RU2721153C1 - Детектирование рентгеновского излучения интерференционной картины в падающем рентгеновском излучении при фазово-контрастной и/или темнопольной рентгеновской визуализации - Google Patents
Детектирование рентгеновского излучения интерференционной картины в падающем рентгеновском излучении при фазово-контрастной и/или темнопольной рентгеновской визуализации Download PDFInfo
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- RU2721153C1 RU2721153C1 RU2019111467A RU2019111467A RU2721153C1 RU 2721153 C1 RU2721153 C1 RU 2721153C1 RU 2019111467 A RU2019111467 A RU 2019111467A RU 2019111467 A RU2019111467 A RU 2019111467A RU 2721153 C1 RU2721153 C1 RU 2721153C1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2008—Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20184—Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
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- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Radiology & Medical Imaging (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP17187475.3A EP3447538A1 (en) | 2017-08-23 | 2017-08-23 | X-ray detection |
| EP17187475.3 | 2017-08-23 | ||
| PCT/EP2018/071847 WO2019038113A1 (en) | 2017-08-23 | 2018-08-13 | X-RAY DETECTION OF A FRICTION OF X-RAY INCIDENCE FRAGMENTS IN PHASE CONTRAST X-RAY IMAGING AND / OR SUD BLACK BACKGROUND |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| RU2721153C1 true RU2721153C1 (ru) | 2020-05-18 |
Family
ID=59702559
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| RU2019111467A RU2721153C1 (ru) | 2017-08-23 | 2018-08-13 | Детектирование рентгеновского излучения интерференционной картины в падающем рентгеновском излучении при фазово-контрастной и/или темнопольной рентгеновской визуализации |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10539688B2 (enExample) |
| EP (2) | EP3447538A1 (enExample) |
| JP (1) | JP7221938B2 (enExample) |
| CN (1) | CN109863424B (enExample) |
| RU (1) | RU2721153C1 (enExample) |
| WO (1) | WO2019038113A1 (enExample) |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
| US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
| USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
| WO2019220410A1 (en) * | 2018-05-17 | 2019-11-21 | Institut National De La Recherche Scientifique (Inrs) | Method and system for sampling and denoising amplification of a signal |
| WO2019236384A1 (en) | 2018-06-04 | 2019-12-12 | Sigray, Inc. | Wavelength dispersive x-ray spectrometer |
| CN112470245B (zh) | 2018-07-26 | 2025-03-18 | 斯格瑞公司 | 高亮度x射线反射源 |
| US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
| WO2020051061A1 (en) | 2018-09-04 | 2020-03-12 | Sigray, Inc. | System and method for x-ray fluorescence with filtering |
| US11056308B2 (en) | 2018-09-07 | 2021-07-06 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
| EP3754382B1 (en) * | 2019-06-17 | 2023-10-25 | Detection Technology Oyj | Radiation detector and method for manufacturing thereof |
| DE112020004169T5 (de) | 2019-09-03 | 2022-05-25 | Sigray, Inc. | System und verfahren zur computergestützten laminografieröntgenfluoreszenz-bildgebung |
| US12379331B2 (en) | 2019-09-06 | 2025-08-05 | The Board Of Trustees Of The Leland Stanford Junior University | Single shot analyzer grating for differential phase contrast X-ray imaging and computed tomography |
| US20210088682A1 (en) * | 2019-09-23 | 2021-03-25 | Sino Canada Health Engineering Research Institute (Hefei) Ltd. | Readout Board Muxing for PET Systems |
| EP3799787A1 (en) * | 2019-10-01 | 2021-04-07 | Koninklijke Philips N.V. | Detector for a dark-field; phase-contrast and attenuation interferometric imaging system |
| US11175243B1 (en) | 2020-02-06 | 2021-11-16 | Sigray, Inc. | X-ray dark-field in-line inspection for semiconductor samples |
| WO2021162947A1 (en) | 2020-02-10 | 2021-08-19 | Sigray, Inc. | X-ray mirror optics with multiple hyperboloidal / hyperbolic surface profiles |
| US11389124B2 (en) * | 2020-02-12 | 2022-07-19 | General Electric Company | X-ray phase contrast detector |
| US20230333215A1 (en) * | 2020-04-14 | 2023-10-19 | Technion Research & Development Foundation Ltd. | Device and method for generating image and distance information |
| CN115667896B (zh) | 2020-05-18 | 2024-06-21 | 斯格瑞公司 | 使用晶体分析器和多个检测元件的x射线吸收光谱的系统和方法 |
| WO2022051579A1 (en) * | 2020-09-03 | 2022-03-10 | The Research Foundation For The State University Of New York | System and method for crystal-to-channel coupling |
| US11549895B2 (en) | 2020-09-17 | 2023-01-10 | Sigray, Inc. | System and method using x-rays for depth-resolving metrology and analysis |
| US12480892B2 (en) | 2020-12-07 | 2025-11-25 | Sigray, Inc. | High throughput 3D x-ray imaging system using a transmission x-ray source |
| WO2022126071A1 (en) | 2020-12-07 | 2022-06-16 | Sigray, Inc. | High throughput 3d x-ray imaging system using a transmission x-ray source |
| JP7403517B2 (ja) * | 2021-10-13 | 2023-12-22 | 日本電子株式会社 | 放射線検出装置および試料分析装置 |
| CN114325805A (zh) * | 2021-12-14 | 2022-04-12 | 无锡通透光电科技有限公司 | 辐射成像探测器及其通道压缩电路、通道压缩方法 |
| US12360067B2 (en) | 2022-03-02 | 2025-07-15 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
| US11860319B2 (en) * | 2022-03-10 | 2024-01-02 | GE Precision Healthcare LLC | High-resolution detector having a reduced number of pixels |
| WO2023177981A1 (en) | 2022-03-15 | 2023-09-21 | Sigray, Inc. | System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector |
| WO2023215204A1 (en) | 2022-05-02 | 2023-11-09 | Sigray, Inc. | X-ray sequential array wavelength dispersive spectrometer |
| WO2024124159A1 (en) * | 2022-12-08 | 2024-06-13 | Schlumberger Technology Corporation | Downhole tools that include a radiation detector and processes for using same |
| US20240272313A1 (en) * | 2023-02-15 | 2024-08-15 | Innocare Optoelectronics Corporation | Electronic device |
| US12209977B2 (en) | 2023-02-16 | 2025-01-28 | Sigray, Inc. | X-ray detector system with at least two stacked flat Bragg diffractors |
| US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
| CN116879326B (zh) * | 2023-09-07 | 2023-12-19 | 浙江大学杭州国际科创中心 | 基于多频条纹的x射线光学相衬成像系统及方法 |
| US12429437B2 (en) | 2023-11-07 | 2025-09-30 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes |
| US12429436B2 (en) | 2024-01-08 | 2025-09-30 | Sigray, Inc. | X-ray analysis system with focused x-ray beam and non-x-ray microscope |
| US12431256B2 (en) | 2024-02-15 | 2025-09-30 | Sigray, Inc. | System and method for generating a focused x-ray beam |
| CN118799868B (zh) * | 2024-06-17 | 2025-03-11 | 沈阳工业大学 | 一种光栅莫尔条纹智能细分方法 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011096584A1 (en) * | 2010-02-04 | 2011-08-11 | Fujifilm Corporation | Radiation imaging system |
| US20120183124A1 (en) * | 2011-01-17 | 2012-07-19 | Fujifilm Corporation | Grid for radiography, radiation image detector, radiation imaging system, and method for manufacturing grid |
| RU2584247C2 (ru) * | 2011-02-01 | 2016-05-20 | Конинклейке Филипс Электроникс Н.В. | Формирование дифференциальных фазово-контрастных изображений с пластинами фокусирующих структур преломления |
| WO2017013153A1 (en) * | 2015-07-21 | 2017-01-26 | Koninklijke Philips N.V. | X-ray detector for phase contrast and/or dark-field imaging |
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| DE102006037281A1 (de) * | 2006-02-01 | 2007-08-09 | Siemens Ag | Röntgenoptisches Durchstrahlungsgitter einer Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen von einem Untersuchungsobjekt |
| DE102006037256B4 (de) * | 2006-02-01 | 2017-03-30 | Paul Scherer Institut | Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen sowie Röntgensystem, Röntgen-C-Bogen-System und Röntgen-CT-System |
| DE102006017291B4 (de) * | 2006-02-01 | 2017-05-24 | Paul Scherer Institut | Fokus/Detektor-System einer Röntgenapparatur zur Erzeugung von Phasenkontrastaufnahmen, Röntgensystem mit einem solchen Fokus/Detektor-System sowie zugehöriges Speichermedium und Verfahren |
| JP5844545B2 (ja) * | 2010-05-31 | 2016-01-20 | 富士フイルム株式会社 | 放射線撮影装置 |
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| JP6353361B2 (ja) * | 2011-07-04 | 2018-07-04 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | 位相コントラストイメージング装置 |
| DE102011082878A1 (de) * | 2011-09-16 | 2013-03-21 | Siemens Aktiengesellschaft | Röntgendetektor einer gitterbasierten Phasenkontrast-Röntgenvorrichtung und Verfahren zum Betreiben einer gitterbasierten Phasenkontrast-Röntgenvorrichtung |
| DE102012217286A1 (de) | 2012-09-25 | 2014-03-27 | Siemens Aktiengesellschaft | Strahlungsdetektor |
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| CN104869905B (zh) * | 2012-12-21 | 2019-08-06 | 卡尔斯特里姆保健公司 | 基于微分相衬成像的医疗放射照相光栅 |
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| CN106404809A (zh) * | 2016-07-27 | 2017-02-15 | 中国科学技术大学 | 一种用于x射线光栅相衬成像装置的图像校正方法 |
-
2017
- 2017-08-23 EP EP17187475.3A patent/EP3447538A1/en not_active Withdrawn
-
2018
- 2018-08-03 US US16/335,819 patent/US10539688B2/en not_active Expired - Fee Related
- 2018-08-13 CN CN201880003957.8A patent/CN109863424B/zh not_active Expired - Fee Related
- 2018-08-13 JP JP2020510552A patent/JP7221938B2/ja active Active
- 2018-08-13 EP EP18750229.9A patent/EP3494415B1/en active Active
- 2018-08-13 RU RU2019111467A patent/RU2721153C1/ru active
- 2018-08-13 WO PCT/EP2018/071847 patent/WO2019038113A1/en not_active Ceased
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011096584A1 (en) * | 2010-02-04 | 2011-08-11 | Fujifilm Corporation | Radiation imaging system |
| US20120183124A1 (en) * | 2011-01-17 | 2012-07-19 | Fujifilm Corporation | Grid for radiography, radiation image detector, radiation imaging system, and method for manufacturing grid |
| RU2584247C2 (ru) * | 2011-02-01 | 2016-05-20 | Конинклейке Филипс Электроникс Н.В. | Формирование дифференциальных фазово-контрастных изображений с пластинами фокусирующих структур преломления |
| WO2017013153A1 (en) * | 2015-07-21 | 2017-01-26 | Koninklijke Philips N.V. | X-ray detector for phase contrast and/or dark-field imaging |
Also Published As
| Publication number | Publication date |
|---|---|
| EP3447538A1 (en) | 2019-02-27 |
| JP7221938B2 (ja) | 2023-02-14 |
| JP2020531825A (ja) | 2020-11-05 |
| CN109863424A (zh) | 2019-06-07 |
| CN109863424B (zh) | 2020-05-12 |
| WO2019038113A1 (en) | 2019-02-28 |
| US20190219713A1 (en) | 2019-07-18 |
| EP3494415A1 (en) | 2019-06-12 |
| EP3494415B1 (en) | 2019-10-23 |
| US10539688B2 (en) | 2020-01-21 |
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