NZ207628A - Gamma radiation scatter detection: plural detectors 'see' at different depths - Google Patents
Gamma radiation scatter detection: plural detectors 'see' at different depthsInfo
- Publication number
- NZ207628A NZ207628A NZ207628A NZ20762884A NZ207628A NZ 207628 A NZ207628 A NZ 207628A NZ 207628 A NZ207628 A NZ 207628A NZ 20762884 A NZ20762884 A NZ 20762884A NZ 207628 A NZ207628 A NZ 207628A
- Authority
- NZ
- New Zealand
- Prior art keywords
- overlay
- radiation
- density
- values
- source
- Prior art date
Links
- 230000005855 radiation Effects 0.000 title claims abstract description 115
- 238000001514 detection method Methods 0.000 title claims description 5
- 239000000463 material Substances 0.000 claims abstract description 59
- 238000000034 method Methods 0.000 claims abstract description 22
- 239000000758 substrate Substances 0.000 claims abstract description 15
- 238000005259 measurement Methods 0.000 claims description 38
- 238000012360 testing method Methods 0.000 claims description 27
- 238000012423 maintenance Methods 0.000 claims description 5
- 230000001419 dependent effect Effects 0.000 claims description 3
- 238000001228 spectrum Methods 0.000 claims description 2
- 238000012545 processing Methods 0.000 claims 3
- 238000010998 test method Methods 0.000 claims 2
- 239000010426 asphalt Substances 0.000 abstract description 4
- 238000009659 non-destructive testing Methods 0.000 abstract 1
- 239000010410 layer Substances 0.000 description 23
- 238000001914 filtration Methods 0.000 description 7
- 230000006870 function Effects 0.000 description 7
- 239000000126 substance Substances 0.000 description 6
- 230000007423 decrease Effects 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- FVAUCKIRQBBSSJ-UHFFFAOYSA-M sodium iodide Chemical compound [Na+].[I-] FVAUCKIRQBBSSJ-UHFFFAOYSA-M 0.000 description 3
- 239000002689 soil Substances 0.000 description 3
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 229910052793 cadmium Inorganic materials 0.000 description 1
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000001739 density measurement Methods 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000008571 general function Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000000284 resting effect Effects 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 235000009518 sodium iodide Nutrition 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Electromagnetism (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Radiation-Therapy Devices (AREA)
- Measurement Of Radiation (AREA)
- Heating, Cooling, Or Curing Plastics Or The Like In General (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/477,820 US4525854A (en) | 1983-03-22 | 1983-03-22 | Radiation scatter apparatus and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NZ207628A true NZ207628A (en) | 1988-02-29 |
Family
ID=23897498
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NZ207628A NZ207628A (en) | 1983-03-22 | 1984-03-26 | Gamma radiation scatter detection: plural detectors 'see' at different depths |
Country Status (11)
Families Citing this family (60)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| AU578501B2 (en) * | 1984-02-09 | 1988-10-27 | Kawasaki Steel Corporation | Method of determining thickness and composition of alloy film |
| US4641030A (en) * | 1984-12-13 | 1987-02-03 | Troxler Electronic Laboratories, Inc. | Apparatus and method for directly measuring the density of a thin layer |
| EP0244498B1 (de) * | 1986-05-06 | 1991-06-12 | Siemens Aktiengesellschaft | Anordnung und Verfahren zur Ermittelung der Berechtigung von Personen durch Überprüfen ihrer Fingerabdrücke |
| US4979197A (en) * | 1986-05-22 | 1990-12-18 | Troxler Electronic Laboratories, Inc. | Nuclear radiation apparatus and method for dynamically measuring density of test materials during compaction |
| DE3690816T1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1986-12-25 | 1988-12-08 | ||
| US4766319A (en) * | 1987-02-12 | 1988-08-23 | Troxler Electronic Laboratories, Inc. | Portable nuclear moisture-density gauge with low activity nuclear sources |
| AU630933B2 (en) * | 1987-03-31 | 1992-11-12 | Adaptive Technologies Inc. | Thickness/density measuring apparatus |
| FR2629914B1 (fr) * | 1988-04-06 | 1991-09-06 | Aerospatiale | Procede et dispositif pour determiner la masse volumique d'un volume elementaire de matiere |
| GB9417419D0 (en) | 1994-08-30 | 1994-10-19 | Mackenzie Innes | Method of measuring film thickness and monitoring liquid flow using backscattered x-rays and gamma-rays |
| GB2323440A (en) * | 1997-03-17 | 1998-09-23 | Johnson & Johnson Medical | Measuring thickness of a layer within a body |
| US6190917B1 (en) | 1998-03-20 | 2001-02-20 | Cem Corporation | Microwave apparatus and method for analysis of asphalt-aggregate compositions |
| US6207462B1 (en) | 1998-03-20 | 2001-03-27 | Cem Corporation | Microwave apparatus and method for analysis of asphalt-aggregate compositions |
| WO2000033059A2 (en) * | 1998-11-30 | 2000-06-08 | American Science And Engineering, Inc. | Multiple scatter system for threat identification |
| US6310936B1 (en) | 1999-03-03 | 2001-10-30 | Troxler Electronic Laboratories, Inc. | Thin layer nuclear density guage |
| US6284986B1 (en) * | 1999-03-15 | 2001-09-04 | Seh America, Inc. | Method of determining the thickness of a layer on a silicon substrate |
| US6492641B1 (en) * | 2000-06-29 | 2002-12-10 | Troxler Electronic Laboratories, Inc. | Apparatus and method for gamma-ray determination of bulk density of samples |
| US6567498B1 (en) | 2002-01-10 | 2003-05-20 | Troxler Electronic Laboratories, Inc. | Low activity nuclear density gauge |
| EP1357382A1 (en) * | 2002-04-26 | 2003-10-29 | Rijksuniversiteit te Groningen | Method and system for determining a property of a pavement by measuring natural gamma radiation |
| US8503605B2 (en) | 2002-07-23 | 2013-08-06 | Rapiscan Systems, Inc. | Four sided imaging system and method for detection of contraband |
| US7963695B2 (en) | 2002-07-23 | 2011-06-21 | Rapiscan Systems, Inc. | Rotatable boom cargo scanning system |
| US9958569B2 (en) | 2002-07-23 | 2018-05-01 | Rapiscan Systems, Inc. | Mobile imaging system and method for detection of contraband |
| US8275091B2 (en) | 2002-07-23 | 2012-09-25 | Rapiscan Systems, Inc. | Compact mobile cargo scanning system |
| US6995667B2 (en) * | 2002-12-23 | 2006-02-07 | Instrotek, Inc. | Systems, methods, and computer program products for automatic tracking and/or remote monitoring of nuclear gauges and/or data communication therewith |
| US6928141B2 (en) | 2003-06-20 | 2005-08-09 | Rapiscan, Inc. | Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers |
| PL1733213T3 (pl) * | 2004-04-09 | 2010-07-30 | American Science & Eng Inc | Eliminowanie przesłuchu w bramce kontrolnej z rozpraszaniem wstecznym, zawierającej wiele źródeł, przez zapewnienie, że tylko jedno źródło emituje promieniowanie w tym samym czasie |
| US7809109B2 (en) * | 2004-04-09 | 2010-10-05 | American Science And Engineering, Inc. | Multiple image collection and synthesis for personnel screening |
| US7471764B2 (en) | 2005-04-15 | 2008-12-30 | Rapiscan Security Products, Inc. | X-ray imaging system having improved weather resistance |
| US7569810B1 (en) | 2005-08-30 | 2009-08-04 | Troxler Electronic Laboratories, Inc. | Methods, systems, and computer program products for measuring the density of material |
| US7605366B2 (en) * | 2005-09-21 | 2009-10-20 | Troxler Electronic Laboratories, Inc. | Nuclear density gauge |
| EP2010943A2 (en) * | 2006-04-21 | 2009-01-07 | American Science & Engineering, Inc. | X-ray imaging of baggage and personnel using arrays of discrete sources and multiple collimated beams |
| US7526064B2 (en) | 2006-05-05 | 2009-04-28 | Rapiscan Security Products, Inc. | Multiple pass cargo inspection system |
| US7555099B2 (en) * | 2006-08-11 | 2009-06-30 | American Science And Engineering, Inc. | X-ray inspection with contemporaneous and proximal transmission and backscatter imaging |
| US8576982B2 (en) | 2008-02-01 | 2013-11-05 | Rapiscan Systems, Inc. | Personnel screening system |
| US8638904B2 (en) | 2010-03-14 | 2014-01-28 | Rapiscan Systems, Inc. | Personnel screening system |
| US8995619B2 (en) | 2010-03-14 | 2015-03-31 | Rapiscan Systems, Inc. | Personnel screening system |
| WO2009089172A2 (en) | 2008-01-04 | 2009-07-16 | Troxler Electronic Laboratories, Inc. | Nuclear gauges and methods of configuration and calibration of nuclear gauges |
| GB0809110D0 (en) | 2008-05-20 | 2008-06-25 | Rapiscan Security Products Inc | Gantry scanner systems |
| US8824632B2 (en) | 2009-07-29 | 2014-09-02 | American Science And Engineering, Inc. | Backscatter X-ray inspection van with top-down imaging |
| MY154268A (en) * | 2009-07-29 | 2015-05-29 | American Science & Eng Inc | Top-down x-ray inspection trailer |
| CN102893341A (zh) | 2010-03-14 | 2013-01-23 | 拉皮斯坎系统股份有限公司 | 波束形成装置 |
| ES2938411T3 (es) | 2011-02-08 | 2023-04-10 | Rapiscan Systems Inc | Vigilancia encubierta utilizando detección multimodalidad |
| US9218933B2 (en) | 2011-06-09 | 2015-12-22 | Rapidscan Systems, Inc. | Low-dose radiographic imaging system |
| US9057679B2 (en) | 2012-02-03 | 2015-06-16 | Rapiscan Systems, Inc. | Combined scatter and transmission multi-view imaging system |
| US10670740B2 (en) | 2012-02-14 | 2020-06-02 | American Science And Engineering, Inc. | Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors |
| EP2952068B1 (en) | 2013-01-31 | 2020-12-30 | Rapiscan Systems, Inc. | Portable security inspection system |
| US10515731B1 (en) | 2013-03-14 | 2019-12-24 | Troxler Electronic Laboratories, Inc. | Nuclear Gauge |
| US11280898B2 (en) | 2014-03-07 | 2022-03-22 | Rapiscan Systems, Inc. | Radar-based baggage and parcel inspection systems |
| US9891314B2 (en) | 2014-03-07 | 2018-02-13 | Rapiscan Systems, Inc. | Ultra wide band detectors |
| GB2530394B (en) | 2014-07-24 | 2017-11-22 | Johnson Matthey Plc | Apparatus for determining thickness of lining layer |
| GB2548299B (en) | 2014-11-25 | 2022-04-27 | Rapiscan Systems Inc | Intelligent security management system |
| JP6746603B2 (ja) | 2015-03-20 | 2020-08-26 | ラピスカン システムズ、インコーポレイテッド | 手持ち式携帯型後方散乱検査システム |
| EP3520120A4 (en) | 2016-09-30 | 2020-07-08 | American Science & Engineering, Inc. | X-RAY RADIATION SOURCE FOR TWO-DIMENSIONAL SCANNING RADIATION |
| SK8449Y1 (sk) * | 2018-05-11 | 2019-05-06 | Fulop Marko | Zariadenie na odhaľovanie nelegálnych úkrytov v náklade železnej rudy |
| WO2019245636A1 (en) | 2018-06-20 | 2019-12-26 | American Science And Engineering, Inc. | Wavelength-shifting sheet-coupled scintillation detectors |
| KR102609389B1 (ko) * | 2019-01-30 | 2023-12-01 | 노드슨 코포레이션 | 복사선-기반의 두께 게이지 |
| US11175245B1 (en) | 2020-06-15 | 2021-11-16 | American Science And Engineering, Inc. | Scatter X-ray imaging with adaptive scanning beam intensity |
| US11340361B1 (en) | 2020-11-23 | 2022-05-24 | American Science And Engineering, Inc. | Wireless transmission detector panel for an X-ray scanner |
| JP2022137873A (ja) * | 2021-03-09 | 2022-09-22 | 東芝Ｉｔコントロールシステム株式会社 | 放射線検査装置 |
| US12283389B2 (en) | 2021-10-01 | 2025-04-22 | Rapiscan Holdings, Inc. | Methods and systems for the concurrent generation of multiple substantially similar X-ray beams |
| US12385854B2 (en) | 2022-07-26 | 2025-08-12 | Rapiscan Holdings, Inc. | Methods and systems for performing on-the-fly automatic calibration adjustments of X-ray inspection systems |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2781453A (en) * | 1953-02-11 | 1957-02-12 | Univ Cornell | Methods and apparatus for determination of characteristics of matter in a surface layer |
| US2997586A (en) * | 1955-08-16 | 1961-08-22 | Serge A Scherbatskoy | Gamma ray testing |
| US2943202A (en) * | 1956-01-26 | 1960-06-28 | Curtiss Wright Corp | Apparatus for measuring wall thickness or density by radiation detection |
| US3148279A (en) * | 1961-05-04 | 1964-09-08 | Western Electric Co | Radiation method of measuring sheath thickness and eccentricity |
| US3202822A (en) * | 1961-11-13 | 1965-08-24 | Phillips Petroleum Co | Method of determining density utilizing a gamma ray source and a pair of detectors |
| US3497691A (en) * | 1967-06-30 | 1970-02-24 | Ohmart Corp | Dual mode fluorescence and backscatter coating thickness measuring gauge |
| US3840746A (en) * | 1971-12-13 | 1974-10-08 | Applied Invention Corp | Gamma ray density probe utilizing a pair of gamma ray sources and a gamma ray detector |
| JPS5222553B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1973-02-20 | 1977-06-17 | ||
| US3854042A (en) * | 1973-05-10 | 1974-12-10 | A Ott | Device for measuring the thickness of layers with a radionuclide irradiating the layer |
| DE2544354A1 (de) * | 1975-10-03 | 1977-04-14 | Siemens Ag | Verfahren zur bestimmung der dichte von koerpern mittels durchdingender strahlen und geraet zu seiner durchfuehrung |
| US4297575A (en) * | 1979-08-13 | 1981-10-27 | Halliburton Company | Simultaneous gamma ray measurement of formation bulk density and casing thickness |
-
1983
- 1983-03-22 US US06/477,820 patent/US4525854A/en not_active Expired - Lifetime
-
1984
- 1984-03-20 ZA ZA842056A patent/ZA842056B/xx unknown
- 1984-03-21 CA CA000450152A patent/CA1219970A/en not_active Expired
- 1984-03-21 IL IL71299A patent/IL71299A/xx not_active IP Right Cessation
- 1984-03-21 AU AU25986/84A patent/AU557007B2/en not_active Ceased
- 1984-03-21 EP EP84301920A patent/EP0120676B1/en not_active Expired
- 1984-03-21 DE DE8484301920T patent/DE3476698D1/de not_active Expired
- 1984-03-21 AT AT84301920T patent/ATE40750T1/de not_active IP Right Cessation
- 1984-03-22 JP JP59055199A patent/JPS59218941A/ja active Granted
- 1984-03-22 ES ES531211A patent/ES8607546A1/es not_active Expired
- 1984-03-26 NZ NZ207628A patent/NZ207628A/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| DE3476698D1 (en) | 1989-03-16 |
| ZA842056B (en) | 1984-10-31 |
| EP0120676B1 (en) | 1989-02-08 |
| CA1219970A (en) | 1987-03-31 |
| ES531211A0 (es) | 1986-06-01 |
| IL71299A0 (en) | 1984-06-29 |
| ES8607546A1 (es) | 1986-06-01 |
| US4525854A (en) | 1985-06-25 |
| ATE40750T1 (de) | 1989-02-15 |
| JPH0247697B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1990-10-22 |
| AU2598684A (en) | 1984-09-27 |
| IL71299A (en) | 1988-11-15 |
| JPS59218941A (ja) | 1984-12-10 |
| EP0120676A2 (en) | 1984-10-03 |
| AU557007B2 (en) | 1986-11-27 |
| EP0120676A3 (en) | 1985-06-12 |
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