RU94013073A - Device for control of regeneration in semiconductor dynamic memory unit - Google Patents

Device for control of regeneration in semiconductor dynamic memory unit

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Publication number
RU94013073A
RU94013073A RU94013073/09A RU94013073A RU94013073A RU 94013073 A RU94013073 A RU 94013073A RU 94013073/09 A RU94013073/09 A RU 94013073/09A RU 94013073 A RU94013073 A RU 94013073A RU 94013073 A RU94013073 A RU 94013073A
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RU
Russia
Prior art keywords
group
output
control unit
local control
input
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Application number
RU94013073/09A
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Russian (ru)
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RU2040808C1 (en
Inventor
Т.Г. Самхарадзе
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Т.Г. Самхарадзе
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Application filed by Т.Г. Самхарадзе filed Critical Т.Г. Самхарадзе
Priority to RU94013073A priority Critical patent/RU2040808C1/en
Application granted granted Critical
Publication of RU2040808C1 publication Critical patent/RU2040808C1/en
Publication of RU94013073A publication Critical patent/RU94013073A/en

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Abstract

FIELD: computer engineering. SUBSTANCE: device has first and second clock pulse oscillators 1 and 2, first and second flip-flops 3 and 4, first and second bus generators 6 and 5 local control unit 7, counters 8, decoder 9, encoder 10, register 11, AND gate 12, OR gate 13. Central processing unit 14 and memory unit 15 of computer are connected to device. In addition device has terminal 16 for request of direct memory access, terminal 17 for permission of direct memory access, terminal 18 for acknowledge of channel access, address line 19, memory control line 20, outputs group 21 and inputs group 22 of local control unit 7, synchronization signal output 24, writing permission signal output 25, strobe signal output 26, reset signal output 27, synchronization input 28 of local control unit 7. In addition device has delay gate 29, group of flip-flops 30.1, ..., 30.i, ..., 30.n, group of AND gates 31.1, ..., 31.i, ...., 31.n, unit 32 which generates code for control of regeneration frequency, group 33 of detectors which measure intensity of external physical fields, writing strobe input 34. Device may be used in special computers that are exposed to heavy physical fields with variable intensity. EFFECT: increased reliability. 1 dwg

Claims (1)

Изобретение относится к вычислительной технике и может быть использовано для восстановления информации в полупроводниковых динамических запоминающих устройствах, входящих в состав специализированных ЭВМ, подвергающихся в процессе эксплуатации воздействию физических полей повышенной интенсивности. Устройство содержит первый 1 и второй 2 генераторы тактовых импульсов, первый 3 и второй 4 триггеры, второй 5 и первый 6 шинные формирователи, блок 7 местного управления, счетчики 8, дешифратор 9, шифратор 10, регистр 11, элемент И 12, элемент ИЛИ 13. Элементы ЭВМ, взаимодействующие с устройством, центральный процессор 14 и оперативная память 15, в качестве которой использовано полупроводниковое ДЗУ. Кроме того, устройство содержит выход 16 требования прямого доступа к памяти (ПДП), вход 17 предоставления ПДП, выход 18 подтверждения захвата канала (ПЗ), адресную шину 19, шину 20 управления памятью, группу 21 выходов и группу 22 входов блока 7 местного управления, вход 23 режима работы блока 7 местного управления, выход 24 сигнала синхронизации, выход 25 сигнала разрешения записи, выход 26 сигнала стробирования, выход 27 сигнала сброса, синхровход 28 блока 7 местного управления. Кроме того, устройство содержит элемент 29 задержки, группу триггеров 30.1,. . ..30.i,..., 30.n, группу элементов И 31.1,..., 31.i.....,31.n, блок 32 формирования кода управления частотой регенерации, группу 33 измерительных датчиков параметров внешних физических полей и вход 34 стробирования записи. 1 ил.
Figure 00000001
The invention relates to computer technology and can be used to restore information in semiconductor dynamic storage devices that are part of specialized computers that are exposed during operation to physical fields of high intensity. The device contains first 1 and second 2 clock generators, first 3 and second 4 triggers, second 5 and first 6 bus drivers, local control unit 7, counters 8, decoder 9, encoder 10, register 11, AND element 12, OR element 13 The computer elements interacting with the device, the Central processor 14 and RAM 15, which is used as a semiconductor DZU. In addition, the device contains an output 16 of the direct memory access (DAP) requirement, an RAP submission input 17, a channel acquisition acknowledgment (PZ) output 18, an address bus 19, a memory management bus 20, an output group 21 and an input group 22 of the local control unit 7 , input 23 of the operating mode of the local control unit 7, output 24 of the synchronization signal, output 25 of the write enable signal, output 26 of the strobe signal, output 27 of the reset signal, sync input 28 of the local control unit 7. In addition, the device contains a delay element 29, a group of triggers 30.1 ,. . ..30.i, ..., 30.n, a group of elements And 31.1, ..., 31.i ....., 31.n, a block 32 for generating a regeneration frequency control code, a group 33 of measuring sensors of external parameters physical fields and input 34 gating records. 1 ill.
Figure 00000001
RU94013073A 1994-04-22 1994-04-22 Device for control of regeneration in semiconductor dynamic memory unit RU2040808C1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
RU94013073A RU2040808C1 (en) 1994-04-22 1994-04-22 Device for control of regeneration in semiconductor dynamic memory unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
RU94013073A RU2040808C1 (en) 1994-04-22 1994-04-22 Device for control of regeneration in semiconductor dynamic memory unit

Publications (2)

Publication Number Publication Date
RU2040808C1 RU2040808C1 (en) 1995-07-25
RU94013073A true RU94013073A (en) 1996-04-20

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Family Applications (1)

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RU94013073A RU2040808C1 (en) 1994-04-22 1994-04-22 Device for control of regeneration in semiconductor dynamic memory unit

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RU (1) RU2040808C1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130126508A1 (en) * 2011-11-17 2013-05-23 Texas Instruments Incorporated Extending Radiation Tolerance By Localized Temperature Annealing Of Semiconductor Devices
RU2533100C2 (en) * 2011-11-15 2014-11-20 Сименс Акциенгезелльшафт Danger detector for operation in nuclear field, having heating system for heating typically non-radiation hardened semiconductor components to increase functional service life

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2533100C2 (en) * 2011-11-15 2014-11-20 Сименс Акциенгезелльшафт Danger detector for operation in nuclear field, having heating system for heating typically non-radiation hardened semiconductor components to increase functional service life
US8907801B2 (en) 2011-11-15 2014-12-09 Siemens Aktiengesellschaft Danger detector for operation in nuclear field, having heating system for heating typically non-radiation hardened semiconductor components to increase functional service life
US20130126508A1 (en) * 2011-11-17 2013-05-23 Texas Instruments Incorporated Extending Radiation Tolerance By Localized Temperature Annealing Of Semiconductor Devices

Also Published As

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RU2040808C1 (en) 1995-07-25

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