NL7415694A - Halfgeleiderinrichting. - Google Patents

Halfgeleiderinrichting.

Info

Publication number
NL7415694A
NL7415694A NL7415694A NL7415694A NL7415694A NL 7415694 A NL7415694 A NL 7415694A NL 7415694 A NL7415694 A NL 7415694A NL 7415694 A NL7415694 A NL 7415694A NL 7415694 A NL7415694 A NL 7415694A
Authority
NL
Netherlands
Prior art keywords
semi
guide device
guide
Prior art date
Application number
NL7415694A
Other languages
English (en)
Dutch (nl)
Original Assignee
Rca Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rca Corp filed Critical Rca Corp
Publication of NL7415694A publication Critical patent/NL7415694A/xx

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/786Thin film transistors, i.e. transistors with a channel being at least partly a thin film
    • H01L29/78606Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device
    • H01L29/78609Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device for preventing leakage current
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H01L21/82Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
    • H01L21/84Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being other than a semiconductor body, e.g. being an insulating body
    • H01L21/86Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being other than a semiconductor body, e.g. being an insulating body the insulating body being sapphire, e.g. silicon on sapphire structure, i.e. SOS
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/051Etching
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/053Field effect transistors fets
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/15Silicon on sapphire SOS

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Ceramic Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Thin Film Transistor (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Junction Field-Effect Transistors (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
NL7415694A 1973-12-03 1974-12-02 Halfgeleiderinrichting. NL7415694A (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US420783A US3890632A (en) 1973-12-03 1973-12-03 Stabilized semiconductor devices and method of making same

Publications (1)

Publication Number Publication Date
NL7415694A true NL7415694A (nl) 1975-06-05

Family

ID=23667832

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7415694A NL7415694A (nl) 1973-12-03 1974-12-02 Halfgeleiderinrichting.

Country Status (13)

Country Link
US (1) US3890632A (de)
JP (1) JPS5212550B2 (de)
BE (1) BE822852A (de)
BR (1) BR7409904A (de)
CA (1) CA1013481A (de)
DE (1) DE2455730C3 (de)
FR (1) FR2253286B1 (de)
GB (1) GB1447849A (de)
IN (1) IN141988B (de)
IT (1) IT1025054B (de)
NL (1) NL7415694A (de)
SE (1) SE401581B (de)
YU (1) YU36421B (de)

Families Citing this family (64)

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GB1507091A (en) * 1974-03-29 1978-04-12 Siemens Ag Schottky-gate field-effect transistors
US3943555A (en) * 1974-05-02 1976-03-09 Rca Corporation SOS Bipolar transistor
US3974515A (en) * 1974-09-12 1976-08-10 Rca Corporation IGFET on an insulating substrate
JPS5138881A (ja) * 1974-09-27 1976-03-31 Kogyo Gijutsuin Zetsuenkibanjohandotaisochi
NL7500550A (nl) * 1975-01-17 1976-07-20 Philips Nv Halfgeleider-geheugeninrichting.
JPS51101476A (en) * 1975-03-04 1976-09-07 Fujitsu Ltd Handotaisochino seizohoho
JPS51135373A (en) * 1975-05-20 1976-11-24 Agency Of Ind Science & Technol Semiconductor device
US4016016A (en) * 1975-05-22 1977-04-05 Rca Corporation Method of simultaneously forming a polycrystalline silicon gate and a single crystal extension of said gate in silicon on sapphire MOS devices
US4015279A (en) * 1975-05-27 1977-03-29 Rca Corporation Edgeless transistor
US4054894A (en) * 1975-05-27 1977-10-18 Rca Corporation Edgeless transistor
JPS5263683A (en) * 1975-11-20 1977-05-26 Mitsubishi Electric Corp Production of semiconductor element
JPS5286088A (en) * 1976-01-13 1977-07-16 Agency Of Ind Science & Technol Manufacture of semiconductor device
US4054895A (en) * 1976-12-27 1977-10-18 Rca Corporation Silicon-on-sapphire mesa transistor having doped edges
US4097314A (en) * 1976-12-30 1978-06-27 Rca Corp. Method of making a sapphire gate transistor
US4113516A (en) * 1977-01-28 1978-09-12 Rca Corporation Method of forming a curved implanted region in a semiconductor body
JPS5396767A (en) * 1977-02-04 1978-08-24 Agency Of Ind Science & Technol Protecting circuit of semiconductor integrated circuit on insulation substrate
SE7800261L (sv) * 1977-02-28 1978-08-29 Rca Corp Sett att tillverka en halvledaranordning
US4330932A (en) * 1978-07-20 1982-05-25 The United States Of America As Represented By The Secretary Of The Navy Process for preparing isolated junctions in thin-film semiconductors utilizing shadow masked deposition to form graded-side mesas
US4178191A (en) * 1978-08-10 1979-12-11 Rca Corp. Process of making a planar MOS silicon-on-insulating substrate device
US4279069A (en) * 1979-02-21 1981-07-21 Rockwell International Corporation Fabrication of a nonvolatile memory array device
US4242156A (en) * 1979-10-15 1980-12-30 Rockwell International Corporation Method of fabricating an SOS island edge passivation structure
US4252574A (en) * 1979-11-09 1981-02-24 Rca Corporation Low leakage N-channel SOS transistors and method of making them
US4393572A (en) * 1980-05-29 1983-07-19 Rca Corporation Method of making low leakage N-channel SOS transistors utilizing positive photoresist masking techniques
US4277884A (en) * 1980-08-04 1981-07-14 Rca Corporation Method for forming an improved gate member utilizing special masking and oxidation to eliminate projecting points on silicon islands
US4313809A (en) * 1980-10-15 1982-02-02 Rca Corporation Method of reducing edge current leakage in N channel silicon-on-sapphire devices
US4545113A (en) * 1980-10-23 1985-10-08 Fairchild Camera & Instrument Corporation Process for fabricating a lateral transistor having self-aligned base and base contact
FR2566583B1 (fr) * 1984-06-22 1986-09-19 Thomson Csf Procede de fabrication d'au moins un transistor a effet de champ en couche mince, et transistor obtenu par ce procede
US4649626A (en) * 1985-07-24 1987-03-17 Hughes Aircraft Company Semiconductor on insulator edge doping process using an expanded mask
US4662059A (en) * 1985-09-19 1987-05-05 Rca Corporation Method of making stabilized silicon-on-insulator field-effect transistors having 100 oriented side and top surfaces
US4751554A (en) * 1985-09-27 1988-06-14 Rca Corporation Silicon-on-sapphire integrated circuit and method of making the same
US4758529A (en) * 1985-10-31 1988-07-19 Rca Corporation Method of forming an improved gate dielectric for a MOSFET on an insulating substrate
US4729006A (en) * 1986-03-17 1988-03-01 International Business Machines Corporation Sidewall spacers for CMOS circuit stress relief/isolation and method for making
US4722912A (en) * 1986-04-28 1988-02-02 Rca Corporation Method of forming a semiconductor structure
US4735917A (en) * 1986-04-28 1988-04-05 General Electric Company Silicon-on-sapphire integrated circuits
US4755481A (en) * 1986-05-15 1988-07-05 General Electric Company Method of making a silicon-on-insulator transistor
US4791464A (en) * 1987-05-12 1988-12-13 General Electric Company Semiconductor device that minimizes the leakage current associated with the parasitic edge transistors and a method of making the same
US4918498A (en) * 1987-05-12 1990-04-17 General Electric Company Edgeless semiconductor device
US4864380A (en) * 1987-05-12 1989-09-05 General Electric Company Edgeless CMOS device
GB2209433B (en) * 1987-09-04 1990-06-13 Plessey Co Plc Semi-conductor devices
GB2211022B (en) * 1987-10-09 1991-10-09 Marconi Electronic Devices A semiconductor device and a process for making the device
US5053345A (en) * 1989-02-06 1991-10-01 Harris Corporation Method of edge doping SOI islands
US5028564A (en) * 1989-04-27 1991-07-02 Chang Chen Chi P Edge doping processes for mesa structures in SOS and SOI devices
US5250818A (en) * 1991-03-01 1993-10-05 Board Of Trustees Of Leland Stanford University Low temperature germanium-silicon on insulator thin-film transistor
JPH0793363B2 (ja) * 1991-09-25 1995-10-09 株式会社半導体エネルギー研究所 半導体集積回路およびその作製方法
JPH05335529A (ja) * 1992-05-28 1993-12-17 Fujitsu Ltd 半導体装置およびその製造方法
GB9315798D0 (en) * 1993-07-30 1993-09-15 Philips Electronics Uk Ltd Manufacture of electronic devices comprising thin-film transistors
JP3645378B2 (ja) 1996-01-19 2005-05-11 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP3729955B2 (ja) * 1996-01-19 2005-12-21 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP3645379B2 (ja) 1996-01-19 2005-05-11 株式会社半導体エネルギー研究所 半導体装置の作製方法
US6478263B1 (en) * 1997-01-17 2002-11-12 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and its manufacturing method
JP3645380B2 (ja) 1996-01-19 2005-05-11 株式会社半導体エネルギー研究所 半導体装置の作製方法、情報端末、ヘッドマウントディスプレイ、ナビゲーションシステム、携帯電話、ビデオカメラ、投射型表示装置
US5888858A (en) 1996-01-20 1999-03-30 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and fabrication method thereof
US7056381B1 (en) 1996-01-26 2006-06-06 Semiconductor Energy Laboratory Co., Ltd. Fabrication method of semiconductor device
US6180439B1 (en) * 1996-01-26 2001-01-30 Semiconductor Energy Laboratory Co., Ltd. Method for fabricating a semiconductor device
US6465287B1 (en) 1996-01-27 2002-10-15 Semiconductor Energy Laboratory Co., Ltd. Method for fabricating a semiconductor device using a metal catalyst and high temperature crystallization
US6100562A (en) 1996-03-17 2000-08-08 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing a semiconductor device
TW451284B (en) * 1996-10-15 2001-08-21 Semiconductor Energy Lab Semiconductor device and method of manufacturing the same
US6147362A (en) * 1997-03-17 2000-11-14 Honeywell International Inc. High performance display pixel for electronics displays
KR19990039940A (ko) * 1997-11-15 1999-06-05 구자홍 박막트랜지스터 제조방법
US6686623B2 (en) 1997-11-18 2004-02-03 Semiconductor Energy Laboratory Co., Ltd. Nonvolatile memory and electronic apparatus
JP2001196591A (ja) * 2000-01-13 2001-07-19 Internatl Business Mach Corp <Ibm> 薄膜トランジスタ、および薄膜トランジスタの製造方法
JP4776801B2 (ja) * 2001-04-24 2011-09-21 株式会社半導体エネルギー研究所 メモリ回路
JP5046464B2 (ja) * 2002-12-18 2012-10-10 株式会社半導体エネルギー研究所 半導体記憶素子の作製方法
CN117030078B (zh) * 2023-08-10 2024-03-15 无锡胜脉电子有限公司 一种硅力敏感芯片及其制备方法、封装方法

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US3394037A (en) * 1965-05-28 1968-07-23 Motorola Inc Method of making a semiconductor device by masking and diffusion
US3409812A (en) * 1965-11-12 1968-11-05 Hughes Aircraft Co Space-charge-limited current triode device
US3486892A (en) * 1966-01-13 1969-12-30 Raytheon Co Preferential etching technique
GB1130058A (en) * 1966-10-03 1968-10-09 Hughes Aircraft Co Thin film space-charge-limited current triode
FR2021973A7 (de) * 1968-10-31 1970-07-24 Nat Semiconductor Corp
NL164424C (nl) * 1970-06-04 1980-12-15 Philips Nv Werkwijze voor het vervaardigen van een veldeffect- transistor met een geisoleerde stuurelektrode, waarbij een door een tegen oxydatie maskerende laag vrijgelaten deel van het oppervlak van een siliciumlichaam aan een oxydatiebehandeling wordt onderworpen ter verkrijging van een althans gedeeltelijk in het siliciumlichaam verzonken siliciumoxydelaag.
DE2044792A1 (de) * 1970-09-10 1972-03-23 Ibm Deutschland Feldeffekt-Transistor
GB1390135A (en) * 1971-05-08 1975-04-09 Matsushita Electric Ind Co Ltd Insulated gate semiconductor device
US3789504A (en) * 1971-10-12 1974-02-05 Gte Laboratories Inc Method of manufacturing an n-channel mos field-effect transistor
US3823352A (en) * 1972-12-13 1974-07-09 Bell Telephone Labor Inc Field effect transistor structures and methods

Also Published As

Publication number Publication date
IN141988B (de) 1977-05-14
FR2253286B1 (de) 1978-09-22
SE7415065L (de) 1975-06-04
JPS50106591A (de) 1975-08-22
FR2253286A1 (de) 1975-06-27
DE2455730B2 (de) 1981-04-23
US3890632A (en) 1975-06-17
AU7578974A (en) 1976-05-27
YU313374A (en) 1981-11-13
DE2455730C3 (de) 1985-08-08
JPS5212550B2 (de) 1977-04-07
GB1447849A (en) 1976-09-02
BE822852A (fr) 1975-04-01
BR7409904A (pt) 1976-05-25
CA1013481A (en) 1977-07-05
DE2455730A1 (de) 1975-06-05
SE401581B (sv) 1978-05-16
YU36421B (en) 1983-06-30
IT1025054B (it) 1978-08-10

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Legal Events

Date Code Title Description
BA A request for search or an international-type search has been filed
BA A request for search or an international-type search has been filed
BB A search report has been drawn up
BC A request for examination has been filed
BV The patent application has lapsed