ES2152180B1 - Aparato y metodo de metrologia bidimensional para temperaturas criogenicas. - Google Patents

Aparato y metodo de metrologia bidimensional para temperaturas criogenicas.

Info

Publication number
ES2152180B1
ES2152180B1 ES9900693A ES9900693A ES2152180B1 ES 2152180 B1 ES2152180 B1 ES 2152180B1 ES 9900693 A ES9900693 A ES 9900693A ES 9900693 A ES9900693 A ES 9900693A ES 2152180 B1 ES2152180 B1 ES 2152180B1
Authority
ES
Spain
Prior art keywords
metrology
temperatures
criogenic
bidimensional
method apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES9900693A
Other languages
English (en)
Other versions
ES2152180A1 (es
Inventor
Carles Agustin Grau
Barco Pablo Abramian
Andrada Javier Martin
Rodriguez Luis Garcia-Tabares
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centro de Investigaciones Energeticas Medioambientales y Tecnologicas CIEMAT
Original Assignee
Centro de Investigaciones Energeticas Medioambientales y Tecnologicas CIEMAT
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centro de Investigaciones Energeticas Medioambientales y Tecnologicas CIEMAT filed Critical Centro de Investigaciones Energeticas Medioambientales y Tecnologicas CIEMAT
Priority to ES9900693A priority Critical patent/ES2152180B1/es
Publication of ES2152180A1 publication Critical patent/ES2152180A1/es
Application granted granted Critical
Publication of ES2152180B1 publication Critical patent/ES2152180B1/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Radiation Pyrometers (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)

Abstract

Aparato y método de metrología bidimensional para temperaturas criogénicas. Constituido por una cubeta (1) de fondo (2) plano y transparente, ligeramente sobreelevado respecto a un escaner (4) gracias a un borde perimetral (3) que presenta la citada cubeta (1) de tal manera que, primeramente se deposita el objeto a medir (5) en la cubeta y se obtiene una primera imagen digitalizada del objeto (5) para a continuación verter nitrógeno líquido en la cubeta (1) y obtener una segunda imagen digitalizada del objeto (5), determinándose la contracción que éste ha sufrido mediante medidas directas sobre ambas imágenes digitalizadas.
ES9900693A 1999-04-07 1999-04-07 Aparato y metodo de metrologia bidimensional para temperaturas criogenicas. Expired - Lifetime ES2152180B1 (es)

Priority Applications (1)

Application Number Priority Date Filing Date Title
ES9900693A ES2152180B1 (es) 1999-04-07 1999-04-07 Aparato y metodo de metrologia bidimensional para temperaturas criogenicas.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES9900693A ES2152180B1 (es) 1999-04-07 1999-04-07 Aparato y metodo de metrologia bidimensional para temperaturas criogenicas.

Publications (2)

Publication Number Publication Date
ES2152180A1 ES2152180A1 (es) 2001-01-16
ES2152180B1 true ES2152180B1 (es) 2001-08-16

Family

ID=8307915

Family Applications (1)

Application Number Title Priority Date Filing Date
ES9900693A Expired - Lifetime ES2152180B1 (es) 1999-04-07 1999-04-07 Aparato y metodo de metrologia bidimensional para temperaturas criogenicas.

Country Status (1)

Country Link
ES (1) ES2152180B1 (es)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2434829C3 (de) * 1974-07-19 1978-11-09 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Lichtelektronische Vorrichtung zur Messung der Länge oder Breite eines Gegenstands
DE2927845C3 (de) * 1979-07-10 1982-01-28 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Einen Taktmaßstab aufweisender Lichtvorhang
NO162830C (no) * 1987-02-20 1990-02-21 Tomra Systems As Anordning ved dimensjonsmaaling.
DD276918A1 (de) * 1987-05-13 1990-03-14 Univ Halle Wittenberg Laserdilatometer zur messung von laengenaenderungen im hochtemperaturbereich

Also Published As

Publication number Publication date
ES2152180A1 (es) 2001-01-16

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