NO982908L - FremgangsmÕte og system for Õ lese et datasignal som angis fra et aktivt pi - Google Patents

FremgangsmÕte og system for Õ lese et datasignal som angis fra et aktivt pi

Info

Publication number
NO982908L
NO982908L NO982908A NO982908A NO982908L NO 982908 L NO982908 L NO 982908L NO 982908 A NO982908 A NO 982908A NO 982908 A NO982908 A NO 982908A NO 982908 L NO982908 L NO 982908L
Authority
NO
Norway
Prior art keywords
reading
active
data signal
signal specified
specified
Prior art date
Application number
NO982908A
Other languages
English (en)
Other versions
NO982908D0 (no
NO322260B1 (no
Inventor
Einar Nygord
Original Assignee
Integrated Detector & Electron
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Integrated Detector & Electron filed Critical Integrated Detector & Electron
Publication of NO982908D0 publication Critical patent/NO982908D0/no
Publication of NO982908L publication Critical patent/NO982908L/no
Publication of NO322260B1 publication Critical patent/NO322260B1/no

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/544—Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/44—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
    • H04N25/443—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array by reading pixels from selected 2D regions of the array, e.g. for windowing or digital zooming
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/79—Arrangements of circuitry being divided between different or multiple substrates, chips or circuit boards, e.g. stacked image sensors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544—Marks applied to semiconductor devices or parts
    • H01L2223/54473—Marks applied to semiconductor devices or parts for use after dicing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Molecular Biology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Nuclear Medicine (AREA)
  • Measurement Of Radiation (AREA)
  • Facsimile Heads (AREA)
  • Radar Systems Or Details Thereof (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
NO19982908A 1997-07-04 1998-06-22 Fremgangsmate og system for a lese et datasignal som angis fra et aktivt piksel i en sensor NO322260B1 (no)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL12123897A IL121238A (en) 1997-07-04 1997-07-04 Multi-channel reading circuit for particle detector

Publications (3)

Publication Number Publication Date
NO982908D0 NO982908D0 (no) 1998-06-22
NO982908L true NO982908L (no) 1999-01-05
NO322260B1 NO322260B1 (no) 2006-09-04

Family

ID=11070343

Family Applications (1)

Application Number Title Priority Date Filing Date
NO19982908A NO322260B1 (no) 1997-07-04 1998-06-22 Fremgangsmate og system for a lese et datasignal som angis fra et aktivt piksel i en sensor

Country Status (6)

Country Link
US (1) US6153882A (no)
EP (1) EP0893705B1 (no)
JP (1) JPH11231058A (no)
DE (1) DE69818763T2 (no)
IL (1) IL121238A (no)
NO (1) NO322260B1 (no)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2789764B1 (fr) 1999-02-17 2001-03-30 Commissariat Energie Atomique Analyseur d'impulsion de rayonnement unique et breve
FR2794894B1 (fr) * 1999-06-08 2001-11-30 Commissariat Energie Atomique Dispositif de detection de rayonnements connecte par film conducteur anisotrope
DE19950919B4 (de) * 1999-10-21 2004-06-17 Forschungszentrum Jülich GmbH Auswerteeinheit zum Auswerten von Detektorereignissen
NL1019287C1 (nl) * 2000-11-08 2002-01-23 Koninkl Philips Electronics Nv R÷ntgenanalysetoestel met een vaste stof plaatsgevoelige r÷ntgendetector.
US6509565B2 (en) 2001-02-20 2003-01-21 Ideas Asa Discriminator circuit for a charge detector
US6590215B2 (en) 2001-04-05 2003-07-08 Toshiba Corporation Readout circuit for a charge detector
DE10201645B4 (de) * 2002-01-17 2007-04-26 Infineon Technologies Ag Verfahren zur Codierung und Authentifizierung von Halbleiterschaltungen
IL148555A (en) 2002-03-07 2007-07-04 Gamma Medica Ideas Norway As Readout circuit for particle detector
JP2009516476A (ja) * 2005-11-14 2009-04-16 サーノフ コーポレーション ハイブリッドのピクセル配列を有するｃｍｏｓイメージ・センサ
WO2009043347A1 (en) * 2007-10-04 2009-04-09 Danmarks Tekniske Universitet A detector for detecting particle radiation of an energy in the range of 150 ev to 300 kev, and a materials mapping apparatus with such a detector.
JP4696172B2 (ja) * 2009-06-15 2011-06-08 古河機械金属株式会社 信号光検出装置及び信号光検出方法
CN103070697B (zh) * 2012-12-31 2014-12-24 沈阳东软医疗系统有限公司 Pet系统探测装置的符合判断电路及其调整装置和方法
US9753150B2 (en) 2014-09-23 2017-09-05 Sharpxview AS Low-rate inexpensive digital γ-ray imaging/inspection system
CN107105748A (zh) 2014-09-25 2017-08-29 纽奇瑞迪专业有限公司 在青春期前的少年中用于促生长的营养补充剂
DE102015117494A1 (de) * 2015-10-14 2017-04-20 Forschungszentrum Jülich GmbH Verfahren, Vorrichtung und Verwendung der Vorrichtung zur Detektion von Neutronen sowie Auslese- und Verarbeitungseinrichtung
JP7176917B2 (ja) * 2018-10-02 2022-11-22 ソニーセミコンダクタソリューションズ株式会社 固体撮像装置及び撮像装置
CN113376680B (zh) * 2020-03-09 2024-03-12 清华大学 用于半导体探测器的读出电路和方法以及半导体探测系统

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8802252A (nl) * 1988-05-31 1989-12-18 Imec Inter Uni Micro Electr Detectie-inrichting voor straling.
JPH0670109A (ja) * 1992-08-21 1994-03-11 Canon Inc 画像処理装置
US5378902A (en) * 1993-09-02 1995-01-03 The Regents Of The University Of Colorado Optoelectronic maximum identifier for detecting the physical location of a maximum intensity optical signal in a winner-take-all network
US5452001A (en) * 1993-10-22 1995-09-19 Xerox Corporation Serial pixel readout scheme for butted sensor chips in multi-chip input scanner
US5619040A (en) * 1994-03-29 1997-04-08 Shapiro; Stephen L. Data acquisition system
US5567944A (en) * 1995-04-28 1996-10-22 University Of Cincinnati Compton camera for in vivo medical imaging of radiopharmaceuticals
EP0939909B1 (en) * 1996-11-24 2003-06-25 Ge Medical Systems Israel, Ltd. Solid state gamma camera

Also Published As

Publication number Publication date
IL121238A0 (en) 1998-01-04
DE69818763D1 (de) 2003-11-13
EP0893705A3 (en) 2000-03-29
EP0893705B1 (en) 2003-10-08
US6153882A (en) 2000-11-28
JPH11231058A (ja) 1999-08-27
NO982908D0 (no) 1998-06-22
DE69818763T2 (de) 2004-08-05
EP0893705A2 (en) 1999-01-27
IL121238A (en) 2002-07-25
NO322260B1 (no) 2006-09-04

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Legal Events

Date Code Title Description
CHAD Change of the owner's name or address (par. 44 patent law, par. patentforskriften)

Owner name: GAMMA MEDICA, US

MK1K Patent expired