JP7221938B2 - 位相コントラスト及び／又は暗視野ｘ線イメージングにおけるｘ線入射干渉縞パターンのｘ線検出 - Google Patents
位相コントラスト及び／又は暗視野ｘ線イメージングにおけるｘ線入射干渉縞パターンのｘ線検出 Download PDFInfo
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- JP7221938B2 JP7221938B2 JP2020510552A JP2020510552A JP7221938B2 JP 7221938 B2 JP7221938 B2 JP 7221938B2 JP 2020510552 A JP2020510552 A JP 2020510552A JP 2020510552 A JP2020510552 A JP 2020510552A JP 7221938 B2 JP7221938 B2 JP 7221938B2
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- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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Applications Claiming Priority (3)
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|---|---|---|---|
| EP17187475.3A EP3447538A1 (en) | 2017-08-23 | 2017-08-23 | X-ray detection |
| EP17187475.3 | 2017-08-23 | ||
| PCT/EP2018/071847 WO2019038113A1 (en) | 2017-08-23 | 2018-08-13 | X-RAY DETECTION OF A FRICTION OF X-RAY INCIDENCE FRAGMENTS IN PHASE CONTRAST X-RAY IMAGING AND / OR SUD BLACK BACKGROUND |
Publications (3)
| Publication Number | Publication Date |
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| JP2020531825A JP2020531825A (ja) | 2020-11-05 |
| JP2020531825A5 JP2020531825A5 (enExample) | 2021-09-24 |
| JP7221938B2 true JP7221938B2 (ja) | 2023-02-14 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
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| JP2020510552A Active JP7221938B2 (ja) | 2017-08-23 | 2018-08-13 | 位相コントラスト及び／又は暗視野ｘ線イメージングにおけるｘ線入射干渉縞パターンのｘ線検出 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10539688B2 (enExample) |
| EP (2) | EP3447538A1 (enExample) |
| JP (1) | JP7221938B2 (enExample) |
| CN (1) | CN109863424B (enExample) |
| RU (1) | RU2721153C1 (enExample) |
| WO (1) | WO2019038113A1 (enExample) |
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| US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
| US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
| USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
| WO2019220410A1 (en) * | 2018-05-17 | 2019-11-21 | Institut National De La Recherche Scientifique (Inrs) | Method and system for sampling and denoising amplification of a signal |
| WO2019236384A1 (en) | 2018-06-04 | 2019-12-12 | Sigray, Inc. | Wavelength dispersive x-ray spectrometer |
| CN112470245B (zh) | 2018-07-26 | 2025-03-18 | 斯格瑞公司 | 高亮度x射线反射源 |
| US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
| WO2020051061A1 (en) | 2018-09-04 | 2020-03-12 | Sigray, Inc. | System and method for x-ray fluorescence with filtering |
| US11056308B2 (en) | 2018-09-07 | 2021-07-06 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
| EP3754382B1 (en) * | 2019-06-17 | 2023-10-25 | Detection Technology Oyj | Radiation detector and method for manufacturing thereof |
| DE112020004169T5 (de) | 2019-09-03 | 2022-05-25 | Sigray, Inc. | System und verfahren zur computergestützten laminografieröntgenfluoreszenz-bildgebung |
| US12379331B2 (en) | 2019-09-06 | 2025-08-05 | The Board Of Trustees Of The Leland Stanford Junior University | Single shot analyzer grating for differential phase contrast X-ray imaging and computed tomography |
| US20210088682A1 (en) * | 2019-09-23 | 2021-03-25 | Sino Canada Health Engineering Research Institute (Hefei) Ltd. | Readout Board Muxing for PET Systems |
| EP3799787A1 (en) * | 2019-10-01 | 2021-04-07 | Koninklijke Philips N.V. | Detector for a dark-field; phase-contrast and attenuation interferometric imaging system |
| US11175243B1 (en) | 2020-02-06 | 2021-11-16 | Sigray, Inc. | X-ray dark-field in-line inspection for semiconductor samples |
| WO2021162947A1 (en) | 2020-02-10 | 2021-08-19 | Sigray, Inc. | X-ray mirror optics with multiple hyperboloidal / hyperbolic surface profiles |
| US11389124B2 (en) * | 2020-02-12 | 2022-07-19 | General Electric Company | X-ray phase contrast detector |
| US20230333215A1 (en) * | 2020-04-14 | 2023-10-19 | Technion Research & Development Foundation Ltd. | Device and method for generating image and distance information |
| CN115667896B (zh) | 2020-05-18 | 2024-06-21 | 斯格瑞公司 | 使用晶体分析器和多个检测元件的x射线吸收光谱的系统和方法 |
| WO2022051579A1 (en) * | 2020-09-03 | 2022-03-10 | The Research Foundation For The State University Of New York | System and method for crystal-to-channel coupling |
| US11549895B2 (en) | 2020-09-17 | 2023-01-10 | Sigray, Inc. | System and method using x-rays for depth-resolving metrology and analysis |
| US12480892B2 (en) | 2020-12-07 | 2025-11-25 | Sigray, Inc. | High throughput 3D x-ray imaging system using a transmission x-ray source |
| WO2022126071A1 (en) | 2020-12-07 | 2022-06-16 | Sigray, Inc. | High throughput 3d x-ray imaging system using a transmission x-ray source |
| JP7403517B2 (ja) * | 2021-10-13 | 2023-12-22 | 日本電子株式会社 | 放射線検出装置および試料分析装置 |
| CN114325805A (zh) * | 2021-12-14 | 2022-04-12 | 无锡通透光电科技有限公司 | 辐射成像探测器及其通道压缩电路、通道压缩方法 |
| US12360067B2 (en) | 2022-03-02 | 2025-07-15 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
| US11860319B2 (en) * | 2022-03-10 | 2024-01-02 | GE Precision Healthcare LLC | High-resolution detector having a reduced number of pixels |
| WO2023177981A1 (en) | 2022-03-15 | 2023-09-21 | Sigray, Inc. | System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector |
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| WO2024124159A1 (en) * | 2022-12-08 | 2024-06-13 | Schlumberger Technology Corporation | Downhole tools that include a radiation detector and processes for using same |
| US20240272313A1 (en) * | 2023-02-15 | 2024-08-15 | Innocare Optoelectronics Corporation | Electronic device |
| US12209977B2 (en) | 2023-02-16 | 2025-01-28 | Sigray, Inc. | X-ray detector system with at least two stacked flat Bragg diffractors |
| US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
| CN116879326B (zh) * | 2023-09-07 | 2023-12-19 | 浙江大学杭州国际科创中心 | 基于多频条纹的x射线光学相衬成像系统及方法 |
| US12429437B2 (en) | 2023-11-07 | 2025-09-30 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes |
| US12429436B2 (en) | 2024-01-08 | 2025-09-30 | Sigray, Inc. | X-ray analysis system with focused x-ray beam and non-x-ray microscope |
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| CN118799868B (zh) * | 2024-06-17 | 2025-03-11 | 沈阳工业大学 | 一种光栅莫尔条纹智能细分方法 |
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| JP2014121607A (ja) | 2012-12-21 | 2014-07-03 | Siemens Aktiengesellschaft | 位相ステッピングによる検査対象の微分位相コントラストイメージングのためのｘ線撮影システムならびにアンギオグラフィ検査方法 |
| JP2014518112A (ja) | 2011-07-04 | 2014-07-28 | コーニンクレッカ フィリップス エヌ ヴェ | 位相コントラストイメージング装置 |
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| DE102006037281A1 (de) * | 2006-02-01 | 2007-08-09 | Siemens Ag | Röntgenoptisches Durchstrahlungsgitter einer Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen von einem Untersuchungsobjekt |
| DE102006037256B4 (de) * | 2006-02-01 | 2017-03-30 | Paul Scherer Institut | Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen sowie Röntgensystem, Röntgen-C-Bogen-System und Röntgen-CT-System |
| DE102006017291B4 (de) * | 2006-02-01 | 2017-05-24 | Paul Scherer Institut | Fokus/Detektor-System einer Röntgenapparatur zur Erzeugung von Phasenkontrastaufnahmen, Röntgensystem mit einem solchen Fokus/Detektor-System sowie zugehöriges Speichermedium und Verfahren |
| JP5702586B2 (ja) * | 2010-02-04 | 2015-04-15 | 富士フイルム株式会社 | 放射線撮影システム |
| JP5844545B2 (ja) * | 2010-05-31 | 2016-01-20 | 富士フイルム株式会社 | 放射線撮影装置 |
| EP2633813B1 (en) * | 2010-10-29 | 2015-02-25 | FUJIFILM Corporation | Phase contrast radiation imaging device |
| JP2012150144A (ja) * | 2011-01-17 | 2012-08-09 | Fujifilm Corp | 放射線画像撮影用グリッド、放射線画像検出器、放射線画像撮影システム及び放射線画像撮影用グリッドの製造方法。 |
| CN103460301B (zh) * | 2011-02-01 | 2017-08-11 | 皇家飞利浦电子股份有限公司 | 具有聚焦偏转结构板的微分相位对比成像 |
| DE102011082878A1 (de) * | 2011-09-16 | 2013-03-21 | Siemens Aktiengesellschaft | Röntgendetektor einer gitterbasierten Phasenkontrast-Röntgenvorrichtung und Verfahren zum Betreiben einer gitterbasierten Phasenkontrast-Röntgenvorrichtung |
| DE102012217286A1 (de) | 2012-09-25 | 2014-03-27 | Siemens Aktiengesellschaft | Strahlungsdetektor |
| US9357975B2 (en) * | 2013-12-30 | 2016-06-07 | Carestream Health, Inc. | Large FOV phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques |
| CN104869905B (zh) * | 2012-12-21 | 2019-08-06 | 卡尔斯特里姆保健公司 | 基于微分相衬成像的医疗放射照相光栅 |
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| EP3143384B1 (en) * | 2014-05-15 | 2020-03-04 | Sigray Inc. | X-ray system and method for measurement, characterization, and analysis of periodic structures |
| JP6581713B2 (ja) * | 2015-07-21 | 2019-09-25 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | 位相コントラスト及び／又は暗視野撮像のためのｘ線検出器、該ｘ線検出器を有する干渉計、ｘ線撮像システム、位相コントラストｘ線撮像及び／又は暗視野ｘ線撮像を行う方法、コンピュータプログラム、コンピュータ読取可能な媒体 |
| CN106404809A (zh) * | 2016-07-27 | 2017-02-15 | 中国科学技术大学 | 一种用于x射线光栅相衬成像装置的图像校正方法 |
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2017
- 2017-08-23 EP EP17187475.3A patent/EP3447538A1/en not_active Withdrawn
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2018
- 2018-08-03 US US16/335,819 patent/US10539688B2/en not_active Expired - Fee Related
- 2018-08-13 CN CN201880003957.8A patent/CN109863424B/zh not_active Expired - Fee Related
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- 2018-08-13 EP EP18750229.9A patent/EP3494415B1/en active Active
- 2018-08-13 RU RU2019111467A patent/RU2721153C1/ru active
- 2018-08-13 WO PCT/EP2018/071847 patent/WO2019038113A1/en not_active Ceased
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014518112A (ja) | 2011-07-04 | 2014-07-28 | コーニンクレッカ フィリップス エヌ ヴェ | 位相コントラストイメージング装置 |
| JP2014121607A (ja) | 2012-12-21 | 2014-07-03 | Siemens Aktiengesellschaft | 位相ステッピングによる検査対象の微分位相コントラストイメージングのためのｘ線撮影システムならびにアンギオグラフィ検査方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP3447538A1 (en) | 2019-02-27 |
| RU2721153C1 (ru) | 2020-05-18 |
| JP2020531825A (ja) | 2020-11-05 |
| CN109863424A (zh) | 2019-06-07 |
| CN109863424B (zh) | 2020-05-12 |
| WO2019038113A1 (en) | 2019-02-28 |
| US20190219713A1 (en) | 2019-07-18 |
| EP3494415A1 (en) | 2019-06-12 |
| EP3494415B1 (en) | 2019-10-23 |
| US10539688B2 (en) | 2020-01-21 |
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