CA3000156A1 - Device for measuring the parameters of phase elements and optical fiber dispersion and a method of measuring the parameters of phase elements and optical fiber dispersion - Google Patents
Device for measuring the parameters of phase elements and optical fiber dispersion and a method of measuring the parameters of phase elements and optical fiber dispersion Download PDFInfo
- Publication number
- CA3000156A1 CA3000156A1 CA3000156A CA3000156A CA3000156A1 CA 3000156 A1 CA3000156 A1 CA 3000156A1 CA 3000156 A CA3000156 A CA 3000156A CA 3000156 A CA3000156 A CA 3000156A CA 3000156 A1 CA3000156 A1 CA 3000156A1
- Authority
- CA
- Canada
- Prior art keywords
- fiber optic
- optic coupler
- collimator
- directed
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 239000013307 optical fiber Substances 0.000 title claims abstract description 199
- 239000006185 dispersion Substances 0.000 title claims abstract description 67
- 238000000034 method Methods 0.000 title claims abstract description 56
- 239000000835 fiber Substances 0.000 claims abstract description 253
- 238000005259 measurement Methods 0.000 claims abstract description 219
- 230000003287 optical effect Effects 0.000 claims abstract description 28
- 230000001427 coherent effect Effects 0.000 claims description 22
- 230000008878 coupling Effects 0.000 claims description 3
- 238000010168 coupling process Methods 0.000 claims description 3
- 238000005859 coupling reaction Methods 0.000 claims description 3
- 230000001105 regulatory effect Effects 0.000 claims description 2
- 230000003595 spectral effect Effects 0.000 claims description 2
- 239000011521 glass Substances 0.000 abstract description 8
- 230000009286 beneficial effect Effects 0.000 description 19
- 230000000694 effects Effects 0.000 description 6
- 238000005305 interferometry Methods 0.000 description 6
- 238000000691 measurement method Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 238000005102 attenuated total reflection Methods 0.000 description 2
- 238000004422 calculation algorithm Methods 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 101100117236 Drosophila melanogaster speck gene Proteins 0.000 description 1
- 238000004566 IR spectroscopy Methods 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000013480 data collection Methods 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000002612 dispersion medium Substances 0.000 description 1
- 238000010410 dusting Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000011545 laboratory measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
- G01B9/02018—Multipass interferometers, e.g. double-pass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02024—Measuring in transmission, i.e. light traverses the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02062—Active error reduction, i.e. varying with time
- G01B9/02064—Active error reduction, i.e. varying with time by particular adjustment of coherence gate, i.e. adjusting position of zero path difference in low coherence interferometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
- G01B9/02072—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by calibration or testing of interferometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0271—Testing optical properties by measuring geometrical properties or aberrations by using interferometric methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
- G01M11/331—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by using interferometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
- G01M11/338—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring dispersion other than PMD, e.g. chromatic dispersion
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Optics & Photonics (AREA)
- Geometry (AREA)
- Immunology (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Dispersion Chemistry (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PLP.414064 | 2015-09-18 | ||
| PL414064A PL237446B1 (pl) | 2015-09-18 | 2015-09-18 | Urządzenie do pomiarów parametrów elementów fazowych i dyspersji światłowodów oraz sposób pomiaru parametrów elementu fazowego i dyspersji światłowodów |
| PCT/PL2015/050065 WO2017048141A1 (en) | 2015-09-18 | 2015-11-30 | Device for measuring the parameters of phase elements and optical fiber dispersion and a method of measuring the parameters of phase elements and optical fiber dispersion |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA3000156A1 true CA3000156A1 (en) | 2017-03-23 |
Family
ID=55085871
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA3000156A Abandoned CA3000156A1 (en) | 2015-09-18 | 2015-11-30 | Device for measuring the parameters of phase elements and optical fiber dispersion and a method of measuring the parameters of phase elements and optical fiber dispersion |
Country Status (11)
| Country | Link |
|---|---|
| US (1) | US20200191551A1 (enExample) |
| EP (1) | EP3423782B1 (enExample) |
| JP (1) | JP2018534547A (enExample) |
| KR (1) | KR20180084745A (enExample) |
| CN (1) | CN108431544A (enExample) |
| CA (1) | CA3000156A1 (enExample) |
| IL (1) | IL258173A (enExample) |
| PH (1) | PH12018500611A1 (enExample) |
| PL (1) | PL237446B1 (enExample) |
| RU (1) | RU2713038C2 (enExample) |
| WO (1) | WO2017048141A1 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111901044B (zh) * | 2019-11-28 | 2021-11-02 | 阳光学院 | 一种单光束相干光通信装置 |
| CN111258081A (zh) * | 2020-02-25 | 2020-06-09 | 中国科学院长春光学精密机械与物理研究所 | 一种基于光纤互联的光学系统装调方法及装置 |
| CN113804405A (zh) * | 2021-08-16 | 2021-12-17 | 广东工业大学 | 一种基于双耦合器环行光路结构的微量光纤色散测量装置 |
| CN115035036B (zh) * | 2022-05-09 | 2025-03-11 | 北京转转精神科技有限责任公司 | 一种屏幕检测方法以及装置 |
| CN115727890A (zh) * | 2022-11-18 | 2023-03-03 | 江苏科技大学 | 一种空间椭圆拟合修正零差对称解调误差的方法 |
| US12442717B2 (en) * | 2023-02-03 | 2025-10-14 | Onto Innovation Inc. | Interferometer with auxiliary lens for measurement of a transparent test object |
| CN118936337B (zh) * | 2024-09-05 | 2025-11-14 | 天津大学 | 一种透明样品厚度和折射率测量系统及方法 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5724836A (en) * | 1980-07-22 | 1982-02-09 | Nippon Telegr & Teleph Corp <Ntt> | Measurement of group delay time difference by mode groups for multimode optical fiber scope |
| US4799789A (en) | 1987-02-27 | 1989-01-24 | Anritsu Corporation | Chromatic dispersion measuring system for optical fibers |
| JPH05107150A (ja) * | 1991-10-14 | 1993-04-27 | Mitsubishi Cable Ind Ltd | 高分散光フアイバの分散測定方法 |
| TW275570B (enExample) * | 1994-05-05 | 1996-05-11 | Boehringer Mannheim Gmbh | |
| JP2004029076A (ja) * | 2002-06-21 | 2004-01-29 | Canon Inc | 波面発生装置、該装置を組み込んだ面形状測定装置、焦点駆動装置 |
| RU2247938C1 (ru) * | 2003-05-27 | 2005-03-10 | Геликонов Валентин Михайлович | Оптическое устройство для исследования объекта |
| US7433027B2 (en) | 2004-12-22 | 2008-10-07 | Novartis Ag | Apparatus and method for detecting lens thickness |
| US7221439B2 (en) | 2005-04-29 | 2007-05-22 | Corning Incorporated | Method of estimating and measuring longitudinal dispersion in optical fibers |
| US20070002331A1 (en) | 2005-06-30 | 2007-01-04 | Hall William J | In line thickness measurement |
| US20080001320A1 (en) * | 2006-06-28 | 2008-01-03 | Knox Wayne H | Optical Material and Method for Modifying the Refractive Index |
| JP5156291B2 (ja) * | 2007-07-31 | 2013-03-06 | 浜松ホトニクス株式会社 | フローセル中を流れるサンプルの光学的特性計測装置 |
| US7787127B2 (en) * | 2007-10-15 | 2010-08-31 | Michael Galle | System and method to determine chromatic dispersion in short lengths of waveguides using a common path interferometer |
| KR101000974B1 (ko) * | 2008-12-01 | 2010-12-13 | 인하대학교 산학협력단 | 간섭무늬 측정시스템을 이용한 광도파로샘플의 색분산 특성측정방법 |
| US8405836B2 (en) * | 2010-03-19 | 2013-03-26 | Interfiber Analysis, LLC | System and method for measuring an optical fiber |
| CN102353520B (zh) * | 2011-06-10 | 2013-06-19 | 北京航空航天大学 | 一种用于光纤延迟线测量系统的延迟量测量方法及其实现装置 |
| US9121705B2 (en) | 2012-04-20 | 2015-09-01 | Massachusetts Institute Of Technology | Sensor for simultaneous measurement of thickness and lateral position of a transparent object |
| US9019485B2 (en) * | 2013-03-11 | 2015-04-28 | Lumetrics, Inc. | Apparatus and method for evaluation of optical elements |
| CN103267743B (zh) * | 2013-04-08 | 2018-09-21 | 辽宁科旺光电科技有限公司 | 一种折射率测量装置及方法 |
| JP6157240B2 (ja) * | 2013-06-28 | 2017-07-05 | キヤノン株式会社 | 屈折率計測方法、屈折率計測装置および光学素子の製造方法 |
-
2015
- 2015-09-18 PL PL414064A patent/PL237446B1/pl unknown
- 2015-11-30 KR KR1020187010232A patent/KR20180084745A/ko not_active Withdrawn
- 2015-11-30 US US15/761,421 patent/US20200191551A1/en not_active Abandoned
- 2015-11-30 WO PCT/PL2015/050065 patent/WO2017048141A1/en not_active Ceased
- 2015-11-30 JP JP2018513754A patent/JP2018534547A/ja active Pending
- 2015-11-30 CN CN201580084639.5A patent/CN108431544A/zh active Pending
- 2015-11-30 EP EP15823404.7A patent/EP3423782B1/en not_active Not-in-force
- 2015-11-30 RU RU2018114296A patent/RU2713038C2/ru active
- 2015-11-30 CA CA3000156A patent/CA3000156A1/en not_active Abandoned
-
2018
- 2018-03-15 IL IL258173A patent/IL258173A/en unknown
- 2018-03-21 PH PH12018500611A patent/PH12018500611A1/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| CN108431544A (zh) | 2018-08-21 |
| PL414064A1 (pl) | 2017-03-27 |
| EP3423782A1 (en) | 2019-01-09 |
| WO2017048141A1 (en) | 2017-03-23 |
| KR20180084745A (ko) | 2018-07-25 |
| PH12018500611A1 (en) | 2018-10-01 |
| RU2018114296A (ru) | 2019-10-18 |
| PL237446B1 (pl) | 2021-04-19 |
| JP2018534547A (ja) | 2018-11-22 |
| RU2713038C2 (ru) | 2020-02-03 |
| IL258173A (en) | 2018-05-31 |
| RU2018114296A3 (enExample) | 2019-10-18 |
| US20200191551A1 (en) | 2020-06-18 |
| EP3423782B1 (en) | 2022-01-26 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FZDE | Discontinued |
Effective date: 20220222 |
|
| FZDE | Discontinued |
Effective date: 20220222 |