SE7601586L - Analysapparat - Google Patents

Analysapparat

Info

Publication number
SE7601586L
SE7601586L SE7601586A SE7601586A SE7601586L SE 7601586 L SE7601586 L SE 7601586L SE 7601586 A SE7601586 A SE 7601586A SE 7601586 A SE7601586 A SE 7601586A SE 7601586 L SE7601586 L SE 7601586L
Authority
SE
Sweden
Prior art keywords
analysis
Prior art date
Application number
SE7601586A
Other languages
English (en)
Swedish (sv)
Inventor
C W Hull
T W Whitehead
B N Colby
Original Assignee
Du Pont
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Du Pont filed Critical Du Pont
Publication of SE7601586L publication Critical patent/SE7601586L/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
SE7601586A 1975-02-13 1976-02-12 Analysapparat SE7601586L (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/549,505 US4016421A (en) 1975-02-13 1975-02-13 Analytical apparatus with variable energy ion beam source

Publications (1)

Publication Number Publication Date
SE7601586L true SE7601586L (sv) 1976-08-16

Family

ID=24193286

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7601586A SE7601586L (sv) 1975-02-13 1976-02-12 Analysapparat

Country Status (9)

Country Link
US (1) US4016421A (de)
JP (1) JPS51119288A (de)
CA (1) CA1052913A (de)
CH (2) CH615532A5 (de)
DE (1) DE2604249A1 (de)
FR (1) FR2301090A1 (de)
GB (1) GB1509697A (de)
IT (1) IT1055252B (de)
SE (1) SE7601586L (de)

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4166952A (en) * 1978-02-24 1979-09-04 E. I. Du Pont De Nemours And Company Method and apparatus for the elemental analysis of solids
DE3249414T1 (de) * 1982-03-31 1984-07-12 Puumalaisen Tutkimuslaitos Oy, Kuopio Massenspektrometrisches Analysierverfahren
DE3510378A1 (de) * 1985-03-22 1986-10-02 Coulston International Corp., Albany, N.Y. Verfahren zur analytischen bestimmung von organischen stoffen
DE3522340A1 (de) * 1985-06-22 1987-01-02 Finnigan Mat Gmbh Linsenanordnung zur fokussierung von elektrisch geladenen teilchen und massenspektrometer mit einer derartigen linsenanordnung
DE69028304T2 (de) * 1989-06-06 1997-04-24 Viking Instr Corp Miniaturisiertes massenspektrometersystem
US5313061A (en) * 1989-06-06 1994-05-17 Viking Instrument Miniaturized mass spectrometer system
GB2250858B (en) * 1990-10-22 1994-11-30 Kratos Analytical Ltd Charged particle extraction arrangement
JP2902197B2 (ja) * 1992-02-04 1999-06-07 株式会社日立製作所 大気圧イオン化質量分析装置
GB2298083B (en) * 1995-02-18 1998-11-18 Atomic Energy Authority Uk Parallel ion beam ion generator
US5604350A (en) * 1995-11-16 1997-02-18 Taiwan Semiconductor Manufacturing Company Ltd. Fitting for an ion source assembly
US5703360A (en) * 1996-08-30 1997-12-30 Hewlett-Packard Company Automated calibrant system for use in a liquid separation/mass spectrometry apparatus
US7119342B2 (en) * 1999-02-09 2006-10-10 Syagen Technology Interfaces for a photoionization mass spectrometer
US6583544B1 (en) 2000-08-07 2003-06-24 Axcelis Technologies, Inc. Ion source having replaceable and sputterable solid source material
SG108825A1 (en) * 2000-08-07 2005-02-28 Axcelis Tech Inc Ion source having replaceable and sputterable solid source material
JP3900917B2 (ja) * 2001-12-10 2007-04-04 日新イオン機器株式会社 イオン注入装置
US7550722B2 (en) * 2004-03-05 2009-06-23 Oi Corporation Focal plane detector assembly of a mass spectrometer
US8026477B2 (en) 2006-03-03 2011-09-27 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy
US7700913B2 (en) 2006-03-03 2010-04-20 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy
EP2035121A4 (de) * 2006-05-26 2010-04-28 Ionsense Inc Vorrichtung zum halten von feststoffen zur verwendung mit oberflächenionisierungstechnik
US7928364B2 (en) * 2006-10-13 2011-04-19 Ionsense, Inc. Sampling system for containment and transfer of ions into a spectroscopy system
US8440965B2 (en) 2006-10-13 2013-05-14 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy
US8207497B2 (en) 2009-05-08 2012-06-26 Ionsense, Inc. Sampling of confined spaces
US8822949B2 (en) 2011-02-05 2014-09-02 Ionsense Inc. Apparatus and method for thermal assisted desorption ionization systems
US8901488B1 (en) 2011-04-18 2014-12-02 Ionsense, Inc. Robust, rapid, secure sample manipulation before during and after ionization for a spectroscopy system
GB2518122B (en) * 2013-02-19 2018-08-08 Markes International Ltd An electron ionisation apparatus
EP3041027A4 (de) * 2013-08-30 2017-04-12 Atonarp Inc. Analysevorrichtung
US9337007B2 (en) 2014-06-15 2016-05-10 Ionsense, Inc. Apparatus and method for generating chemical signatures using differential desorption
US9899196B1 (en) 2016-01-12 2018-02-20 Jeol Usa, Inc. Dopant-assisted direct analysis in real time mass spectrometry
GB2548596A (en) * 2016-03-22 2017-09-27 Micromass Ltd An interface probe
US10541122B2 (en) 2017-06-13 2020-01-21 Mks Instruments, Inc. Robust ion source
US10636640B2 (en) 2017-07-06 2020-04-28 Ionsense, Inc. Apparatus and method for chemical phase sampling analysis
JP2021521591A (ja) * 2018-04-13 2021-08-26 アダプタス ソリューションズ プロプライエタリー リミテッド 改善された入力光学系とコンポーネント配置を備えたサンプル分析装置
US11328919B2 (en) * 2018-05-11 2022-05-10 Leco Corporation Two-stage ion source comprising closed and open ion volumes
US10825673B2 (en) 2018-06-01 2020-11-03 Ionsense Inc. Apparatus and method for reducing matrix effects
JP7705845B2 (ja) 2019-10-28 2025-07-10 イオンセンス インコーポレイテッド 大気リアルタイムイオン化
US11913861B2 (en) 2020-05-26 2024-02-27 Bruker Scientific Llc Electrostatic loading of powder samples for ionization

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2472870A (en) * 1944-11-21 1949-06-14 Cons Eng Corp Mass spectrometry
US3155826A (en) * 1961-12-29 1964-11-03 John L Peters Mass spectrometer leak detector including a novel repeller-heater assembly
NL6609292A (de) * 1966-07-02 1968-01-03
GB1263705A (en) * 1968-08-16 1972-02-16 Atomic Energy Authority Uk Improvements in or relating to mass spectrometers
GB1252569A (de) * 1968-12-17 1971-11-10
SE325726B (de) * 1969-04-21 1970-07-06 Lkb Produkter Ab

Also Published As

Publication number Publication date
IT1055252B (it) 1981-12-21
US4016421A (en) 1977-04-05
FR2301090B1 (de) 1981-12-31
GB1509697A (en) 1978-05-04
FR2301090A1 (fr) 1976-09-10
CH616275A5 (de) 1980-03-14
CH615532A5 (de) 1980-01-31
CA1052913A (en) 1979-04-17
JPS51119288A (en) 1976-10-19
DE2604249A1 (de) 1976-08-26

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