NO983884D0 - Sonde for feilaktiveringsanordninger - Google Patents

Sonde for feilaktiveringsanordninger

Info

Publication number
NO983884D0
NO983884D0 NO983884A NO983884A NO983884D0 NO 983884 D0 NO983884 D0 NO 983884D0 NO 983884 A NO983884 A NO 983884A NO 983884 A NO983884 A NO 983884A NO 983884 D0 NO983884 D0 NO 983884D0
Authority
NO
Norway
Prior art keywords
probe
fault
malfunctioning devices
emitter
reference signal
Prior art date
Application number
NO983884A
Other languages
English (en)
Norwegian (no)
Other versions
NO983884L (no
Inventor
Piero Belforte
Flavio Maggioni
Original Assignee
Cselt Centro Studi Lab Telecom
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cselt Centro Studi Lab Telecom filed Critical Cselt Centro Studi Lab Telecom
Publication of NO983884D0 publication Critical patent/NO983884D0/no
Publication of NO983884L publication Critical patent/NO983884L/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators

Landscapes

  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Valve Device For Special Equipments (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measuring Leads Or Probes (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
  • Eye Examination Apparatus (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Control Of Stepping Motors (AREA)
NO983884A 1996-03-06 1998-08-24 Sonde for feilaktiveringsanordninger NO983884L (no)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT96TO000168A IT1285299B1 (it) 1996-03-06 1996-03-06 Sonda per dispositivi attuatori di guasto
PCT/EP1997/001096 WO1997033180A1 (en) 1996-03-06 1997-03-05 Probe for fault actuation devices

Publications (2)

Publication Number Publication Date
NO983884D0 true NO983884D0 (no) 1998-08-24
NO983884L NO983884L (no) 1998-08-24

Family

ID=11414361

Family Applications (1)

Application Number Title Priority Date Filing Date
NO983884A NO983884L (no) 1996-03-06 1998-08-24 Sonde for feilaktiveringsanordninger

Country Status (12)

Country Link
US (1) US6320390B1 (de)
EP (1) EP0885397B1 (de)
JP (1) JP3201611B2 (de)
AT (1) ATE206525T1 (de)
AU (1) AU708184B2 (de)
CA (1) CA2248315A1 (de)
DE (1) DE69707108T2 (de)
ES (1) ES2166069T3 (de)
IT (1) IT1285299B1 (de)
NO (1) NO983884L (de)
PT (1) PT885397E (de)
WO (1) WO1997033180A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4275583B2 (ja) * 2004-06-24 2009-06-10 ユーディナデバイス株式会社 電子モジュール
US7609080B2 (en) * 2005-03-22 2009-10-27 Formfactor, Inc. Voltage fault detection and protection

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2363360B1 (de) * 1973-12-20 1975-06-05 Koerting Radio Werke Gmbh, 8211 Grassau Transistorverstärker
US4309657A (en) * 1980-01-09 1982-01-05 Burroughs Corporation Apparatus for analyzing semiconductor memories
JPS57153464A (en) * 1981-03-18 1982-09-22 Toshiba Corp Injection type semiconductor integrated logic circuit
JPS62183215A (ja) 1986-02-07 1987-08-11 Hitachi Ltd 半導体集積回路装置
EP0262367A1 (de) 1986-09-30 1988-04-06 Siemens Aktiengesellschaft Mechanische Sonde zur Messung zeitabhängiger elektrischer Signale
US4841240A (en) * 1988-01-29 1989-06-20 American Telephone And Telegraph Company, At&T Bell Laboratories Method and apparatus for verifying the continuity between a circuit board and a test fixture

Also Published As

Publication number Publication date
ITTO960168A0 (de) 1996-03-06
WO1997033180A1 (en) 1997-09-12
EP0885397A1 (de) 1998-12-23
IT1285299B1 (it) 1998-06-03
JP3201611B2 (ja) 2001-08-27
CA2248315A1 (en) 1997-09-12
ES2166069T3 (es) 2002-04-01
NO983884L (no) 1998-08-24
PT885397E (pt) 2002-03-28
ATE206525T1 (de) 2001-10-15
AU708184B2 (en) 1999-07-29
AU2024097A (en) 1997-09-22
DE69707108T2 (de) 2002-11-07
DE69707108D1 (de) 2001-11-08
JPH11505031A (ja) 1999-05-11
ITTO960168A1 (it) 1997-09-06
EP0885397B1 (de) 2001-10-04
US6320390B1 (en) 2001-11-20

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Legal Events

Date Code Title Description
FC2A Withdrawal, rejection or dismissal of laid open patent application