SE8502036D0 - Apparat och forfarande for att bestemma verdet av en kapacitans apparat och forfarande for att bestemma verdet av en kapacitans - Google Patents

Apparat och forfarande for att bestemma verdet av en kapacitans apparat och forfarande for att bestemma verdet av en kapacitans

Info

Publication number
SE8502036D0
SE8502036D0 SE8502036A SE8502036A SE8502036D0 SE 8502036 D0 SE8502036 D0 SE 8502036D0 SE 8502036 A SE8502036 A SE 8502036A SE 8502036 A SE8502036 A SE 8502036A SE 8502036 D0 SE8502036 D0 SE 8502036D0
Authority
SE
Sweden
Prior art keywords
capacitor
value
determining
time period
procedure
Prior art date
Application number
SE8502036A
Other languages
English (en)
Other versions
SE8502036L (sv
SE447511B (sv
Inventor
S J Carusillo
Original Assignee
Johnson Service Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Johnson Service Co filed Critical Johnson Service Co
Publication of SE8502036L publication Critical patent/SE8502036L/sv
Publication of SE8502036D0 publication Critical patent/SE8502036D0/sv
Publication of SE447511B publication Critical patent/SE447511B/sv

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605Measuring capacitance
SE8502036A 1983-09-14 1985-04-26 Forfarande och krets for att bestemma en kondensators kapacitansverde SE447511B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/532,017 US4558274A (en) 1983-09-14 1983-09-14 Apparatus and method determining the value of a capacitance

Publications (3)

Publication Number Publication Date
SE8502036L SE8502036L (sv) 1985-04-26
SE8502036D0 true SE8502036D0 (sv) 1985-04-26
SE447511B SE447511B (sv) 1986-11-17

Family

ID=24120057

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8502036A SE447511B (sv) 1983-09-14 1985-04-26 Forfarande och krets for att bestemma en kondensators kapacitansverde

Country Status (11)

Country Link
US (1) US4558274A (sv)
EP (1) EP0156811B1 (sv)
JP (1) JPS60502227A (sv)
CA (1) CA1222546A (sv)
DE (1) DE3490412T (sv)
DK (1) DK208585D0 (sv)
GB (1) GB2161280B (sv)
NL (1) NL8420187A (sv)
NO (1) NO851873L (sv)
SE (1) SE447511B (sv)
WO (1) WO1985001356A1 (sv)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2564205B1 (fr) * 1984-05-10 1986-10-24 Univ Rennes Procede et dispositif pour le test rapide de condensateurs et de materiaux dielectriques
US4794320A (en) * 1987-08-10 1988-12-27 Moore Products Co. Multi-frequency capacitance sensor
US5245294A (en) * 1991-03-08 1993-09-14 General Electric Company Method for evaluating operability of filter components in power conversion system
US5202640A (en) * 1991-06-03 1993-04-13 International Business Machines Corporation Capacitance and leakage test method and apparatus
DE4208399A1 (de) * 1992-03-16 1993-09-23 Knorr Bremse Ag Verfahren und messvorrichtung zur messung der zeitkonstanten eines elektrischen wegaufnehmers
WO1994006002A1 (en) * 1992-09-10 1994-03-17 David Sarnoff Research Center, Inc. Capacitive sensor and method of measuring changes in capacitance
US5585733A (en) * 1992-09-10 1996-12-17 David Sarnoff Research Center Capacitive sensor and method of measuring changes in capacitance
US5461321A (en) * 1993-09-17 1995-10-24 Penberthy, Inc. Apparatus and method for measuring capacitance from the duration of a charge-discharge charge cycle
US5576628A (en) * 1994-09-30 1996-11-19 Telcom Semiconductor, Inc. Method and apparatus to measure capacitance
US5663506A (en) * 1995-08-21 1997-09-02 Moore Products Co. Capacitive temperature and pressure transducer
US5730165A (en) * 1995-12-26 1998-03-24 Philipp; Harald Time domain capacitive field detector
US5945831A (en) * 1997-06-10 1999-08-31 Sargent; John S. Volume charge density measuring system
ES2245362T3 (es) 2000-04-14 2006-01-01 Robertshaw Controls Company Circuito y sistema para la medida del nivel de la capacidad.
US6661410B2 (en) * 2001-09-07 2003-12-09 Microsoft Corporation Capacitive sensing and data input device power management
US6703599B1 (en) * 2002-01-30 2004-03-09 Microsoft Corporation Proximity sensor with adaptive threshold
US6954867B2 (en) 2002-07-26 2005-10-11 Microsoft Corporation Capacitive sensing employing a repeatable offset charge
US7472028B2 (en) * 2004-06-25 2008-12-30 Kele Inc. Sensor or capacitance measuring with a microprocessor
FR2885416B1 (fr) * 2005-05-07 2016-06-10 Acam Messelectronic Gmbh Procede et dispositif de mesure de capacites.
DE102006020301B4 (de) * 2005-05-07 2014-07-31 Acam-Messelectronic Gmbh Verfahren und Vorrichtung zum Messen von Kapazitäten
US7312616B2 (en) 2006-01-20 2007-12-25 Cypress Semiconductor Corporation Successive approximate capacitance measurement circuit
US8547114B2 (en) 2006-11-14 2013-10-01 Cypress Semiconductor Corporation Capacitance to code converter with sigma-delta modulator
KR100834743B1 (ko) * 2006-12-21 2008-06-05 삼성전자주식회사 커패시턴스 측정 회로 및 그에 따른 커패시턴스 측정 방법
US9500686B1 (en) 2007-06-29 2016-11-22 Cypress Semiconductor Corporation Capacitance measurement system and methods
US7804307B1 (en) * 2007-06-29 2010-09-28 Cypress Semiconductor Corporation Capacitance measurement systems and methods
US8089289B1 (en) 2007-07-03 2012-01-03 Cypress Semiconductor Corporation Capacitive field sensor with sigma-delta modulator
US8169238B1 (en) 2007-07-03 2012-05-01 Cypress Semiconductor Corporation Capacitance to frequency converter
US8570053B1 (en) 2007-07-03 2013-10-29 Cypress Semiconductor Corporation Capacitive field sensor with sigma-delta modulator
US8525798B2 (en) 2008-01-28 2013-09-03 Cypress Semiconductor Corporation Touch sensing
US8358142B2 (en) 2008-02-27 2013-01-22 Cypress Semiconductor Corporation Methods and circuits for measuring mutual and self capacitance
US8319505B1 (en) 2008-10-24 2012-11-27 Cypress Semiconductor Corporation Methods and circuits for measuring mutual and self capacitance
US9104273B1 (en) 2008-02-29 2015-08-11 Cypress Semiconductor Corporation Multi-touch sensing method
US8321174B1 (en) 2008-09-26 2012-11-27 Cypress Semiconductor Corporation System and method to measure capacitance of capacitive sensor array
DE102013212965A1 (de) 2013-07-03 2015-01-08 Volkswagen Aktiengesellschaft Batterieladungsausgleichsvorrichtung, Batteriemanagementsystem und Verfahren zum Ladungsausgleich
JP7311380B2 (ja) * 2019-10-01 2023-07-19 株式会社日立産機システム 電源コンデンサ静電容量測定装置及び電源コンデンサ静電容量測定方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2134112B1 (sv) * 1971-04-20 1974-03-22 Sodern
JPS539542B2 (sv) * 1972-09-21 1978-04-06
US4065715A (en) * 1975-12-18 1977-12-27 General Motors Corporation Pulse duration modulated signal transducer
GB2006970B (en) * 1977-09-23 1982-03-31 Testut Aequitas Capacitance measuring device
US4282480A (en) * 1978-05-02 1981-08-04 Matsushita Electric Industrial Co., Ltd. Apparatus for humidity detection
US4492916A (en) * 1979-07-20 1985-01-08 Johnson Benjamin A Digital meter using calculator components
US4227419A (en) * 1979-09-04 1980-10-14 Kavlico Corporation Capacitive pressure transducer
DE3050519C2 (de) * 1980-12-18 1984-02-16 Siemens AG, 1000 Berlin und 8000 München Verfahren und Schaltungsanordnung zur Bestimmung des Wertes der Kapazität eines Meßobjektes

Also Published As

Publication number Publication date
NL8420187A (nl) 1985-07-01
DE3490412T (de) 1985-09-05
EP0156811B1 (en) 1987-11-19
WO1985001356A1 (en) 1985-03-28
DK208585A (da) 1985-05-10
GB2161280A (en) 1986-01-08
CA1222546A (en) 1987-06-02
SE8502036L (sv) 1985-04-26
JPS60502227A (ja) 1985-12-19
US4558274A (en) 1985-12-10
SE447511B (sv) 1986-11-17
EP0156811A1 (en) 1985-10-09
DK208585D0 (da) 1985-05-10
GB8506391D0 (en) 1985-04-11
GB2161280B (en) 1987-08-26
NO851873L (no) 1985-05-10

Similar Documents

Publication Publication Date Title
SE8502036L (sv) Apparat och forfarande for att bestemma verdet av en kapacitans
ATE186405T1 (de) Verfahren und schaltungen zum messen der leitfähigkeit von lösungen
SE8701033L (sv) Forfarande och apparat for att analysera elektrodimpedans
FR2309874A1 (fr) Procede et dispositif de mesure du potentiel polarisant de structures en metal contenues dans un electrolyte d'un champ electrique
ATE46399T1 (de) Verfahren, schaltung und einrichtung zur beseitigung der gleichspannungskomponente eines kapazitiven wechselspannungsteilers.
DK174783D0 (da) Moentundersoegelsesapparat med anvendelse af en rl relaksationsoscillator
SE8601959L (sv) Forfarande och apparat for att testa kommunikationssystem
ATE4676T1 (de) Verfahren zum ermitteln der filterstromgrenze eines elektrofilters.
DK34777A (da) Spendingskilde til patrykkelse af hojspendingsimpulser over et tendror i et apparat til afprovning af tendror
JPS55155258A (en) Device for measuring characteristic of gapless arrester
US3576491A (en) Resistance measuring bridge circuit including output gating means
DE3066478D1 (en) Method and apparatus for accurately determining the rms value of an unknown signal
PL211978A1 (pl) Uklad do pomiaru pradu za pomoca magnetycznego miernika napiecia
ATE40218T1 (de) Isolierungsanalysierungsvorrichtung und verfahren.
NO150777C (no) Fremgangsmaate og apparat for bestemmelse av dielektrisitetskonstant og ledningsevne i grunnformasjoner
JPS5694256A (en) Method of cleaning electrode for measuring apparatus for component contained in liquid and device thereof
DK475080A (da) Apparat til samtidig maaling af mange komponenter i kontinuerlig stroemmende system
GB2011095A (en) Method of temperature measurement
JPS539583A (en) Method and apparatus for measuring aprtial discharge
JPS573052A (en) Earth resistance tester
SU550592A1 (ru) Измеритель емкостей конденсаторов, шунтированных резисторами
JPS5786747A (en) Measuring method for humidity and dew condensation
JPS5611367A (en) Detecting unit and method for degradation of apparatus using zinc oxide element
SE7903585L (sv) Anordning ansluten till ett vexelstromsnet for att avkenna spenning i detta och att ge ett utgangsverde som er proprotionellt med forhallandet mellan netets linjespenning och frekvens
JPS5735767A (en) Leakage current detector for arrester

Legal Events

Date Code Title Description
NUG Patent has lapsed

Ref document number: 8502036-0

Effective date: 19890725

Format of ref document f/p: F