NL98715C - - Google Patents
Info
- Publication number
- NL98715C NL98715C NL98715DA NL98715C NL 98715 C NL98715 C NL 98715C NL 98715D A NL98715D A NL 98715DA NL 98715 C NL98715 C NL 98715C
- Authority
- NL
- Netherlands
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/295—Electron or ion diffraction tubes
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Microscoopes, Condenser (AREA)
- Electron Sources, Ion Sources (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP325278X | 1953-09-04 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL98715C true NL98715C (en:Method) |
Family
ID=12361412
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL98715D NL98715C (en:Method) | 1953-09-04 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US2802110A (en:Method) |
| CH (1) | CH325278A (en:Method) |
| DE (1) | DE1049988B (en:Method) |
| FR (1) | FR1111567A (en:Method) |
| GB (1) | GB763522A (en:Method) |
| NL (1) | NL98715C (en:Method) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3005098A (en) * | 1958-03-31 | 1961-10-17 | Gen Electric | X-ray emission analysis |
| GB918297A (en) * | 1960-04-07 | 1963-02-13 | William Charles Nixon | Improvements in electron microscopes |
| NL265945A (en:Method) * | 1960-06-18 | |||
| US3313936A (en) * | 1964-01-06 | 1967-04-11 | Varian Associates | Low energy electron diffraction apparatus having three concentric tubular focusing elctrodes |
| US3225192A (en) * | 1962-12-28 | 1965-12-21 | Hitachi Ltd | Apparatus for producing electron microscope and diffraction images separately and simultaneously on the image plane |
| US3308294A (en) * | 1963-05-24 | 1967-03-07 | Hitachi Ltd | Tiltable specimen holder for electron microscopes with electrical deflecting means to wobble the electron beam image |
| NL154050B (nl) * | 1966-08-13 | 1977-07-15 | Philips Nv | Elektronenmicroscoop. |
| DE1614125B1 (de) * | 1967-02-24 | 1972-12-07 | Max Planck Gesellschaft | Korpuskularstrahlgeraet zur wahlweisen abbildung eines praeparats oder seiner beugungsdiagramms, insbesondere elektromikroskop |
| DE1614126B1 (de) * | 1967-02-27 | 1970-11-19 | Max Planck Gesellschaft | Korpuskularstrahlmikroskop,insbesondere Elektronenmikroskop,mit einer durch das Vorfeld einer Objektivlinse gebildeten Kondensorlinse und einer Bereichsblende |
| US3566109A (en) * | 1968-02-15 | 1971-02-23 | Bell Telephone Labor Inc | Electron microscope method and apparatus for improving image phase contrast |
| JPS5126227B2 (en:Method) * | 1971-09-21 | 1976-08-05 | ||
| JPS5136196B2 (en:Method) * | 1972-05-22 | 1976-10-07 | ||
| US3872305A (en) * | 1972-12-06 | 1975-03-18 | Jeol Ltd | Convertible scanning electron microscope |
| US4167676A (en) * | 1978-02-21 | 1979-09-11 | Bell Telephone Laboratories, Incorporated | Variable-spot scanning in an electron beam exposure system |
| JPS585956A (ja) * | 1981-07-01 | 1983-01-13 | Hitachi Ltd | 電子顕微鏡 |
| DE3423149A1 (de) * | 1984-06-22 | 1986-01-02 | Fa. Carl Zeiss, 7920 Heidenheim | Verfahren und anordnung zur elektronenenergiegefilterten abbildung eines objektes oder eines objektbeugungsdiagrammes mit einem transmissions-elektronenmikroskop |
| DE102006011615A1 (de) * | 2006-03-14 | 2007-09-20 | Carl Zeiss Nts Gmbh | Phasenkontrast-Elektronenmikroskop |
| EP2413345B1 (en) * | 2010-07-29 | 2013-02-20 | Carl Zeiss NTS GmbH | Charged particle beam system |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2422807A (en) * | 1945-03-29 | 1947-06-24 | Rca Corp | Art of ascertaining the atomic structure of materials |
| GB646019A (en) * | 1946-01-05 | 1950-11-15 | Philips Nv | Improvements in or relating to electron microscopes |
| GB680300A (en) * | 1950-02-23 | 1952-10-01 | Vickers Electrical Co Ltd | Improvements relating to magnetic electron lenses |
| DE876729C (de) * | 1950-09-03 | 1953-05-18 | Siemens Ag | Aus vier Linsen bestehendes Abbildungssystem fuer Elektronenmikroskope |
| US2688092A (en) * | 1951-05-21 | 1954-08-31 | Hitachi Ltd | Electron lens system |
| US2688091A (en) * | 1951-05-21 | 1954-08-31 | Hitachi Ltd | Electron lens system |
-
0
- NL NL98715D patent/NL98715C/xx active
- DE DENDAT1049988D patent/DE1049988B/de active Pending
-
1954
- 1954-07-27 US US446125A patent/US2802110A/en not_active Expired - Lifetime
- 1954-08-04 GB GB22693/54A patent/GB763522A/en not_active Expired
- 1954-08-27 FR FR1111567D patent/FR1111567A/fr not_active Expired
- 1954-09-01 CH CH325278D patent/CH325278A/de unknown
Also Published As
| Publication number | Publication date |
|---|---|
| FR1111567A (fr) | 1956-03-01 |
| US2802110A (en) | 1957-08-06 |
| DE1049988B (en:Method) | |
| CH325278A (de) | 1957-10-31 |
| GB763522A (en) | 1956-12-12 |