SE0101374L - Förfarande och anordning för optisk avsyning - Google Patents

Förfarande och anordning för optisk avsyning

Info

Publication number
SE0101374L
SE0101374L SE0101374A SE0101374A SE0101374L SE 0101374 L SE0101374 L SE 0101374L SE 0101374 A SE0101374 A SE 0101374A SE 0101374 A SE0101374 A SE 0101374A SE 0101374 L SE0101374 L SE 0101374L
Authority
SE
Sweden
Prior art keywords
sweep
inspection
optical inspection
scanner
inspection method
Prior art date
Application number
SE0101374A
Other languages
Unknown language ( )
English (en)
Other versions
SE0101374D0 (sv
Inventor
Svante Bjoerk
Original Assignee
Svante Bjoerk Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Svante Bjoerk Ab filed Critical Svante Bjoerk Ab
Priority to SE0101374A priority Critical patent/SE0101374L/sv
Publication of SE0101374D0 publication Critical patent/SE0101374D0/sv
Priority to DE60229036T priority patent/DE60229036D1/de
Priority to EP02445049A priority patent/EP1348946B1/en
Priority to AT02445049T priority patent/ATE409312T1/de
Priority to US10/125,590 priority patent/US6961127B2/en
Publication of SE0101374L publication Critical patent/SE0101374L/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
SE0101374A 2001-04-19 2001-04-19 Förfarande och anordning för optisk avsyning SE0101374L (sv)

Priority Applications (5)

Application Number Priority Date Filing Date Title
SE0101374A SE0101374L (sv) 2001-04-19 2001-04-19 Förfarande och anordning för optisk avsyning
DE60229036T DE60229036D1 (de) 2001-04-19 2002-04-18 Vorrichtung und Verfahren zur optischen Inspektion
EP02445049A EP1348946B1 (en) 2001-04-19 2002-04-18 Device and method for optical inspection
AT02445049T ATE409312T1 (de) 2001-04-19 2002-04-18 Vorrichtung und verfahren zur optischen inspektion
US10/125,590 US6961127B2 (en) 2001-04-19 2002-04-19 Device and method for optical inspection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0101374A SE0101374L (sv) 2001-04-19 2001-04-19 Förfarande och anordning för optisk avsyning

Publications (2)

Publication Number Publication Date
SE0101374D0 SE0101374D0 (sv) 2001-04-19
SE0101374L true SE0101374L (sv) 2002-10-20

Family

ID=20283814

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0101374A SE0101374L (sv) 2001-04-19 2001-04-19 Förfarande och anordning för optisk avsyning

Country Status (5)

Country Link
US (1) US6961127B2 (sv)
EP (1) EP1348946B1 (sv)
AT (1) ATE409312T1 (sv)
DE (1) DE60229036D1 (sv)
SE (1) SE0101374L (sv)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE514090C2 (sv) * 1999-04-12 2000-12-18 Photonic Systems Ab Förfarande och system för detektering av föroreningar i ett transparent material
US7187995B2 (en) 2003-12-31 2007-03-06 3M Innovative Properties Company Maximization of yield for web-based articles
US6950717B1 (en) 2004-03-19 2005-09-27 Sara Lee Corporation System and method for controlling width and stitch density of a fabric web
US7623699B2 (en) * 2004-04-19 2009-11-24 3M Innovative Properties Company Apparatus and method for the automated marking of defects on webs of material
US7889907B2 (en) * 2005-01-12 2011-02-15 The Boeing Company Apparatus and methods for inspecting tape lamination
US7542821B2 (en) 2007-07-26 2009-06-02 3M Innovative Properties Company Multi-unit process spatial synchronization of image inspection systems
US8175739B2 (en) 2007-07-26 2012-05-08 3M Innovative Properties Company Multi-unit process spatial synchronization
US7797133B2 (en) 2008-09-10 2010-09-14 3M Innovative Properties Company Multi-roller registered repeat defect detection of a web process line
ITMI20090218A1 (it) * 2009-02-19 2010-08-20 Laem System S R L Dispositivo e metodo per il controllo di qualità in linea di impianti per la produzione di film estrusi in materiale termoplastico
US8428334B2 (en) * 2010-03-26 2013-04-23 Cooper S.K. Kuo Inspection System
JP5474869B2 (ja) * 2010-09-03 2014-04-16 日東電工株式会社 偏光膜を有する積層体ストリップロールの製造方法
US10063727B2 (en) * 2015-12-29 2018-08-28 Kabushiki Kaisha Toshiba Marking apparatus and decoloring apparatus
US9594059B1 (en) * 2015-12-31 2017-03-14 The Boeing Company System and method for automated bond testing
EP3746775A1 (en) 2018-01-31 2020-12-09 3M Innovative Properties Company Virtual camera array for inspection of manufactured webs
TWI794400B (zh) * 2018-01-31 2023-03-01 美商3M新設資產公司 用於連續移動帶材的紅外光透射檢查
WO2019152187A1 (en) 2018-01-31 2019-08-08 3M Innovative Properties Company Photolabile barbiturate compounds

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5757246A (en) * 1980-09-25 1982-04-06 Fuji Photo Film Co Ltd Detecting and measuring apparatus for flaw
US5068799A (en) 1985-04-24 1991-11-26 Jarrett Jr Harold M System and method for detecting flaws in continuous web materials
GB8822183D0 (en) * 1988-09-21 1988-10-26 Radix Systems Ltd Method & apparatus for processing line scan optical images
US5440648A (en) 1991-11-19 1995-08-08 Dalsa, Inc. High speed defect detection apparatus having defect detection circuits mounted in the camera housing
JP3278518B2 (ja) * 1993-12-27 2002-04-30 日本板硝子株式会社 物体の構造および／または模様に関する欠陥を検出する方法および装置
EP0696733A1 (en) * 1994-08-12 1996-02-14 Kabushiki Kaisha Toshiba Surface inspection system
SE511822C2 (sv) 1996-11-13 1999-11-29 Svante Bjoerk Ab Anordning och metod för att markera defekter på en transparent remsa
SE9801170L (sv) * 1998-04-02 1999-10-03 Photonic Systems Ab Förfarande och system för övervakning eller avsökning av ett föremål, material eller dylikt
SE514090C2 (sv) 1999-04-12 2000-12-18 Photonic Systems Ab Förfarande och system för detektering av föroreningar i ett transparent material
SE514081C2 (sv) 1999-04-12 2000-12-18 Photonic Systems Ab Förfarande och anordning för kalibrering av utrustning för ytjämnhetsbestämning hos film- eller arkmaterial

Also Published As

Publication number Publication date
ATE409312T1 (de) 2008-10-15
EP1348946B1 (en) 2008-09-24
US20020154307A1 (en) 2002-10-24
SE0101374D0 (sv) 2001-04-19
DE60229036D1 (de) 2008-11-06
EP1348946A1 (en) 2003-10-01
US6961127B2 (en) 2005-11-01

Similar Documents

Publication Publication Date Title
SE0101374L (sv) Förfarande och anordning för optisk avsyning
US4223346A (en) Automatic defect detecting inspection apparatus
KR100826153B1 (ko) 영상의 농도치 히스토그램을 이용한 크랙의 폭 측정방법
KR920012905A (ko) 투명물체의 결함검사 방법 및 그 장치
US6456318B1 (en) Defect inspection apparatus and method by comparing two pairs of areas adjacent to one another
JPS6333160Y2 (sv)
DK1770006T3 (da) Fremgangsmåde og indretning til inspektion af en genstand
EP1724030A3 (en) Detection system for use in a sorting apparatus, a method for determining drift in the detection system and a sorting apparatus comprising such detection system
KR100415796B1 (ko) 스캐닝간격결정방법
WO1994016290A1 (en) Web curl measurement system
JP2010093471A (ja) 撮像装置、撮像装置用半導体集積回路、および欠陥画素判定方法
JP6482248B2 (ja) 狭隙間点検装置
JPH0763699A (ja) 欠陥検査装置
JPS63169542A (ja) コンクリ−ト構造物に於ける表面異常の検査方法
JP2733958B2 (ja) 長尺シートの欠陥検査装置
JP2008026072A (ja) 欠陥検査装置及び欠陥検査方法
JP2005274325A (ja) 金属帯の光学式欠陥検査方法
JPH10325809A (ja) ウェブの欠陥検査装置及びウェブの欠陥検査方法
JP2004132800A (ja) 帯状体の表面欠陥検査装置
JPH01214743A (ja) 光学検査装置
JPH04299785A (ja) 色むら検査装置
JP3473800B2 (ja) 欠点検査方法及び装置
JP2701872B2 (ja) 面付パターンの欠陥検査装置
JPH04364446A (ja) 欠陥検査装置
JPH0894584A (ja) 磁粉探傷における画素分解能検定方法及びその実施に使用する装置

Legal Events

Date Code Title Description
NAV Patent application has lapsed