PT3249415T - Dispositivo de placa de ponto de teste para uma bancada de teste com deteção de defeitos - Google Patents

Dispositivo de placa de ponto de teste para uma bancada de teste com deteção de defeitos

Info

Publication number
PT3249415T
PT3249415T PT171693682T PT17169368T PT3249415T PT 3249415 T PT3249415 T PT 3249415T PT 171693682 T PT171693682 T PT 171693682T PT 17169368 T PT17169368 T PT 17169368T PT 3249415 T PT3249415 T PT 3249415T
Authority
PT
Portugal
Prior art keywords
test
card device
point card
fault finding
test point
Prior art date
Application number
PT171693682T
Other languages
English (en)
Original Assignee
Tsk Pruefsysteme Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tsk Pruefsysteme Gmbh filed Critical Tsk Pruefsysteme Gmbh
Publication of PT3249415T publication Critical patent/PT3249415T/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
    • G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
PT171693682T 2016-05-26 2017-05-04 Dispositivo de placa de ponto de teste para uma bancada de teste com deteção de defeitos PT3249415T (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102016109741.1A DE102016109741B4 (de) 2016-05-26 2016-05-26 Testpunktkarten-Einrichtung für einen Prüftisch

Publications (1)

Publication Number Publication Date
PT3249415T true PT3249415T (pt) 2022-03-01

Family

ID=58701416

Family Applications (1)

Application Number Title Priority Date Filing Date
PT171693682T PT3249415T (pt) 2016-05-26 2017-05-04 Dispositivo de placa de ponto de teste para uma bancada de teste com deteção de defeitos

Country Status (9)

Country Link
EP (1) EP3249415B1 (pt)
CN (1) CN107436395B (pt)
DE (1) DE102016109741B4 (pt)
ES (1) ES2907930T3 (pt)
HU (1) HUE058094T2 (pt)
MX (1) MX2017006876A (pt)
PL (1) PL3249415T3 (pt)
PT (1) PT3249415T (pt)
RS (1) RS62965B1 (pt)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020119889A1 (de) * 2018-12-11 2020-06-18 Lisa Dräxlmaier GmbH Kontaktierungssystem und prüfvorrichtung mit flexiblem steckeradapter sowie entsprechendes prüfverfahren
DE102021107121A1 (de) 2021-03-23 2022-09-29 Md Elektronik Gmbh Kabeltester
DE102021132297A1 (de) * 2021-12-08 2023-06-15 Lisa Dräxlmaier GmbH Adapter und schienenanordnung zur prüfung von elektrischen komponenten und positionierung von adaptern auf einer schienenanordnung
CN114325488B (zh) * 2021-12-29 2024-03-12 北京朝阳隆华电线电缆有限公司 一种线束故障检验台以及线束故障检测方法
DE102022110739B3 (de) * 2022-05-02 2023-09-07 Lisa Dräxlmaier GmbH Palette für einen leitungssatzautomat und verfahren zum herstellen eines leitungssatzes
EP4336201A1 (de) * 2022-09-08 2024-03-13 ESPI Logistics GmbH Vereinfachter prüfaufbau bei der kabelbaumprüfung

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE8713233U1 (pt) * 1987-10-01 1988-02-11 Lutzke, Werner, 8900 Augsburg, De
JPH05297025A (ja) * 1992-04-16 1993-11-12 Mitsubishi Heavy Ind Ltd 電子機器トラブルシュート用計測装置
DE4436354A1 (de) * 1994-10-12 1996-04-25 Hanno Link Vorrichtung zum gleichzeitigen Prüfen einer Mehrzahl von elektrischen oder elektronischen Teilen
DE19500113C2 (de) * 1995-01-04 1996-03-28 Klaus Wurmhoeringer Kabeltestadapter
GB2315334A (en) * 1996-07-16 1998-01-28 Michael Patrick Creamer Circuit feed detector
JP3161351B2 (ja) * 1997-02-24 2001-04-25 住友電装株式会社 オートロック式導通検査ユニット
DE29920214U1 (de) * 1999-11-17 2000-01-20 Tsk Pruefsysteme Fuer Elektris Einrichtung zum Testen von mit Steckern versehenen Kabeln
DE10019860C1 (de) * 2000-04-18 2001-10-31 Wee Electrotest Engineering Gm Verfahren und Einrichtung zum Prüfen von Kabelbäumen
AU2001246540A1 (en) * 2000-04-18 2001-10-30 Wee Electrotest Engineering Gmbh Method and device for testing cable trees
CN103018647B (zh) * 2011-09-27 2015-07-22 致茂电子(苏州)有限公司 多芯片的测试方法及其点测机
DE102011087152B4 (de) * 2011-11-25 2013-08-14 Digalog Industrie-Mikroelektronik Gmbh Testsystem und Testverfahren für Kabelbäume
CN203133118U (zh) * 2013-01-04 2013-08-14 航天科工防御技术研究试验中心 电连接器测试适配器

Also Published As

Publication number Publication date
EP3249415A1 (de) 2017-11-29
EP3249415B1 (de) 2021-12-01
MX2017006876A (es) 2018-08-28
DE102016109741B4 (de) 2017-12-21
PL3249415T3 (pl) 2022-03-28
CN107436395A (zh) 2017-12-05
RS62965B1 (sr) 2022-03-31
DE102016109741A1 (de) 2017-11-30
HUE058094T2 (hu) 2022-07-28
ES2907930T3 (es) 2022-04-27
CN107436395B (zh) 2021-09-07

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