NL8200511A - Inrichting voor het continu meten van gehaltes aan een element in suspensies. - Google Patents

Inrichting voor het continu meten van gehaltes aan een element in suspensies. Download PDF

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Publication number
NL8200511A
NL8200511A NL8200511A NL8200511A NL8200511A NL 8200511 A NL8200511 A NL 8200511A NL 8200511 A NL8200511 A NL 8200511A NL 8200511 A NL8200511 A NL 8200511A NL 8200511 A NL8200511 A NL 8200511A
Authority
NL
Netherlands
Prior art keywords
measuring
detector
suspension
target
primary
Prior art date
Application number
NL8200511A
Other languages
English (en)
Dutch (nl)
Original Assignee
Kernforschungsz Karlsruhe
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19813110944 external-priority patent/DE3110944A1/de
Priority claimed from DE19813111187 external-priority patent/DE3111187A1/de
Application filed by Kernforschungsz Karlsruhe filed Critical Kernforschungsz Karlsruhe
Publication of NL8200511A publication Critical patent/NL8200511A/nl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NL8200511A 1981-03-20 1982-02-11 Inrichting voor het continu meten van gehaltes aan een element in suspensies. NL8200511A (nl)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
DE3110944 1981-03-20
DE19813110944 DE3110944A1 (de) 1981-03-20 1981-03-20 "einrichtung zur kontinuierlichen messung von elementgehalten in trueben"
DE3111187 1981-03-21
DE19813111187 DE3111187A1 (de) 1981-03-21 1981-03-21 Einrichtung zur kontinuierlichen messung von elementgehalten in trueben

Publications (1)

Publication Number Publication Date
NL8200511A true NL8200511A (nl) 1982-10-18

Family

ID=25791968

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8200511A NL8200511A (nl) 1981-03-20 1982-02-11 Inrichting voor het continu meten van gehaltes aan een element in suspensies.

Country Status (7)

Country Link
AT (1) AT390842B (de)
AU (1) AU544999B2 (de)
CA (1) CA1182590A (de)
FI (1) FI72815C (de)
FR (1) FR2502335B1 (de)
NL (1) NL8200511A (de)
SE (1) SE459937B (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3424937A1 (de) * 1984-07-06 1986-02-06 Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe Einrichtung zur messung der konzentration einer pulverprobe

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3742226A (en) * 1971-05-14 1973-06-26 Applied Res Lab Liquid cell for x-ray fluorescence analysis
DE2621027A1 (de) * 1976-05-12 1977-11-24 Kernenergieverwert Ges Fuer Vorrichtung zur quantitativen in-line- roentgenfluoreszenzanalyse von schlaemmen
US4152591A (en) * 1977-05-13 1979-05-01 E. I. Du Pont De Nemours And Company On-stream chemical element monitor
DE2727989C3 (de) * 1977-06-22 1980-05-08 Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe Einrichtung zur Bestimmung von Uran und/oder Thorium in Erzproben
DE2915986C2 (de) * 1979-04-20 1982-04-08 Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe Verfahren zur kontinuierlichen Messung von Elementgehalten

Also Published As

Publication number Publication date
SE8201288L (sv) 1982-09-21
SE459937B (sv) 1989-08-21
FI820820L (fi) 1982-09-21
ATA42682A (de) 1989-12-15
AU8172082A (en) 1982-09-23
FI72815B (fi) 1987-03-31
FI72815C (fi) 1987-07-10
FR2502335B1 (fr) 1986-02-14
AU544999B2 (en) 1985-06-27
CA1182590A (en) 1985-02-12
FR2502335A1 (fr) 1982-09-24
AT390842B (de) 1990-07-10

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Legal Events

Date Code Title Description
A85 Still pending on 85-01-01
BA A request for search or an international-type search has been filed
BB A search report has been drawn up
BC A request for examination has been filed
BV The patent application has lapsed