SE9901292D0 - Förfarande och anordning för kalibrering av utrustning för ytjämnhetsbestämning hos film- eller arkmaterial - Google Patents
Förfarande och anordning för kalibrering av utrustning för ytjämnhetsbestämning hos film- eller arkmaterialInfo
- Publication number
- SE9901292D0 SE9901292D0 SE9901292A SE9901292A SE9901292D0 SE 9901292 D0 SE9901292 D0 SE 9901292D0 SE 9901292 A SE9901292 A SE 9901292A SE 9901292 A SE9901292 A SE 9901292A SE 9901292 D0 SE9901292 D0 SE 9901292D0
- Authority
- SE
- Sweden
- Prior art keywords
- elevations
- dimensions
- shaft
- equipment
- calibration
- Prior art date
Links
- 230000002093 peripheral effect Effects 0.000 abstract 2
- 230000005540 biological transmission Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9901292A SE514081C2 (sv) | 1999-04-12 | 1999-04-12 | Förfarande och anordning för kalibrering av utrustning för ytjämnhetsbestämning hos film- eller arkmaterial |
US09/958,710 US6594015B1 (en) | 1999-04-12 | 2000-04-10 | Method and a device for calibrating equipment for determining the surface uniformity of film or sheet material |
EP00923046A EP1190216A1 (en) | 1999-04-12 | 2000-04-10 | A method and a device for calibrating equipment for determining the surface uniformity of film or sheet material |
PCT/SE2000/000682 WO2000062014A1 (en) | 1999-04-12 | 2000-04-10 | A method and a device for calibrating equipment for determining the surface uniformity of film or sheet material |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9901292A SE514081C2 (sv) | 1999-04-12 | 1999-04-12 | Förfarande och anordning för kalibrering av utrustning för ytjämnhetsbestämning hos film- eller arkmaterial |
Publications (3)
Publication Number | Publication Date |
---|---|
SE9901292D0 true SE9901292D0 (sv) | 1999-04-12 |
SE9901292L SE9901292L (sv) | 2000-10-13 |
SE514081C2 SE514081C2 (sv) | 2000-12-18 |
Family
ID=20415179
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE9901292A SE514081C2 (sv) | 1999-04-12 | 1999-04-12 | Förfarande och anordning för kalibrering av utrustning för ytjämnhetsbestämning hos film- eller arkmaterial |
Country Status (4)
Country | Link |
---|---|
US (1) | US6594015B1 (sv) |
EP (1) | EP1190216A1 (sv) |
SE (1) | SE514081C2 (sv) |
WO (1) | WO2000062014A1 (sv) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE0101374L (sv) | 2001-04-19 | 2002-10-20 | Svante Bjoerk Ab | Förfarande och anordning för optisk avsyning |
EP2065900A1 (en) | 2007-10-23 | 2009-06-03 | Borealis Technology Oy | Semiconductive polymer composition |
US8693810B2 (en) | 2008-11-05 | 2014-04-08 | The Trustees Of Princeton University | Optical counter-phase system and method of RF interference cancellation |
US8682170B2 (en) | 2011-05-20 | 2014-03-25 | The Trustees Of Princeton University | System and method for broadband RF interference cancellation |
EP2886585A1 (en) | 2013-12-20 | 2015-06-24 | Borealis AG | Semiconductive polymer composition for electric power cables |
EP3173442A1 (en) | 2015-11-27 | 2017-05-31 | Borealis AG | Semiconductive polyethylene composition |
EP3173443A1 (en) | 2015-11-27 | 2017-05-31 | Borealis AG | Semiconductive polyethylene composition |
BR112022004504A2 (pt) | 2019-09-13 | 2022-05-31 | Borealis Ag | Composição de polímero semicondutor |
CN114651042A (zh) | 2019-09-13 | 2022-06-21 | 博里利斯股份公司 | 半导体聚合物组合物 |
CN117083327A (zh) | 2021-03-16 | 2023-11-17 | 博里利斯股份公司 | 半导电聚合物组合物 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4656663A (en) * | 1984-08-06 | 1987-04-07 | E. I. Du Pont De Nemours And Company | Method of film inspection with a microscopical image analyzer |
JPS62255806A (ja) * | 1986-04-29 | 1987-11-07 | Mitsubishi Electric Corp | 膜厚測定方法及び装置 |
US5047652A (en) * | 1990-04-16 | 1991-09-10 | International Paper Company | System for on-line measurement of color, opacity and reflectance of a translucent moving web |
DE4416786A1 (de) * | 1994-05-09 | 1995-11-16 | Berliner Inst Fuer Optik Gmbh | Verfahren zur Kalibrierung eines Interferometers zur Zylinderprüfung sowie Vorrichtung zur Durchführung des Verfahrens |
US5850287A (en) * | 1997-07-11 | 1998-12-15 | Hewlett-Packard Company | Roller assembly having pre-aligned for on-line thickness measurements |
US6080982A (en) * | 1998-05-13 | 2000-06-27 | The United States Of America As Represented By The Secretary Of The Navy | Embedded wear sensor |
-
1999
- 1999-04-12 SE SE9901292A patent/SE514081C2/sv not_active IP Right Cessation
-
2000
- 2000-04-10 WO PCT/SE2000/000682 patent/WO2000062014A1/en not_active Application Discontinuation
- 2000-04-10 EP EP00923046A patent/EP1190216A1/en not_active Withdrawn
- 2000-04-10 US US09/958,710 patent/US6594015B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP1190216A1 (en) | 2002-03-27 |
WO2000062014A1 (en) | 2000-10-19 |
SE9901292L (sv) | 2000-10-13 |
SE514081C2 (sv) | 2000-12-18 |
US6594015B1 (en) | 2003-07-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
NUG | Patent has lapsed |