CH325278A - Elektronenmikroskop - Google Patents

Elektronenmikroskop

Info

Publication number
CH325278A
CH325278A CH325278DA CH325278A CH 325278 A CH325278 A CH 325278A CH 325278D A CH325278D A CH 325278DA CH 325278 A CH325278 A CH 325278A
Authority
CH
Switzerland
Prior art keywords
electron microscope
microscope
electron
Prior art date
Application number
Other languages
English (en)
Inventor
Kazato Kenji
Ito Kazuo
Original Assignee
Kabushikikaisha Nihondenshi Ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kabushikikaisha Nihondenshi Ko filed Critical Kabushikikaisha Nihondenshi Ko
Publication of CH325278A publication Critical patent/CH325278A/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/295—Electron or ion diffraction tubes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Microscoopes, Condenser (AREA)
  • Electron Sources, Ion Sources (AREA)
CH325278D 1953-09-04 1954-09-01 Elektronenmikroskop CH325278A (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP325278X 1953-09-04

Publications (1)

Publication Number Publication Date
CH325278A true CH325278A (de) 1957-10-31

Family

ID=12361412

Family Applications (1)

Application Number Title Priority Date Filing Date
CH325278D CH325278A (de) 1953-09-04 1954-09-01 Elektronenmikroskop

Country Status (6)

Country Link
US (1) US2802110A (de)
CH (1) CH325278A (de)
DE (1) DE1049988B (de)
FR (1) FR1111567A (de)
GB (1) GB763522A (de)
NL (1) NL98715C (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1614125B1 (de) * 1967-02-24 1972-12-07 Max Planck Gesellschaft Korpuskularstrahlgeraet zur wahlweisen abbildung eines praeparats oder seiner beugungsdiagramms, insbesondere elektromikroskop

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3005098A (en) * 1958-03-31 1961-10-17 Gen Electric X-ray emission analysis
GB918297A (en) * 1960-04-07 1963-02-13 William Charles Nixon Improvements in electron microscopes
NL265945A (de) * 1960-06-18
US3313936A (en) * 1964-01-06 1967-04-11 Varian Associates Low energy electron diffraction apparatus having three concentric tubular focusing elctrodes
US3225192A (en) * 1962-12-28 1965-12-21 Hitachi Ltd Apparatus for producing electron microscope and diffraction images separately and simultaneously on the image plane
US3308294A (en) * 1963-05-24 1967-03-07 Hitachi Ltd Tiltable specimen holder for electron microscopes with electrical deflecting means to wobble the electron beam image
NL154050B (nl) * 1966-08-13 1977-07-15 Philips Nv Elektronenmicroscoop.
DE1614126B1 (de) * 1967-02-27 1970-11-19 Max Planck Gesellschaft Korpuskularstrahlmikroskop,insbesondere Elektronenmikroskop,mit einer durch das Vorfeld einer Objektivlinse gebildeten Kondensorlinse und einer Bereichsblende
US3566109A (en) * 1968-02-15 1971-02-23 Bell Telephone Labor Inc Electron microscope method and apparatus for improving image phase contrast
JPS5126227B2 (de) * 1971-09-21 1976-08-05
JPS5136196B2 (de) * 1972-05-22 1976-10-07
US3872305A (en) * 1972-12-06 1975-03-18 Jeol Ltd Convertible scanning electron microscope
US4167676A (en) * 1978-02-21 1979-09-11 Bell Telephone Laboratories, Incorporated Variable-spot scanning in an electron beam exposure system
JPS585956A (ja) * 1981-07-01 1983-01-13 Hitachi Ltd 電子顕微鏡
DE3423149A1 (de) * 1984-06-22 1986-01-02 Fa. Carl Zeiss, 7920 Heidenheim Verfahren und anordnung zur elektronenenergiegefilterten abbildung eines objektes oder eines objektbeugungsdiagrammes mit einem transmissions-elektronenmikroskop
DE102006011615A1 (de) * 2006-03-14 2007-09-20 Carl Zeiss Nts Gmbh Phasenkontrast-Elektronenmikroskop
EP2413345B1 (de) * 2010-07-29 2013-02-20 Carl Zeiss NTS GmbH Strahlensystem mit geladenen Teilchen

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2422807A (en) * 1945-03-29 1947-06-24 Rca Corp Art of ascertaining the atomic structure of materials
GB646019A (en) * 1946-01-05 1950-11-15 Philips Nv Improvements in or relating to electron microscopes
GB680300A (en) * 1950-02-23 1952-10-01 Vickers Electrical Co Ltd Improvements relating to magnetic electron lenses
DE876729C (de) * 1950-09-03 1953-05-18 Siemens Ag Aus vier Linsen bestehendes Abbildungssystem fuer Elektronenmikroskope
US2688091A (en) * 1951-05-21 1954-08-31 Hitachi Ltd Electron lens system
US2688092A (en) * 1951-05-21 1954-08-31 Hitachi Ltd Electron lens system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1614125B1 (de) * 1967-02-24 1972-12-07 Max Planck Gesellschaft Korpuskularstrahlgeraet zur wahlweisen abbildung eines praeparats oder seiner beugungsdiagramms, insbesondere elektromikroskop

Also Published As

Publication number Publication date
US2802110A (en) 1957-08-06
GB763522A (en) 1956-12-12
DE1049988B (de)
FR1111567A (fr) 1956-03-01
NL98715C (de)

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