CA2560145A1 - Online analysis device - Google Patents
Online analysis device Download PDFInfo
- Publication number
- CA2560145A1 CA2560145A1 CA002560145A CA2560145A CA2560145A1 CA 2560145 A1 CA2560145 A1 CA 2560145A1 CA 002560145 A CA002560145 A CA 002560145A CA 2560145 A CA2560145 A CA 2560145A CA 2560145 A1 CA2560145 A1 CA 2560145A1
- Authority
- CA
- Canada
- Prior art keywords
- operating state
- ray tube
- ray
- control unit
- acceleration voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K5/00—Irradiation devices
- G21K5/02—Irradiation devices having no beam-forming means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/56—Switching-on; Switching-off
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Engineering & Computer Science (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- X-Ray Techniques (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
Abstract
The inventive analysis device comprises a system for feeding an analysable material, an X-ray tube (20) whose X-ray beam is oriented towards the measuring area (b) of the feeding system, a control unit (30) for controlling the X-ray tube, an X-ray detector (40) for measuring X-ray radiation interacting with the material or emitted thereby and a material sensor which detects whether the material is present in a measuring area or is supplied thereto and generates a signal thereabout. In order to relieve from a shutter without reducing the lifetime of the X-ray tube, the device is characterised in that the material detector is associated with the control unit (30) and said control unit (30) controls the X-ray tube according to the signal of the material detector in one operating state thereof, wherein a current heating the X-ray tube has the same order of magnitude in the two operating states and the acceleration tension increases in the first operating state from 5kV to 100kV and is reduced by 10 kV in the second operating state.
Description
ONLINE ANALYSIS DEVICE
Specification Technical Field of Invention The invention relates to an online analysis device as defined in the preamble to claim 1.
Prior Art The use of ionizing radiation for online analyses procedures is known. Such a procedure involves for the most part the irradiation of a spatially delimited meas-uring region of the conveyed material, so as to determine the interaction with this material. In the process, the transmitted as well as the backscattered signal can be used, or the signal emitted as a result of excitation. In the case of X-ray fluo-rescence, for example, the generated characteristic X-ray luminescence radiation is measured with the aid of one or several detectors, and a conclusion concern-ing the material composition is reached on the basis of the measured spectrum.
As a rule, either a radioactive emitter or an X-ray tube can be used for irradiating the material. To protect against radiation, it is generally necessary to prevent rays emitted by an X-ray or gamma-ray source from escaping if no material to be measured is located in the measuring region. A movable cover is used for this, a so-called shutter, which is actuated by a material detector that detects the pres-ence of material to be measured in the measuring region. When using a radio-active gamma source, it is absolutely necessary to provide such a mechanical shutter since a radioactive isotope naturally cannot be turned off. However, shutters are also used if an X-ray tube is used as radiation source because a fre-quent, complete shutdown of the X-ray tube would severely restrict its service life.
In particular when used for industrial purposes, meaning under rough and dirty environmental conditions, using a mechanical shutter can often cause problems because this shutter can jam easily, which results in a malfunction of the meas-uring device.
Subject Matter of the Invention Starting with this premise, it is the object of the present invention to further modify and improve a generic device of this type, which utilizes an X-ray tube as radia-tion source, such that a mechanical shutter can be omitted without reducing the service life of the X-ray tube.
This object is solved with an online analysis device, which has the features as disclosed in claim 1.
The improvement according to the invention is achieved as follows. The material detector, which detects the presence or absence of material to be measured, does not actuate a mechanical shutter, as is presently the case, but transmits a respective signal to the control unit for the X-ray tube. The control unit can gen-erate two different operating states of the X-ray tube, namely an active state where the X-ray tube generates X-rays with the desired energy and intensity, as well as an idle state where the X-ray tube does not emit any energy quanta above a specific energy. To prevent a considerable reduction in the service life of the X-ray tube as a result of a frequent change between the two operating states, the X-ray tube is not completely shut down during the idle state.
Instead, only its acceleration voltage is reduced considerably while the heating current of the hot cathode is kept as constant as possible. Some fluctuations can be toler-ated in this case. Changes in the heating-current intensity of up to 50%, de-pending on the respectively used X-ray tube, can still be acceptable. For the most part, however, the goal should be to achieve a constancy of ~ 10%. To prevent space-charge effects, or at least keep these low, the acceleration voltage is not lowered to zero, but only to a value that is harmless in view of the gener-ated radiation, for example below SkV.
With stabilized acceleration voltage power supply units, such as the ones used in the field of measuring technology, it is not possible in that case to keep the heat-ing current constant by using a separate circuit because a constant anode cur-rent is generated by controlling the heating current. These supply units are therefore provided with signal-voltage inputs, designed to preset the desired val-ues for the acceleration voltage and the anode current.
According to the invention, the X-ray tube is therefore connected such that the acceleration voltage and the anode current are simultaneously reduced in such a way that the heating current essentially remains constant. As a result, it is possi-ble to place the tube into a non-dangerous idle state without reducing its service life, as compared to the constant operation.
According to one preferred embodiment described in claim 2, the control unit is provided with respectively two circuits for realizing the two operating states, wherein these circuits generate the signal voltages for the acceleration voltage and the anode current. A relay that is actuated by the material detector functions to switch between these two states.
Additional and preferred embodiments follow from the other dependent claims, as well as the exemplary embodiment below which is explained further with refer-ence to the drawings, wherein:
Specification Technical Field of Invention The invention relates to an online analysis device as defined in the preamble to claim 1.
Prior Art The use of ionizing radiation for online analyses procedures is known. Such a procedure involves for the most part the irradiation of a spatially delimited meas-uring region of the conveyed material, so as to determine the interaction with this material. In the process, the transmitted as well as the backscattered signal can be used, or the signal emitted as a result of excitation. In the case of X-ray fluo-rescence, for example, the generated characteristic X-ray luminescence radiation is measured with the aid of one or several detectors, and a conclusion concern-ing the material composition is reached on the basis of the measured spectrum.
As a rule, either a radioactive emitter or an X-ray tube can be used for irradiating the material. To protect against radiation, it is generally necessary to prevent rays emitted by an X-ray or gamma-ray source from escaping if no material to be measured is located in the measuring region. A movable cover is used for this, a so-called shutter, which is actuated by a material detector that detects the pres-ence of material to be measured in the measuring region. When using a radio-active gamma source, it is absolutely necessary to provide such a mechanical shutter since a radioactive isotope naturally cannot be turned off. However, shutters are also used if an X-ray tube is used as radiation source because a fre-quent, complete shutdown of the X-ray tube would severely restrict its service life.
In particular when used for industrial purposes, meaning under rough and dirty environmental conditions, using a mechanical shutter can often cause problems because this shutter can jam easily, which results in a malfunction of the meas-uring device.
Subject Matter of the Invention Starting with this premise, it is the object of the present invention to further modify and improve a generic device of this type, which utilizes an X-ray tube as radia-tion source, such that a mechanical shutter can be omitted without reducing the service life of the X-ray tube.
This object is solved with an online analysis device, which has the features as disclosed in claim 1.
The improvement according to the invention is achieved as follows. The material detector, which detects the presence or absence of material to be measured, does not actuate a mechanical shutter, as is presently the case, but transmits a respective signal to the control unit for the X-ray tube. The control unit can gen-erate two different operating states of the X-ray tube, namely an active state where the X-ray tube generates X-rays with the desired energy and intensity, as well as an idle state where the X-ray tube does not emit any energy quanta above a specific energy. To prevent a considerable reduction in the service life of the X-ray tube as a result of a frequent change between the two operating states, the X-ray tube is not completely shut down during the idle state.
Instead, only its acceleration voltage is reduced considerably while the heating current of the hot cathode is kept as constant as possible. Some fluctuations can be toler-ated in this case. Changes in the heating-current intensity of up to 50%, de-pending on the respectively used X-ray tube, can still be acceptable. For the most part, however, the goal should be to achieve a constancy of ~ 10%. To prevent space-charge effects, or at least keep these low, the acceleration voltage is not lowered to zero, but only to a value that is harmless in view of the gener-ated radiation, for example below SkV.
With stabilized acceleration voltage power supply units, such as the ones used in the field of measuring technology, it is not possible in that case to keep the heat-ing current constant by using a separate circuit because a constant anode cur-rent is generated by controlling the heating current. These supply units are therefore provided with signal-voltage inputs, designed to preset the desired val-ues for the acceleration voltage and the anode current.
According to the invention, the X-ray tube is therefore connected such that the acceleration voltage and the anode current are simultaneously reduced in such a way that the heating current essentially remains constant. As a result, it is possi-ble to place the tube into a non-dangerous idle state without reducing its service life, as compared to the constant operation.
According to one preferred embodiment described in claim 2, the control unit is provided with respectively two circuits for realizing the two operating states, wherein these circuits generate the signal voltages for the acceleration voltage and the anode current. A relay that is actuated by the material detector functions to switch between these two states.
Additional and preferred embodiments follow from the other dependent claims, as well as the exemplary embodiment below which is explained further with refer-ence to the drawings, wherein:
Short Description of the Drawings Figure 1 Shows a schematic representation of an online analysis device for the element analysis; and Figure 2 Shows a schematic representation of a control unit and the X-ray tube actuated by means of this control unit.
Description of Preferred Embodiments Figure 1 shows a device for realizing an element analysis as example for an on-line analysis. A material M is conveyed on the conveyor belt 10, which in this case functions as feed conveyor, wherein the material M is initially flattened by means of the plow 12.
The X-ray tube 20 irradiates the measuring region B on the material M. An X-ray detector 40 is also directed toward the measuring region B for measuring the X-ray fluorescence radiation. The spectra obtained in the process are used for de-termining the composition of the material M.
Upstream of the measuring region B, as seen in conveying direction, a micro-wave measuring section is arranged, which comprises a microwave transmitter 52 as well as a microwave receiver 54. This measuring section is designed for determining whether or not the material M is located on the conveyor belt 10.
Of course, other types of detectors can also be used to meet this requirement, for example capacitive sensors. If the voltage in the idle state is only reduced enough so that the detector still receives a signal, then the signal generated by the X-ray detector 40 can be used for determining the presence or absence of material. The X-ray detector 40 would then simultaneously function as material detector within the meaning of this application.
Description of Preferred Embodiments Figure 1 shows a device for realizing an element analysis as example for an on-line analysis. A material M is conveyed on the conveyor belt 10, which in this case functions as feed conveyor, wherein the material M is initially flattened by means of the plow 12.
The X-ray tube 20 irradiates the measuring region B on the material M. An X-ray detector 40 is also directed toward the measuring region B for measuring the X-ray fluorescence radiation. The spectra obtained in the process are used for de-termining the composition of the material M.
Upstream of the measuring region B, as seen in conveying direction, a micro-wave measuring section is arranged, which comprises a microwave transmitter 52 as well as a microwave receiver 54. This measuring section is designed for determining whether or not the material M is located on the conveyor belt 10.
Of course, other types of detectors can also be used to meet this requirement, for example capacitive sensors. If the voltage in the idle state is only reduced enough so that the detector still receives a signal, then the signal generated by the X-ray detector 40 can be used for determining the presence or absence of material. The X-ray detector 40 would then simultaneously function as material detector within the meaning of this application.
The microwave receiver 54, which in this case functions as material detector, determines whether or not material M is located on the conveyor belt 10, based on the attenuation and/or phase displacement of the microwave signal. A
signal, dependent thereon and delayed so as to correspond to the transporting speed of the belt, is subsequently transmitted by the microwave receiver 54 to the control unit 30 of the X-ray tube 20.
The control unit 30 generates the heating current and the acceleration voltage for the X-ray tube 20. Depending on the signal of the microwave receiver 54, the control unit 30 generates two different operating states for the X-ray tube 20.
First of all, this is the active state where the acceleration voltage has a value between 15 and 25keV, for example, wherein 2A here is a typical value for the heating current of the hot cathode. This operating state is triggered if material is detected on the conveyor belt by the microwave measuring section. If no mate-rial is detected on the conveyor belt 10, then the control unit switches to the sec-ond operating state. While switching to the second operating state, the heating current is kept as constant as possible while the acceleration voltage is lowered considerably to a predetermined value, for example 3000 volt.
Figure 2 schematically shows an exemplary embodiment of a control unit 30, wherein the two operating states are realized by generating fixed acceleration voltages for each state, the operating state and the idle state with corresponding anode currents.
The X-ray tube must be switched to the idle state when the belt is empty or is stopped, wherein this information is provided by potential-free contacts. In a cir-cuit, these contacts are arranged in line with the relay coil S of a double relay with two switching states and provided with contacts K~, K~~, and K2, K2.
signal, dependent thereon and delayed so as to correspond to the transporting speed of the belt, is subsequently transmitted by the microwave receiver 54 to the control unit 30 of the X-ray tube 20.
The control unit 30 generates the heating current and the acceleration voltage for the X-ray tube 20. Depending on the signal of the microwave receiver 54, the control unit 30 generates two different operating states for the X-ray tube 20.
First of all, this is the active state where the acceleration voltage has a value between 15 and 25keV, for example, wherein 2A here is a typical value for the heating current of the hot cathode. This operating state is triggered if material is detected on the conveyor belt by the microwave measuring section. If no mate-rial is detected on the conveyor belt 10, then the control unit switches to the sec-ond operating state. While switching to the second operating state, the heating current is kept as constant as possible while the acceleration voltage is lowered considerably to a predetermined value, for example 3000 volt.
Figure 2 schematically shows an exemplary embodiment of a control unit 30, wherein the two operating states are realized by generating fixed acceleration voltages for each state, the operating state and the idle state with corresponding anode currents.
The X-ray tube must be switched to the idle state when the belt is empty or is stopped, wherein this information is provided by potential-free contacts. In a cir-cuit, these contacts are arranged in line with the relay coil S of a double relay with two switching states and provided with contacts K~, K~~, and K2, K2.
An indicator light can furthermore be installed in this circuit for signaling.
An ad-ditional potential-free contact should be installed in series to signal the state of the safety circuit and to ensure that the indicator light is turned off when the safety circuit is open.
The control voltages for acceleration voltage and anode current are derived with the aid of 4 potentiometers from a reference voltage, which should equal the maximum control voltage Umax. R1 and R2 are used to obtain the control volt-ages for the operating and idle state of the acceleration voltage while R3 and are used to obtain the control voltages for the operating and idle state of the an-ode current. These are fed via the relay contacts K~, K~~, and K2, K2 to the con-trol inputs 31 a, 31 b for the acceleration voltage and the anode current of the ac-celeration voltage generator 31. Following the adjustment of the control voltages for the desired acceleration voltage and the desired anode current in the operat-ing state, as well as for the desired acceleration voltage in the idle state, the heating current or voltage drop in the operating state is measured at the tube heater and the anode current is adjusted in the idle state, such that the heating current and/or the voltage drop at the heater has the same value as for the oper-ating conditions. The acceleration voltage in this case cannot be adjusted to any low level since the control for the anode current must be operated in the control range. A voltage of less than SkV, however, is generally easy to reach.
Of course, the required voltages can also be generated in different ways, for ex-ample with a microprocessor-controlled DA converter.
The safety circuit for the control unit 30, which shuts down the current to the X-ray tube completely in case of an interruption, is not shown herein.
An ad-ditional potential-free contact should be installed in series to signal the state of the safety circuit and to ensure that the indicator light is turned off when the safety circuit is open.
The control voltages for acceleration voltage and anode current are derived with the aid of 4 potentiometers from a reference voltage, which should equal the maximum control voltage Umax. R1 and R2 are used to obtain the control volt-ages for the operating and idle state of the acceleration voltage while R3 and are used to obtain the control voltages for the operating and idle state of the an-ode current. These are fed via the relay contacts K~, K~~, and K2, K2 to the con-trol inputs 31 a, 31 b for the acceleration voltage and the anode current of the ac-celeration voltage generator 31. Following the adjustment of the control voltages for the desired acceleration voltage and the desired anode current in the operat-ing state, as well as for the desired acceleration voltage in the idle state, the heating current or voltage drop in the operating state is measured at the tube heater and the anode current is adjusted in the idle state, such that the heating current and/or the voltage drop at the heater has the same value as for the oper-ating conditions. The acceleration voltage in this case cannot be adjusted to any low level since the control for the anode current must be operated in the control range. A voltage of less than SkV, however, is generally easy to reach.
Of course, the required voltages can also be generated in different ways, for ex-ample with a microprocessor-controlled DA converter.
The safety circuit for the control unit 30, which shuts down the current to the X-ray tube completely in case of an interruption, is not shown herein.
Claims (12)
1. An online analysis device, said device comprising:
- a feed conveyor for supplying the material to be analyzed;
- an X-ray tube (20) for which the X-ray beam is directed toward a measuring region (B) on the feed conveyor;
- a control unit (30) for actuating the X-ray tube;
- an X-ray detector (40) for measuring the X-ray radiation that inter acts with the material, or the radiation emitted by this material;
- a material detector, which detects whether material is present in the measuring region or is supplied thereto and which then generates a signal dependent thereon, characterized in that the material detector is connected to the control unit (30) and that the control unit (30) actuates the X-ray tube (20) in one of two operating states, in dependence on the signal from the material de-tector, wherein the heating current of the X-ray tube has the same order of magnitude for both operating states and the acceleration voltage in the first operating state ranges from 5kV to 100kV and in the second operating state is less than 10kV.
- a feed conveyor for supplying the material to be analyzed;
- an X-ray tube (20) for which the X-ray beam is directed toward a measuring region (B) on the feed conveyor;
- a control unit (30) for actuating the X-ray tube;
- an X-ray detector (40) for measuring the X-ray radiation that inter acts with the material, or the radiation emitted by this material;
- a material detector, which detects whether material is present in the measuring region or is supplied thereto and which then generates a signal dependent thereon, characterized in that the material detector is connected to the control unit (30) and that the control unit (30) actuates the X-ray tube (20) in one of two operating states, in dependence on the signal from the material de-tector, wherein the heating current of the X-ray tube has the same order of magnitude for both operating states and the acceleration voltage in the first operating state ranges from 5kV to 100kV and in the second operating state is less than 10kV.
2. The device according to claim 1, characterized in that the fluctuation in the heating-current intensity in the second operating state, as compared to the intensity in the first operating state, is less than 50%.
3. The device according to claim 2, characterized in that the fluctuation in the heating-current intensity in the second operating state, as compared to the intensity in the first operating state, is less than 10%.
4. The device according to one of the claims 1 to 3, characterized in that the two operating states in the control unit (30) are generated with the aid of two circuits, wherein a relay (36) switches between these two circuits.
5. The device according to one of the claims 1 to 3, characterized in that the two operating states are adjusted via the analog outputs of a microproces-sor-controlled system.
6. The device according to claim 1, characterized in that the acceleration voltage generator (31) is provided with a digital interface for controlling the acceleration voltage and the anode current, and that both operating states are adjusted by means of this interface.
7. The device according to one of the preceding claims, characterized in that the acceleration voltage in the first operating state ranges from 10 to 30kV
and in the second operating state ranges from 500V to 5kV.
and in the second operating state ranges from 500V to 5kV.
8. The device according to one of the preceding claims, characterized in that the online analysis is realized with the aid of a transmission measurement.
9. The device according to one of the preceding claims, characterized in that the online analysis is realized with the aid of a backscattering measure-ment.
10. The device according to one of the preceding claims, characterized in that the online analysis operates based on the principle of X-ray fluorescence.
11. The device according to one of the preceding claims, characterized in that a signal light (L) indicates the operating state of the tube.
12. The device according to claim 11, characterized in that the signal light (L) goes out when the tube is in the idle state and the circuit is open.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102004012704A DE102004012704B4 (en) | 2004-03-16 | 2004-03-16 | Device for online analysis and use of such a device |
| DE102004012704.2 | 2004-03-16 | ||
| PCT/EP2005/002785 WO2005090952A1 (en) | 2004-03-16 | 2005-03-16 | Online analysis device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2560145A1 true CA2560145A1 (en) | 2005-09-29 |
| CA2560145C CA2560145C (en) | 2014-10-28 |
Family
ID=34963659
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA2560145A Expired - Fee Related CA2560145C (en) | 2004-03-16 | 2005-03-16 | Online analysis device |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US7787593B2 (en) |
| EP (1) | EP1725858B1 (en) |
| AT (1) | ATE480765T1 (en) |
| AU (1) | AU2005224328B9 (en) |
| CA (1) | CA2560145C (en) |
| DE (2) | DE102004012704B4 (en) |
| PL (1) | PL1725858T3 (en) |
| WO (1) | WO2005090952A1 (en) |
| ZA (1) | ZA200607437B (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102007056938A1 (en) * | 2007-11-24 | 2009-05-28 | Katz, Elisabeth | Device for the online analysis of sludges and suspensions |
| US10342107B2 (en) | 2015-11-12 | 2019-07-02 | Kimtron, Inc. | Cascaded filament transformer within a resistive shroud |
| US10398011B2 (en) | 2015-11-12 | 2019-08-27 | Kimtron, Inc. | Method and apparatus for active filament management |
| WO2024071462A1 (en) * | 2022-09-27 | 2024-04-04 | 엘지전자 주식회사 | X-ray electron emission control device |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2129383A (en) * | 1933-07-25 | 1938-09-06 | Westinghouse Electric & Mfg Co | X-ray system for taking short exposure x-ray photographs |
| US2240037A (en) * | 1938-10-08 | 1941-04-29 | X Ray Flash Lamp Corp | Method and apparatus for producing x-ray flashes |
| US3655964A (en) * | 1968-05-06 | 1972-04-11 | David Laurie Slight | Ionizing radiation apparatus and method for distinguishing between materials in a mixture |
| US3783287A (en) * | 1972-05-18 | 1974-01-01 | Picker Corp | Anode current stabilization circuit x-ray tube having stabilizer electrode |
| US4386320A (en) * | 1978-09-15 | 1983-05-31 | Lafrance Robert R | X-Ray system signal derivation circuits for heat unit indicators and/or calibration meters |
| US4593371A (en) * | 1983-11-14 | 1986-06-03 | General Electric Company | X-ray tube emission current controller |
| CA1242260A (en) * | 1986-04-24 | 1988-09-20 | Leonard Kelly | Multisorting method and apparatus |
| US4827371A (en) * | 1988-04-04 | 1989-05-02 | Ion Systems, Inc. | Method and apparatus for ionizing gas with point of use ion flow delivery |
| US5497008A (en) | 1990-10-31 | 1996-03-05 | X-Ray Optical Systems, Inc. | Use of a Kumakhov lens in analytic instruments |
| JP2594200B2 (en) * | 1992-01-12 | 1997-03-26 | 株式会社堀場製作所 | X-ray fluorescence analyzer |
| US5339349A (en) * | 1992-10-26 | 1994-08-16 | Xeno Millan Y | Portable x-ray unit |
| DE4408057B4 (en) | 1994-03-07 | 2008-12-24 | Ifg-Institute For Scientific Instruments Gmbh | Device for X-ray fluorescence spectroscopy and its use |
| FI97647C (en) * | 1994-11-14 | 1997-01-27 | Ima Engineering Ltd Oy | Method and apparatus for determining the content of an element |
| DE19522221A1 (en) * | 1995-06-20 | 1997-01-02 | Zeiss Carl Fa | Method for regulating the emission current of an electron source and electron source with regulating the emission current |
| US5778039A (en) | 1996-02-21 | 1998-07-07 | Advanced Micro Devices, Inc. | Method and apparatus for the detection of light elements on the surface of a semiconductor substrate using x-ray fluorescence (XRF) |
| US5974111A (en) * | 1996-09-24 | 1999-10-26 | Vivid Technologies, Inc. | Identifying explosives or other contraband by employing transmitted or scattered X-rays |
| US5867561A (en) * | 1997-07-30 | 1999-02-02 | General Electric Company | Medical diagnostic imaging system with power conserving control apparatus |
| JP3771697B2 (en) | 1997-11-01 | 2006-04-26 | 株式会社堀場製作所 | Fluorescent X-ray analyzer |
| DE19843229A1 (en) | 1998-09-10 | 2000-04-20 | Ifg Inst Fuer Geraetebau Gmbh | Method and device for analyzing samples using X-ray fluorescence spectroscopy |
| US6130931A (en) | 1998-09-17 | 2000-10-10 | Process Control, Inc. | X-ray fluorescence elemental analyzer |
| JP4370057B2 (en) | 1998-10-21 | 2009-11-25 | パナリティカル ビー ヴィ | X-ray irradiation apparatus having an X source including a capillary optical system |
| JP4026976B2 (en) * | 1999-03-02 | 2007-12-26 | 浜松ホトニクス株式会社 | X-ray generator, X-ray imaging apparatus, and X-ray inspection system |
| RU2180439C2 (en) | 2000-02-11 | 2002-03-10 | Кумахов Мурадин Абубекирович | Process of generation of image of internal structure of object with use of x-rays and device for its realization |
| US7200200B2 (en) * | 2001-09-04 | 2007-04-03 | Quality Control, Inc. | X-ray fluorescence measuring system and methods for trace elements |
| US7099433B2 (en) * | 2004-03-01 | 2006-08-29 | Spectramet, Llc | Method and apparatus for sorting materials according to relative composition |
-
2004
- 2004-03-16 DE DE102004012704A patent/DE102004012704B4/en not_active Expired - Fee Related
-
2005
- 2005-03-16 WO PCT/EP2005/002785 patent/WO2005090952A1/en active Application Filing
- 2005-03-16 CA CA2560145A patent/CA2560145C/en not_active Expired - Fee Related
- 2005-03-16 US US10/592,231 patent/US7787593B2/en not_active Expired - Fee Related
- 2005-03-16 PL PL05729826T patent/PL1725858T3/en unknown
- 2005-03-16 EP EP05729826A patent/EP1725858B1/en not_active Not-in-force
- 2005-03-16 DE DE502005010219T patent/DE502005010219D1/en active Active
- 2005-03-16 AU AU2005224328A patent/AU2005224328B9/en not_active Ceased
- 2005-03-16 AT AT05729826T patent/ATE480765T1/en active
-
2006
- 2006-09-05 ZA ZA200607437A patent/ZA200607437B/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| EP1725858A1 (en) | 2006-11-29 |
| PL1725858T3 (en) | 2011-02-28 |
| AU2005224328B2 (en) | 2010-11-25 |
| CA2560145C (en) | 2014-10-28 |
| ZA200607437B (en) | 2009-01-28 |
| AU2005224328A1 (en) | 2005-09-29 |
| US7787593B2 (en) | 2010-08-31 |
| EP1725858B1 (en) | 2010-09-08 |
| US20070280413A1 (en) | 2007-12-06 |
| WO2005090952A1 (en) | 2005-09-29 |
| DE102004012704B4 (en) | 2008-01-03 |
| DE502005010219D1 (en) | 2010-10-21 |
| DE102004012704A1 (en) | 2005-10-20 |
| ATE480765T1 (en) | 2010-09-15 |
| AU2005224328B9 (en) | 2011-01-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CA2560145C (en) | Online analysis device | |
| EP2188652B1 (en) | Scanning systems for security and medical scanners having means to control the radiation source | |
| KR101731195B1 (en) | Detection of x-rays, and x-ray detector system | |
| US2747104A (en) | Interval timing apparatus | |
| CN103984035A (en) | Double-mode rapidly-passing type moving target radiation detection system and method | |
| CN112005332A (en) | X-ray source and X-ray imaging apparatus | |
| CA2563462C (en) | Device for the analysis of elements | |
| CN104837509B (en) | The apparatus and method sterilized for container using the monitoring of x streamers | |
| US20040109536A1 (en) | X-ray detector for feedback stabilization of an X-ray tube | |
| AU2012203317B2 (en) | X-Ray tube and x-ray fluorescence analyser utilizing selective excitation radiation | |
| JPH08238237A (en) | Radiographic apparatus | |
| JP2002168806A (en) | X-ray foreign matter detector | |
| JP3197796U (en) | Collimator for X-ray fluoroscopic apparatus and X-ray fluoroscopic apparatus | |
| JP4220015B2 (en) | Ionizing radiation detector | |
| KR101728341B1 (en) | enter warning system for RT room | |
| US3742216A (en) | Nucleonic gauge for measuring properties of thin materials | |
| US20230380786A1 (en) | X-ray system | |
| US2840716A (en) | Ray sensitive screen unit and associated apparatus | |
| US2875344A (en) | Protection system | |
| JP2006014935A (en) | X-ray diagnostic apparatus | |
| US5727043A (en) | X-ray diffractometer | |
| Yu et al. | Low Intensity Electron Beam Controlling and Monitoring | |
| JP2008082848A (en) | Radiation detector | |
| JPH08313700A (en) | Electron beam source | |
| JPH06273359A (en) | Total reflection fluorescent x-ray analyzer |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request | ||
| MKLA | Lapsed |
Effective date: 20220301 |
|
| MKLA | Lapsed |
Effective date: 20200831 |