SE0001577D0 - Method and device for processing images - Google Patents

Method and device for processing images

Info

Publication number
SE0001577D0
SE0001577D0 SE0001577A SE0001577A SE0001577D0 SE 0001577 D0 SE0001577 D0 SE 0001577D0 SE 0001577 A SE0001577 A SE 0001577A SE 0001577 A SE0001577 A SE 0001577A SE 0001577 D0 SE0001577 D0 SE 0001577D0
Authority
SE
Sweden
Prior art keywords
nominal
appearance data
data
determined
appearance
Prior art date
Application number
SE0001577A
Other languages
English (en)
Other versions
SE516239C2 (sv
SE0001577L (sv
Inventor
Niklas Andersson
Simon Sandgdren
Johan Aaberg
Original Assignee
Mydata Automation Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=20279484&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=SE0001577(D0) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Mydata Automation Ab filed Critical Mydata Automation Ab
Priority to SE0001577A priority Critical patent/SE516239C2/sv
Publication of SE0001577D0 publication Critical patent/SE0001577D0/sv
Priority to KR1020027014365A priority patent/KR100874389B1/ko
Priority to JP2001581234A priority patent/JP4800547B2/ja
Priority to PCT/SE2001/000916 priority patent/WO2001084499A2/en
Priority to CNB018085407A priority patent/CN1264115C/zh
Priority to AT01926303T priority patent/ATE249620T1/de
Priority to DE60100757T priority patent/DE60100757T2/de
Priority to EP01926303A priority patent/EP1277041B1/en
Priority to US10/240,561 priority patent/US7324710B2/en
Priority to AU2001252833A priority patent/AU2001252833A1/en
Publication of SE0001577L publication Critical patent/SE0001577L/sv
Publication of SE516239C2 publication Critical patent/SE516239C2/sv

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/70Determining position or orientation of objects or cameras
    • G06T7/73Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/74Determining position or orientation of objects or cameras using feature-based methods involving reference images or patches
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00General purpose image data processing
    • G06T1/20Processor architectures; Processor configuration, e.g. pipelining
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30148Semiconductor; IC; Wafer
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30152Solder
SE0001577A 2000-04-28 2000-04-28 Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data. SE516239C2 (sv)

Priority Applications (10)

Application Number Priority Date Filing Date Title
SE0001577A SE516239C2 (sv) 2000-04-28 2000-04-28 Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data.
AU2001252833A AU2001252833A1 (en) 2000-04-28 2001-04-27 Method and device for processing images
US10/240,561 US7324710B2 (en) 2000-04-28 2001-04-27 Method and device for determining nominal data for electronic circuits by capturing a digital image and compare with stored nominal data
PCT/SE2001/000916 WO2001084499A2 (en) 2000-04-28 2001-04-27 Method and device for determining nominal data for electronic circuits by capturing a digital image and compare with stored nonimal data
JP2001581234A JP4800547B2 (ja) 2000-04-28 2001-04-27 画像を処理する方法と装置
KR1020027014365A KR100874389B1 (ko) 2000-04-28 2001-04-27 이미지 처리 방법 및 장치
CNB018085407A CN1264115C (zh) 2000-04-28 2001-04-27 用于确定电子装置标称机械数据的方法和装置
AT01926303T ATE249620T1 (de) 2000-04-28 2001-04-27 Verfahren und einrichtung zur verarbeitung von bildern
DE60100757T DE60100757T2 (de) 2000-04-28 2001-04-27 Verfahren und einrichtung zur verarbeitung von bildern
EP01926303A EP1277041B1 (en) 2000-04-28 2001-04-27 Method and device for processing images

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0001577A SE516239C2 (sv) 2000-04-28 2000-04-28 Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data.

Publications (3)

Publication Number Publication Date
SE0001577D0 true SE0001577D0 (sv) 2000-04-28
SE0001577L SE0001577L (sv) 2001-10-29
SE516239C2 SE516239C2 (sv) 2001-12-03

Family

ID=20279484

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0001577A SE516239C2 (sv) 2000-04-28 2000-04-28 Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data.

Country Status (10)

Country Link
US (1) US7324710B2 (sv)
EP (1) EP1277041B1 (sv)
JP (1) JP4800547B2 (sv)
KR (1) KR100874389B1 (sv)
CN (1) CN1264115C (sv)
AT (1) ATE249620T1 (sv)
AU (1) AU2001252833A1 (sv)
DE (1) DE60100757T2 (sv)
SE (1) SE516239C2 (sv)
WO (1) WO2001084499A2 (sv)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7711157B2 (en) * 2006-08-01 2010-05-04 California Institute Of Technology Artificial intelligence systems for identifying objects
US20090080010A1 (en) * 2007-09-21 2009-03-26 Canon Kabushiki Kaisha Image forming apparatus, image forming method, and program
CN101878434B (zh) * 2008-04-10 2014-05-07 普拉德研究及开发股份有限公司 用于表征被井眼穿过的地质构造的方法
US8725477B2 (en) 2008-04-10 2014-05-13 Schlumberger Technology Corporation Method to generate numerical pseudocores using borehole images, digital rock samples, and multi-point statistics
US8389057B2 (en) * 2009-04-06 2013-03-05 Douglas Knox Systems and methods for printing electronic device assembly
US8311788B2 (en) 2009-07-01 2012-11-13 Schlumberger Technology Corporation Method to quantify discrete pore shapes, volumes, and surface areas using confocal profilometry
BR102015013591A8 (pt) * 2015-06-10 2023-03-07 Valid Solucoes E Servicos De Seguranca Em Meios De Pagamento E Identificacao S A Processo e sistema de identificação de produtos em movimentação em uma linha de produção
JP7353757B2 (ja) * 2015-07-13 2023-10-02 レニショウ パブリック リミテッド カンパニー アーチファクトを測定するための方法

Family Cites Families (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5941228B2 (ja) * 1979-08-30 1984-10-05 富士通株式会社 情報抽出システム
DE3856485T2 (de) 1987-02-20 2002-05-08 Sagem Verfahren zum Vergleichen von Fingerabdrücken
US4790564A (en) * 1987-02-20 1988-12-13 Morpho Systemes Automatic fingerprint identification system including processes and apparatus for matching fingerprints
JPH07118012B2 (ja) * 1987-10-20 1995-12-18 松下電器産業株式会社 部品のリード端子間隔検査方法
ATE135110T1 (de) 1988-05-09 1996-03-15 Omron Tateisi Electronics Co Substrat-prüfungsvorrichtung
US5265170A (en) * 1990-01-11 1993-11-23 Hine Design, Inc. Devices and methods for reading identification marks on semiconductor wafers
US5119436A (en) 1990-09-24 1992-06-02 Kulicke And Soffa Industries, Inc Method of centering bond positions
US5185811A (en) * 1990-12-27 1993-02-09 International Business Machines Corporation Automated visual inspection of electronic component leads prior to placement
SG45181A1 (en) 1991-07-22 1998-01-16 Omron Tateisi Electronics Co Teaching method and system for mounted component inspection
US5469294A (en) 1992-05-01 1995-11-21 Xrl, Inc. Illumination system for OCR of indicia on a substrate
US5737122A (en) 1992-05-01 1998-04-07 Electro Scientific Industries, Inc. Illumination system for OCR of indicia on a substrate
US5555316A (en) * 1992-06-30 1996-09-10 Matsushita Electric Industrial Co., Ltd. Inspecting apparatus of mounting state of component or printing state of cream solder in mounting line of electronic component
JP2941617B2 (ja) 1993-10-21 1999-08-25 株式会社テンリュウテクニックス 電子部品の部品データ記録装置およびそれを用いた電子部品の搬送組み付け装置
US5563798A (en) * 1994-04-05 1996-10-08 Applied Materials, Inc. Wafer positioning system
JP3472971B2 (ja) * 1994-07-15 2003-12-02 株式会社アドバンテスト Ic不良解析方法及び不良解析装置
US6026176A (en) * 1995-07-25 2000-02-15 Cognex Corporation Machine vision methods and articles of manufacture for ball grid array inspection
JP3679471B2 (ja) * 1995-09-18 2005-08-03 ジェネシス・テクノロジー株式会社 光学的欠陥検査装置
JP2850807B2 (ja) * 1995-10-27 1999-01-27 日本電気株式会社 検査データ作成装置
JPH09184715A (ja) * 1995-12-28 1997-07-15 Hitachi Ltd パターン形状検査装置
JPH09265537A (ja) * 1996-03-29 1997-10-07 Hitachi Ltd 画像処理方法
US5785484A (en) 1996-08-23 1998-07-28 Electro Scientific Industries, Inc. Method and apparatus for orienting miniature components
US5894530A (en) 1996-09-05 1999-04-13 Electro Scientific Industries, Inc. Optical viewing system for simultaneously viewing indicia located on top and bottom surfaces of a substrate
CN1201953A (zh) 1997-06-06 1998-12-16 童超 手形图像识别仪
US5956134A (en) * 1997-07-11 1999-09-21 Semiconductor Technologies & Instruments, Inc. Inspection system and method for leads of semiconductor devices
US6895109B1 (en) * 1997-09-04 2005-05-17 Texas Instruments Incorporated Apparatus and method for automatically detecting defects on silicon dies on silicon wafers
US6038336A (en) 1997-12-04 2000-03-14 Daewoo Electronics Co., Ltd. PCB testing circuit for an automatic inserting apparatus and a testing method therefor
US5969752A (en) 1998-06-15 1999-10-19 Electro Scientific Industries Multi-function viewer/tester for miniature electric components
JP4358991B2 (ja) * 1998-08-04 2009-11-04 サイバーオプティクス コーポレーション 強化されたセンサ
US6275742B1 (en) * 1999-04-16 2001-08-14 Berkeley Process Control, Inc. Wafer aligner system
US6326618B1 (en) * 1999-07-02 2001-12-04 Agere Systems Guardian Corp. Method of analyzing semiconductor surface with patterned feature using line width metrology
US6225639B1 (en) * 1999-08-27 2001-05-01 Agere Systems Guardian Corp. Method of monitoring a patterned transfer process using line width metrology
EP1089214A3 (en) * 1999-09-30 2005-01-26 Matsushita Electric Industrial Co., Ltd. Apparatus and method for image recognition
US6411867B1 (en) * 1999-10-27 2002-06-25 Fujitsu Ten Limited Vehicle driving support system, and steering angle detection device
US6718227B1 (en) 1999-12-16 2004-04-06 Texas Instruments Incorporated System and method for determining a position error in a wafer handling device
DE60139236D1 (de) * 2000-05-12 2009-08-27 Toyota Jidoshokki Kariya Kk Hilfe beim rückwärtsfahren einen fahrzeugs
US6464636B1 (en) * 2000-10-18 2002-10-15 Koninklijke Philips Electronics N.V. Configuration tool for use in ultrasound imaging device
US6584213B2 (en) * 2001-07-23 2003-06-24 Pulsent Corporation Motion matching method

Also Published As

Publication number Publication date
EP1277041A2 (en) 2003-01-22
DE60100757T2 (de) 2004-07-01
SE516239C2 (sv) 2001-12-03
KR20030005301A (ko) 2003-01-17
JP2003532243A (ja) 2003-10-28
JP4800547B2 (ja) 2011-10-26
KR100874389B1 (ko) 2008-12-17
SE0001577L (sv) 2001-10-29
EP1277041B1 (en) 2003-09-10
ATE249620T1 (de) 2003-09-15
WO2001084499A3 (en) 2002-01-24
US20030113039A1 (en) 2003-06-19
CN1264115C (zh) 2006-07-12
CN1426533A (zh) 2003-06-25
US7324710B2 (en) 2008-01-29
AU2001252833A1 (en) 2001-11-12
DE60100757D1 (de) 2003-10-16
WO2001084499A2 (en) 2001-11-08

Similar Documents

Publication Publication Date Title
EP1598775A4 (en) IMAGE PROCESSING DEVICE, METHOD AND PROGRAM
ATE222390T1 (de) Münzprüfvorrichtung, münzverarbeitungsapparat mit einer solchen münzprüfvorrichtung und münzprüfverfahren
DE60309884D1 (de) Verfahren, vorrichtung und gerät zur ablesung von informationen von, zum beispiel, gestapelten jetons
SG145697A1 (en) Image processing method and system for microfluidic devices
WO2003005007A1 (en) Method and device for inspecting defect of sheet-shaped transparent body
SE0200419D0 (sv) Elektronisk penna samt sensorarrangemang och styranordning vid sådan
WO2006110611A3 (en) Image acquisition and exploitation camera system and methods therefore
EP1431803A3 (en) Image pickup apparatus for performing three-dimensional shape measurement and corresponding method
TW200608770A (en) Image-capturing device and method for removing strangers
ATE475152T1 (de) Verfahren zur automatischen 3d-bildgebung
ATE506664T1 (de) Verfahren zur wiedergabe grafischer objekte
GB2363935A (en) Using an electronic camera to build a file containing text
WO2006012132A3 (en) Generation of directional field information in the context of image processing
EP1701539A3 (en) Television program alert device and method
EP2615818A3 (en) Method of automatically geotagging data
EP1845717A3 (en) Video program processing method and system
SE0001577D0 (sv) Method and device for processing images
ATE475084T1 (de) Potentiometrischer sensor
TW200612141A (en) Electro-optical device, method of driving the same, data line driving circuit, signal processing circuit, and electronic apparatus
FI20045397A0 (sv) Förverkligande av dataöverföring mellan åtminstone två programvaror
EP1351498A3 (fr) Procédé de traitement en temps réel d'un signal représentatif d'une image
TW200629891A (en) Digital televisions and electronic devices with program reminding, and methods thereof
EP1150492A3 (en) Electronic watermark embedding and detecting device and method
SE0302603D0 (sv) System and method of imaging the characteristics of an object
EP1511290A3 (en) Solid-state image sensing apparatus

Legal Events

Date Code Title Description
NUG Patent has lapsed