SE402974B - Ljuselektronisk lengdmetningsanordning - Google Patents

Ljuselektronisk lengdmetningsanordning

Info

Publication number
SE402974B
SE402974B SE7507584A SE7507584A SE402974B SE 402974 B SE402974 B SE 402974B SE 7507584 A SE7507584 A SE 7507584A SE 7507584 A SE7507584 A SE 7507584A SE 402974 B SE402974 B SE 402974B
Authority
SE
Sweden
Prior art keywords
light electronic
saturation device
electronic length
length saturation
light
Prior art date
Application number
SE7507584A
Other languages
English (en)
Swedish (sv)
Other versions
SE7507584L (sv
Inventor
J Erdmann
Original Assignee
Sick Gmbh Optik Elektronik Fir
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sick Gmbh Optik Elektronik Fir filed Critical Sick Gmbh Optik Elektronik Fir
Publication of SE7507584L publication Critical patent/SE7507584L/xx
Publication of SE402974B publication Critical patent/SE402974B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
SE7507584A 1974-07-19 1975-07-02 Ljuselektronisk lengdmetningsanordning SE402974B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2434829A DE2434829C3 (de) 1974-07-19 1974-07-19 Lichtelektronische Vorrichtung zur Messung der Länge oder Breite eines Gegenstands

Publications (2)

Publication Number Publication Date
SE7507584L SE7507584L (sv) 1976-01-20
SE402974B true SE402974B (sv) 1978-07-24

Family

ID=5921015

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7507584A SE402974B (sv) 1974-07-19 1975-07-02 Ljuselektronisk lengdmetningsanordning

Country Status (6)

Country Link
US (1) US4025796A (online.php)
DE (1) DE2434829C3 (online.php)
FR (1) FR2279067A1 (online.php)
GB (1) GB1498227A (online.php)
IT (1) IT1041310B (online.php)
SE (1) SE402974B (online.php)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2622113C3 (de) * 1976-05-18 1982-04-08 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Vorrichtung zur Korrektur der sphärischen Aberration eines sphärischen Hohlspiegels
US4122525A (en) * 1976-07-12 1978-10-24 Eaton-Leonard Corporation Method and apparatus for profile scanning
DE2636906C3 (de) * 1976-08-17 1983-12-29 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Verfahren zur Erzeugung eines Schaltsignals beim Durchgang eines Kontrastsprunges und Schaltungsanordnung zur Ausführung des Verfahrens
US4199259A (en) * 1977-06-27 1980-04-22 Autech Detector pulse enhancement circuit
FI54972C (fi) * 1978-01-18 1979-04-10 A Elektroniikka Foerfarande och anordning foer optisk maetning av dimensionen hos en kropp
FR2494837A1 (fr) * 1980-11-26 1982-05-28 Commissariat Energie Atomique Dispositif de controle des dimensions et de l'ecartement de pieces rigides disposees en faisceau
US4429218A (en) 1981-05-11 1984-01-31 Xerox Corporation Scanning beam detector
US4447723A (en) * 1981-09-03 1984-05-08 Excellon Industries Scanning beam reference employing a retroreflective code means
DE3147433A1 (de) * 1981-11-30 1983-06-09 Eppendorf Gerätebau Netheler + Hinz GmbH, 2000 Hamburg Verfahren zur photometrischen messung des inhalts von probegefaessen sowie vorrichtungen zur durchfuehrung des verfahrens
US4629288A (en) * 1983-12-15 1986-12-16 Texas Instruments Incorporated Optical spatial address system suitable for flat panel displays and the like
SE453223B (sv) * 1986-05-09 1988-01-18 Eloptricon Ab Forfaringssett och apparat for beroringsfri och noggrann kontrollmetning av maskindelar
US4775788A (en) * 1986-10-03 1988-10-04 Greyhawk Systems, Inc. Apparatus for detecting position of a rotating element using a two-grating moire pattern
NO162830C (no) * 1987-02-20 1990-02-21 Tomra Systems As Anordning ved dimensjonsmaaling.
DE3737631C1 (de) * 1987-11-05 1989-03-02 Sick Optik Elektronik Erwin Optische Abstastvorrichtung fuer ebene Oberflaechen
SE462696B (sv) * 1988-01-12 1990-08-13 Emve I Aastorp Ab Saett och anordning foer bestaemning av en approximativ, tredimensionell avbildning av ett foeremaal
NO167334C (no) * 1989-06-22 1991-10-23 Tomra Systems As Fremgangsmaate og anordning for dimensjonsmaaling.
JP3370370B2 (ja) * 1993-02-15 2003-01-27 株式会社リコー 光走査型画像読取装置
DE19806288A1 (de) * 1998-02-16 1999-08-26 Fraunhofer Ges Forschung Laserscanner-Meßsystem
ES2152180B1 (es) * 1999-04-07 2001-08-16 Ct Investig Energeticas Ciemat Aparato y metodo de metrologia bidimensional para temperaturas criogenicas.

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2659823A (en) * 1951-09-21 1953-11-17 Jr Carl A Vossberg Measuring system
DE2015694B2 (de) * 1970-04-02 1971-11-11 Exatest Meßtechnik GmbH, 5090 Le verkusen Verfahren zur beruehrungslosen messung der breite oder lage eines gegenstandes mittels eines sichtstrahls
GB1336008A (en) * 1970-11-30 1973-11-07 Decca Ltd Detecting systems
US3907439A (en) * 1973-08-14 1975-09-23 Zygo Corp Edge-sensing with a scanning laser beam

Also Published As

Publication number Publication date
GB1498227A (en) 1978-01-18
FR2279067A1 (fr) 1976-02-13
DE2434829C3 (de) 1978-11-09
FR2279067B1 (online.php) 1980-04-18
IT1041310B (it) 1980-01-10
DE2434829B2 (de) 1978-03-16
US4025796A (en) 1977-05-24
SE7507584L (sv) 1976-01-20
DE2434829A1 (de) 1976-01-29

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