RU94013073A - Device for control of regeneration in semiconductor dynamic memory unit - Google Patents
Device for control of regeneration in semiconductor dynamic memory unitInfo
- Publication number
- RU94013073A RU94013073A RU94013073/09A RU94013073A RU94013073A RU 94013073 A RU94013073 A RU 94013073A RU 94013073/09 A RU94013073/09 A RU 94013073/09A RU 94013073 A RU94013073 A RU 94013073A RU 94013073 A RU94013073 A RU 94013073A
- Authority
- RU
- Russia
- Prior art keywords
- group
- output
- control unit
- local control
- input
- Prior art date
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- Logic Circuits (AREA)
- Debugging And Monitoring (AREA)
Abstract
FIELD: computer engineering. SUBSTANCE: device has first and second clock pulse oscillators 1 and 2, first and second flip-flops 3 and 4, first and second bus generators 6 and 5 local control unit 7, counters 8, decoder 9, encoder 10, register 11, AND gate 12, OR gate 13. Central processing unit 14 and memory unit 15 of computer are connected to device. In addition device has terminal 16 for request of direct memory access, terminal 17 for permission of direct memory access, terminal 18 for acknowledge of channel access, address line 19, memory control line 20, outputs group 21 and inputs group 22 of local control unit 7, synchronization signal output 24, writing permission signal output 25, strobe signal output 26, reset signal output 27, synchronization input 28 of local control unit 7. In addition device has delay gate 29, group of flip-flops 30.1, ..., 30.i, ..., 30.n, group of AND gates 31.1, ..., 31.i, ...., 31.n, unit 32 which generates code for control of regeneration frequency, group 33 of detectors which measure intensity of external physical fields, writing strobe input 34. Device may be used in special computers that are exposed to heavy physical fields with variable intensity. EFFECT: increased reliability. 1 dwg
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
RU94013073A RU2040808C1 (en) | 1994-04-22 | 1994-04-22 | Device for control of regeneration in semiconductor dynamic memory unit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
RU94013073A RU2040808C1 (en) | 1994-04-22 | 1994-04-22 | Device for control of regeneration in semiconductor dynamic memory unit |
Publications (2)
Publication Number | Publication Date |
---|---|
RU2040808C1 RU2040808C1 (en) | 1995-07-25 |
RU94013073A true RU94013073A (en) | 1996-04-20 |
Family
ID=20154686
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
RU94013073A RU2040808C1 (en) | 1994-04-22 | 1994-04-22 | Device for control of regeneration in semiconductor dynamic memory unit |
Country Status (1)
Country | Link |
---|---|
RU (1) | RU2040808C1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130126508A1 (en) * | 2011-11-17 | 2013-05-23 | Texas Instruments Incorporated | Extending Radiation Tolerance By Localized Temperature Annealing Of Semiconductor Devices |
RU2533100C2 (en) * | 2011-11-15 | 2014-11-20 | Сименс Акциенгезелльшафт | Danger detector for operation in nuclear field, having heating system for heating typically non-radiation hardened semiconductor components to increase functional service life |
-
1994
- 1994-04-22 RU RU94013073A patent/RU2040808C1/en active
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2533100C2 (en) * | 2011-11-15 | 2014-11-20 | Сименс Акциенгезелльшафт | Danger detector for operation in nuclear field, having heating system for heating typically non-radiation hardened semiconductor components to increase functional service life |
US8907801B2 (en) | 2011-11-15 | 2014-12-09 | Siemens Aktiengesellschaft | Danger detector for operation in nuclear field, having heating system for heating typically non-radiation hardened semiconductor components to increase functional service life |
US20130126508A1 (en) * | 2011-11-17 | 2013-05-23 | Texas Instruments Incorporated | Extending Radiation Tolerance By Localized Temperature Annealing Of Semiconductor Devices |
Also Published As
Publication number | Publication date |
---|---|
RU2040808C1 (en) | 1995-07-25 |
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