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CA1266324A
(en)
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Image pick-up apparatus
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US3835247A
(en)
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Field illumination for image analysis
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KR100306826B1
(ko)
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이미지투사장치
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JPH0754684B2
(ja)
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電子顕微鏡
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JPH0830648B2
(ja)
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光学像コントラストを発生させる装置
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US4097740A
(en)
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Method and apparatus for focusing the objective lens of a scanning transmission-type corpuscular-beam microscope
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JPH0675568B2
(ja)
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内視鏡の光量制御装置
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JP4348455B2
(ja)
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撮像装置
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US4694186A
(en)
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System for photoelectric detection
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JP3153350B2
(ja)
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自動焦点合わせ機能を備えた電子顕微鏡
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USRE30099E
(en)
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Distance detecting device
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US3569699A
(en)
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A device for detecting crystallographic defects in semiconductor crystals
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US6078046A
(en)
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Apparatus for measuring electron beam intensity and electron microscope comprising the same
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JP2001227932A
(ja)
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マスク検査装置
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SU310431A1
(ru)
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Всесоюзная пат?нтн04ехнн4ешбиблиотека
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JPS6050936A
(ja)
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化合物半導体結晶の組成分布評価法
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SU1213550A1
(ru)
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Рентгеновский аппарат
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JP2730004B2
(ja)
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光源装置
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US3743396A
(en)
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Continuous film movement motion picture apparatus
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GB2175172A
(en)
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Video cameras
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SU1469401A1
(ru)
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|
Способ электронно-оптического исследовани дефектов кристаллов
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JPH03138841A
(ja)
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|
走査形電子顕微鏡
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JPS6233523B2
(enExample)
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SU279203A1
(ru)
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УСТРОЙСТВО дл ВОСПРОИЗВЕДЕНИЯ ИНФОРМАЦИИ
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JPS5914223B2
(ja)
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像表示装置
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