CN109863424B - 对相衬x射线成像和/或暗场x射线成像中的x射线入射条纹图样的x射线探测 - Google Patents

对相衬x射线成像和/或暗场x射线成像中的x射线入射条纹图样的x射线探测 Download PDF

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Publication number
CN109863424B
CN109863424B CN201880003957.8A CN201880003957A CN109863424B CN 109863424 B CN109863424 B CN 109863424B CN 201880003957 A CN201880003957 A CN 201880003957A CN 109863424 B CN109863424 B CN 109863424B
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ray
optical
sub
detector
scintillator
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CN109863424A (zh
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R·斯特德曼布克
E·勒斯尔
W·吕腾
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2008—Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20184—Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors

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  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201880003957.8A 2017-08-23 2018-08-13 对相衬x射线成像和/或暗场x射线成像中的x射线入射条纹图样的x射线探测 Expired - Fee Related CN109863424B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP17187475.3A EP3447538A1 (en) 2017-08-23 2017-08-23 X-ray detection
EP17187475.3 2017-08-23
PCT/EP2018/071847 WO2019038113A1 (en) 2017-08-23 2018-08-13 X-RAY DETECTION OF A FRICTION OF X-RAY INCIDENCE FRAGMENTS IN PHASE CONTRAST X-RAY IMAGING AND / OR SUD BLACK BACKGROUND

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CN109863424A CN109863424A (zh) 2019-06-07
CN109863424B true CN109863424B (zh) 2020-05-12

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US (1) US10539688B2 (enExample)
EP (2) EP3447538A1 (enExample)
JP (1) JP7221938B2 (enExample)
CN (1) CN109863424B (enExample)
RU (1) RU2721153C1 (enExample)
WO (1) WO2019038113A1 (enExample)

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CN114729907B (zh) 2019-09-03 2023-05-23 斯格瑞公司 用于计算机层析x射线荧光成像的系统和方法
US12379331B2 (en) 2019-09-06 2025-08-05 The Board Of Trustees Of The Leland Stanford Junior University Single shot analyzer grating for differential phase contrast X-ray imaging and computed tomography
US20210088682A1 (en) * 2019-09-23 2021-03-25 Sino Canada Health Engineering Research Institute (Hefei) Ltd. Readout Board Muxing for PET Systems
EP3799787A1 (en) * 2019-10-01 2021-04-07 Koninklijke Philips N.V. Detector for a dark-field; phase-contrast and attenuation interferometric imaging system
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
US11217357B2 (en) 2020-02-10 2022-01-04 Sigray, Inc. X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles
US11389124B2 (en) * 2020-02-12 2022-07-19 General Electric Company X-ray phase contrast detector
US20230333215A1 (en) * 2020-04-14 2023-10-19 Technion Research & Development Foundation Ltd. Device and method for generating image and distance information
CN115667896B (zh) 2020-05-18 2024-06-21 斯格瑞公司 使用晶体分析器和多个检测元件的x射线吸收光谱的系统和方法
JP2023542627A (ja) * 2020-09-03 2023-10-11 ザ・リサーチ・ファウンデーション・フォー・ザ・ステイト・ユニヴァーシティ・オブ・ニューヨーク 結晶とチャネルの結合のためのシステムおよび方法
DE112021004828T5 (de) 2020-09-17 2023-08-03 Sigray, Inc. System und verfahren unter verwendung von röntgenstrahlen für tiefenauflösende messtechnik und analyse
JP7626856B2 (ja) 2020-12-07 2025-02-04 シグレイ、インコーポレイテッド 透過ｘ線源を用いた高スループット３ｄ ｘ線撮像システム
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
JP7403517B2 (ja) * 2021-10-13 2023-12-22 日本電子株式会社 放射線検出装置および試料分析装置
CN114325805A (zh) * 2021-12-14 2022-04-12 无锡通透光电科技有限公司 辐射成像探测器及其通道压缩电路、通道压缩方法
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
US11860319B2 (en) * 2022-03-10 2024-01-02 GE Precision Healthcare LLC High-resolution detector having a reduced number of pixels
US11992350B2 (en) 2022-03-15 2024-05-28 Sigray, Inc. System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
DE112023002079T5 (de) 2022-05-02 2025-02-27 Sigray, Inc. Sequenzielles wellenlängendispersives röntgenspektrometer
WO2024124159A1 (en) * 2022-12-08 2024-06-13 Schlumberger Technology Corporation Downhole tools that include a radiation detector and processes for using same
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CN116879326B (zh) * 2023-09-07 2023-12-19 浙江大学杭州国际科创中心 基于多频条纹的x射线光学相衬成像系统及方法
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Also Published As

Publication number Publication date
WO2019038113A1 (en) 2019-02-28
JP2020531825A (ja) 2020-11-05
US20190219713A1 (en) 2019-07-18
CN109863424A (zh) 2019-06-07
EP3494415B1 (en) 2019-10-23
RU2721153C1 (ru) 2020-05-18
US10539688B2 (en) 2020-01-21
JP7221938B2 (ja) 2023-02-14
EP3447538A1 (en) 2019-02-27
EP3494415A1 (en) 2019-06-12

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