FR2301090A1 - Appareil pour l'analyse des gaz - Google Patents

Appareil pour l'analyse des gaz

Info

Publication number
FR2301090A1
FR2301090A1 FR7603855A FR7603855A FR2301090A1 FR 2301090 A1 FR2301090 A1 FR 2301090A1 FR 7603855 A FR7603855 A FR 7603855A FR 7603855 A FR7603855 A FR 7603855A FR 2301090 A1 FR2301090 A1 FR 2301090A1
Authority
FR
France
Prior art keywords
analysis apparatus
gas analysis
gas
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7603855A
Other languages
English (en)
Other versions
FR2301090B1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
EIDP Inc
Original Assignee
EI Du Pont de Nemours and Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by EI Du Pont de Nemours and Co filed Critical EI Du Pont de Nemours and Co
Publication of FR2301090A1 publication Critical patent/FR2301090A1/fr
Application granted granted Critical
Publication of FR2301090B1 publication Critical patent/FR2301090B1/fr
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
FR7603855A 1975-02-13 1976-02-12 Appareil pour l'analyse des gaz Granted FR2301090A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/549,505 US4016421A (en) 1975-02-13 1975-02-13 Analytical apparatus with variable energy ion beam source

Publications (2)

Publication Number Publication Date
FR2301090A1 true FR2301090A1 (fr) 1976-09-10
FR2301090B1 FR2301090B1 (fr) 1981-12-31

Family

ID=24193286

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7603855A Granted FR2301090A1 (fr) 1975-02-13 1976-02-12 Appareil pour l'analyse des gaz

Country Status (9)

Country Link
US (1) US4016421A (fr)
JP (1) JPS51119288A (fr)
CA (1) CA1052913A (fr)
CH (2) CH615532A5 (fr)
DE (1) DE2604249A1 (fr)
FR (1) FR2301090A1 (fr)
GB (1) GB1509697A (fr)
IT (1) IT1055252B (fr)
SE (1) SE7601586L (fr)

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4166952A (en) * 1978-02-24 1979-09-04 E. I. Du Pont De Nemours And Company Method and apparatus for the elemental analysis of solids
GB2128398A (en) * 1982-03-31 1984-04-26 Puumalaisen Tutkimuslaitos Oy Mass-spectrometric method of analysis
DE3510378A1 (de) * 1985-03-22 1986-10-02 Coulston International Corp., Albany, N.Y. Verfahren zur analytischen bestimmung von organischen stoffen
DE3522340A1 (de) * 1985-06-22 1987-01-02 Finnigan Mat Gmbh Linsenanordnung zur fokussierung von elektrisch geladenen teilchen und massenspektrometer mit einer derartigen linsenanordnung
US5313061A (en) * 1989-06-06 1994-05-17 Viking Instrument Miniaturized mass spectrometer system
AU5856490A (en) * 1989-06-06 1991-01-08 Viking Instruments Corp. Miniaturized mass spectrometer system
GB2250858B (en) * 1990-10-22 1994-11-30 Kratos Analytical Ltd Charged particle extraction arrangement
JP2902197B2 (ja) * 1992-02-04 1999-06-07 株式会社日立製作所 大気圧イオン化質量分析装置
GB2298083B (en) * 1995-02-18 1998-11-18 Atomic Energy Authority Uk Parallel ion beam ion generator
US5604350A (en) * 1995-11-16 1997-02-18 Taiwan Semiconductor Manufacturing Company Ltd. Fitting for an ion source assembly
US5703360A (en) * 1996-08-30 1997-12-30 Hewlett-Packard Company Automated calibrant system for use in a liquid separation/mass spectrometry apparatus
US7119342B2 (en) * 1999-02-09 2006-10-10 Syagen Technology Interfaces for a photoionization mass spectrometer
US6583544B1 (en) * 2000-08-07 2003-06-24 Axcelis Technologies, Inc. Ion source having replaceable and sputterable solid source material
SG108825A1 (en) * 2000-08-07 2005-02-28 Axcelis Tech Inc Ion source having replaceable and sputterable solid source material
JP3900917B2 (ja) * 2001-12-10 2007-04-04 日新イオン機器株式会社 イオン注入装置
JP4931793B2 (ja) * 2004-03-05 2012-05-16 オイ コーポレイション 質量分析計の焦点面検出器アセンブリ
US8026477B2 (en) * 2006-03-03 2011-09-27 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy
US7700913B2 (en) * 2006-03-03 2010-04-20 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy
WO2007140349A2 (fr) * 2006-05-26 2007-12-06 Ionsense, Inc. Appareil destiné à prendre en charge des solides à utiliser avec la technologie d'ionisation de surface
US8440965B2 (en) 2006-10-13 2013-05-14 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy
EP2099553A4 (fr) * 2006-10-13 2010-05-12 Ionsense Inc Système d'échantillonnage pour le confinement et le transfert d'ions dans un système de spectroscopie
US8207497B2 (en) 2009-05-08 2012-06-26 Ionsense, Inc. Sampling of confined spaces
US8822949B2 (en) 2011-02-05 2014-09-02 Ionsense Inc. Apparatus and method for thermal assisted desorption ionization systems
US8901488B1 (en) 2011-04-18 2014-12-02 Ionsense, Inc. Robust, rapid, secure sample manipulation before during and after ionization for a spectroscopy system
GB2518122B (en) * 2013-02-19 2018-08-08 Markes International Ltd An electron ionisation apparatus
US9666422B2 (en) * 2013-08-30 2017-05-30 Atonarp Inc. Analyzer
US9337007B2 (en) 2014-06-15 2016-05-10 Ionsense, Inc. Apparatus and method for generating chemical signatures using differential desorption
US9899196B1 (en) 2016-01-12 2018-02-20 Jeol Usa, Inc. Dopant-assisted direct analysis in real time mass spectrometry
GB2548596A (en) * 2016-03-22 2017-09-27 Micromass Ltd An interface probe
US10541122B2 (en) 2017-06-13 2020-01-21 Mks Instruments, Inc. Robust ion source
US10636640B2 (en) 2017-07-06 2020-04-28 Ionsense, Inc. Apparatus and method for chemical phase sampling analysis
WO2019195896A1 (fr) * 2018-04-13 2019-10-17 ETP Ion Detect Pty Ltd Appareil d'analyse d'échantillon comportant une optique d'entrée améliorée et un agencement de composants
WO2019217541A1 (fr) * 2018-05-11 2019-11-14 Leco Corporation Source d'ions à deux étages comprenant des volumes d'ions fermés et ouverts
US10825673B2 (en) 2018-06-01 2020-11-03 Ionsense Inc. Apparatus and method for reducing matrix effects
EP4052278A4 (fr) 2019-10-28 2023-11-22 Ionsense, Inc. Ionisation en temps réel atmosphérique à écoulement pulsatoire
US11913861B2 (en) 2020-05-26 2024-02-27 Bruker Scientific Llc Electrostatic loading of powder samples for ionization

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2472870A (en) * 1944-11-21 1949-06-14 Cons Eng Corp Mass spectrometry
FR2015813A1 (fr) * 1968-08-16 1970-04-30 Atomic Energy Authority Uk

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3155826A (en) * 1961-12-29 1964-11-03 John L Peters Mass spectrometer leak detector including a novel repeller-heater assembly
NL6609292A (fr) * 1966-07-02 1968-01-03
GB1252569A (fr) * 1968-12-17 1971-11-10
SE325726B (fr) * 1969-04-21 1970-07-06 Lkb Produkter Ab

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2472870A (en) * 1944-11-21 1949-06-14 Cons Eng Corp Mass spectrometry
FR2015813A1 (fr) * 1968-08-16 1970-04-30 Atomic Energy Authority Uk

Also Published As

Publication number Publication date
SE7601586L (sv) 1976-08-16
CH615532A5 (fr) 1980-01-31
CA1052913A (fr) 1979-04-17
FR2301090B1 (fr) 1981-12-31
CH616275A5 (fr) 1980-03-14
GB1509697A (en) 1978-05-04
IT1055252B (it) 1981-12-21
DE2604249A1 (de) 1976-08-26
US4016421A (en) 1977-04-05
JPS51119288A (en) 1976-10-19

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Legal Events

Date Code Title Description
ST Notification of lapse