SE9904184L - Testfixtur - Google Patents
TestfixturInfo
- Publication number
- SE9904184L SE9904184L SE9904184A SE9904184A SE9904184L SE 9904184 L SE9904184 L SE 9904184L SE 9904184 A SE9904184 A SE 9904184A SE 9904184 A SE9904184 A SE 9904184A SE 9904184 L SE9904184 L SE 9904184L
- Authority
- SE
- Sweden
- Prior art keywords
- printed circuit
- module
- sleeves
- test fixture
- contacting
- Prior art date
Links
- 239000000523 sample Substances 0.000 abstract 3
- 229910000679 solder Inorganic materials 0.000 abstract 3
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/045—Sockets or component fixtures for RF or HF testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9904184A SE515298C2 (sv) | 1999-11-19 | 1999-11-19 | Testfixtur |
PCT/SE2000/002131 WO2001036984A1 (en) | 1999-11-19 | 2000-10-31 | A test fixture |
AU15641/01A AU1564101A (en) | 1999-11-19 | 2000-10-31 | A test fixture |
US09/711,079 US6411113B1 (en) | 1999-11-19 | 2000-11-14 | Radio frequency test fixture |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9904184A SE515298C2 (sv) | 1999-11-19 | 1999-11-19 | Testfixtur |
Publications (3)
Publication Number | Publication Date |
---|---|
SE9904184D0 SE9904184D0 (sv) | 1999-11-19 |
SE9904184L true SE9904184L (sv) | 2001-05-20 |
SE515298C2 SE515298C2 (sv) | 2001-07-09 |
Family
ID=20417773
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE9904184A SE515298C2 (sv) | 1999-11-19 | 1999-11-19 | Testfixtur |
Country Status (4)
Country | Link |
---|---|
US (1) | US6411113B1 ( ) |
AU (1) | AU1564101A ( ) |
SE (1) | SE515298C2 ( ) |
WO (1) | WO2001036984A1 ( ) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005504991A (ja) * | 2001-10-10 | 2005-02-17 | デラウェア キャピタル フォーメーション,インコーポレイテッド | 高周波回路板を検査するための同軸チルトピン治具 |
GB2477358A (en) * | 2010-02-02 | 2011-08-03 | Thales Holdings Uk Plc | RF testing an integrated circuit assembly during manufacture using a interposed adaptor layer which is removed after test to attach the IC to a BGA |
CN108205081B (zh) * | 2018-01-19 | 2024-04-02 | 桂林电子科技大学 | 一种用于微尺度焊球回波损耗测量的装置 |
CN111781431A (zh) * | 2020-07-13 | 2020-10-16 | 芝纶自动化科技(上海)有限公司 | 一种测试装置 |
CN114243287A (zh) * | 2021-12-10 | 2022-03-25 | 上海微波技术研究所(中国电子科技集团公司第五十研究所) | 毫米波相控阵天线阵列集成转换接头 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5532983A (en) * | 1992-12-30 | 1996-07-02 | Intel Corporation | Circuit design for point-to-point chip for high speed testing |
US5500605A (en) * | 1993-09-17 | 1996-03-19 | At&T Corp. | Electrical test apparatus and method |
US5859538A (en) * | 1996-01-31 | 1999-01-12 | Hewlett-Packard Company | Method and apparatus for connecting a ball grid array device to a test instrument to facilitate the monitoring of individual signals or the interruption of individual signals or both |
US5955888A (en) * | 1997-09-10 | 1999-09-21 | Xilinx, Inc. | Apparatus and method for testing ball grid array packaged integrated circuits |
US6246011B1 (en) * | 1998-12-02 | 2001-06-12 | Nortel Networks Limited | Solder joint reliability |
US6218729B1 (en) * | 1999-03-11 | 2001-04-17 | Atmel Corporation | Apparatus and method for an integrated circuit having high Q reactive components |
-
1999
- 1999-11-19 SE SE9904184A patent/SE515298C2/sv not_active IP Right Cessation
-
2000
- 2000-10-31 AU AU15641/01A patent/AU1564101A/en not_active Abandoned
- 2000-10-31 WO PCT/SE2000/002131 patent/WO2001036984A1/en active Application Filing
- 2000-11-14 US US09/711,079 patent/US6411113B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
SE515298C2 (sv) | 2001-07-09 |
SE9904184D0 (sv) | 1999-11-19 |
US6411113B1 (en) | 2002-06-25 |
AU1564101A (en) | 2001-05-30 |
WO2001036984A1 (en) | 2001-05-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
NUG | Patent has lapsed |