IL71299A - Radiation scatter apparatus and method - Google Patents

Radiation scatter apparatus and method

Info

Publication number
IL71299A
IL71299A IL71299A IL7129984A IL71299A IL 71299 A IL71299 A IL 71299A IL 71299 A IL71299 A IL 71299A IL 7129984 A IL7129984 A IL 7129984A IL 71299 A IL71299 A IL 71299A
Authority
IL
Israel
Prior art keywords
density
determined
radiation scatter
pavement
radiation
Prior art date
Application number
IL71299A
Other languages
English (en)
Other versions
IL71299A0 (en
Original Assignee
Troxler Electronic Lab Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Troxler Electronic Lab Inc filed Critical Troxler Electronic Lab Inc
Publication of IL71299A0 publication Critical patent/IL71299A0/xx
Publication of IL71299A publication Critical patent/IL71299A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Radiation-Therapy Devices (AREA)
  • Measurement Of Radiation (AREA)
  • Heating, Cooling, Or Curing Plastics Or The Like In General (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
IL71299A 1983-03-22 1984-03-21 Radiation scatter apparatus and method IL71299A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/477,820 US4525854A (en) 1983-03-22 1983-03-22 Radiation scatter apparatus and method

Publications (2)

Publication Number Publication Date
IL71299A0 IL71299A0 (en) 1984-06-29
IL71299A true IL71299A (en) 1988-11-15

Family

ID=23897498

Family Applications (1)

Application Number Title Priority Date Filing Date
IL71299A IL71299A (en) 1983-03-22 1984-03-21 Radiation scatter apparatus and method

Country Status (11)

Country Link
US (1) US4525854A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
EP (1) EP0120676B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS59218941A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
AT (1) ATE40750T1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
AU (1) AU557007B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CA (1) CA1219970A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE3476698D1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
ES (1) ES8607546A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
IL (1) IL71299A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
NZ (1) NZ207628A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
ZA (1) ZA842056B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

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US4766319A (en) * 1987-02-12 1988-08-23 Troxler Electronic Laboratories, Inc. Portable nuclear moisture-density gauge with low activity nuclear sources
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GB9417419D0 (en) 1994-08-30 1994-10-19 Mackenzie Innes Method of measuring film thickness and monitoring liquid flow using backscattered x-rays and gamma-rays
GB2323440A (en) * 1997-03-17 1998-09-23 Johnson & Johnson Medical Measuring thickness of a layer within a body
US6190917B1 (en) 1998-03-20 2001-02-20 Cem Corporation Microwave apparatus and method for analysis of asphalt-aggregate compositions
US6207462B1 (en) 1998-03-20 2001-03-27 Cem Corporation Microwave apparatus and method for analysis of asphalt-aggregate compositions
WO2000033059A2 (en) * 1998-11-30 2000-06-08 American Science And Engineering, Inc. Multiple scatter system for threat identification
US6310936B1 (en) 1999-03-03 2001-10-30 Troxler Electronic Laboratories, Inc. Thin layer nuclear density guage
US6284986B1 (en) * 1999-03-15 2001-09-04 Seh America, Inc. Method of determining the thickness of a layer on a silicon substrate
US6492641B1 (en) * 2000-06-29 2002-12-10 Troxler Electronic Laboratories, Inc. Apparatus and method for gamma-ray determination of bulk density of samples
US6567498B1 (en) 2002-01-10 2003-05-20 Troxler Electronic Laboratories, Inc. Low activity nuclear density gauge
EP1357382A1 (en) * 2002-04-26 2003-10-29 Rijksuniversiteit te Groningen Method and system for determining a property of a pavement by measuring natural gamma radiation
US8503605B2 (en) 2002-07-23 2013-08-06 Rapiscan Systems, Inc. Four sided imaging system and method for detection of contraband
US7963695B2 (en) 2002-07-23 2011-06-21 Rapiscan Systems, Inc. Rotatable boom cargo scanning system
US9958569B2 (en) 2002-07-23 2018-05-01 Rapiscan Systems, Inc. Mobile imaging system and method for detection of contraband
US8275091B2 (en) 2002-07-23 2012-09-25 Rapiscan Systems, Inc. Compact mobile cargo scanning system
US6995667B2 (en) * 2002-12-23 2006-02-07 Instrotek, Inc. Systems, methods, and computer program products for automatic tracking and/or remote monitoring of nuclear gauges and/or data communication therewith
US6928141B2 (en) 2003-06-20 2005-08-09 Rapiscan, Inc. Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers
PL1733213T3 (pl) * 2004-04-09 2010-07-30 American Science & Eng Inc Eliminowanie przesłuchu w bramce kontrolnej z rozpraszaniem wstecznym, zawierającej wiele źródeł, przez zapewnienie, że tylko jedno źródło emituje promieniowanie w tym samym czasie
US7809109B2 (en) * 2004-04-09 2010-10-05 American Science And Engineering, Inc. Multiple image collection and synthesis for personnel screening
US7471764B2 (en) 2005-04-15 2008-12-30 Rapiscan Security Products, Inc. X-ray imaging system having improved weather resistance
US7569810B1 (en) 2005-08-30 2009-08-04 Troxler Electronic Laboratories, Inc. Methods, systems, and computer program products for measuring the density of material
US7605366B2 (en) * 2005-09-21 2009-10-20 Troxler Electronic Laboratories, Inc. Nuclear density gauge
EP2010943A2 (en) * 2006-04-21 2009-01-07 American Science & Engineering, Inc. X-ray imaging of baggage and personnel using arrays of discrete sources and multiple collimated beams
US7526064B2 (en) 2006-05-05 2009-04-28 Rapiscan Security Products, Inc. Multiple pass cargo inspection system
US7555099B2 (en) * 2006-08-11 2009-06-30 American Science And Engineering, Inc. X-ray inspection with contemporaneous and proximal transmission and backscatter imaging
US8576982B2 (en) 2008-02-01 2013-11-05 Rapiscan Systems, Inc. Personnel screening system
US8638904B2 (en) 2010-03-14 2014-01-28 Rapiscan Systems, Inc. Personnel screening system
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US8824632B2 (en) 2009-07-29 2014-09-02 American Science And Engineering, Inc. Backscatter X-ray inspection van with top-down imaging
MY154268A (en) * 2009-07-29 2015-05-29 American Science & Eng Inc Top-down x-ray inspection trailer
CN102893341A (zh) 2010-03-14 2013-01-23 拉皮斯坎系统股份有限公司 波束形成装置
ES2938411T3 (es) 2011-02-08 2023-04-10 Rapiscan Systems Inc Vigilancia encubierta utilizando detección multimodalidad
US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
US9057679B2 (en) 2012-02-03 2015-06-16 Rapiscan Systems, Inc. Combined scatter and transmission multi-view imaging system
US10670740B2 (en) 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
EP2952068B1 (en) 2013-01-31 2020-12-30 Rapiscan Systems, Inc. Portable security inspection system
US10515731B1 (en) 2013-03-14 2019-12-24 Troxler Electronic Laboratories, Inc. Nuclear Gauge
US11280898B2 (en) 2014-03-07 2022-03-22 Rapiscan Systems, Inc. Radar-based baggage and parcel inspection systems
US9891314B2 (en) 2014-03-07 2018-02-13 Rapiscan Systems, Inc. Ultra wide band detectors
GB2530394B (en) 2014-07-24 2017-11-22 Johnson Matthey Plc Apparatus for determining thickness of lining layer
GB2548299B (en) 2014-11-25 2022-04-27 Rapiscan Systems Inc Intelligent security management system
JP6746603B2 (ja) 2015-03-20 2020-08-26 ラピスカン システムズ、インコーポレイテッド 手持ち式携帯型後方散乱検査システム
EP3520120A4 (en) 2016-09-30 2020-07-08 American Science & Engineering, Inc. X-RAY RADIATION SOURCE FOR TWO-DIMENSIONAL SCANNING RADIATION
SK8449Y1 (sk) * 2018-05-11 2019-05-06 Fulop Marko Zariadenie na odhaľovanie nelegálnych úkrytov v náklade železnej rudy
WO2019245636A1 (en) 2018-06-20 2019-12-26 American Science And Engineering, Inc. Wavelength-shifting sheet-coupled scintillation detectors
KR102609389B1 (ko) * 2019-01-30 2023-12-01 노드슨 코포레이션 복사선-기반의 두께 게이지
US11175245B1 (en) 2020-06-15 2021-11-16 American Science And Engineering, Inc. Scatter X-ray imaging with adaptive scanning beam intensity
US11340361B1 (en) 2020-11-23 2022-05-24 American Science And Engineering, Inc. Wireless transmission detector panel for an X-ray scanner
JP2022137873A (ja) * 2021-03-09 2022-09-22 東芝Ｉｔコントロールシステム株式会社 放射線検査装置
US12283389B2 (en) 2021-10-01 2025-04-22 Rapiscan Holdings, Inc. Methods and systems for the concurrent generation of multiple substantially similar X-ray beams
US12385854B2 (en) 2022-07-26 2025-08-12 Rapiscan Holdings, Inc. Methods and systems for performing on-the-fly automatic calibration adjustments of X-ray inspection systems

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US2781453A (en) * 1953-02-11 1957-02-12 Univ Cornell Methods and apparatus for determination of characteristics of matter in a surface layer
US2997586A (en) * 1955-08-16 1961-08-22 Serge A Scherbatskoy Gamma ray testing
US2943202A (en) * 1956-01-26 1960-06-28 Curtiss Wright Corp Apparatus for measuring wall thickness or density by radiation detection
US3148279A (en) * 1961-05-04 1964-09-08 Western Electric Co Radiation method of measuring sheath thickness and eccentricity
US3202822A (en) * 1961-11-13 1965-08-24 Phillips Petroleum Co Method of determining density utilizing a gamma ray source and a pair of detectors
US3497691A (en) * 1967-06-30 1970-02-24 Ohmart Corp Dual mode fluorescence and backscatter coating thickness measuring gauge
US3840746A (en) * 1971-12-13 1974-10-08 Applied Invention Corp Gamma ray density probe utilizing a pair of gamma ray sources and a gamma ray detector
JPS5222553B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1973-02-20 1977-06-17
US3854042A (en) * 1973-05-10 1974-12-10 A Ott Device for measuring the thickness of layers with a radionuclide irradiating the layer
DE2544354A1 (de) * 1975-10-03 1977-04-14 Siemens Ag Verfahren zur bestimmung der dichte von koerpern mittels durchdingender strahlen und geraet zu seiner durchfuehrung
US4297575A (en) * 1979-08-13 1981-10-27 Halliburton Company Simultaneous gamma ray measurement of formation bulk density and casing thickness

Also Published As

Publication number Publication date
DE3476698D1 (en) 1989-03-16
ZA842056B (en) 1984-10-31
EP0120676B1 (en) 1989-02-08
CA1219970A (en) 1987-03-31
ES531211A0 (es) 1986-06-01
IL71299A0 (en) 1984-06-29
ES8607546A1 (es) 1986-06-01
US4525854A (en) 1985-06-25
ATE40750T1 (de) 1989-02-15
JPH0247697B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1990-10-22
AU2598684A (en) 1984-09-27
JPS59218941A (ja) 1984-12-10
EP0120676A2 (en) 1984-10-03
AU557007B2 (en) 1986-11-27
EP0120676A3 (en) 1985-06-12
NZ207628A (en) 1988-02-29

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