PL237446B1 - Urządzenie do pomiarów parametrów elementów fazowych i dyspersji światłowodów oraz sposób pomiaru parametrów elementu fazowego i dyspersji światłowodów - Google Patents

Urządzenie do pomiarów parametrów elementów fazowych i dyspersji światłowodów oraz sposób pomiaru parametrów elementu fazowego i dyspersji światłowodów Download PDF

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Publication number
PL237446B1
PL237446B1 PL414064A PL41406415A PL237446B1 PL 237446 B1 PL237446 B1 PL 237446B1 PL 414064 A PL414064 A PL 414064A PL 41406415 A PL41406415 A PL 41406415A PL 237446 B1 PL237446 B1 PL 237446B1
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PL
Poland
Prior art keywords
measuring
arm
coupler
collimator
optical fiber
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PL414064A
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English (en)
Polish (pl)
Other versions
PL414064A1 (pl
Inventor
Karol STĘPIEŃ
Karol Stępień
Michalina JÓŹWIK
Michalina Jóźwik
Marek NAPIERAŁA
Marek Napierała
Anna Katarzyna Mąkowska
Łukasz SZOSTKIEWICZ
Łukasz Szostkiewicz
Michał MURAWSKI
Michał Murawski
Stanisław LIPIŃSKI
Stanisław Lipiński
Zbigniew HOŁDYŃSKI
Zbigniew Hołdyński
Tomasz STAŃCZYK
Tomasz Stańczyk
Tomasz NASIŁOWSKI
Tomasz Nasiłowski
Original Assignee
Polskie Centrum Fotoniki I Swiatlowodow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=55085871&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=PL237446(B1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Polskie Centrum Fotoniki I Swiatlowodow filed Critical Polskie Centrum Fotoniki I Swiatlowodow
Priority to PL414064A priority Critical patent/PL237446B1/pl
Priority to KR1020187010232A priority patent/KR20180084745A/ko
Priority to EP15823404.7A priority patent/EP3423782B1/en
Priority to RU2018114296A priority patent/RU2713038C2/ru
Priority to PCT/PL2015/050065 priority patent/WO2017048141A1/en
Priority to CN201580084639.5A priority patent/CN108431544A/zh
Priority to US15/761,421 priority patent/US20200191551A1/en
Priority to JP2018513754A priority patent/JP2018534547A/ja
Priority to CA3000156A priority patent/CA3000156A1/en
Publication of PL414064A1 publication Critical patent/PL414064A1/pl
Priority to IL258173A priority patent/IL258173A/en
Priority to PH12018500611A priority patent/PH12018500611A1/en
Publication of PL237446B1 publication Critical patent/PL237446B1/pl

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02024—Measuring in transmission, i.e. light traverses the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
    • G01B9/02018—Multipass interferometers, e.g. double-pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062—Active error reduction, i.e. varying with time
    • G01B9/02064—Active error reduction, i.e. varying with time by particular adjustment of coherence gate, i.e. adjusting position of zero path difference in low coherence interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
    • G01B9/02072—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by calibration or testing of interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0271—Testing optical properties by measuring geometrical properties or aberrations by using interferometric methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/331—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by using interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/338—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring dispersion other than PMD, e.g. chromatic dispersion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Geometry (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
PL414064A 2015-09-18 2015-09-18 Urządzenie do pomiarów parametrów elementów fazowych i dyspersji światłowodów oraz sposób pomiaru parametrów elementu fazowego i dyspersji światłowodów PL237446B1 (pl)

Priority Applications (11)

Application Number Priority Date Filing Date Title
PL414064A PL237446B1 (pl) 2015-09-18 2015-09-18 Urządzenie do pomiarów parametrów elementów fazowych i dyspersji światłowodów oraz sposób pomiaru parametrów elementu fazowego i dyspersji światłowodów
CA3000156A CA3000156A1 (en) 2015-09-18 2015-11-30 Device for measuring the parameters of phase elements and optical fiber dispersion and a method of measuring the parameters of phase elements and optical fiber dispersion
PCT/PL2015/050065 WO2017048141A1 (en) 2015-09-18 2015-11-30 Device for measuring the parameters of phase elements and optical fiber dispersion and a method of measuring the parameters of phase elements and optical fiber dispersion
EP15823404.7A EP3423782B1 (en) 2015-09-18 2015-11-30 Device and method for measuring the parameters of phase elements
RU2018114296A RU2713038C2 (ru) 2015-09-18 2015-11-30 Устройство для измерения параметров фазовых элементов и дисперсии оптического волокна и способ измерения параметров фазовых элементов и дисперсии оптического волокна
KR1020187010232A KR20180084745A (ko) 2015-09-18 2015-11-30 위상 요소들의 파라미터들과 광섬유 분산을 측정하는 장치 및 위상 요소들의 파라미터들과 광섬유 분산을 측정하는 방법
CN201580084639.5A CN108431544A (zh) 2015-09-18 2015-11-30 用于测量相元件参数和光纤色散的设备及用于测量相元件参数和光纤色散的方法
US15/761,421 US20200191551A1 (en) 2015-09-18 2015-11-30 Device for measuring the parameters of phase elements and optical fiber dispersion and a method of measuring the parameters of phase elements and optical fiber dispersion
JP2018513754A JP2018534547A (ja) 2015-09-18 2015-11-30 位相素子のパラメータおよび光ファイバの分散を測定する装置および方法
IL258173A IL258173A (en) 2015-09-18 2018-03-15 Device for measuring the parameters of phase elements and optical fiber dispersion and a method of measuring the parameters of phase elements and optical fiber dispersion
PH12018500611A PH12018500611A1 (en) 2015-09-18 2018-03-21 Device for measuring the parameters of phase elements and optical fiber dispersion and a method of measuring the parameters of phase elements and optical fiber dispersion

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PL414064A PL237446B1 (pl) 2015-09-18 2015-09-18 Urządzenie do pomiarów parametrów elementów fazowych i dyspersji światłowodów oraz sposób pomiaru parametrów elementu fazowego i dyspersji światłowodów

Publications (2)

Publication Number Publication Date
PL414064A1 PL414064A1 (pl) 2017-03-27
PL237446B1 true PL237446B1 (pl) 2021-04-19

Family

ID=55085871

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PL414064A PL237446B1 (pl) 2015-09-18 2015-09-18 Urządzenie do pomiarów parametrów elementów fazowych i dyspersji światłowodów oraz sposób pomiaru parametrów elementu fazowego i dyspersji światłowodów

Country Status (11)

Country Link
US (1) US20200191551A1 (enExample)
EP (1) EP3423782B1 (enExample)
JP (1) JP2018534547A (enExample)
KR (1) KR20180084745A (enExample)
CN (1) CN108431544A (enExample)
CA (1) CA3000156A1 (enExample)
IL (1) IL258173A (enExample)
PH (1) PH12018500611A1 (enExample)
PL (1) PL237446B1 (enExample)
RU (1) RU2713038C2 (enExample)
WO (1) WO2017048141A1 (enExample)

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CN111901044B (zh) * 2019-11-28 2021-11-02 阳光学院 一种单光束相干光通信装置
CN111258081A (zh) * 2020-02-25 2020-06-09 中国科学院长春光学精密机械与物理研究所 一种基于光纤互联的光学系统装调方法及装置
CN113804405A (zh) * 2021-08-16 2021-12-17 广东工业大学 一种基于双耦合器环行光路结构的微量光纤色散测量装置
CN115035036B (zh) * 2022-05-09 2025-03-11 北京转转精神科技有限责任公司 一种屏幕检测方法以及装置
CN115727890A (zh) * 2022-11-18 2023-03-03 江苏科技大学 一种空间椭圆拟合修正零差对称解调误差的方法
US12442717B2 (en) * 2023-02-03 2025-10-14 Onto Innovation Inc. Interferometer with auxiliary lens for measurement of a transparent test object
CN118936337B (zh) * 2024-09-05 2025-11-14 天津大学 一种透明样品厚度和折射率测量系统及方法

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Also Published As

Publication number Publication date
CN108431544A (zh) 2018-08-21
PL414064A1 (pl) 2017-03-27
EP3423782A1 (en) 2019-01-09
WO2017048141A1 (en) 2017-03-23
KR20180084745A (ko) 2018-07-25
PH12018500611A1 (en) 2018-10-01
RU2018114296A (ru) 2019-10-18
JP2018534547A (ja) 2018-11-22
RU2713038C2 (ru) 2020-02-03
IL258173A (en) 2018-05-31
RU2018114296A3 (enExample) 2019-10-18
US20200191551A1 (en) 2020-06-18
CA3000156A1 (en) 2017-03-23
EP3423782B1 (en) 2022-01-26

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