NL7415694A - Halfgeleiderinrichting. - Google Patents
Halfgeleiderinrichting.Info
- Publication number
- NL7415694A NL7415694A NL7415694A NL7415694A NL7415694A NL 7415694 A NL7415694 A NL 7415694A NL 7415694 A NL7415694 A NL 7415694A NL 7415694 A NL7415694 A NL 7415694A NL 7415694 A NL7415694 A NL 7415694A
- Authority
- NL
- Netherlands
- Prior art keywords
- semi
- guide device
- guide
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78606—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device
- H01L29/78609—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device for preventing leakage current
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/84—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being other than a semiconductor body, e.g. being an insulating body
- H01L21/86—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being other than a semiconductor body, e.g. being an insulating body the insulating body being sapphire, e.g. silicon on sapphire structure, i.e. SOS
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/051—Etching
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/053—Field effect transistors fets
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/15—Silicon on sapphire SOS
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Ceramic Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Thin Film Transistor (AREA)
- Electrodes Of Semiconductors (AREA)
- Junction Field-Effect Transistors (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US420783A US3890632A (en) | 1973-12-03 | 1973-12-03 | Stabilized semiconductor devices and method of making same |
Publications (1)
Publication Number | Publication Date |
---|---|
NL7415694A true NL7415694A (nl) | 1975-06-05 |
Family
ID=23667832
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL7415694A NL7415694A (nl) | 1973-12-03 | 1974-12-02 | Halfgeleiderinrichting. |
Country Status (13)
Country | Link |
---|---|
US (1) | US3890632A (de) |
JP (1) | JPS5212550B2 (de) |
BE (1) | BE822852A (de) |
BR (1) | BR7409904A (de) |
CA (1) | CA1013481A (de) |
DE (1) | DE2455730C3 (de) |
FR (1) | FR2253286B1 (de) |
GB (1) | GB1447849A (de) |
IN (1) | IN141988B (de) |
IT (1) | IT1025054B (de) |
NL (1) | NL7415694A (de) |
SE (1) | SE401581B (de) |
YU (1) | YU36421B (de) |
Families Citing this family (64)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1507091A (en) * | 1974-03-29 | 1978-04-12 | Siemens Ag | Schottky-gate field-effect transistors |
US3943555A (en) * | 1974-05-02 | 1976-03-09 | Rca Corporation | SOS Bipolar transistor |
US3974515A (en) * | 1974-09-12 | 1976-08-10 | Rca Corporation | IGFET on an insulating substrate |
JPS5138881A (ja) * | 1974-09-27 | 1976-03-31 | Kogyo Gijutsuin | Zetsuenkibanjohandotaisochi |
NL7500550A (nl) * | 1975-01-17 | 1976-07-20 | Philips Nv | Halfgeleider-geheugeninrichting. |
JPS51101476A (en) * | 1975-03-04 | 1976-09-07 | Fujitsu Ltd | Handotaisochino seizohoho |
JPS51135373A (en) * | 1975-05-20 | 1976-11-24 | Agency Of Ind Science & Technol | Semiconductor device |
US4016016A (en) * | 1975-05-22 | 1977-04-05 | Rca Corporation | Method of simultaneously forming a polycrystalline silicon gate and a single crystal extension of said gate in silicon on sapphire MOS devices |
US4015279A (en) * | 1975-05-27 | 1977-03-29 | Rca Corporation | Edgeless transistor |
US4054894A (en) * | 1975-05-27 | 1977-10-18 | Rca Corporation | Edgeless transistor |
JPS5263683A (en) * | 1975-11-20 | 1977-05-26 | Mitsubishi Electric Corp | Production of semiconductor element |
JPS5286088A (en) * | 1976-01-13 | 1977-07-16 | Agency Of Ind Science & Technol | Manufacture of semiconductor device |
US4054895A (en) * | 1976-12-27 | 1977-10-18 | Rca Corporation | Silicon-on-sapphire mesa transistor having doped edges |
US4097314A (en) * | 1976-12-30 | 1978-06-27 | Rca Corp. | Method of making a sapphire gate transistor |
US4113516A (en) * | 1977-01-28 | 1978-09-12 | Rca Corporation | Method of forming a curved implanted region in a semiconductor body |
JPS5396767A (en) * | 1977-02-04 | 1978-08-24 | Agency Of Ind Science & Technol | Protecting circuit of semiconductor integrated circuit on insulation substrate |
SE7800261L (sv) * | 1977-02-28 | 1978-08-29 | Rca Corp | Sett att tillverka en halvledaranordning |
US4330932A (en) * | 1978-07-20 | 1982-05-25 | The United States Of America As Represented By The Secretary Of The Navy | Process for preparing isolated junctions in thin-film semiconductors utilizing shadow masked deposition to form graded-side mesas |
US4178191A (en) * | 1978-08-10 | 1979-12-11 | Rca Corp. | Process of making a planar MOS silicon-on-insulating substrate device |
US4279069A (en) * | 1979-02-21 | 1981-07-21 | Rockwell International Corporation | Fabrication of a nonvolatile memory array device |
US4242156A (en) * | 1979-10-15 | 1980-12-30 | Rockwell International Corporation | Method of fabricating an SOS island edge passivation structure |
US4252574A (en) * | 1979-11-09 | 1981-02-24 | Rca Corporation | Low leakage N-channel SOS transistors and method of making them |
US4393572A (en) * | 1980-05-29 | 1983-07-19 | Rca Corporation | Method of making low leakage N-channel SOS transistors utilizing positive photoresist masking techniques |
US4277884A (en) * | 1980-08-04 | 1981-07-14 | Rca Corporation | Method for forming an improved gate member utilizing special masking and oxidation to eliminate projecting points on silicon islands |
US4313809A (en) * | 1980-10-15 | 1982-02-02 | Rca Corporation | Method of reducing edge current leakage in N channel silicon-on-sapphire devices |
US4545113A (en) * | 1980-10-23 | 1985-10-08 | Fairchild Camera & Instrument Corporation | Process for fabricating a lateral transistor having self-aligned base and base contact |
FR2566583B1 (fr) * | 1984-06-22 | 1986-09-19 | Thomson Csf | Procede de fabrication d'au moins un transistor a effet de champ en couche mince, et transistor obtenu par ce procede |
US4649626A (en) * | 1985-07-24 | 1987-03-17 | Hughes Aircraft Company | Semiconductor on insulator edge doping process using an expanded mask |
US4662059A (en) * | 1985-09-19 | 1987-05-05 | Rca Corporation | Method of making stabilized silicon-on-insulator field-effect transistors having 100 oriented side and top surfaces |
US4751554A (en) * | 1985-09-27 | 1988-06-14 | Rca Corporation | Silicon-on-sapphire integrated circuit and method of making the same |
US4758529A (en) * | 1985-10-31 | 1988-07-19 | Rca Corporation | Method of forming an improved gate dielectric for a MOSFET on an insulating substrate |
US4729006A (en) * | 1986-03-17 | 1988-03-01 | International Business Machines Corporation | Sidewall spacers for CMOS circuit stress relief/isolation and method for making |
US4722912A (en) * | 1986-04-28 | 1988-02-02 | Rca Corporation | Method of forming a semiconductor structure |
US4735917A (en) * | 1986-04-28 | 1988-04-05 | General Electric Company | Silicon-on-sapphire integrated circuits |
US4755481A (en) * | 1986-05-15 | 1988-07-05 | General Electric Company | Method of making a silicon-on-insulator transistor |
US4791464A (en) * | 1987-05-12 | 1988-12-13 | General Electric Company | Semiconductor device that minimizes the leakage current associated with the parasitic edge transistors and a method of making the same |
US4918498A (en) * | 1987-05-12 | 1990-04-17 | General Electric Company | Edgeless semiconductor device |
US4864380A (en) * | 1987-05-12 | 1989-09-05 | General Electric Company | Edgeless CMOS device |
GB2209433B (en) * | 1987-09-04 | 1990-06-13 | Plessey Co Plc | Semi-conductor devices |
GB2211022B (en) * | 1987-10-09 | 1991-10-09 | Marconi Electronic Devices | A semiconductor device and a process for making the device |
US5053345A (en) * | 1989-02-06 | 1991-10-01 | Harris Corporation | Method of edge doping SOI islands |
US5028564A (en) * | 1989-04-27 | 1991-07-02 | Chang Chen Chi P | Edge doping processes for mesa structures in SOS and SOI devices |
US5250818A (en) * | 1991-03-01 | 1993-10-05 | Board Of Trustees Of Leland Stanford University | Low temperature germanium-silicon on insulator thin-film transistor |
JPH0793363B2 (ja) * | 1991-09-25 | 1995-10-09 | 株式会社半導体エネルギー研究所 | 半導体集積回路およびその作製方法 |
JPH05335529A (ja) * | 1992-05-28 | 1993-12-17 | Fujitsu Ltd | 半導体装置およびその製造方法 |
GB9315798D0 (en) * | 1993-07-30 | 1993-09-15 | Philips Electronics Uk Ltd | Manufacture of electronic devices comprising thin-film transistors |
JP3645378B2 (ja) | 1996-01-19 | 2005-05-11 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
JP3729955B2 (ja) * | 1996-01-19 | 2005-12-21 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
JP3645379B2 (ja) | 1996-01-19 | 2005-05-11 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
US6478263B1 (en) * | 1997-01-17 | 2002-11-12 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and its manufacturing method |
JP3645380B2 (ja) | 1996-01-19 | 2005-05-11 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法、情報端末、ヘッドマウントディスプレイ、ナビゲーションシステム、携帯電話、ビデオカメラ、投射型表示装置 |
US5888858A (en) | 1996-01-20 | 1999-03-30 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and fabrication method thereof |
US7056381B1 (en) | 1996-01-26 | 2006-06-06 | Semiconductor Energy Laboratory Co., Ltd. | Fabrication method of semiconductor device |
US6180439B1 (en) * | 1996-01-26 | 2001-01-30 | Semiconductor Energy Laboratory Co., Ltd. | Method for fabricating a semiconductor device |
US6465287B1 (en) | 1996-01-27 | 2002-10-15 | Semiconductor Energy Laboratory Co., Ltd. | Method for fabricating a semiconductor device using a metal catalyst and high temperature crystallization |
US6100562A (en) | 1996-03-17 | 2000-08-08 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing a semiconductor device |
TW451284B (en) * | 1996-10-15 | 2001-08-21 | Semiconductor Energy Lab | Semiconductor device and method of manufacturing the same |
US6147362A (en) * | 1997-03-17 | 2000-11-14 | Honeywell International Inc. | High performance display pixel for electronics displays |
KR19990039940A (ko) * | 1997-11-15 | 1999-06-05 | 구자홍 | 박막트랜지스터 제조방법 |
US6686623B2 (en) | 1997-11-18 | 2004-02-03 | Semiconductor Energy Laboratory Co., Ltd. | Nonvolatile memory and electronic apparatus |
JP2001196591A (ja) * | 2000-01-13 | 2001-07-19 | Internatl Business Mach Corp <Ibm> | 薄膜トランジスタ、および薄膜トランジスタの製造方法 |
JP4776801B2 (ja) * | 2001-04-24 | 2011-09-21 | 株式会社半導体エネルギー研究所 | メモリ回路 |
JP5046464B2 (ja) * | 2002-12-18 | 2012-10-10 | 株式会社半導体エネルギー研究所 | 半導体記憶素子の作製方法 |
CN117030078B (zh) * | 2023-08-10 | 2024-03-15 | 无锡胜脉电子有限公司 | 一种硅力敏感芯片及其制备方法、封装方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3394037A (en) * | 1965-05-28 | 1968-07-23 | Motorola Inc | Method of making a semiconductor device by masking and diffusion |
US3409812A (en) * | 1965-11-12 | 1968-11-05 | Hughes Aircraft Co | Space-charge-limited current triode device |
US3486892A (en) * | 1966-01-13 | 1969-12-30 | Raytheon Co | Preferential etching technique |
GB1130058A (en) * | 1966-10-03 | 1968-10-09 | Hughes Aircraft Co | Thin film space-charge-limited current triode |
FR2021973A7 (de) * | 1968-10-31 | 1970-07-24 | Nat Semiconductor Corp | |
NL164424C (nl) * | 1970-06-04 | 1980-12-15 | Philips Nv | Werkwijze voor het vervaardigen van een veldeffect- transistor met een geisoleerde stuurelektrode, waarbij een door een tegen oxydatie maskerende laag vrijgelaten deel van het oppervlak van een siliciumlichaam aan een oxydatiebehandeling wordt onderworpen ter verkrijging van een althans gedeeltelijk in het siliciumlichaam verzonken siliciumoxydelaag. |
DE2044792A1 (de) * | 1970-09-10 | 1972-03-23 | Ibm Deutschland | Feldeffekt-Transistor |
GB1390135A (en) * | 1971-05-08 | 1975-04-09 | Matsushita Electric Ind Co Ltd | Insulated gate semiconductor device |
US3789504A (en) * | 1971-10-12 | 1974-02-05 | Gte Laboratories Inc | Method of manufacturing an n-channel mos field-effect transistor |
US3823352A (en) * | 1972-12-13 | 1974-07-09 | Bell Telephone Labor Inc | Field effect transistor structures and methods |
-
1973
- 1973-12-03 US US420783A patent/US3890632A/en not_active Expired - Lifetime
-
1974
- 1974-10-18 IT IT28598/74A patent/IT1025054B/it active
- 1974-10-26 IN IN2343/CAL/74A patent/IN141988B/en unknown
- 1974-11-15 FR FR7437729A patent/FR2253286B1/fr not_active Expired
- 1974-11-21 CA CA214,319A patent/CA1013481A/en not_active Expired
- 1974-11-25 YU YU03133/74A patent/YU36421B/xx unknown
- 1974-11-25 DE DE2455730A patent/DE2455730C3/de not_active Expired
- 1974-11-25 GB GB5095374A patent/GB1447849A/en not_active Expired
- 1974-11-27 BR BR9904/74A patent/BR7409904A/pt unknown
- 1974-12-02 BE BE151070A patent/BE822852A/xx unknown
- 1974-12-02 SE SE7415065A patent/SE401581B/xx not_active IP Right Cessation
- 1974-12-02 JP JP49139384A patent/JPS5212550B2/ja not_active Expired
- 1974-12-02 NL NL7415694A patent/NL7415694A/xx not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
IN141988B (de) | 1977-05-14 |
FR2253286B1 (de) | 1978-09-22 |
SE7415065L (de) | 1975-06-04 |
JPS50106591A (de) | 1975-08-22 |
FR2253286A1 (de) | 1975-06-27 |
DE2455730B2 (de) | 1981-04-23 |
US3890632A (en) | 1975-06-17 |
AU7578974A (en) | 1976-05-27 |
YU313374A (en) | 1981-11-13 |
DE2455730C3 (de) | 1985-08-08 |
JPS5212550B2 (de) | 1977-04-07 |
GB1447849A (en) | 1976-09-02 |
BE822852A (fr) | 1975-04-01 |
BR7409904A (pt) | 1976-05-25 |
CA1013481A (en) | 1977-07-05 |
DE2455730A1 (de) | 1975-06-05 |
SE401581B (sv) | 1978-05-16 |
YU36421B (en) | 1983-06-30 |
IT1025054B (it) | 1978-08-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
BA | A request for search or an international-type search has been filed | ||
BA | A request for search or an international-type search has been filed | ||
BB | A search report has been drawn up | ||
BC | A request for examination has been filed | ||
BV | The patent application has lapsed |