PL1725858T3 - Urządzenie do analizy on-line - Google Patents

Urządzenie do analizy on-line

Info

Publication number
PL1725858T3
PL1725858T3 PL05729826T PL05729826T PL1725858T3 PL 1725858 T3 PL1725858 T3 PL 1725858T3 PL 05729826 T PL05729826 T PL 05729826T PL 05729826 T PL05729826 T PL 05729826T PL 1725858 T3 PL1725858 T3 PL 1725858T3
Authority
PL
Poland
Prior art keywords
ray tube
detector
ray
analysis device
states
Prior art date
Application number
PL05729826T
Other languages
English (en)
Inventor
Albert Klein
Original Assignee
Katz Elisabeth
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Katz Elisabeth filed Critical Katz Elisabeth
Publication of PL1725858T3 publication Critical patent/PL1725858T3/pl

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K5/00—Irradiation devices
    • G21K5/02—Irradiation devices having no beam-forming means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/56—Switching-on; Switching-off

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Engineering & Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • X-Ray Techniques (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
PL05729826T 2004-03-16 2005-03-16 Urządzenie do analizy on-line PL1725858T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102004012704A DE102004012704B4 (de) 2004-03-16 2004-03-16 Vorrichtung zur online-Analyse und Verwendung einer solchen Vorrichtung
PCT/EP2005/002785 WO2005090952A1 (de) 2004-03-16 2005-03-16 Vorrichtung zur online-analyse
EP05729826A EP1725858B1 (de) 2004-03-16 2005-03-16 Vorrichtung zur online-analyse

Publications (1)

Publication Number Publication Date
PL1725858T3 true PL1725858T3 (pl) 2011-02-28

Family

ID=34963659

Family Applications (1)

Application Number Title Priority Date Filing Date
PL05729826T PL1725858T3 (pl) 2004-03-16 2005-03-16 Urządzenie do analizy on-line

Country Status (9)

Country Link
US (1) US7787593B2 (pl)
EP (1) EP1725858B1 (pl)
AT (1) ATE480765T1 (pl)
AU (1) AU2005224328B9 (pl)
CA (1) CA2560145C (pl)
DE (2) DE102004012704B4 (pl)
PL (1) PL1725858T3 (pl)
WO (1) WO2005090952A1 (pl)
ZA (1) ZA200607437B (pl)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007056938A1 (de) * 2007-11-24 2009-05-28 Katz, Elisabeth Vorrichtung zur Online-Analyse von Schlämmen und Suspensionen
US10342107B2 (en) 2015-11-12 2019-07-02 Kimtron, Inc. Cascaded filament transformer within a resistive shroud
US10398011B2 (en) 2015-11-12 2019-08-27 Kimtron, Inc. Method and apparatus for active filament management
WO2024071462A1 (ko) * 2022-09-27 2024-04-04 엘지전자 주식회사 엑스레이 전자 방출 제어 장치

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2129383A (en) * 1933-07-25 1938-09-06 Westinghouse Electric & Mfg Co X-ray system for taking short exposure x-ray photographs
US2240037A (en) * 1938-10-08 1941-04-29 X Ray Flash Lamp Corp Method and apparatus for producing x-ray flashes
US3655964A (en) * 1968-05-06 1972-04-11 David Laurie Slight Ionizing radiation apparatus and method for distinguishing between materials in a mixture
US3783287A (en) * 1972-05-18 1974-01-01 Picker Corp Anode current stabilization circuit x-ray tube having stabilizer electrode
US4386320A (en) * 1978-09-15 1983-05-31 Lafrance Robert R X-Ray system signal derivation circuits for heat unit indicators and/or calibration meters
US4593371A (en) * 1983-11-14 1986-06-03 General Electric Company X-ray tube emission current controller
CA1242260A (en) * 1986-04-24 1988-09-20 Leonard Kelly Multisorting method and apparatus
US4827371A (en) * 1988-04-04 1989-05-02 Ion Systems, Inc. Method and apparatus for ionizing gas with point of use ion flow delivery
US5497008A (en) 1990-10-31 1996-03-05 X-Ray Optical Systems, Inc. Use of a Kumakhov lens in analytic instruments
JP2594200B2 (ja) * 1992-01-12 1997-03-26 株式会社堀場製作所 蛍光ｘ線分析装置
US5339349A (en) * 1992-10-26 1994-08-16 Xeno Millan Y Portable x-ray unit
DE4408057B4 (de) 1994-03-07 2008-12-24 Ifg-Institute For Scientific Instruments Gmbh Vorrichtung zur Röntgenfluoreszenzspektroskopie und deren Verwendung
FI97647C (fi) * 1994-11-14 1997-01-27 Ima Engineering Ltd Oy Menetelmä ja laitteisto alkuaineen pitoisuuden määrittämiseksi
DE19522221A1 (de) * 1995-06-20 1997-01-02 Zeiss Carl Fa Verfahren zur Regelung des Emissionsstromes einer Elektronenquelle und Elektronenquelle mit einer Regelung des Emissionsstromes
US5778039A (en) 1996-02-21 1998-07-07 Advanced Micro Devices, Inc. Method and apparatus for the detection of light elements on the surface of a semiconductor substrate using x-ray fluorescence (XRF)
US5974111A (en) * 1996-09-24 1999-10-26 Vivid Technologies, Inc. Identifying explosives or other contraband by employing transmitted or scattered X-rays
US5867561A (en) * 1997-07-30 1999-02-02 General Electric Company Medical diagnostic imaging system with power conserving control apparatus
JP3771697B2 (ja) 1997-11-01 2006-04-26 株式会社堀場製作所 螢光ｘ線分析装置
DE19843229A1 (de) 1998-09-10 2000-04-20 Ifg Inst Fuer Geraetebau Gmbh Verfahren und Gerät zum Analysieren von Proben mittels Röntgenfluoreszenz-Spektroskopie
US6130931A (en) 1998-09-17 2000-10-10 Process Control, Inc. X-ray fluorescence elemental analyzer
JP4370057B2 (ja) 1998-10-21 2009-11-25 パナリティカル ビー ヴィ 毛細管光学系を含むｘ源を有するｘ線照射装置
JP4026976B2 (ja) * 1999-03-02 2007-12-26 浜松ホトニクス株式会社 Ｘ線発生装置、ｘ線撮像装置及びｘ線検査システム
RU2180439C2 (ru) 2000-02-11 2002-03-10 Кумахов Мурадин Абубекирович Способ получения изображения внутренней структуры объекта с использованием рентгеновского излучения и устройство для его осуществления
US7200200B2 (en) * 2001-09-04 2007-04-03 Quality Control, Inc. X-ray fluorescence measuring system and methods for trace elements
US7099433B2 (en) * 2004-03-01 2006-08-29 Spectramet, Llc Method and apparatus for sorting materials according to relative composition

Also Published As

Publication number Publication date
EP1725858A1 (de) 2006-11-29
AU2005224328B2 (en) 2010-11-25
CA2560145C (en) 2014-10-28
CA2560145A1 (en) 2005-09-29
ZA200607437B (en) 2009-01-28
AU2005224328A1 (en) 2005-09-29
US7787593B2 (en) 2010-08-31
EP1725858B1 (de) 2010-09-08
US20070280413A1 (en) 2007-12-06
WO2005090952A1 (de) 2005-09-29
DE102004012704B4 (de) 2008-01-03
DE502005010219D1 (de) 2010-10-21
DE102004012704A1 (de) 2005-10-20
ATE480765T1 (de) 2010-09-15
AU2005224328B9 (en) 2011-01-06

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