NO982908D0 - FremgangsmÕte og system for Õ lese et datasignal som angis fra et aktivt bildeelement i en sensor - Google Patents

FremgangsmÕte og system for Õ lese et datasignal som angis fra et aktivt bildeelement i en sensor

Info

Publication number
NO982908D0
NO982908D0 NO982908A NO982908A NO982908D0 NO 982908 D0 NO982908 D0 NO 982908D0 NO 982908 A NO982908 A NO 982908A NO 982908 A NO982908 A NO 982908A NO 982908 D0 NO982908 D0 NO 982908D0
Authority
NO
Norway
Prior art keywords
reading
sensor
data signal
active pixel
signal specified
Prior art date
Application number
NO982908A
Other languages
English (en)
Other versions
NO322260B1 (no
NO982908L (no
Inventor
Einar Nygord
Original Assignee
Integrated Detector & Electron
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Integrated Detector & Electron filed Critical Integrated Detector & Electron
Publication of NO982908D0 publication Critical patent/NO982908D0/no
Publication of NO982908L publication Critical patent/NO982908L/no
Publication of NO322260B1 publication Critical patent/NO322260B1/no

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/544Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • G01T1/247Detector read-out circuitry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914Measurement of spatial distribution of radiation
    • G01T1/2921Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/44Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
    • H04N25/443Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array by reading pixels from selected 2D regions of the array, e.g. for windowing or digital zooming
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/79Arrangements of circuitry being divided between different or multiple substrates, chips or circuit boards, e.g. stacked image sensors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544Marks applied to semiconductor devices or parts
    • H01L2223/54473Marks applied to semiconductor devices or parts for use after dicing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Molecular Biology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Nuclear Medicine (AREA)
  • Measurement Of Radiation (AREA)
  • Facsimile Heads (AREA)
  • Radar Systems Or Details Thereof (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
NO19982908A 1997-07-04 1998-06-22 Fremgangsmate og system for a lese et datasignal som angis fra et aktivt piksel i en sensor NO322260B1 (no)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL12123897A IL121238A (en) 1997-07-04 1997-07-04 Multi-channel reading circuit for particle detector

Publications (3)

Publication Number Publication Date
NO982908D0 true NO982908D0 (no) 1998-06-22
NO982908L NO982908L (no) 1999-01-05
NO322260B1 NO322260B1 (no) 2006-09-04

Family

ID=11070343

Family Applications (1)

Application Number Title Priority Date Filing Date
NO19982908A NO322260B1 (no) 1997-07-04 1998-06-22 Fremgangsmate og system for a lese et datasignal som angis fra et aktivt piksel i en sensor

Country Status (6)

Country Link
US (1) US6153882A (no)
EP (1) EP0893705B1 (no)
JP (1) JPH11231058A (no)
DE (1) DE69818763T2 (no)
IL (1) IL121238A (no)
NO (1) NO322260B1 (no)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2789764B1 (fr) * 1999-02-17 2001-03-30 Commissariat Energie Atomique Analyseur d'impulsion de rayonnement unique et breve
FR2794894B1 (fr) * 1999-06-08 2001-11-30 Commissariat Energie Atomique Dispositif de detection de rayonnements connecte par film conducteur anisotrope
DE19950919B4 (de) * 1999-10-21 2004-06-17 Forschungszentrum Jülich GmbH Auswerteeinheit zum Auswerten von Detektorereignissen
NL1019287C1 (nl) * 2000-11-08 2002-01-23 Koninkl Philips Electronics Nv R÷ntgenanalysetoestel met een vaste stof plaatsgevoelige r÷ntgendetector.
US6509565B2 (en) 2001-02-20 2003-01-21 Ideas Asa Discriminator circuit for a charge detector
US6590215B2 (en) 2001-04-05 2003-07-08 Toshiba Corporation Readout circuit for a charge detector
DE10201645B4 (de) * 2002-01-17 2007-04-26 Infineon Technologies Ag Verfahren zur Codierung und Authentifizierung von Halbleiterschaltungen
IL148555A (en) 2002-03-07 2007-07-04 Gamma Medica Ideas Norway As Readout circuit for particle detector
JP2009516476A (ja) * 2005-11-14 2009-04-16 サーノフ コーポレーション ハイブリッドのピクセル配列を有するcmosイメージ・センサ
CN101861529B (zh) * 2007-10-04 2013-06-19 丹麦技术大学 用于检测能量在150eV至300keV范围内的粒子辐射的检测器以及具有这种检测器的材料映像装置
JP4696172B2 (ja) * 2009-06-15 2011-06-08 古河機械金属株式会社 信号光検出装置及び信号光検出方法
CN103070697B (zh) * 2012-12-31 2014-12-24 沈阳东软医疗系统有限公司 Pet系统探测装置的符合判断电路及其调整装置和方法
US9753150B2 (en) 2014-09-23 2017-09-05 Sharpxview AS Low-rate inexpensive digital γ-ray imaging/inspection system
US10278980B2 (en) 2014-09-25 2019-05-07 Nutriteen Professionals Ltd Nutritional supplements for growth enhancement in pre-pubertal adolescents
DE102015117494A1 (de) * 2015-10-14 2017-04-20 Forschungszentrum Jülich GmbH Verfahren, Vorrichtung und Verwendung der Vorrichtung zur Detektion von Neutronen sowie Auslese- und Verarbeitungseinrichtung
JP7176917B2 (ja) 2018-10-02 2022-11-22 ソニーセミコンダクタソリューションズ株式会社 固体撮像装置及び撮像装置
CN113376680B (zh) * 2020-03-09 2024-03-12 清华大学 用于半导体探测器的读出电路和方法以及半导体探测系统

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8802252A (nl) * 1988-05-31 1989-12-18 Imec Inter Uni Micro Electr Detectie-inrichting voor straling.
JPH0670109A (ja) * 1992-08-21 1994-03-11 Canon Inc 画像処理装置
US5378902A (en) * 1993-09-02 1995-01-03 The Regents Of The University Of Colorado Optoelectronic maximum identifier for detecting the physical location of a maximum intensity optical signal in a winner-take-all network
US5452001A (en) * 1993-10-22 1995-09-19 Xerox Corporation Serial pixel readout scheme for butted sensor chips in multi-chip input scanner
US5619040A (en) * 1994-03-29 1997-04-08 Shapiro; Stephen L. Data acquisition system
US5567944A (en) * 1995-04-28 1996-10-22 University Of Cincinnati Compton camera for in vivo medical imaging of radiopharmaceuticals
US6242745B1 (en) * 1996-11-24 2001-06-05 Ge Medical Systems Israel Ltd. Solid state gamma camera

Also Published As

Publication number Publication date
IL121238A0 (en) 1998-01-04
IL121238A (en) 2002-07-25
NO322260B1 (no) 2006-09-04
EP0893705A2 (en) 1999-01-27
DE69818763T2 (de) 2004-08-05
EP0893705A3 (en) 2000-03-29
DE69818763D1 (de) 2003-11-13
JPH11231058A (ja) 1999-08-27
US6153882A (en) 2000-11-28
EP0893705B1 (en) 2003-10-08
NO982908L (no) 1999-01-05

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Legal Events

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CHAD Change of the owner's name or address (par. 44 patent law, par. patentforskriften)

Owner name: GAMMA MEDICA, US

MK1K Patent expired