SE8601800D0 - Sett och anordning for att overvaka ett feltolerant datorminne - Google Patents
Sett och anordning for att overvaka ett feltolerant datorminneInfo
- Publication number
- SE8601800D0 SE8601800D0 SE8601800A SE8601800A SE8601800D0 SE 8601800 D0 SE8601800 D0 SE 8601800D0 SE 8601800 A SE8601800 A SE 8601800A SE 8601800 A SE8601800 A SE 8601800A SE 8601800 D0 SE8601800 D0 SE 8601800D0
- Authority
- SE
- Sweden
- Prior art keywords
- logic
- signal generator
- identification signal
- error correction
- elements
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2215—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1044—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices with specific ECC/EDC distribution
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Detection And Correction Of Errors (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE8601800A SE453228B (sv) | 1986-04-18 | 1986-04-18 | Sett och anordning for att overvaka ett feltolerant datorminne |
EP19870850121 EP0243332A1 (en) | 1986-04-18 | 1987-04-13 | Method and apparatus for monitoring an error-tolerant computer store |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE8601800A SE453228B (sv) | 1986-04-18 | 1986-04-18 | Sett och anordning for att overvaka ett feltolerant datorminne |
Publications (3)
Publication Number | Publication Date |
---|---|
SE8601800D0 true SE8601800D0 (sv) | 1986-04-18 |
SE8601800L SE8601800L (sv) | 1987-10-19 |
SE453228B SE453228B (sv) | 1988-01-18 |
Family
ID=20364261
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE8601800A SE453228B (sv) | 1986-04-18 | 1986-04-18 | Sett och anordning for att overvaka ett feltolerant datorminne |
Country Status (2)
Country | Link |
---|---|
EP (1) | EP0243332A1 (sv) |
SE (1) | SE453228B (sv) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02166700A (ja) * | 1988-12-15 | 1990-06-27 | Samsung Electron Co Ltd | エラー検査及び訂正装置を内蔵した不揮発性半導体メモリ装置 |
US9606851B2 (en) | 2015-02-02 | 2017-03-28 | International Business Machines Corporation | Error monitoring of a memory device containing embedded error correction |
US9940457B2 (en) | 2015-02-13 | 2018-04-10 | International Business Machines Corporation | Detecting a cryogenic attack on a memory device with embedded error correction |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3405258A (en) * | 1965-04-07 | 1968-10-08 | Ibm | Reliability test for computer check circuits |
SE387764B (sv) * | 1975-09-16 | 1976-09-13 | Ericsson Telefon Ab L M | Sett att upptecka fel i en minnesanordning och kategoritillempningslogik for utforande av settet |
US4223382A (en) * | 1978-11-30 | 1980-09-16 | Sperry Corporation | Closed loop error correct |
US4281398A (en) * | 1980-02-12 | 1981-07-28 | Mostek Corporation | Block redundancy for memory array |
US4363124A (en) * | 1980-06-26 | 1982-12-07 | International Business Machines Corp. | Recirculating loop memory array tester |
US4313199A (en) * | 1980-06-26 | 1982-01-26 | International Business Machines Corp. | Recirculating loop memory array fault locator |
US4531213A (en) * | 1982-03-03 | 1985-07-23 | Sperry Corporation | Memory through checking system with comparison of data word parity before and after ECC processing |
-
1986
- 1986-04-18 SE SE8601800A patent/SE453228B/sv not_active IP Right Cessation
-
1987
- 1987-04-13 EP EP19870850121 patent/EP0243332A1/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
SE8601800L (sv) | 1987-10-19 |
EP0243332A1 (en) | 1987-10-28 |
SE453228B (sv) | 1988-01-18 |
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Legal Events
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NAL | Patent in force |
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