FR1111567A - Microscope électronique - Google Patents

Microscope électronique

Info

Publication number
FR1111567A
FR1111567A FR1111567DA FR1111567A FR 1111567 A FR1111567 A FR 1111567A FR 1111567D A FR1111567D A FR 1111567DA FR 1111567 A FR1111567 A FR 1111567A
Authority
FR
France
Prior art keywords
electronic microscope
microscope
electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NIHONDENSHI KOGAKU KENKYUSHO KK
Original Assignee
NIHONDENSHI KOGAKU KENKYUSHO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NIHONDENSHI KOGAKU KENKYUSHO KK filed Critical NIHONDENSHI KOGAKU KENKYUSHO KK
Application granted granted Critical
Publication of FR1111567A publication Critical patent/FR1111567A/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/295—Electron or ion diffraction tubes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Microscoopes, Condenser (AREA)
  • Electron Sources, Ion Sources (AREA)
FR1111567D 1953-09-04 1954-08-27 Microscope électronique Expired FR1111567A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP325278X 1953-09-04

Publications (1)

Publication Number Publication Date
FR1111567A true FR1111567A (fr) 1956-03-01

Family

ID=12361412

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1111567D Expired FR1111567A (fr) 1953-09-04 1954-08-27 Microscope électronique

Country Status (6)

Country Link
US (1) US2802110A (fr)
CH (1) CH325278A (fr)
DE (1) DE1049988B (fr)
FR (1) FR1111567A (fr)
GB (1) GB763522A (fr)
NL (1) NL98715C (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0166328A2 (fr) * 1984-06-22 1986-01-02 Firma Carl Zeiss Procédé et dispositif pour produire l'image d'un objet ou du diagramme de diffraction d'un objet par filtrage d'énergie des électrons avec un microscope électronique à transmission

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3005098A (en) * 1958-03-31 1961-10-17 Gen Electric X-ray emission analysis
GB918297A (en) * 1960-04-07 1963-02-13 William Charles Nixon Improvements in electron microscopes
NL265945A (fr) * 1960-06-18
US3313936A (en) * 1964-01-06 1967-04-11 Varian Associates Low energy electron diffraction apparatus having three concentric tubular focusing elctrodes
US3225192A (en) * 1962-12-28 1965-12-21 Hitachi Ltd Apparatus for producing electron microscope and diffraction images separately and simultaneously on the image plane
US3308294A (en) * 1963-05-24 1967-03-07 Hitachi Ltd Tiltable specimen holder for electron microscopes with electrical deflecting means to wobble the electron beam image
NL154050B (nl) * 1966-08-13 1977-07-15 Philips Nv Elektronenmicroscoop.
DE1614125B1 (de) * 1967-02-24 1972-12-07 Max Planck Gesellschaft Korpuskularstrahlgeraet zur wahlweisen abbildung eines praeparats oder seiner beugungsdiagramms, insbesondere elektromikroskop
DE1614126B1 (de) * 1967-02-27 1970-11-19 Max Planck Gesellschaft Korpuskularstrahlmikroskop,insbesondere Elektronenmikroskop,mit einer durch das Vorfeld einer Objektivlinse gebildeten Kondensorlinse und einer Bereichsblende
US3566109A (en) * 1968-02-15 1971-02-23 Bell Telephone Labor Inc Electron microscope method and apparatus for improving image phase contrast
JPS5126227B2 (fr) * 1971-09-21 1976-08-05
JPS5136196B2 (fr) * 1972-05-22 1976-10-07
US3872305A (en) * 1972-12-06 1975-03-18 Jeol Ltd Convertible scanning electron microscope
US4167676A (en) * 1978-02-21 1979-09-11 Bell Telephone Laboratories, Incorporated Variable-spot scanning in an electron beam exposure system
JPS585956A (ja) * 1981-07-01 1983-01-13 Hitachi Ltd 電子顕微鏡
DE102006011615A1 (de) * 2006-03-14 2007-09-20 Carl Zeiss Nts Gmbh Phasenkontrast-Elektronenmikroskop
EP2413345B1 (fr) * 2010-07-29 2013-02-20 Carl Zeiss NTS GmbH Système d'irradiation par particules chargées

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2422807A (en) * 1945-03-29 1947-06-24 Rca Corp Art of ascertaining the atomic structure of materials
GB646019A (en) * 1946-01-05 1950-11-15 Philips Nv Improvements in or relating to electron microscopes
GB680300A (en) * 1950-02-23 1952-10-01 Vickers Electrical Co Ltd Improvements relating to magnetic electron lenses
DE876729C (de) * 1950-09-03 1953-05-18 Siemens Ag Aus vier Linsen bestehendes Abbildungssystem fuer Elektronenmikroskope
US2688091A (en) * 1951-05-21 1954-08-31 Hitachi Ltd Electron lens system
US2688092A (en) * 1951-05-21 1954-08-31 Hitachi Ltd Electron lens system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0166328A2 (fr) * 1984-06-22 1986-01-02 Firma Carl Zeiss Procédé et dispositif pour produire l'image d'un objet ou du diagramme de diffraction d'un objet par filtrage d'énergie des électrons avec un microscope électronique à transmission
EP0166328A3 (en) * 1984-06-22 1986-12-30 Firma Carl Zeiss Method of and device for imaging an object or the diffraction diagram of an object through electron energy filtering with a transmission electron microscope

Also Published As

Publication number Publication date
NL98715C (fr)
DE1049988B (fr)
GB763522A (en) 1956-12-12
CH325278A (de) 1957-10-31
US2802110A (en) 1957-08-06

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