SE425937B - Sett och anordning for att analysera en jonstrale fran en jonkella - Google Patents
Sett och anordning for att analysera en jonstrale fran en jonkellaInfo
- Publication number
- SE425937B SE425937B SE7713827A SE7713827A SE425937B SE 425937 B SE425937 B SE 425937B SE 7713827 A SE7713827 A SE 7713827A SE 7713827 A SE7713827 A SE 7713827A SE 425937 B SE425937 B SE 425937B
- Authority
- SE
- Sweden
- Prior art keywords
- deflection
- field
- ion beam
- ion
- source
- Prior art date
Links
- 238000003795 desorption Methods 0.000 claims description 27
- 238000010884 ion-beam technique Methods 0.000 claims description 18
- 238000000034 method Methods 0.000 claims description 8
- 238000010438 heat treatment Methods 0.000 claims 4
- 230000003213 activating effect Effects 0.000 claims 3
- 230000004913 activation Effects 0.000 claims 2
- 238000001514 detection method Methods 0.000 claims 1
- 150000002500 ions Chemical class 0.000 description 34
- 239000000523 sample Substances 0.000 description 19
- 238000004458 analytical method Methods 0.000 description 11
- 230000005684 electric field Effects 0.000 description 7
- 238000010276 construction Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 230000001133 acceleration Effects 0.000 description 2
- 210000001787 dendrite Anatomy 0.000 description 2
- 230000005686 electrostatic field Effects 0.000 description 2
- 238000004949 mass spectrometry Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 230000005355 Hall effect Effects 0.000 description 1
- 238000003556 assay Methods 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000000451 chemical ionisation Methods 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000000434 field desorption mass spectrometry Methods 0.000 description 1
- 238000001819 mass spectrum Methods 0.000 description 1
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000005979 thermal decomposition reaction Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/32—Static spectrometers using double focusing
- H01J49/326—Static spectrometers using double focusing with magnetic and electrostatic sectors of 90 degrees
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US05/748,298 US4099052A (en) | 1976-12-07 | 1976-12-07 | Mass spectrometer beam monitor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| SE7713827L SE7713827L (sv) | 1978-06-08 |
| SE425937B true SE425937B (sv) | 1982-11-22 |
Family
ID=25008864
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SE7713827A SE425937B (sv) | 1976-12-07 | 1977-12-06 | Sett och anordning for att analysera en jonstrale fran en jonkella |
Country Status (7)
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2765890B2 (ja) * | 1988-12-09 | 1998-06-18 | 株式会社日立製作所 | プラズマイオン源微量元素質量分析装置 |
| CA2555985A1 (en) * | 2004-03-04 | 2005-09-15 | Mds Inc., Doing Business Through Its Mds Sciex Division | Method and system for mass analysis of samples |
| US7504621B2 (en) * | 2004-03-04 | 2009-03-17 | Mds Inc. | Method and system for mass analysis of samples |
| DE102009029899A1 (de) * | 2009-06-19 | 2010-12-23 | Thermo Fisher Scientific (Bremen) Gmbh | Massenspektrometer und Verfahren zur Isotopenanalyse |
| CN110568474B (zh) * | 2019-10-08 | 2024-04-12 | 中国工程物理研究院激光聚变研究中心 | 一种宽能谱范围的带电粒子谱仪 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1498936B2 (de) * | 1963-12-28 | 1971-01-14 | Nihon Densht K K , Tokio | Verfahren und Vorrichtung zur Steue rung der Expositionszeit in einem Massen spektrographen |
| GB1116427A (en) * | 1965-01-21 | 1968-06-06 | Ass Elect Ind | Improvements in or relating to the measurement of the gas content of metals |
| US3475604A (en) * | 1965-09-30 | 1969-10-28 | Hitachi Ltd | Mass spectrometer having means for simultaneously detecting single focussing and double focussing mass spectra |
| GB1131495A (en) * | 1965-10-04 | 1968-10-23 | Edwards High Vacuum Int Ltd | Improvements in or relating to electron emission control in mass spectrometers |
| US3518424A (en) * | 1967-09-13 | 1970-06-30 | Exxon Research Engineering Co | Ion beam intensity control for a field ionization mass spectrometer employing voltage feedback to the ion source |
| US3602709A (en) * | 1968-03-14 | 1971-08-31 | Bell & Howell Co | Mass analyzer including magnetic field control means |
| US3548188A (en) * | 1969-05-06 | 1970-12-15 | Vacuum Instr Corp | Method and apparatus for mass analyzing a gas which is selectively desorbed from a body |
| JPS5110797B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1970-07-24 | 1976-04-06 | ||
| US3953732A (en) * | 1973-09-28 | 1976-04-27 | The University Of Rochester | Dynamic mass spectrometer |
| US3868507A (en) * | 1973-12-05 | 1975-02-25 | Atomic Energy Commission | Field desorption spectrometer |
-
1976
- 1976-12-07 US US05/748,298 patent/US4099052A/en not_active Expired - Lifetime
-
1977
- 1977-12-05 CA CA292,438A patent/CA1081867A/en not_active Expired
- 1977-12-05 GB GB50511/77A patent/GB1560328A/en not_active Expired
- 1977-12-06 FR FR7736691A patent/FR2373875A1/fr active Granted
- 1977-12-06 SE SE7713827A patent/SE425937B/sv unknown
- 1977-12-06 DE DE19772754198 patent/DE2754198A1/de not_active Withdrawn
- 1977-12-07 JP JP14619477A patent/JPS5371892A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5371892A (en) | 1978-06-26 |
| GB1560328A (en) | 1980-02-06 |
| DE2754198A1 (de) | 1978-06-08 |
| FR2373875A1 (fr) | 1978-07-07 |
| SE7713827L (sv) | 1978-06-08 |
| US4099052A (en) | 1978-07-04 |
| FR2373875B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1980-08-22 |
| CA1081867A (en) | 1980-07-15 |
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