SE7411921L - SELF-CLEANING WITH AN OPENING CONTINUED STEERING FOR A COULTER APPLIANCE AND ELECTROLYTE SUPPLY SYSTEM THEREFORE - Google Patents

SELF-CLEANING WITH AN OPENING CONTINUED STEERING FOR A COULTER APPLIANCE AND ELECTROLYTE SUPPLY SYSTEM THEREFORE

Info

Publication number
SE7411921L
SE7411921L SE7411921A SE7411921A SE7411921L SE 7411921 L SE7411921 L SE 7411921L SE 7411921 A SE7411921 A SE 7411921A SE 7411921 A SE7411921 A SE 7411921A SE 7411921 L SE7411921 L SE 7411921L
Authority
SE
Sweden
Prior art keywords
electrolyte
coulter
waste
appliance
cleaning
Prior art date
Application number
SE7411921A
Other languages
Unknown language ( )
Swedish (sv)
Other versions
SE409246B (en
Inventor
W R Hogg
W H Coulter
G Ginsberg
O Proni
T J Godin
Original Assignee
Coulter Electronics
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Coulter Electronics filed Critical Coulter Electronics
Publication of SE7411921L publication Critical patent/SE7411921L/en
Publication of SE409246B publication Critical patent/SE409246B/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10Investigating individual particles
    • G01N15/1031Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10Investigating individual particles
    • G01N15/1031Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N15/13Details pertaining to apertures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/28Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/38Diluting, dispersing or mixing samples

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

1479901 Electro-physical measurement; particle analysis COULTER ELECTRONICS Ltd 23 Sept 1974 [26 Sept 1973] 41368/74 Heading G1N(C) In a Coulter type particle analyzer, a "twochamber" tube is provided whereby clean electrolyte can be flowed past the aperture to waste, in a manner similar to that disclosed in Specification 1341336 and a constriction in the flow-path is arranged to increase the velocity behind the aperture. OVERALL SYSTEM FIG. 1. A double tube 13 is sealed into a coupling block 19 attached by screws 59 to the head-block 58, for easy interchange. The electrolyte system is electrically isolated from waste 42 and supply reservoir 52 by drip feed tanks 24, 29. The sample and electrolyte are moved through the apparatus by vacuum applied to the waste drip tank 24. The clean electrolyte flow is regulated by a constriction 27. Several variations of double tube construction are disclosed with reference to Figs. 2 ... 13 which are substantially self explanatory. Figs. 2, 5, 6, 7 only are shown as typical.
SE7411921A 1973-09-26 1974-09-23 OPENING MODULE FOR USE IN A PARTICULATE MATERIAL SE409246B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US400986A US3902115A (en) 1973-09-26 1973-09-26 Self-cleaning aperture tube for coulter study apparatus and electrolyte supply system therefor

Publications (2)

Publication Number Publication Date
SE7411921L true SE7411921L (en) 1975-03-27
SE409246B SE409246B (en) 1979-08-06

Family

ID=23585797

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7411921A SE409246B (en) 1973-09-26 1974-09-23 OPENING MODULE FOR USE IN A PARTICULATE MATERIAL

Country Status (8)

Country Link
US (1) US3902115A (en)
JP (1) JPS5522734B2 (en)
CA (1) CA1007704A (en)
DE (1) DE2445411C2 (en)
FR (1) FR2244989B1 (en)
GB (1) GB1479901A (en)
NL (1) NL7412562A (en)
SE (1) SE409246B (en)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3979669A (en) * 1973-09-26 1976-09-07 Coulter Electronics, Inc. Particle analyzing system
US4014611A (en) * 1975-04-30 1977-03-29 Coulter Electronics, Inc. Aperture module for use in particle testing apparatus
US4103229A (en) * 1977-01-28 1978-07-25 The University Of Virginia Continuous-flow, resistive-particle counting apparatus
SE7801123L (en) * 1977-02-15 1978-02-13 Coulter Electronics ELECTRONIC PARTICLE DETECTION OPENING MODULE WITH PERFORATED ELECTRODES
US4090128A (en) * 1977-02-15 1978-05-16 Coulter Electronics, Inc. Aperture module for use in particle testing apparatus
US4157498A (en) * 1977-08-01 1979-06-05 Miles Laboratories, Inc. Flow-through type particle analyzing apparatus
US4290011A (en) * 1978-05-18 1981-09-15 Particle Data, Inc. Particle length and volume comeasurement with controlled orientation
US4491786A (en) * 1978-09-13 1985-01-01 Coulter Electronics, Inc. Transducer for measuring particles suspended in a fluid
JPS55143431A (en) * 1979-04-26 1980-11-08 Toa Medical Electronics Co Ltd Detector for corpuscle
JPH0129567Y2 (en) * 1980-01-21 1989-09-08
JPS56103348A (en) * 1980-01-22 1981-08-18 Toa Medical Electronics Co Ltd Particle detector
US4361803A (en) * 1980-08-26 1982-11-30 Coulter Electronics, Inc. Apparatus for recirculating sweep flow electrolyte without a pump
DE3437519A1 (en) * 1983-10-14 1985-04-25 Sequoia Turner Corp Method and apparatus for analysing particulate material
US4710021A (en) * 1983-10-14 1987-12-01 Sequoia-Turner Corporation Particulate matter analyzing apparatus and method
JPH0622203Y2 (en) * 1989-01-26 1994-06-08 東亜医用電子株式会社 Sample measuring device
US5094818A (en) * 1989-05-04 1992-03-10 Exact Science, Inc. Self-filling anti-siphon flow system for particle analysis
AU1258595A (en) * 1993-12-23 1995-07-10 Abbott Laboratories Method of making a stress relieved count probe
US5402062A (en) * 1993-12-23 1995-03-28 Abbott Laboratories Mechanical capture of count wafer for particle analysis
US5432992A (en) * 1993-12-23 1995-07-18 Abbott Laboratories Method of making count probe with removable count wafer
US5895869A (en) * 1995-11-17 1999-04-20 Mwi, Inc. Method and apparatus for analyzing particulate matter
US6111398A (en) * 1997-07-03 2000-08-29 Coulter International Corp. Method and apparatus for sensing and characterizing particles
US6175227B1 (en) 1997-07-03 2001-01-16 Coulter International Corp. Potential-sensing method and apparatus for sensing and characterizing particles by the Coulter principle
US6259242B1 (en) 1999-05-26 2001-07-10 Coulter International Corp. Apparatus incorporating a sensing conduit in conductive material and method of use thereof for sensing and characterizing particles
EP1206692B1 (en) * 1999-08-06 2008-11-26 Chempaq A/S Particle characterisation apparatus
EP1552276A1 (en) * 2002-06-11 2005-07-13 Chempaq A/S A disposable cartridge for characterizing particles suspended in a liquid
CA2597496A1 (en) 2005-02-10 2006-08-17 Chempaq A/S Dual sample cartridge and method for characterizing particles in liquid
US8028566B2 (en) * 2005-02-10 2011-10-04 Chempaq A/S Dual sample cartridge and method for characterizing particles in liquid
DE102009024561A1 (en) * 2009-06-08 2010-12-16 Hydac Filter Systems Gmbh Method and device for detecting impurities in a fluid

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3340471A (en) * 1966-08-22 1967-09-05 Coulter Electronics Flow-through sample apparatus for use with electrical particle study device
US3746976A (en) * 1971-04-07 1973-07-17 Coulter Electronics Self-cleaning aperture tube for coulter study apparatus

Also Published As

Publication number Publication date
DE2445411C2 (en) 1984-08-09
JPS5061269A (en) 1975-05-26
GB1479901A (en) 1977-07-13
DE2445411A1 (en) 1975-05-07
US3902115A (en) 1975-08-26
NL7412562A (en) 1975-04-01
JPS5522734B2 (en) 1980-06-18
SE409246B (en) 1979-08-06
FR2244989A1 (en) 1975-04-18
FR2244989B1 (en) 1976-10-22
CA1007704A (en) 1977-03-29

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