SE9604131L - Anordning och metod för att markera defekter - Google Patents
Anordning och metod för att markera defekterInfo
- Publication number
- SE9604131L SE9604131L SE9604131A SE9604131A SE9604131L SE 9604131 L SE9604131 L SE 9604131L SE 9604131 A SE9604131 A SE 9604131A SE 9604131 A SE9604131 A SE 9604131A SE 9604131 L SE9604131 L SE 9604131L
- Authority
- SE
- Sweden
- Prior art keywords
- strip
- defect
- marker
- marked
- detector
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9604131A SE511822C2 (sv) | 1996-11-13 | 1996-11-13 | Anordning och metod för att markera defekter på en transparent remsa |
US09/284,612 US6295129B1 (en) | 1996-11-13 | 1997-11-11 | Arrangement and method for marking defects |
PCT/SE1997/001880 WO1998021568A1 (en) | 1996-11-13 | 1997-11-11 | Arrangement and method for marking defects |
DE69719784T DE69719784T2 (de) | 1996-11-13 | 1997-11-11 | Vorrichtung und verfahren zur markierung von defekten |
JP52247098A JP2001504225A (ja) | 1996-11-13 | 1997-11-11 | 欠陥をマークするための装置及び方法 |
EP97913600A EP0938664B1 (en) | 1996-11-13 | 1997-11-11 | Device and method for marking defects |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9604131A SE511822C2 (sv) | 1996-11-13 | 1996-11-13 | Anordning och metod för att markera defekter på en transparent remsa |
Publications (3)
Publication Number | Publication Date |
---|---|
SE9604131D0 SE9604131D0 (sv) | 1996-11-13 |
SE9604131L true SE9604131L (sv) | 1998-05-15 |
SE511822C2 SE511822C2 (sv) | 1999-11-29 |
Family
ID=20404574
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE9604131A SE511822C2 (sv) | 1996-11-13 | 1996-11-13 | Anordning och metod för att markera defekter på en transparent remsa |
Country Status (6)
Country | Link |
---|---|
US (1) | US6295129B1 (sv) |
EP (1) | EP0938664B1 (sv) |
JP (1) | JP2001504225A (sv) |
DE (1) | DE69719784T2 (sv) |
SE (1) | SE511822C2 (sv) |
WO (1) | WO1998021568A1 (sv) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6674523B2 (en) * | 2000-07-27 | 2004-01-06 | Canon Kabushiki Kaisha | Pre-viewing inspection method for article and device therefor |
US7171033B2 (en) * | 2001-03-28 | 2007-01-30 | The Boeing Company | System and method for identifying defects in a composite structure |
SE0101374L (sv) | 2001-04-19 | 2002-10-20 | Svante Bjoerk Ab | Förfarande och anordning för optisk avsyning |
GB0207874D0 (en) * | 2002-04-05 | 2002-05-15 | Pelcombe Ltd | Web marking systems and methods |
WO2005065367A2 (en) * | 2003-12-31 | 2005-07-21 | 3M Innovative Properties Company | Maximation of yield for web-based articles |
US7623699B2 (en) * | 2004-04-19 | 2009-11-24 | 3M Innovative Properties Company | Apparatus and method for the automated marking of defects on webs of material |
US20060090319A1 (en) * | 2004-11-01 | 2006-05-04 | Howe Major K | Defect locating system for moving web |
US20120247643A1 (en) * | 2005-10-28 | 2012-10-04 | The Boeing Company | Tape flaw and splice avoidance |
US8158210B2 (en) * | 2005-10-28 | 2012-04-17 | The Boeing Company | Systems and methods for tape flaw and splice avoidance in manufacturing |
US20090028417A1 (en) * | 2007-07-26 | 2009-01-29 | 3M Innovative Properties Company | Fiducial marking for multi-unit process spatial synchronization |
US7542821B2 (en) * | 2007-07-26 | 2009-06-02 | 3M Innovative Properties Company | Multi-unit process spatial synchronization of image inspection systems |
US8175739B2 (en) * | 2007-07-26 | 2012-05-08 | 3M Innovative Properties Company | Multi-unit process spatial synchronization |
US7797133B2 (en) * | 2008-09-10 | 2010-09-14 | 3M Innovative Properties Company | Multi-roller registered repeat defect detection of a web process line |
TWI411557B (zh) * | 2010-11-26 | 2013-10-11 | Primax Electronics Ltd | 標籤列印裝置 |
DE102020202096B3 (de) * | 2020-02-19 | 2021-05-27 | Greenerity Gmbh | Verfahren und Vorrichtung zur Markierung eines Defekts in einer funktionalen Schicht einer Brennstoffzelle, einer Elektrolysezelle oder einer elektrochemischen Sensoranwendung |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1077561A (en) * | 1964-02-18 | 1967-08-02 | Omron Tateisi Electronics Co | System of detecting and marking defects in a moving web |
US3989387A (en) | 1971-09-24 | 1976-11-02 | Saint-Gobain Industries | Method and apparatus for detecting optical defects in transparent sheets |
US4038544A (en) | 1976-05-03 | 1977-07-26 | Xerox Corporation | Apparatus and method for developing an electrostatic latent image |
FR2500630A1 (fr) | 1981-02-25 | 1982-08-27 | Leser Jacques | Procede pour la recherche des defauts des feuilles de verre et dispositif mettant en oeuvre ce procede |
JPS5974040A (ja) * | 1982-10-08 | 1984-04-26 | 大日本印刷株式会社 | ラベル貼付方法及び装置 |
DE3325125C1 (de) * | 1983-07-12 | 1985-02-14 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Anordnung zur Markierung von Fehlstellen an schnell laufenden Materialbahnen |
DE3629004A1 (de) | 1986-08-27 | 1988-03-10 | Agie Ag Ind Elektronik | Stromzufuehrung fuer eine drahtelektrode einer elektroerosionsmaschine |
US4865872A (en) * | 1987-02-17 | 1989-09-12 | Enamel Products & Plating Company | Strip inspecting apparatus and associated method |
US4817424A (en) * | 1987-02-17 | 1989-04-04 | Enamel Products & Planting Company | Strip inspecting apparatus and associated method |
-
1996
- 1996-11-13 SE SE9604131A patent/SE511822C2/sv not_active IP Right Cessation
-
1997
- 1997-11-11 US US09/284,612 patent/US6295129B1/en not_active Expired - Fee Related
- 1997-11-11 EP EP97913600A patent/EP0938664B1/en not_active Revoked
- 1997-11-11 WO PCT/SE1997/001880 patent/WO1998021568A1/en active IP Right Grant
- 1997-11-11 DE DE69719784T patent/DE69719784T2/de not_active Revoked
- 1997-11-11 JP JP52247098A patent/JP2001504225A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
US6295129B1 (en) | 2001-09-25 |
EP0938664A1 (en) | 1999-09-01 |
DE69719784T2 (de) | 2003-12-24 |
SE511822C2 (sv) | 1999-11-29 |
DE69719784D1 (de) | 2003-04-17 |
SE9604131D0 (sv) | 1996-11-13 |
WO1998021568A1 (en) | 1998-05-22 |
EP0938664B1 (en) | 2003-03-12 |
JP2001504225A (ja) | 2001-03-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
NUG | Patent has lapsed |