IT1041310B - Dispositivo fotoelettronico per la misurazione delle lunghezze - Google Patents

Dispositivo fotoelettronico per la misurazione delle lunghezze

Info

Publication number
IT1041310B
IT1041310B IT68885/75A IT6888575A IT1041310B IT 1041310 B IT1041310 B IT 1041310B IT 68885/75 A IT68885/75 A IT 68885/75A IT 6888575 A IT6888575 A IT 6888575A IT 1041310 B IT1041310 B IT 1041310B
Authority
IT
Italy
Prior art keywords
lengths
measurement
photoelectronic device
photoelectronic
Prior art date
Application number
IT68885/75A
Other languages
English (en)
Original Assignee
Sick Optik Elektronik Erwin
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sick Optik Elektronik Erwin filed Critical Sick Optik Elektronik Erwin
Application granted granted Critical
Publication of IT1041310B publication Critical patent/IT1041310B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
IT68885/75A 1974-07-19 1975-07-18 Dispositivo fotoelettronico per la misurazione delle lunghezze IT1041310B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2434829A DE2434829C3 (de) 1974-07-19 1974-07-19 Lichtelektronische Vorrichtung zur Messung der Länge oder Breite eines Gegenstands

Publications (1)

Publication Number Publication Date
IT1041310B true IT1041310B (it) 1980-01-10

Family

ID=5921015

Family Applications (1)

Application Number Title Priority Date Filing Date
IT68885/75A IT1041310B (it) 1974-07-19 1975-07-18 Dispositivo fotoelettronico per la misurazione delle lunghezze

Country Status (6)

Country Link
US (1) US4025796A (it)
DE (1) DE2434829C3 (it)
FR (1) FR2279067A1 (it)
GB (1) GB1498227A (it)
IT (1) IT1041310B (it)
SE (1) SE402974B (it)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2622113C3 (de) * 1976-05-18 1982-04-08 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Vorrichtung zur Korrektur der sphärischen Aberration eines sphärischen Hohlspiegels
US4122525A (en) * 1976-07-12 1978-10-24 Eaton-Leonard Corporation Method and apparatus for profile scanning
DE2636906C3 (de) * 1976-08-17 1983-12-29 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Verfahren zur Erzeugung eines Schaltsignals beim Durchgang eines Kontrastsprunges und Schaltungsanordnung zur Ausführung des Verfahrens
US4199259A (en) * 1977-06-27 1980-04-22 Autech Detector pulse enhancement circuit
FI54972C (fi) * 1978-01-18 1979-04-10 A Elektroniikka Foerfarande och anordning foer optisk maetning av dimensionen hos en kropp
FR2494837A1 (fr) * 1980-11-26 1982-05-28 Commissariat Energie Atomique Dispositif de controle des dimensions et de l'ecartement de pieces rigides disposees en faisceau
US4447723A (en) * 1981-09-03 1984-05-08 Excellon Industries Scanning beam reference employing a retroreflective code means
DE3147433A1 (de) * 1981-11-30 1983-06-09 Eppendorf Gerätebau Netheler + Hinz GmbH, 2000 Hamburg Verfahren zur photometrischen messung des inhalts von probegefaessen sowie vorrichtungen zur durchfuehrung des verfahrens
US4629288A (en) * 1983-12-15 1986-12-16 Texas Instruments Incorporated Optical spatial address system suitable for flat panel displays and the like
SE453223B (sv) * 1986-05-09 1988-01-18 Eloptricon Ab Forfaringssett och apparat for beroringsfri och noggrann kontrollmetning av maskindelar
US4775788A (en) * 1986-10-03 1988-10-04 Greyhawk Systems, Inc. Apparatus for detecting position of a rotating element using a two-grating moire pattern
NO162830C (no) * 1987-02-20 1990-02-21 Tomra Systems As Anordning ved dimensjonsmaaling.
DE3737631C1 (de) * 1987-11-05 1989-03-02 Sick Optik Elektronik Erwin Optische Abstastvorrichtung fuer ebene Oberflaechen
SE462696B (sv) * 1988-01-12 1990-08-13 Emve I Aastorp Ab Saett och anordning foer bestaemning av en approximativ, tredimensionell avbildning av ett foeremaal
NO167334C (no) * 1989-06-22 1991-10-23 Tomra Systems As Fremgangsmaate og anordning for dimensjonsmaaling.
JP3370370B2 (ja) * 1993-02-15 2003-01-27 株式会社リコー 光走査型画像読取装置
DE19806288A1 (de) * 1998-02-16 1999-08-26 Fraunhofer Ges Forschung Laserscanner-Meßsystem
ES2152180B1 (es) * 1999-04-07 2001-08-16 Ct Investig Energeticas Ciemat Aparato y metodo de metrologia bidimensional para temperaturas criogenicas.

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2659823A (en) * 1951-09-21 1953-11-17 Jr Carl A Vossberg Measuring system
DE2015694B2 (de) * 1970-04-02 1971-11-11 Exatest Meßtechnik GmbH, 5090 Le verkusen Verfahren zur beruehrungslosen messung der breite oder lage eines gegenstandes mittels eines sichtstrahls
GB1336008A (en) * 1970-11-30 1973-11-07 Decca Ltd Detecting systems
US3907439A (en) * 1973-08-14 1975-09-23 Zygo Corp Edge-sensing with a scanning laser beam

Also Published As

Publication number Publication date
DE2434829B2 (de) 1978-03-16
DE2434829C3 (de) 1978-11-09
GB1498227A (en) 1978-01-18
DE2434829A1 (de) 1976-01-29
SE402974B (sv) 1978-07-24
FR2279067B1 (it) 1980-04-18
SE7507584L (sv) 1976-01-20
US4025796A (en) 1977-05-24
FR2279067A1 (fr) 1976-02-13

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