SE516239C2 - Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data. - Google Patents

Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data.

Info

Publication number
SE516239C2
SE516239C2 SE0001577A SE0001577A SE516239C2 SE 516239 C2 SE516239 C2 SE 516239C2 SE 0001577 A SE0001577 A SE 0001577A SE 0001577 A SE0001577 A SE 0001577A SE 516239 C2 SE516239 C2 SE 516239C2
Authority
SE
Sweden
Prior art keywords
nominal
objects
characteristic
data
identified
Prior art date
Application number
SE0001577A
Other languages
English (en)
Swedish (sv)
Other versions
SE0001577D0 (sv
SE0001577L (sv
Inventor
Niklas Andersson
Simon Sandgren
Johan Aaberg
Original Assignee
Mydata Automation Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=20279484&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=SE516239(C2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Mydata Automation Ab filed Critical Mydata Automation Ab
Priority to SE0001577A priority Critical patent/SE516239C2/sv
Publication of SE0001577D0 publication Critical patent/SE0001577D0/xx
Priority to AU2001252833A priority patent/AU2001252833A1/en
Priority to AT01926303T priority patent/ATE249620T1/de
Priority to CNB018085407A priority patent/CN1264115C/zh
Priority to US10/240,561 priority patent/US7324710B2/en
Priority to PCT/SE2001/000916 priority patent/WO2001084499A2/en
Priority to DE60100757T priority patent/DE60100757T2/de
Priority to KR1020027014365A priority patent/KR100874389B1/ko
Priority to EP01926303A priority patent/EP1277041B1/de
Priority to JP2001581234A priority patent/JP4800547B2/ja
Publication of SE0001577L publication Critical patent/SE0001577L/xx
Publication of SE516239C2 publication Critical patent/SE516239C2/sv

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G06T1/20—Processor architectures; Processor configuration, e.g. pipelining
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/74—Determining position or orientation of objects or cameras using feature-based methods involving reference images or patches
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30148—Semiconductor; IC; Wafer
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30152—Solder

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
SE0001577A 2000-04-28 2000-04-28 Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data. SE516239C2 (sv)

Priority Applications (10)

Application Number Priority Date Filing Date Title
SE0001577A SE516239C2 (sv) 2000-04-28 2000-04-28 Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data.
JP2001581234A JP4800547B2 (ja) 2000-04-28 2001-04-27 画像を処理する方法と装置
EP01926303A EP1277041B1 (de) 2000-04-28 2001-04-27 Verfahren und einrichtung zur verarbeitung von bildern
CNB018085407A CN1264115C (zh) 2000-04-28 2001-04-27 用于确定电子装置标称机械数据的方法和装置
AT01926303T ATE249620T1 (de) 2000-04-28 2001-04-27 Verfahren und einrichtung zur verarbeitung von bildern
AU2001252833A AU2001252833A1 (en) 2000-04-28 2001-04-27 Method and device for processing images
US10/240,561 US7324710B2 (en) 2000-04-28 2001-04-27 Method and device for determining nominal data for electronic circuits by capturing a digital image and compare with stored nominal data
PCT/SE2001/000916 WO2001084499A2 (en) 2000-04-28 2001-04-27 Method and device for determining nominal data for electronic circuits by capturing a digital image and compare with stored nonimal data
DE60100757T DE60100757T2 (de) 2000-04-28 2001-04-27 Verfahren und einrichtung zur verarbeitung von bildern
KR1020027014365A KR100874389B1 (ko) 2000-04-28 2001-04-27 이미지 처리 방법 및 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0001577A SE516239C2 (sv) 2000-04-28 2000-04-28 Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data.

Publications (3)

Publication Number Publication Date
SE0001577D0 SE0001577D0 (sv) 2000-04-28
SE0001577L SE0001577L (sv) 2001-10-29
SE516239C2 true SE516239C2 (sv) 2001-12-03

Family

ID=20279484

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0001577A SE516239C2 (sv) 2000-04-28 2000-04-28 Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data.

Country Status (10)

Country Link
US (1) US7324710B2 (de)
EP (1) EP1277041B1 (de)
JP (1) JP4800547B2 (de)
KR (1) KR100874389B1 (de)
CN (1) CN1264115C (de)
AT (1) ATE249620T1 (de)
AU (1) AU2001252833A1 (de)
DE (1) DE60100757T2 (de)
SE (1) SE516239C2 (de)
WO (1) WO2001084499A2 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7711157B2 (en) 2006-08-01 2010-05-04 California Institute Of Technology Artificial intelligence systems for identifying objects
US20090080010A1 (en) * 2007-09-21 2009-03-26 Canon Kabushiki Kaisha Image forming apparatus, image forming method, and program
WO2009126888A2 (en) * 2008-04-10 2009-10-15 Services Petroliers Schlumberger Method for characterizing a geological formation traversed by a borehole
US8725477B2 (en) 2008-04-10 2014-05-13 Schlumberger Technology Corporation Method to generate numerical pseudocores using borehole images, digital rock samples, and multi-point statistics
US8389057B2 (en) * 2009-04-06 2013-03-05 Douglas Knox Systems and methods for printing electronic device assembly
US8311788B2 (en) 2009-07-01 2012-11-13 Schlumberger Technology Corporation Method to quantify discrete pore shapes, volumes, and surface areas using confocal profilometry
BR102015013591A8 (pt) * 2015-06-10 2023-03-07 Valid Solucoes E Servicos De Seguranca Em Meios De Pagamento E Identificacao S A Processo e sistema de identificação de produtos em movimentação em uma linha de produção
US10591289B2 (en) * 2015-07-13 2020-03-17 Renishaw Plc Method for measuring an artefact

Family Cites Families (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5941228B2 (ja) * 1979-08-30 1984-10-05 富士通株式会社 情報抽出システム
ES2161800T3 (es) 1987-02-20 2001-12-16 Sagem Procedimiento para comparar huellas digitales.
US4790564A (en) 1987-02-20 1988-12-13 Morpho Systemes Automatic fingerprint identification system including processes and apparatus for matching fingerprints
JPH07118012B2 (ja) * 1987-10-20 1995-12-18 松下電器産業株式会社 部品のリード端子間隔検査方法
SG66545A1 (en) 1988-05-09 1999-07-20 Omron Tateisi Electronics Co Apparatus for inspecting printed circuit boards and the like and method of operating the same
US5265170A (en) * 1990-01-11 1993-11-23 Hine Design, Inc. Devices and methods for reading identification marks on semiconductor wafers
US5119436A (en) 1990-09-24 1992-06-02 Kulicke And Soffa Industries, Inc Method of centering bond positions
US5185811A (en) 1990-12-27 1993-02-09 International Business Machines Corporation Automated visual inspection of electronic component leads prior to placement
EP0526080B1 (de) 1991-07-22 1996-10-02 Omron Corporation Lehrmethode und System zur Kontrolle der angeschlossenen Bauteile
US5737122A (en) 1992-05-01 1998-04-07 Electro Scientific Industries, Inc. Illumination system for OCR of indicia on a substrate
US5469294A (en) 1992-05-01 1995-11-21 Xrl, Inc. Illumination system for OCR of indicia on a substrate
US5555316A (en) * 1992-06-30 1996-09-10 Matsushita Electric Industrial Co., Ltd. Inspecting apparatus of mounting state of component or printing state of cream solder in mounting line of electronic component
JP2941617B2 (ja) 1993-10-21 1999-08-25 株式会社テンリュウテクニックス 電子部品の部品データ記録装置およびそれを用いた電子部品の搬送組み付け装置
US5563798A (en) * 1994-04-05 1996-10-08 Applied Materials, Inc. Wafer positioning system
JP3472971B2 (ja) * 1994-07-15 2003-12-02 株式会社アドバンテスト Ｉｃ不良解析方法及び不良解析装置
US6026176A (en) 1995-07-25 2000-02-15 Cognex Corporation Machine vision methods and articles of manufacture for ball grid array inspection
JP3679471B2 (ja) * 1995-09-18 2005-08-03 ジェネシス・テクノロジー株式会社 光学的欠陥検査装置
JP2850807B2 (ja) * 1995-10-27 1999-01-27 日本電気株式会社 検査データ作成装置
JPH09184715A (ja) * 1995-12-28 1997-07-15 Hitachi Ltd パターン形状検査装置
JPH09265537A (ja) * 1996-03-29 1997-10-07 Hitachi Ltd 画像処理方法
US5785484A (en) 1996-08-23 1998-07-28 Electro Scientific Industries, Inc. Method and apparatus for orienting miniature components
US5894530A (en) 1996-09-05 1999-04-13 Electro Scientific Industries, Inc. Optical viewing system for simultaneously viewing indicia located on top and bottom surfaces of a substrate
CN1201953A (zh) 1997-06-06 1998-12-16 童超 手形图像识别仪
US5956134A (en) * 1997-07-11 1999-09-21 Semiconductor Technologies & Instruments, Inc. Inspection system and method for leads of semiconductor devices
US6895109B1 (en) * 1997-09-04 2005-05-17 Texas Instruments Incorporated Apparatus and method for automatically detecting defects on silicon dies on silicon wafers
US6038336A (en) 1997-12-04 2000-03-14 Daewoo Electronics Co., Ltd. PCB testing circuit for an automatic inserting apparatus and a testing method therefor
US5969752A (en) 1998-06-15 1999-10-19 Electro Scientific Industries Multi-function viewer/tester for miniature electric components
US6195165B1 (en) * 1998-08-04 2001-02-27 Cyberoptics Corporation Enhanced sensor
US6275742B1 (en) * 1999-04-16 2001-08-14 Berkeley Process Control, Inc. Wafer aligner system
US6326618B1 (en) * 1999-07-02 2001-12-04 Agere Systems Guardian Corp. Method of analyzing semiconductor surface with patterned feature using line width metrology
US6225639B1 (en) * 1999-08-27 2001-05-01 Agere Systems Guardian Corp. Method of monitoring a patterned transfer process using line width metrology
EP1089214A3 (de) * 1999-09-30 2005-01-26 Matsushita Electric Industrial Co., Ltd. Gerät und Verfahren zur Bilderkennung
US6411867B1 (en) * 1999-10-27 2002-06-25 Fujitsu Ten Limited Vehicle driving support system, and steering angle detection device
US6718227B1 (en) 1999-12-16 2004-04-06 Texas Instruments Incorporated System and method for determining a position error in a wafer handling device
WO2001085496A1 (en) * 2000-05-12 2001-11-15 Kabushiki Kaisha Toyota Jidoshokki Vehicle backing support apparatus
US6464636B1 (en) * 2000-10-18 2002-10-15 Koninklijke Philips Electronics N.V. Configuration tool for use in ultrasound imaging device
US6584213B2 (en) * 2001-07-23 2003-06-24 Pulsent Corporation Motion matching method

Also Published As

Publication number Publication date
ATE249620T1 (de) 2003-09-15
DE60100757T2 (de) 2004-07-01
AU2001252833A1 (en) 2001-11-12
EP1277041A2 (de) 2003-01-22
WO2001084499A3 (en) 2002-01-24
EP1277041B1 (de) 2003-09-10
WO2001084499A2 (en) 2001-11-08
DE60100757D1 (de) 2003-10-16
SE0001577D0 (sv) 2000-04-28
JP2003532243A (ja) 2003-10-28
SE0001577L (sv) 2001-10-29
JP4800547B2 (ja) 2011-10-26
KR20030005301A (ko) 2003-01-17
KR100874389B1 (ko) 2008-12-17
US20030113039A1 (en) 2003-06-19
CN1426533A (zh) 2003-06-25
CN1264115C (zh) 2006-07-12
US7324710B2 (en) 2008-01-29

Similar Documents

Publication Publication Date Title
CN108961236B (zh) 电路板缺陷检测方法及装置
CN112750116B (zh) 一种缺陷检测方法、装置、计算机设备及存储介质
US11645827B2 (en) Detection method and device for assembly body multi-view change based on feature matching
CN118226238B (zh) 一种飞针测试方法、系统及飞针测试机
KR20180022619A (ko) Pcb 패널 검사 방법 및 그 장치
SE516239C2 (sv) Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data.
CN110532973B (zh) 基于特殊锚点的双页文本图像识别及定位分割方法
CN117115105A (zh) 一种工件处理方法、装置、设备以及存储介质
US7006694B1 (en) System and method for pattern identification
CN111368573A (zh) 一种基于几何特征约束的定位方法
CN120070375B (zh) 一种基于图像分析的pcb线路板生产缺陷检测方法及系统
CN109509165B (zh) 图像定位区域选取方法及装置
CN112565615B (zh) 飞拍拍摄触发点的确定方法和装置
CN116258838B (zh) 一种用于管片模具合模系统的智能视觉引导方法
CN109215068B (zh) 图像放大率测量方法及装置
CN117928376A (zh) 探针台t轴旋转中心确定方法、装置和电子设备
EP3690808B1 (de) Verfahren zur bestimmung der verschiebung eines bauteils
CN116958152B (zh) 一种零件尺寸测量方法、装置、设备及介质
CN117953189B (zh) 视点确定方法、装置、电子设备及存储介质
CN110705479A (zh) 模型训练方法和目标识别方法、装置、设备及介质
US20040184654A1 (en) Optimizing selection of reference markings used in estimating the position of an imaging device
CN114187294B (zh) 基于先验信息的规则晶片定位方法
CN121366163A (zh) 一种多层匹配测量方法及影像测量设备
CN119904499A (zh) 电子产品零部件高度检测方法、装置、设备及存储介质
CN117726677A (zh) 特征定位处理方法、装置、设备及可读存储介质

Legal Events

Date Code Title Description
NUG Patent has lapsed