NL8000251A - Stelsel voor het bewaken van kristalgroei. - Google Patents

Stelsel voor het bewaken van kristalgroei. Download PDF

Info

Publication number
NL8000251A
NL8000251A NL8000251A NL8000251A NL8000251A NL 8000251 A NL8000251 A NL 8000251A NL 8000251 A NL8000251 A NL 8000251A NL 8000251 A NL8000251 A NL 8000251A NL 8000251 A NL8000251 A NL 8000251A
Authority
NL
Netherlands
Prior art keywords
image
growth
meniscus
video signal
signal
Prior art date
Application number
NL8000251A
Other languages
English (en)
Dutch (nl)
Original Assignee
Mobil Tyco Solar Energy Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mobil Tyco Solar Energy Corp filed Critical Mobil Tyco Solar Energy Corp
Publication of NL8000251A publication Critical patent/NL8000251A/nl

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/34Edge-defined film-fed crystal-growth using dies or slits
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/20Controlling or regulating
    • C30B15/22Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal
    • C30B15/26Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal using television detectors; using photo or X-ray detectors
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T117/00Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10T117/10Apparatus
    • Y10T117/1004Apparatus with means for measuring, testing, or sensing
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T117/00Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10T117/10Apparatus
    • Y10T117/1004Apparatus with means for measuring, testing, or sensing
    • Y10T117/1008Apparatus with means for measuring, testing, or sensing with responsive control means
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T117/00Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10T117/10Apparatus
    • Y10T117/1024Apparatus for crystallization from liquid or supercritical state
    • Y10T117/1032Seed pulling
    • Y10T117/1036Seed pulling including solid member shaping means other than seed or product [e.g., EDFG die]
    • Y10T117/1044Seed pulling including solid member shaping means other than seed or product [e.g., EDFG die] including means forming a flat shape [e.g., ribbon]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
NL8000251A 1979-01-15 1980-01-15 Stelsel voor het bewaken van kristalgroei. NL8000251A (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/003,278 US4242589A (en) 1979-01-15 1979-01-15 Apparatus for monitoring crystal growth
US327879 1989-03-23

Publications (1)

Publication Number Publication Date
NL8000251A true NL8000251A (nl) 1980-07-17

Family

ID=21705049

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8000251A NL8000251A (nl) 1979-01-15 1980-01-15 Stelsel voor het bewaken van kristalgroei.

Country Status (10)

Country Link
US (1) US4242589A (US06262066-20010717-C00424.png)
JP (1) JPS55109294A (US06262066-20010717-C00424.png)
AU (1) AU528708B2 (US06262066-20010717-C00424.png)
CA (1) CA1128172A (US06262066-20010717-C00424.png)
DE (1) DE3001259A1 (US06262066-20010717-C00424.png)
FR (1) FR2446333A1 (US06262066-20010717-C00424.png)
GB (1) GB2043482B (US06262066-20010717-C00424.png)
IL (1) IL59154A (US06262066-20010717-C00424.png)
IN (1) IN153555B (US06262066-20010717-C00424.png)
NL (1) NL8000251A (US06262066-20010717-C00424.png)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2923240A1 (de) * 1979-06-08 1980-12-18 Leybold Heraeus Gmbh & Co Kg Messverfahren und messanordnung fuer den durchmesser von einkristallen beim tiegelziehen
FR2551233B1 (fr) * 1983-08-29 1985-10-25 Comp Generale Electricite Dispositif pour deposer en regime continu une couche de silicium polycristallin sur un ruban de carbone
FR2556109B2 (fr) * 1983-08-29 1986-09-12 Comp Generale Electricite Dispositif pour deposer en regime continu une couche de silicium polycristallin sur un ruban de carbone
US4944925A (en) * 1985-06-10 1990-07-31 Sumitomo Electric Industries, Ltd. Apparatus for producing single crystals
JPS63269003A (ja) * 1987-04-27 1988-11-07 Shin Etsu Handotai Co Ltd 晶出界面位置検出装置
USRE34375E (en) * 1987-05-05 1993-09-14 Mobil Solar Energy Corporation System for controlling apparatus for growing tubular crystalline bodies
US4936947A (en) * 1987-05-05 1990-06-26 Mobil Solar Energy Corporation System for controlling apparatus for growing tubular crystalline bodies
JPS6483595A (en) * 1987-09-25 1989-03-29 Shinetsu Handotai Kk Device for measuring crystal diameter
JPH0774117B2 (ja) * 1989-10-20 1995-08-09 信越半導体株式会社 ヒータの温度パターン作成方法及びこの温度パターンを用いたSi単結晶育成制御装置
FI911857A (fi) * 1990-04-27 1991-10-28 Nippon Kokan Kk Foerfarande och apparat foer kontroll av diametern hos en enskild silikonkristall.
US5246535A (en) * 1990-04-27 1993-09-21 Nkk Corporation Method and apparatus for controlling the diameter of a silicon single crystal
US5882402A (en) * 1997-09-30 1999-03-16 Memc Electronic Materials, Inc. Method for controlling growth of a silicon crystal
DE102006041736A1 (de) 2006-09-04 2008-03-20 Schott Solar Gmbh Verfahren und Anordnung zur Herstellung eines Rohres
WO2012044909A1 (en) * 2010-10-01 2012-04-05 Evergreen Solar, Inc. Sheet wafer defect mitigation
JP2013538781A (ja) * 2010-10-01 2013-10-17 エバーグリーン ソーラー, インコーポレイテッド ウエハ重量の関数としたシートウエハ処理
CN112281208B (zh) * 2019-07-22 2022-04-05 隆基绿能科技股份有限公司 一种液口距确定方法、装置及单晶炉

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3291650A (en) * 1963-12-23 1966-12-13 Gen Motors Corp Control of crystal size
JPS4850983A (US06262066-20010717-C00424.png) * 1971-10-29 1973-07-18
US3870477A (en) * 1972-07-10 1975-03-11 Tyco Laboratories Inc Optical control of crystal growth
DE2349736A1 (de) * 1973-10-03 1975-04-24 Siemens Ag Ueberwachungseinrichtung fuer eine vorrichtung zum ziehen von kristallen aus der schmelze
JPS5424319B2 (US06262066-20010717-C00424.png) * 1974-08-02 1979-08-20
US3958129A (en) * 1974-08-05 1976-05-18 Motorola, Inc. Automatic crystal diameter control for growth of semiconductor crystals
FR2310044A1 (fr) * 1975-04-29 1976-11-26 Commissariat Energie Atomique Procede et dispositif d'isolement de figures dans une image
US4059343A (en) * 1976-02-26 1977-11-22 The United States Of America As Represented By The Secretary Of The Air Force Prismatic anamorphic system for optical correlators

Also Published As

Publication number Publication date
GB2043482B (en) 1982-12-08
JPS55109294A (en) 1980-08-22
IL59154A (en) 1982-12-31
IL59154A0 (en) 1980-05-30
US4242589A (en) 1980-12-30
JPH0329753B2 (US06262066-20010717-C00424.png) 1991-04-25
GB2043482A (en) 1980-10-08
IN153555B (US06262066-20010717-C00424.png) 1984-07-28
AU5478680A (en) 1980-08-21
CA1128172A (en) 1982-07-20
FR2446333A1 (fr) 1980-08-08
FR2446333B1 (US06262066-20010717-C00424.png) 1985-04-12
DE3001259C2 (US06262066-20010717-C00424.png) 1992-09-10
AU528708B2 (en) 1983-05-12
DE3001259A1 (de) 1980-07-24

Similar Documents

Publication Publication Date Title
NL8000251A (nl) Stelsel voor het bewaken van kristalgroei.
TW444073B (en) Method and system for controlling growth of a silicon crystal
US3718757A (en) Temperature monitoring
JP5677441B2 (ja) 観察装置、観察プログラム及び観察システム
CN101377008B (zh) 硅单晶提拉方法
US4277441A (en) Apparatus for monitoring crystal growth
EP0903428A2 (de) Einrichtung und Verfahren für die Bestimmung von Durchmessern eines Kristalls
US3909380A (en) Reference pattern zeta potential measurement apparatus and method therefor
CN1172869A (zh) 与控制硅晶体生长的系统一起使用的无失真摄像机
US4318769A (en) Method of monitoring crystal growth
US4239583A (en) Method and apparatus for crystal growth control
US4184907A (en) Control of capillary die shaped crystal growth of silicon and germanium crystals
US6447602B1 (en) Crystal growth apparatus and method
US4290835A (en) Method for crystal growth control
US6093244A (en) Silicon ribbon growth dendrite thickness control system
JPH08239293A (ja) 単結晶の直径制御方法
CN208520494U (zh) 一种溶液饱和温度自动测量装置
JP5445499B2 (ja) 観察装置
Sazaki et al. In-situ monitoring system of the position and temperature at the crystal–solution interface
JPS6127359B2 (US06262066-20010717-C00424.png)
CN108489629A (zh) 一种溶液饱和温度自动测量装置及测量方法
DE19738438A1 (de) Einrichtung für die Bestimmung des Durchmessers eines Kristalls
EP1196646B1 (en) Dendrite thickness control system for growing silicon ribbon
Kawaji et al. Study of natural convection and interface shape in directional solidification of succinonitrile
Kaplan New Applications For Infrared Taicroimaging

Legal Events

Date Code Title Description
DNT Communications of changes of names of applicants whose applications have been laid open to public inspection

Free format text: MOBIL SOLAR ENERGY CORPORATION

A85 Still pending on 85-01-01
BA A request for search or an international-type search has been filed
BB A search report has been drawn up
BC A request for examination has been filed
BV The patent application has lapsed