SE409906B - Sett och anordning for analys med fotoelektronspektroskopi - Google Patents
Sett och anordning for analys med fotoelektronspektroskopiInfo
- Publication number
- SE409906B SE409906B SE7614161A SE7614161A SE409906B SE 409906 B SE409906 B SE 409906B SE 7614161 A SE7614161 A SE 7614161A SE 7614161 A SE7614161 A SE 7614161A SE 409906 B SE409906 B SE 409906B
- Authority
- SE
- Sweden
- Prior art keywords
- analysis
- photoelectron spectroscopy
- photoelectron
- spectroscopy
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7539096A FR2335839A1 (fr) | 1975-12-19 | 1975-12-19 | Procede d'analyse d'echantillons en matiere isolante par spectrometrie photo-electronique et porte-echantillon pour la mise en oeuvre dudit procede |
Publications (2)
Publication Number | Publication Date |
---|---|
SE7614161L SE7614161L (sv) | 1977-06-20 |
SE409906B true SE409906B (sv) | 1979-09-10 |
Family
ID=9163968
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE7614161A SE409906B (sv) | 1975-12-19 | 1976-12-16 | Sett och anordning for analys med fotoelektronspektroskopi |
Country Status (8)
Country | Link |
---|---|
US (1) | US4097738A (fr) |
JP (1) | JPS5277792A (fr) |
BE (1) | BE849129A (fr) |
DE (1) | DE2657439A1 (fr) |
ES (1) | ES454412A1 (fr) |
FR (1) | FR2335839A1 (fr) |
GB (1) | GB1556075A (fr) |
SE (1) | SE409906B (fr) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3128814A1 (de) * | 1981-07-21 | 1983-02-10 | Siemens AG, 1000 Berlin und 8000 München | Elektrisch leitende probenhalterung fuer die analysentechnik der sekundaerionen-massenspektrometrie |
JPH0711495B2 (ja) * | 1982-05-07 | 1995-02-08 | 株式会社日立製作所 | 光電子測定方法 |
JPS60121652A (ja) * | 1983-12-02 | 1985-06-29 | Hitachi Ltd | 質量分析用試料ホルダ− |
JPS60135846A (ja) * | 1983-12-26 | 1985-07-19 | Anelva Corp | 二次イオン質量分析方法 |
US4590376A (en) * | 1984-05-30 | 1986-05-20 | Photo Acoustic Technology, Inc. | Apparatus and technique for monitoring photoelectron emission from surfaces |
DE3576213D1 (de) * | 1984-09-18 | 1990-04-05 | Integrated Circuit Testing | Gegenfeld-spektrometer fuer die elektronenstrahl-messtechnik. |
EP0661385A1 (fr) * | 1991-08-19 | 1995-07-05 | OHMI, Tadahiro | Procede de formation d'un film d'oxyde |
US6146135A (en) | 1991-08-19 | 2000-11-14 | Tadahiro Ohmi | Oxide film forming method |
US8307665B2 (en) * | 2006-04-06 | 2012-11-13 | National Institute Of Advanced Industrial Science And Technology | Sample cooling apparatus |
CN114047215B (zh) * | 2021-10-20 | 2023-08-15 | 北京科技大学顺德研究生院 | 一种用于消除被测样品表面不均匀荷电的装置及方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1282498A (en) * | 1969-11-17 | 1972-07-19 | Ass Elect Ind | Improvements in or relating to apparatus for use in electron spectroscopy |
US3749926A (en) * | 1971-08-03 | 1973-07-31 | Du Pont | Charged particle energy analysis |
US3822383A (en) * | 1973-04-13 | 1974-07-02 | Weston Instruments Inc | Profile gauging system |
-
1975
- 1975-12-19 FR FR7539096A patent/FR2335839A1/fr active Granted
-
1976
- 1976-12-07 BE BE173020A patent/BE849129A/fr unknown
- 1976-12-15 GB GB52346/76A patent/GB1556075A/en not_active Expired
- 1976-12-16 SE SE7614161A patent/SE409906B/xx unknown
- 1976-12-17 DE DE19762657439 patent/DE2657439A1/de not_active Withdrawn
- 1976-12-17 US US05/751,374 patent/US4097738A/en not_active Expired - Lifetime
- 1976-12-18 ES ES454412A patent/ES454412A1/es not_active Expired
- 1976-12-20 JP JP51153289A patent/JPS5277792A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
JPS5277792A (en) | 1977-06-30 |
ES454412A1 (es) | 1977-12-01 |
BE849129A (fr) | 1977-04-01 |
DE2657439A1 (de) | 1977-07-07 |
US4097738A (en) | 1978-06-27 |
GB1556075A (en) | 1979-11-21 |
FR2335839B1 (fr) | 1980-01-25 |
FR2335839A1 (fr) | 1977-07-15 |
SE7614161L (sv) | 1977-06-20 |
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