SE516239C2 - Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data. - Google Patents

Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data.

Info

Publication number
SE516239C2
SE516239C2 SE0001577A SE0001577A SE516239C2 SE 516239 C2 SE516239 C2 SE 516239C2 SE 0001577 A SE0001577 A SE 0001577A SE 0001577 A SE0001577 A SE 0001577A SE 516239 C2 SE516239 C2 SE 516239C2
Authority
SE
Sweden
Prior art keywords
nominal
objects
characteristic
data
identified
Prior art date
Application number
SE0001577A
Other languages
English (en)
Swedish (sv)
Other versions
SE0001577D0 (sv
SE0001577L (sv
Inventor
Niklas Andersson
Simon Sandgren
Johan Aaberg
Original Assignee
Mydata Automation Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=20279484&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=SE516239(C2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Mydata Automation Ab filed Critical Mydata Automation Ab
Priority to SE0001577A priority Critical patent/SE516239C2/sv
Publication of SE0001577D0 publication Critical patent/SE0001577D0/xx
Priority to PCT/SE2001/000916 priority patent/WO2001084499A2/en
Priority to AT01926303T priority patent/ATE249620T1/de
Priority to US10/240,561 priority patent/US7324710B2/en
Priority to DE60100757T priority patent/DE60100757T2/de
Priority to AU2001252833A priority patent/AU2001252833A1/en
Priority to EP01926303A priority patent/EP1277041B1/de
Priority to KR1020027014365A priority patent/KR100874389B1/ko
Priority to CNB018085407A priority patent/CN1264115C/zh
Priority to JP2001581234A priority patent/JP4800547B2/ja
Publication of SE0001577L publication Critical patent/SE0001577L/xx
Publication of SE516239C2 publication Critical patent/SE516239C2/sv

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G06T1/20—Processor architectures; Processor configuration, e.g. pipelining
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/74—Determining position or orientation of objects or cameras using feature-based methods involving reference images or patches
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30148—Semiconductor; IC; Wafer
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30152—Solder

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
SE0001577A 2000-04-28 2000-04-28 Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data. SE516239C2 (sv)

Priority Applications (10)

Application Number Priority Date Filing Date Title
SE0001577A SE516239C2 (sv) 2000-04-28 2000-04-28 Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data.
JP2001581234A JP4800547B2 (ja) 2000-04-28 2001-04-27 画像を処理する方法と装置
CNB018085407A CN1264115C (zh) 2000-04-28 2001-04-27 用于确定电子装置标称机械数据的方法和装置
US10/240,561 US7324710B2 (en) 2000-04-28 2001-04-27 Method and device for determining nominal data for electronic circuits by capturing a digital image and compare with stored nominal data
AT01926303T ATE249620T1 (de) 2000-04-28 2001-04-27 Verfahren und einrichtung zur verarbeitung von bildern
PCT/SE2001/000916 WO2001084499A2 (en) 2000-04-28 2001-04-27 Method and device for determining nominal data for electronic circuits by capturing a digital image and compare with stored nonimal data
DE60100757T DE60100757T2 (de) 2000-04-28 2001-04-27 Verfahren und einrichtung zur verarbeitung von bildern
AU2001252833A AU2001252833A1 (en) 2000-04-28 2001-04-27 Method and device for processing images
EP01926303A EP1277041B1 (de) 2000-04-28 2001-04-27 Verfahren und einrichtung zur verarbeitung von bildern
KR1020027014365A KR100874389B1 (ko) 2000-04-28 2001-04-27 이미지 처리 방법 및 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0001577A SE516239C2 (sv) 2000-04-28 2000-04-28 Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data.

Publications (3)

Publication Number Publication Date
SE0001577D0 SE0001577D0 (sv) 2000-04-28
SE0001577L SE0001577L (sv) 2001-10-29
SE516239C2 true SE516239C2 (sv) 2001-12-03

Family

ID=20279484

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0001577A SE516239C2 (sv) 2000-04-28 2000-04-28 Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data.

Country Status (10)

Country Link
US (1) US7324710B2 (de)
EP (1) EP1277041B1 (de)
JP (1) JP4800547B2 (de)
KR (1) KR100874389B1 (de)
CN (1) CN1264115C (de)
AT (1) ATE249620T1 (de)
AU (1) AU2001252833A1 (de)
DE (1) DE60100757T2 (de)
SE (1) SE516239C2 (de)
WO (1) WO2001084499A2 (de)

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US7711157B2 (en) 2006-08-01 2010-05-04 California Institute Of Technology Artificial intelligence systems for identifying objects
US20090080010A1 (en) * 2007-09-21 2009-03-26 Canon Kabushiki Kaisha Image forming apparatus, image forming method, and program
US8725477B2 (en) 2008-04-10 2014-05-13 Schlumberger Technology Corporation Method to generate numerical pseudocores using borehole images, digital rock samples, and multi-point statistics
CN101878434B (zh) * 2008-04-10 2014-05-07 普拉德研究及开发股份有限公司 用于表征被井眼穿过的地质构造的方法
US8389057B2 (en) * 2009-04-06 2013-03-05 Douglas Knox Systems and methods for printing electronic device assembly
US8311788B2 (en) 2009-07-01 2012-11-13 Schlumberger Technology Corporation Method to quantify discrete pore shapes, volumes, and surface areas using confocal profilometry
BR102015013591A8 (pt) * 2015-06-10 2023-03-07 Valid Solucoes E Servicos De Seguranca Em Meios De Pagamento E Identificacao S A Processo e sistema de identificação de produtos em movimentação em uma linha de produção
CN107850425B (zh) * 2015-07-13 2022-08-26 瑞尼斯豪公司 用于测量制品的方法

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US4790564A (en) 1987-02-20 1988-12-13 Morpho Systemes Automatic fingerprint identification system including processes and apparatus for matching fingerprints
ES2096550T3 (es) 1987-02-20 1997-03-16 Sagem Metodo para la identificacion automatica de huellas dactilares.
JPH07118012B2 (ja) * 1987-10-20 1995-12-18 松下電器産業株式会社 部品のリード端子間隔検査方法
AU3543689A (en) * 1988-05-09 1989-11-29 Omron Tateisi Electronics Co. Substrate examining apparatus and method of operating same
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SG45181A1 (en) 1991-07-22 1998-01-16 Omron Tateisi Electronics Co Teaching method and system for mounted component inspection
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US5555316A (en) * 1992-06-30 1996-09-10 Matsushita Electric Industrial Co., Ltd. Inspecting apparatus of mounting state of component or printing state of cream solder in mounting line of electronic component
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US5563798A (en) * 1994-04-05 1996-10-08 Applied Materials, Inc. Wafer positioning system
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US6026176A (en) * 1995-07-25 2000-02-15 Cognex Corporation Machine vision methods and articles of manufacture for ball grid array inspection
JP3679471B2 (ja) 1995-09-18 2005-08-03 ジェネシス・テクノロジー株式会社 光学的欠陥検査装置
JP2850807B2 (ja) * 1995-10-27 1999-01-27 日本電気株式会社 検査データ作成装置
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Also Published As

Publication number Publication date
JP4800547B2 (ja) 2011-10-26
CN1426533A (zh) 2003-06-25
KR20030005301A (ko) 2003-01-17
WO2001084499A2 (en) 2001-11-08
CN1264115C (zh) 2006-07-12
US7324710B2 (en) 2008-01-29
SE0001577D0 (sv) 2000-04-28
US20030113039A1 (en) 2003-06-19
AU2001252833A1 (en) 2001-11-12
EP1277041B1 (de) 2003-09-10
SE0001577L (sv) 2001-10-29
ATE249620T1 (de) 2003-09-15
KR100874389B1 (ko) 2008-12-17
DE60100757T2 (de) 2004-07-01
EP1277041A2 (de) 2003-01-22
JP2003532243A (ja) 2003-10-28
WO2001084499A3 (en) 2002-01-24
DE60100757D1 (de) 2003-10-16

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