NO314520B1 - Innretning og fremgangsmåte for å måle deformasjon til en mekanisk testpröve - Google Patents
Innretning og fremgangsmåte for å måle deformasjon til en mekanisk testpröve Download PDFInfo
- Publication number
- NO314520B1 NO314520B1 NO20000272A NO20000272A NO314520B1 NO 314520 B1 NO314520 B1 NO 314520B1 NO 20000272 A NO20000272 A NO 20000272A NO 20000272 A NO20000272 A NO 20000272A NO 314520 B1 NO314520 B1 NO 314520B1
- Authority
- NO
- Norway
- Prior art keywords
- sample
- light beam
- devices
- stated
- interferometer
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 26
- 238000000034 method Methods 0.000 title claims abstract description 24
- 238000005259 measurement Methods 0.000 claims abstract description 24
- 238000001314 profilometry Methods 0.000 claims abstract description 7
- 238000005305 interferometry Methods 0.000 claims abstract description 5
- 230000002093 peripheral effect Effects 0.000 claims description 4
- 238000006073 displacement reaction Methods 0.000 claims description 2
- 230000003287 optical effect Effects 0.000 abstract description 21
- 239000000463 material Substances 0.000 description 4
- 239000000919 ceramic Substances 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 238000004080 punching Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
- G01N3/06—Special adaptations of indicating or recording means
- G01N3/068—Special adaptations of indicating or recording means with optical indicating or recording means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
- G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02029—Combination with non-interferometric systems, i.e. for measuring the object
- G01B9/02031—With non-optical systems, e.g. tactile
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/28—Investigating ductility, e.g. suitability of sheet metal for deep-drawing or spinning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/003—Generation of the force
- G01N2203/005—Electromagnetic means
- G01N2203/0051—Piezoelectric means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/026—Specifications of the specimen
- G01N2203/0262—Shape of the specimen
- G01N2203/0278—Thin specimens
- G01N2203/0282—Two dimensional, e.g. tapes, webs, sheets, strips, disks or membranes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/04—Chucks, fixtures, jaws, holders or anvils
- G01N2203/0482—Chucks, fixtures, jaws, holders or anvils comprising sensing means
- G01N2203/0494—Clamping ring, "whole periphery" clamping
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP97830375A EP0893669B1 (de) | 1997-07-21 | 1997-07-21 | Verfahren und Vorrichtung zum Messen der Deformation eines mechanischen Prüfstücks |
| PCT/EP1998/004531 WO1999005472A1 (en) | 1997-07-21 | 1998-07-20 | Device and method for measuring deformation of a mechanical test specimen |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| NO20000272D0 NO20000272D0 (no) | 2000-01-19 |
| NO20000272L NO20000272L (no) | 2000-03-17 |
| NO314520B1 true NO314520B1 (no) | 2003-03-31 |
Family
ID=8230723
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NO20000272A NO314520B1 (no) | 1997-07-21 | 2000-01-19 | Innretning og fremgangsmåte for å måle deformasjon til en mekanisk testpröve |
Country Status (11)
| Country | Link |
|---|---|
| US (1) | US6279404B1 (de) |
| EP (1) | EP0893669B1 (de) |
| JP (1) | JP2001511511A (de) |
| AT (1) | ATE219239T1 (de) |
| CA (1) | CA2297152A1 (de) |
| DE (1) | DE69713318T2 (de) |
| DK (1) | DK0893669T3 (de) |
| ES (1) | ES2178747T3 (de) |
| NO (1) | NO314520B1 (de) |
| PT (1) | PT893669E (de) |
| WO (1) | WO1999005472A1 (de) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB9903638D0 (en) * | 1999-02-17 | 1999-04-07 | European Community | A measurement method and measurement apparatus |
| JP3549153B2 (ja) * | 2000-09-20 | 2004-08-04 | 株式会社共和電業 | 光ファイバ干渉センサ、光ファイバ干渉センサの信号処理システム、信号処理方法および記録媒体 |
| DE10213910B4 (de) * | 2002-03-28 | 2004-05-06 | Wieland-Werke Ag | Objektivierung von (Oberflächen-)Prüfverfahren durch Bildverarbeitung |
| JP3955899B2 (ja) * | 2002-09-20 | 2007-08-08 | 国立大学法人埼玉大学 | 電子的スペックル干渉法を用いた変形計測方法および装置 |
| JP3944558B2 (ja) * | 2003-11-11 | 2007-07-11 | 国立大学法人群馬大学 | 材料試験方法 |
| WO2007109616A2 (en) * | 2006-03-17 | 2007-09-27 | William Marsh Rice University | System and method to measure nano-scale stress and strain in materials |
| US7730950B2 (en) * | 2007-01-19 | 2010-06-08 | Halliburton Energy Services, Inc. | Methods for treating intervals of a subterranean formation having variable permeability |
| US8042405B2 (en) * | 2008-07-23 | 2011-10-25 | University Of Kentucky Research Foundation | Method and apparatus for characterizing microscale formability of thin sheet materials |
| KR101706100B1 (ko) * | 2011-12-15 | 2017-02-15 | 삼성전자주식회사 | 성형한계선도 획득용 시험장치 |
| CN104315847A (zh) * | 2014-09-19 | 2015-01-28 | 国家电网公司 | 一种用于小冲杆蠕变试验的高温加热炉 |
| CN106918501A (zh) * | 2016-11-25 | 2017-07-04 | 华东理工大学 | 多尺寸小冲杆试样夹持装置 |
| US20200249138A1 (en) * | 2017-10-16 | 2020-08-06 | Imprintec GmbH | Device and Method for Automatic Workpiece Inspection |
| CN108693026A (zh) * | 2017-12-22 | 2018-10-23 | 宁波诺丁汉大学 | 一种基于声发射传感器的小冲杆试验系统及其试验方法 |
| CN108645697A (zh) * | 2018-05-14 | 2018-10-12 | 西南科技大学 | 一种用于核结构材料的小样品力学性能测试系统 |
| CN108716892B (zh) * | 2018-06-27 | 2019-11-29 | 安阳工学院 | 一种带有光学测量的圆柱滚子变形装置及其测量方法 |
| JP7516422B2 (ja) | 2019-05-15 | 2024-07-16 | コーニング インコーポレイテッド | 縁部強度試験方法及び装置 |
| CN110823119B (zh) * | 2019-11-26 | 2024-09-03 | 深圳大学 | 基于视觉-激光复合测量的高压实验舱测量系统 |
| CN110987677B (zh) * | 2019-12-25 | 2021-08-10 | 上海交通大学 | 提高微形变加载精度的方法及装置 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DD137619A1 (de) * | 1978-07-11 | 1979-09-12 | Gerd Jaeger | Vorrichtung,insbesondere zur digitalen kraftmessung |
| US4280764A (en) * | 1980-02-21 | 1981-07-28 | The United States Of America As Represented By The Secretary Of The Navy | Phase-conjugate interferometer |
| DE3016879C2 (de) * | 1980-05-02 | 1982-12-30 | Krautkrämer, GmbH, 5000 Köln | Verfahren und Vorrichtung zur zerstörungsfreien Ultraschall-Werkstoffprüfung |
| DK155250C (da) * | 1985-08-13 | 1989-07-24 | Lars Bager | Fremgangsmaade og apparat til maaling af afstandsvariationer |
| US4690001A (en) * | 1985-11-13 | 1987-09-01 | Mts Systems Corporation | Optical displacement transducer usable as an extensometer |
| EP0354250B1 (de) * | 1988-08-01 | 1993-06-23 | Carl Schenck Ag | Durchstossvorrichtung für die Prüfung von Werkstoffproben oder Bauteilen |
| DE4036120C2 (de) * | 1990-11-13 | 1994-06-23 | Steinbichler Hans | Verfahren zur Bestimmung der Wegänderung von Strahlen, insbesondere von Lichtstrahlen, und Vorrichtung zur Durchführung des Verfahrens |
| US5202939A (en) * | 1992-07-21 | 1993-04-13 | Institut National D'optique | Fabry-perot optical sensing device for measuring a physical parameter |
| US6128082A (en) * | 1998-09-18 | 2000-10-03 | Board Of Trustees Operating Michigan State University | Technique and apparatus for performing electronic speckle pattern interferometry |
| JP3585034B2 (ja) * | 2000-12-14 | 2004-11-04 | 日産自動車株式会社 | 高強度レース及びその製造方法 |
-
1997
- 1997-07-21 ES ES97830375T patent/ES2178747T3/es not_active Expired - Lifetime
- 1997-07-21 EP EP97830375A patent/EP0893669B1/de not_active Expired - Lifetime
- 1997-07-21 AT AT97830375T patent/ATE219239T1/de not_active IP Right Cessation
- 1997-07-21 PT PT97830375T patent/PT893669E/pt unknown
- 1997-07-21 DK DK97830375T patent/DK0893669T3/da active
- 1997-07-21 DE DE69713318T patent/DE69713318T2/de not_active Expired - Lifetime
-
1998
- 1998-07-20 US US09/463,263 patent/US6279404B1/en not_active Expired - Fee Related
- 1998-07-20 CA CA002297152A patent/CA2297152A1/en not_active Abandoned
- 1998-07-20 WO PCT/EP1998/004531 patent/WO1999005472A1/en active Application Filing
- 1998-07-20 JP JP2000504415A patent/JP2001511511A/ja active Pending
-
2000
- 2000-01-19 NO NO20000272A patent/NO314520B1/no not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| ES2178747T3 (es) | 2003-01-01 |
| PT893669E (pt) | 2002-11-29 |
| US6279404B1 (en) | 2001-08-28 |
| DE69713318T2 (de) | 2003-01-16 |
| WO1999005472A1 (en) | 1999-02-04 |
| EP0893669A1 (de) | 1999-01-27 |
| ATE219239T1 (de) | 2002-06-15 |
| CA2297152A1 (en) | 1999-02-04 |
| JP2001511511A (ja) | 2001-08-14 |
| EP0893669B1 (de) | 2002-06-12 |
| DE69713318D1 (de) | 2002-07-18 |
| NO20000272D0 (no) | 2000-01-19 |
| NO20000272L (no) | 2000-03-17 |
| DK0893669T3 (da) | 2002-10-07 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM1K | Lapsed by not paying the annual fees |