KR20180084745A - 위상 요소들의 파라미터들과 광섬유 분산을 측정하는 장치 및 위상 요소들의 파라미터들과 광섬유 분산을 측정하는 방법 - Google Patents

위상 요소들의 파라미터들과 광섬유 분산을 측정하는 장치 및 위상 요소들의 파라미터들과 광섬유 분산을 측정하는 방법 Download PDF

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KR20180084745A
KR20180084745A KR1020187010232A KR20187010232A KR20180084745A KR 20180084745 A KR20180084745 A KR 20180084745A KR 1020187010232 A KR1020187010232 A KR 1020187010232A KR 20187010232 A KR20187010232 A KR 20187010232A KR 20180084745 A KR20180084745 A KR 20180084745A
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South Korea
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optical fiber
fiber coupler
collimator
directed
arm
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Korean (ko)
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카롤 스테피엔
미할리나 우즈비크
마렉 나피에르아
안나 지올로비츠
루카스 슈츠키비츠
미할 무라프스키
스타니슬라프 리핀스키
즈비그뉴 홀딘스키
토마스 스탄치크
토마스 나질로스키
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폴스키 센트룸 포토니키 아이 스위애틀로우도우
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
    • G01B9/02018—Multipass interferometers, e.g. double-pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02024—Measuring in transmission, i.e. light traverses the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062—Active error reduction, i.e. varying with time
    • G01B9/02064—Active error reduction, i.e. varying with time by particular adjustment of coherence gate, i.e. adjusting position of zero path difference in low coherence interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
    • G01B9/02072—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by calibration or testing of interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0271—Testing optical properties by measuring geometrical properties or aberrations by using interferometric methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/331—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by using interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/338—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring dispersion other than PMD, e.g. chromatic dispersion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Geometry (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
KR1020187010232A 2015-09-18 2015-11-30 위상 요소들의 파라미터들과 광섬유 분산을 측정하는 장치 및 위상 요소들의 파라미터들과 광섬유 분산을 측정하는 방법 Withdrawn KR20180084745A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
PLP.414064 2015-09-18
PL414064A PL237446B1 (pl) 2015-09-18 2015-09-18 Urządzenie do pomiarów parametrów elementów fazowych i dyspersji światłowodów oraz sposób pomiaru parametrów elementu fazowego i dyspersji światłowodów
PCT/PL2015/050065 WO2017048141A1 (en) 2015-09-18 2015-11-30 Device for measuring the parameters of phase elements and optical fiber dispersion and a method of measuring the parameters of phase elements and optical fiber dispersion

Publications (1)

Publication Number Publication Date
KR20180084745A true KR20180084745A (ko) 2018-07-25

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ID=55085871

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KR1020187010232A Withdrawn KR20180084745A (ko) 2015-09-18 2015-11-30 위상 요소들의 파라미터들과 광섬유 분산을 측정하는 장치 및 위상 요소들의 파라미터들과 광섬유 분산을 측정하는 방법

Country Status (11)

Country Link
US (1) US20200191551A1 (enExample)
EP (1) EP3423782B1 (enExample)
JP (1) JP2018534547A (enExample)
KR (1) KR20180084745A (enExample)
CN (1) CN108431544A (enExample)
CA (1) CA3000156A1 (enExample)
IL (1) IL258173A (enExample)
PH (1) PH12018500611A1 (enExample)
PL (1) PL237446B1 (enExample)
RU (1) RU2713038C2 (enExample)
WO (1) WO2017048141A1 (enExample)

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CN111901044B (zh) * 2019-11-28 2021-11-02 阳光学院 一种单光束相干光通信装置
CN111258081A (zh) * 2020-02-25 2020-06-09 中国科学院长春光学精密机械与物理研究所 一种基于光纤互联的光学系统装调方法及装置
CN113804405A (zh) * 2021-08-16 2021-12-17 广东工业大学 一种基于双耦合器环行光路结构的微量光纤色散测量装置
CN115035036B (zh) * 2022-05-09 2025-03-11 北京转转精神科技有限责任公司 一种屏幕检测方法以及装置
CN115727890A (zh) * 2022-11-18 2023-03-03 江苏科技大学 一种空间椭圆拟合修正零差对称解调误差的方法
US12442717B2 (en) * 2023-02-03 2025-10-14 Onto Innovation Inc. Interferometer with auxiliary lens for measurement of a transparent test object
CN118936337B (zh) * 2024-09-05 2025-11-14 天津大学 一种透明样品厚度和折射率测量系统及方法

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JPS5724836A (en) * 1980-07-22 1982-02-09 Nippon Telegr & Teleph Corp <Ntt> Measurement of group delay time difference by mode groups for multimode optical fiber scope
US4799789A (en) 1987-02-27 1989-01-24 Anritsu Corporation Chromatic dispersion measuring system for optical fibers
JPH05107150A (ja) * 1991-10-14 1993-04-27 Mitsubishi Cable Ind Ltd 高分散光フアイバの分散測定方法
TW275570B (enExample) * 1994-05-05 1996-05-11 Boehringer Mannheim Gmbh
JP2004029076A (ja) * 2002-06-21 2004-01-29 Canon Inc 波面発生装置、該装置を組み込んだ面形状測定装置、焦点駆動装置
RU2247938C1 (ru) * 2003-05-27 2005-03-10 Геликонов Валентин Михайлович Оптическое устройство для исследования объекта
US7433027B2 (en) 2004-12-22 2008-10-07 Novartis Ag Apparatus and method for detecting lens thickness
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US20070002331A1 (en) 2005-06-30 2007-01-04 Hall William J In line thickness measurement
US20080001320A1 (en) * 2006-06-28 2008-01-03 Knox Wayne H Optical Material and Method for Modifying the Refractive Index
JP5156291B2 (ja) * 2007-07-31 2013-03-06 浜松ホトニクス株式会社 フローセル中を流れるサンプルの光学的特性計測装置
US7787127B2 (en) * 2007-10-15 2010-08-31 Michael Galle System and method to determine chromatic dispersion in short lengths of waveguides using a common path interferometer
KR101000974B1 (ko) * 2008-12-01 2010-12-13 인하대학교 산학협력단 간섭무늬 측정시스템을 이용한 광도파로샘플의 색분산 특성측정방법
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Also Published As

Publication number Publication date
CN108431544A (zh) 2018-08-21
PL414064A1 (pl) 2017-03-27
EP3423782A1 (en) 2019-01-09
WO2017048141A1 (en) 2017-03-23
PH12018500611A1 (en) 2018-10-01
RU2018114296A (ru) 2019-10-18
PL237446B1 (pl) 2021-04-19
JP2018534547A (ja) 2018-11-22
RU2713038C2 (ru) 2020-02-03
IL258173A (en) 2018-05-31
RU2018114296A3 (enExample) 2019-10-18
US20200191551A1 (en) 2020-06-18
CA3000156A1 (en) 2017-03-23
EP3423782B1 (en) 2022-01-26

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Patent event date: 20180411

Patent event code: PA01051R01D

Comment text: International Patent Application

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