SE0801497L - Halvledarkomponent innefattande ett aktivt skikt omgivet på båda sidor av ett kontaktskikt och med ett elektrodskikt - Google Patents
Halvledarkomponent innefattande ett aktivt skikt omgivet på båda sidor av ett kontaktskikt och med ett elektrodskiktInfo
- Publication number
- SE0801497L SE0801497L SE0801497A SE0801497A SE0801497L SE 0801497 L SE0801497 L SE 0801497L SE 0801497 A SE0801497 A SE 0801497A SE 0801497 A SE0801497 A SE 0801497A SE 0801497 L SE0801497 L SE 0801497L
- Authority
- SE
- Sweden
- Prior art keywords
- layer
- semiconductor component
- sides
- contact
- active
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 5
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
-
- H01L27/16—
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N19/00—Integrated devices, or assemblies of multiple devices, comprising at least one thermoelectric or thermomagnetic element covered by groups H10N10/00 - H10N15/00
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Light Receiving Elements (AREA)
- Electrodes Of Semiconductors (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE0801497A SE535723C2 (sv) | 2008-06-25 | 2008-06-25 | Halvledarkomponent innefattande ett aktivt skikt omgivet på båda sidor av ett kontaktskikt och med ett elektrodskikt |
EP09162800.8A EP2138818B1 (en) | 2008-06-25 | 2009-06-16 | Bolometer comprising an active layer surrounded on both sides by a contact layer and with an electrode layer. |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE0801497A SE535723C2 (sv) | 2008-06-25 | 2008-06-25 | Halvledarkomponent innefattande ett aktivt skikt omgivet på båda sidor av ett kontaktskikt och med ett elektrodskikt |
Publications (2)
Publication Number | Publication Date |
---|---|
SE0801497L true SE0801497L (sv) | 2009-12-26 |
SE535723C2 SE535723C2 (sv) | 2012-11-27 |
Family
ID=40992063
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE0801497A SE535723C2 (sv) | 2008-06-25 | 2008-06-25 | Halvledarkomponent innefattande ett aktivt skikt omgivet på båda sidor av ett kontaktskikt och med ett elektrodskikt |
Country Status (2)
Country | Link |
---|---|
EP (1) | EP2138818B1 (sv) |
SE (1) | SE535723C2 (sv) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
MD340Z (ro) * | 2010-04-23 | 2011-09-30 | Институт Электронной Инженерии И Промышленных Технологий | Bolometru |
US11819208B2 (en) | 2021-08-05 | 2023-11-21 | Covidien Lp | Handheld electromechanical surgical device with strain gauge drift detection |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3357247B2 (ja) | 1996-08-23 | 2002-12-16 | アルプス電気株式会社 | 感温素子および輻射線センサ |
-
2008
- 2008-06-25 SE SE0801497A patent/SE535723C2/sv not_active IP Right Cessation
-
2009
- 2009-06-16 EP EP09162800.8A patent/EP2138818B1/en not_active Not-in-force
Also Published As
Publication number | Publication date |
---|---|
EP2138818A1 (en) | 2009-12-30 |
EP2138818B1 (en) | 2013-11-27 |
SE535723C2 (sv) | 2012-11-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
NUG | Patent has lapsed |