011-07-26 2018-09-05 Kratos Analytical Ltd MALDI sample preparation methods and targets
US9337007B2 (en) 2014-06-15 2016-05-10 Ionsense, Inc. Apparatus and method for generating chemical signatures using differential desorption
US9899196B1 (en) 2016-01-12 2018-02-20 Jeol Usa, Inc. Dopant-assisted direct analysis in real time mass spectrometry
GB201705981D0 (en) 2017-04-13 2017-05-31 Micromass Ltd MALDI target plate
US10636640B2 (en) 2017-07-06 2020-04-28 Ionsense, Inc. Apparatus and method for chemical phase sampling analysis
US10825673B2 (en) 2018-06-01 2020-11-03 Ionsense Inc. Apparatus and method for reducing matrix effects
GB201815676D0 (en) 2018-09-26 2018-11-07 Micromass Ltd MALDI nozzle
KR20220088409A (en) 2019-10-28 2022-06-27 이온센스 인코포레이티드 Real-time pulsating flow atmospheric ionization
US11913861B2 (en) 2020-05-26 2024-02-27 Bruker Scientific Llc Electrostatic loading of powder samples for ionization

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3796872A (en) * 1970-12-18 1974-03-12 Ass Elect Ind Mass spectrometry
US5106583A (en) * 1989-03-08 1992-04-21 Applied Biosystems, Inc. Automated protein hydrolysis system
US5777324A (en) * 1996-09-19 1998-07-07 Sequenom, Inc. Method and apparatus for maldi analysis
EP1051731B1 (en) * 1997-12-05 2002-07-03 University Of British Columbia Method of analyzing ions in an apparatus including a time of flight mass spectrometer and a linear ion trap
CA2227806C (en) 1998-01-23 2006-07-18 University Of Manitoba Spectrometer provided with pulsed ion source and transmission device to damp ion motion and method of use
US6331702B1 (en) 1999-01-25 2001-12-18 University Of Manitoba Spectrometer provided with pulsed ion source and transmission device to damp ion motion and method of use
US5965884A (en) 1998-06-04 1999-10-12 The Regents Of The University Of California Atmospheric pressure matrix assisted laser desorption
US6849847B1 (en) 1998-06-12 2005-02-01 Agilent Technologies, Inc. Ambient pressure matrix-assisted laser desorption ionization (MALDI) apparatus and method of analysis
WO2000077822A2 (en) * 1999-06-11 2000-12-21 Perseptive Biosystems, Inc. Method and apparatus for determining molecular weight of labile molecules
US7332271B2 (en) * 2000-02-18 2008-02-19 Board Of Trustees Of The Leland Stanford Junior University Apparatus and methods for parallel processing of micro-volume liquid reactions
JP2002175770A (en) * 2000-12-08 2002-06-21 Hitachi Ltd Sample chamber for gas exhaustion and circuit pattern forming device using the same
EP1402561A4 (en) * 2001-05-25 2007-06-06 Analytica Of Branford Inc Atmospheric and vacuum pressure maldi ion source
JP4772212B2 (en) 2001-05-31 2011-09-14 浜松ホトニクス株式会社 X-ray generator
US6683300B2 (en) * 2001-09-17 2004-01-27 Science & Engineering Services, Inc. Method and apparatus for mass spectrometry analysis of common analyte solutions

Also Published As

Publication number Publication date
WO2003081205A2 (en) 2003-10-02
AU2003220320A8 (en) 2003-10-08
AU2003220320A1 (en) 2003-10-08
CA2479872C (en) 2009-06-23
EP1492613A2 (en) 2005-01-05
EP1492613A4 (en) 2009-12-16
WO2003081205A3 (en) 2003-12-18

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