JPS55109294A - Crystal growth monitor device and method - Google Patents

Crystal growth monitor device and method

Info

Publication number
JPS55109294A
JPS55109294A JP344880A JP344880A JPS55109294A JP S55109294 A JPS55109294 A JP S55109294A JP 344880 A JP344880 A JP 344880A JP 344880 A JP344880 A JP 344880A JP S55109294 A JPS55109294 A JP S55109294A
Authority
JP
Japan
Prior art keywords
crystal growth
monitor device
growth monitor
crystal
monitor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP344880A
Other languages
English (en)
Other versions
JPH0329753B2 (ja
Inventor
Satsuchisu Emaniyuaru
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Schott Solar CSP Inc
Original Assignee
Mobil Tyco Solar Energy Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mobil Tyco Solar Energy Corp filed Critical Mobil Tyco Solar Energy Corp
Publication of JPS55109294A publication Critical patent/JPS55109294A/ja
Publication of JPH0329753B2 publication Critical patent/JPH0329753B2/ja
Granted legal-status Critical Current

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/34—Edge-defined film-fed crystal-growth using dies or slits
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/20—Controlling or regulating
    • C30B15/22—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal
    • C30B15/26—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal using television detectors; using photo or X-ray detectors
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10T117/10—Apparatus
    • Y10T117/1004—Apparatus with means for measuring, testing, or sensing
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10T117/10—Apparatus
    • Y10T117/1004—Apparatus with means for measuring, testing, or sensing
    • Y10T117/1008—Apparatus with means for measuring, testing, or sensing with responsive control means
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10T117/10—Apparatus
    • Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
    • Y10T117/1032—Seed pulling
    • Y10T117/1036—Seed pulling including solid member shaping means other than seed or product [e.g., EDFG die]
    • Y10T117/1044—Seed pulling including solid member shaping means other than seed or product [e.g., EDFG die] including means forming a flat shape [e.g., ribbon]
JP344880A 1979-01-15 1980-01-16 Crystal growth monitor device and method Granted JPS55109294A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/003,278 US4242589A (en) 1979-01-15 1979-01-15 Apparatus for monitoring crystal growth

Publications (2)

Publication Number Publication Date
JPS55109294A true JPS55109294A (en) 1980-08-22
JPH0329753B2 JPH0329753B2 (ja) 1991-04-25

Family

ID=21705049

Family Applications (1)

Application Number Title Priority Date Filing Date
JP344880A Granted JPS55109294A (en) 1979-01-15 1980-01-16 Crystal growth monitor device and method

Country Status (10)

Country Link
US (1) US4242589A (ja)
JP (1) JPS55109294A (ja)
AU (1) AU528708B2 (ja)
CA (1) CA1128172A (ja)
DE (1) DE3001259A1 (ja)
FR (1) FR2446333A1 (ja)
GB (1) GB2043482B (ja)
IL (1) IL59154A (ja)
IN (1) IN153555B (ja)
NL (1) NL8000251A (ja)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2923240A1 (de) * 1979-06-08 1980-12-18 Leybold Heraeus Gmbh & Co Kg Messverfahren und messanordnung fuer den durchmesser von einkristallen beim tiegelziehen
FR2556109B2 (fr) * 1983-08-29 1986-09-12 Comp Generale Electricite Dispositif pour deposer en regime continu une couche de silicium polycristallin sur un ruban de carbone
FR2551233B1 (fr) * 1983-08-29 1985-10-25 Comp Generale Electricite Dispositif pour deposer en regime continu une couche de silicium polycristallin sur un ruban de carbone
US4944925A (en) * 1985-06-10 1990-07-31 Sumitomo Electric Industries, Ltd. Apparatus for producing single crystals
JPS63269003A (ja) * 1987-04-27 1988-11-07 Shin Etsu Handotai Co Ltd 晶出界面位置検出装置
USRE34375E (en) * 1987-05-05 1993-09-14 Mobil Solar Energy Corporation System for controlling apparatus for growing tubular crystalline bodies
US4936947A (en) * 1987-05-05 1990-06-26 Mobil Solar Energy Corporation System for controlling apparatus for growing tubular crystalline bodies
JPS6483595A (en) * 1987-09-25 1989-03-29 Shinetsu Handotai Kk Device for measuring crystal diameter
JPH0774117B2 (ja) * 1989-10-20 1995-08-09 信越半導体株式会社 ヒータの温度パターン作成方法及びこの温度パターンを用いたＳｉ単結晶育成制御装置
US5246535A (en) * 1990-04-27 1993-09-21 Nkk Corporation Method and apparatus for controlling the diameter of a silicon single crystal
FI911857A (fi) * 1990-04-27 1991-10-28 Nippon Kokan Kk Foerfarande och apparat foer kontroll av diametern hos en enskild silikonkristall.
US5882402A (en) * 1997-09-30 1999-03-16 Memc Electronic Materials, Inc. Method for controlling growth of a silicon crystal
DE102006041736A1 (de) 2006-09-04 2008-03-20 Schott Solar Gmbh Verfahren und Anordnung zur Herstellung eines Rohres
WO2012044909A1 (en) * 2010-10-01 2012-04-05 Evergreen Solar, Inc. Sheet wafer defect mitigation
CA2813432A1 (en) * 2010-10-01 2012-04-05 Evergreen Solar, Inc. Sheet wafer processing as a function of wafer weight
CN112281208B (zh) * 2019-07-22 2022-04-05 隆基绿能科技股份有限公司 一种液口距确定方法、装置及单晶炉

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4850983A (ja) * 1971-10-29 1973-07-18
JPS5127394A (ja) * 1974-08-02 1976-03-06 Hitachi Ltd

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3291650A (en) * 1963-12-23 1966-12-13 Gen Motors Corp Control of crystal size
US3870477A (en) * 1972-07-10 1975-03-11 Tyco Laboratories Inc Optical control of crystal growth
DE2349736A1 (de) * 1973-10-03 1975-04-24 Siemens Ag Ueberwachungseinrichtung fuer eine vorrichtung zum ziehen von kristallen aus der schmelze
US3958129A (en) * 1974-08-05 1976-05-18 Motorola, Inc. Automatic crystal diameter control for growth of semiconductor crystals
FR2310044A1 (fr) * 1975-04-29 1976-11-26 Commissariat Energie Atomique Procede et dispositif d'isolement de figures dans une image
US4059343A (en) * 1976-02-26 1977-11-22 The United States Of America As Represented By The Secretary Of The Air Force Prismatic anamorphic system for optical correlators

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4850983A (ja) * 1971-10-29 1973-07-18
JPS5127394A (ja) * 1974-08-02 1976-03-06 Hitachi Ltd

Also Published As

Publication number Publication date
AU5478680A (en) 1980-08-21
AU528708B2 (en) 1983-05-12
JPH0329753B2 (ja) 1991-04-25
IL59154A0 (en) 1980-05-30
CA1128172A (en) 1982-07-20
DE3001259A1 (de) 1980-07-24
IN153555B (ja) 1984-07-28
US4242589A (en) 1980-12-30
FR2446333B1 (ja) 1985-04-12
IL59154A (en) 1982-12-31
DE3001259C2 (ja) 1992-09-10
NL8000251A (nl) 1980-07-17
GB2043482B (en) 1982-12-08
FR2446333A1 (fr) 1980-08-08
GB2043482A (en) 1980-10-08

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